CN220872522U

CN220872522U - Test board for universal chip

Info

Publication number: CN220872522U
Application number: CN202322499904.0U
Authority: CN
Inventors: 蒲研; 陈建铭; 林海鹏; 赵玉华
Original assignee: Shenzhen Zhenghongtai Technology Co ltd
Current assignee: Shenzhen Zhenghongtai Technology Co ltd
Priority date: 2023-09-14
Filing date: 2023-09-14
Publication date: 2024-04-30
Anticipated expiration: 2033-09-14

Abstract

The utility model discloses a test board for a universal chip, which comprises a base, a detection board, a through hole, a telescopic energizing test assembly, a movable fixed test module and a chip body, wherein the detection board is fixedly arranged at the top of the base, the through hole is formed in the top surface of the detection board, the telescopic energizing test assembly is fixedly connected with the bottom surface of the detection board, the movable fixed test module is fixedly connected with the top surface of the detection board, the chip body is movably connected with the movable fixed test module, the telescopic energizing test assembly comprises a motor I and a threaded rod, the threaded rod is fixedly connected with an output shaft of the motor I, and the telescopic energizing test assembly comprises a limiting block and a telescopic rod I.

Description

Test board for universal chip

Technical Field

The utility model particularly relates to a test board for a universal chip, and belongs to the technical field of chip testing.

Background

The chip is also called a microcircuit, and is understood to mean that the circuit is miniaturized, an integrated circuit manufactured on the surface of a semiconductor chip is also called a thin film integrated circuit, and another thick film integrated circuit is a miniaturized circuit formed by independent semiconductor equipment and passive components and integrated into a substrate or a circuit board, the chip is a soul in an electronic device, and the chip can help to complete operation, processing tasks and control the electronic device.

The chip needs to carry out the detection of circular telegram before using, ensures that the detection of chip normal just can be used, and the detection of chip needs to use the test board, and the chip model that different electronic equipment used is different, can meet the problem that needs to detect different chips when detecting the test to the chip, can meet the fixed problem to the chip simultaneously, and current test board for general type chip is not good to the detection effect of the circular telegram condition of each pin of the chip of different models when using, and is unfavorable to the fixed effect of the chip of different models simultaneously.

Disclosure of utility model

The utility model aims to provide a test board for a universal chip, which can detect the electrifying conditions of chips with different types and can better fix the chips with different types.

The utility model realizes the above-mentioned purpose through following technical scheme, a test board for general type chip, including base, pick-up plate, through-hole, flexible circular telegram test module, movable fixed test module and chip body, the pick-up plate is fixed to be set up in the top of base, the top surface of pick-up plate has seted up the through-hole, flexible circular telegram test module with the bottom surface fixed connection of pick-up plate, movable fixed test module with the top surface fixed connection of pick-up plate, the chip body with movable fixed test module swing joint.

Further, the telescopic power-on test assembly comprises a first motor and a threaded rod, wherein the threaded rod is fixedly connected with an output shaft of the first motor, and the limiting block can be conveniently driven to move.

Further, telescopic circular telegram test assembly includes stopper and telescopic link one, the stopper with threaded rod passes through threaded connection, the stiff end of telescopic link one is fixed wears to establish in the stopper, the telescopic link one's flexible end is fixed to be provided with the probe, can conveniently test for each pin of chip.

Further, the movable fixed test module comprises a support frame and a transverse frame, wherein the transverse frame is fixedly connected with the top end of the support frame, and the second telescopic rod can be conveniently supported.

Further, the movable fixed test module comprises a second telescopic rod and a fixed box, the fixed end of the second telescopic rod is fixedly connected with the bottom surface of the transverse frame, the fixed box is fixedly connected with the telescopic end of the second telescopic rod, the chip can be conveniently driven to lift, and the motor and the fixing clamp can be fixed.

Further, the movable fixed test module comprises a second motor and a gear, the second motor is fixedly connected with the outer side wall of the fixed box, and the gear is fixedly connected with an output shaft of the second motor, so that the fixed clamp can be conveniently driven to move.

Further, the movable fixed test module comprises a fixing clamp, the fixing clamp is in sliding connection with the inner side wall of the fixing box, the fixing clamp is meshed with the gear, and a fixing needle is fixedly arranged at the bottom of the fixing clamp, so that chips of different models can be conveniently clamped.

Further, the side wall of the fixed needle is fixedly provided with an elastic rod, and the telescopic end of the elastic rod is fixedly provided with a detection block, so that the chip can be conveniently electrified.

The utility model has the technical effects and advantages that: according to the utility model, through the cooperation of the telescopic power-on test assembly and the movable fixed test module, the detection of the power-on condition of chips of different types can be realized more comprehensively, the qualification of the chips can be ensured, and meanwhile, through the use of the movable fixed test module, the effect of better fixing the chips of different types which are being detected can be realized, and the smooth detection can be ensured.

Drawings

FIG. 1 is a schematic top view of the present utility model;

FIG. 2 is a schematic view of the bottom view of the present utility model;

FIG. 3 is a schematic top view of a movable stationary test module according to the present utility model;

Fig. 4 is a right-view structural schematic diagram of the movable type fixed test module according to the present utility model.

Fig. 5 is an enlarged schematic view of the structure of fig. 1a according to the present utility model.

In the figure: 1. a base; 2. a detection plate; 3. a through hole; 4. a telescoping power-on test assembly; 401. a first motor; 402. a threaded rod; 403. a limiting block; 404. a first telescopic rod; 405. a probe; 5. a movable fixed test module; 501. a support frame; 502. a cross frame; 503. a second telescopic rod; 504. a fixed box; 505. a second motor; 506. a gear; 507. a fixing clamp; 508. fixing the needle; 509. an elastic rod; 510. a detection block; 6. and a chip body.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-5, a test board for a universal chip includes a base 1, a test board 2, a through hole 3, a telescopic power-on test module 4, a movable fixed test module 5 and a chip body 6, wherein the test board 2 is fixedly arranged at the top of the base 1, the through hole 3 is formed in the top surface of the test board 2, the telescopic power-on test module 4 is fixedly connected with the bottom surface of the test board 2, the movable fixed test module 5 is fixedly connected with the top surface of the test board 2, and the chip body 6 is movably connected with the movable fixed test module 5.

When the portable power-on testing device is used, the base 1 can conveniently support the detection plate 2, the detection plate 2 can support the telescopic power-on testing assembly 4 and the movable fixed testing module 5, the through hole 3 can conveniently detect the chip body 6 by the telescopic power-on testing assembly 4, the telescopic power-on testing assembly 4 can move, the telescopic power-on testing assembly 4 can detect power-on conditions of the chip bodies 6 with different types, the movable fixed testing module 5 can clamp and fix the chip bodies 6 with different types, and the chip bodies 6 can be conveniently and comprehensively detected.

As shown in fig. 2, the telescopic power-on testing assembly 4 comprises a first motor 401 and a threaded rod 402, the threaded rod 402 is fixedly connected with an output shaft of the first motor 401, the telescopic power-on testing assembly 4 comprises a limiting block 403 and a first telescopic rod 404, the limiting block 403 is connected with the threaded rod 402 through threads, a fixed end of the first telescopic rod 404 is fixedly arranged in the limiting block 403 in a penetrating mode, and a probe 405 is fixedly arranged at a telescopic end of the first telescopic rod 404.

The chip body 6 is clamped by the movable fixed test module 5 and moves to a plane close to the top end of the probe 405, the motor 401 is started to drive the threaded rod 402 to rotate, the threaded rod 402 rotates to drive the limiting block 403 to move in the front-back direction, the limiting block 403 moves in the front-back direction to drive the telescopic rod 404 to move in the front-back direction, the telescopic rod 404 is started while the motor 401 is started, the telescopic rod 404 stretches and contracts to drive the probe 405 to move in the left-right direction, the probe 405 can be driven to contact each pin on the chip body 6 through the matched use of the motor 401 and the telescopic rod 404, one pin of the chip body 6 is electrified through the movable fixed test module 5, and the electrifying condition of the chip body 6 can be detected.

The top of stopper 403 is the plane, and the top of stopper 403 contacts with the bottom surface of pick-up plate 2, and when threaded rod 402 drove stopper 403 and remove, the bottom surface of pick-up plate 2 can be spacing to stopper 403, can prevent stopper 403 along with threaded rod 402 rotation.

As shown in fig. 2-5, the movable fixed test module 5 includes a support 501 and a cross frame 502, the cross frame 502 is fixedly connected with the top end of the support 501, the movable fixed test module 5 includes a second telescopic rod 503 and a fixed box 504, the fixed end of the second telescopic rod 503 is fixedly connected with the bottom surface of the cross frame 502, the fixed box 504 is fixedly connected with the telescopic end of the second telescopic rod 503, the movable fixed test module 5 includes a second motor 505 and a gear 506, the second motor 505 is fixedly connected with the outer side wall of the fixed box 504, the gear 506 is fixedly connected with the output shaft of the second motor 505, the movable fixed test module 5 includes a fixed clip 507, the fixed clip 507 is slidingly connected with the inner side wall of the fixed box 504, the fixed clip 507 is meshed with the gear 506, a fixed needle 508 is fixedly arranged at the bottom of the fixed clip 507, an elastic rod 509 is fixedly arranged at the side wall of the fixed needle 508, and a detection block 510 is fixedly arranged at the telescopic end of the elastic rod 509.

When the chip body 6 needs to be fixed, through the starting motor II 505, the starting of the motor II 505 drives the gear 506 to rotate, tooth grooves are formed in the side wall of the fixing clamp 507, the tooth grooves can be convenient for the fixing clamp 507 to be meshed with the gear 506, the gear 506 rotates to drive the tooth grooves to move, the tooth grooves can drive the fixing clamp 507 to be closed, the fixing pins 508 are arranged on two grabbing clamps of the fixing clamp 507 in pairs, the fixing pins 507 are closed to drive the fixing pins 508 on two sides to be close, the elastic rod 509 is driven to move when the fixing pins 508 on two sides are close to each other, the elastic rod 509 moves to drive the detection block 510 to move, the detection block 510 contacts with one pin on the chip body 6, the pin is fixed to the detection block 510, the fixing pins 508 on two sides are continuously close to drive the elastic rod 509 to stretch, and the fixing pins 508 can clamp the chip body 6.

The second telescopic rod 503 drives the fixed box 504 to descend, the second motor 505 and the fixed clamp 507 are driven by the descent of the fixed box 504, the fixed pin 508 is driven by the descent of the fixed clamp 507, the elastic rod 509 and the chip body 6 are driven by the descent of the fixed pin 508, the elastic rod 509 drives the detection block 510 to descend synchronously along with the chip body 6, when the chip body 6 descends to the plane where the top end of the probe 405 is located, the probe 405 can be driven to contact with each pin on the chip body 6 according to the matched use of the first motor 401 and the first telescopic rod 404 in the last step, the detection block 510 contacts with one fixed pin on the chip body 6, the probe 405 sequentially contacts with each pin on the chip body 6, the chip body 6 can be electrified, and the electrifying condition between each pin of the chip body 6 can be detected.

The support frame 501 can support the crossbearer 502, and the crossbearer 502 can fix telescopic link two 503, and fixed box 504 can fix motor two 505, and fixed box 504 can be spacing to fixation clamp 507, drives fixation clamp 507 through gear 506 and expands and close, can make things convenient for the chip body 6 of fixed needle 508 centre gripping different models, through the cooperation use of motor one 401 and telescopic link one 404, can drive the pin on the chip body 6 of probe 405 contact not unidimensional, can conveniently carry out the test of circular telegram condition for the chip body 6 of different models.

It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is provided for clarity only, and that the disclosure is not limited to the embodiments described in detail below, and that the embodiments described in the examples may be combined as appropriate to form other embodiments that will be apparent to those skilled in the art.

Claims

1. The utility model provides a test board for general type chip, includes base (1), pick-up plate (2), through-hole (3), telescopic circular telegram test assembly (4), movable fixed test module (5) and chip (6), its characterized in that: the utility model discloses a portable electronic device, including base (1), pick-up board (2), through-hole (3) have been seted up to the top surface of pick-up board (2), telescopic circular telegram test assembly (4) with the bottom surface fixed connection of pick-up board (2), movable fixed test module (5) with the top surface fixed connection of pick-up board (2), chip (6) with movable fixed test module (5) swing joint.

2. A test panel for a generic chip as defined in claim 1, wherein: the telescopic power-on test assembly (4) comprises a motor I (401) and a threaded rod (402), and the threaded rod (402) is fixedly connected with an output shaft of the motor I (401).

3. A test board for a universal chip as claimed in claim 2, wherein: the telescopic power-on test assembly (4) comprises a limiting block (403) and a telescopic rod I (404), the limiting block (403) is connected with the threaded rod (402) through threads, the fixed end of the telescopic rod I (404) is fixedly arranged in the limiting block (403) in a penetrating mode, and a probe (405) is fixedly arranged at the telescopic end of the telescopic rod I (404).

4. A test panel for a generic chip as defined in claim 1, wherein: the movable fixed test module (5) comprises a support frame (501) and a transverse frame (502), and the transverse frame (502) is fixedly connected with the top end of the support frame (501).

5. A test panel for a generic chip as defined in claim 4, wherein: the movable fixed test module (5) comprises a second telescopic rod (503) and a fixed box (504), wherein the fixed end of the second telescopic rod (503) is fixedly connected with the bottom surface of the transverse frame (502), and the fixed box (504) is fixedly connected with the telescopic end of the second telescopic rod (503).

6. A test panel for a generic chip as defined in claim 5, wherein: the movable fixed test module (5) comprises a second motor (505) and a gear (506), wherein the second motor (505) is fixedly connected with the outer side wall of the fixed box (504), and the gear (506) is fixedly connected with an output shaft of the second motor (505).

7. A test panel for a generic chip as defined in claim 6, wherein: the movable fixed test module (5) comprises a fixing clamp (507), the fixing clamp (507) is in sliding connection with the inner side wall of the fixing box (504), the fixing clamp (507) is meshed with the gear (506), and a fixing needle (508) is fixedly arranged at the bottom of the fixing clamp (507).

8. A test panel for a generic chip as defined in claim 7, wherein: an elastic rod (509) is fixedly arranged on the side wall of the fixed needle (508), and a detection block (510) is fixedly arranged at the telescopic end of the elastic rod (509).