CN217278536U

CN217278536U - Contact pressure adjustable probe testing arrangement

Info

Publication number: CN217278536U
Application number: CN202123373085.2U
Authority: CN
Inventors: 方经军
Original assignee: Suzhou Stende Electronic Technology Co ltd
Current assignee: Suzhou Stende Electronic Technology Co ltd
Priority date: 2021-12-29
Filing date: 2021-12-29
Publication date: 2022-08-23
Anticipated expiration: 2031-12-29

Abstract

The utility model discloses a probe testing device with adjustable contact pressure, which relates to the technical field of PCBA testing and comprises a bottom plate, a testing unit and an adjusting unit; the upper surface of the bottom plate is fixedly provided with a mounting bracket; the test unit contains gear, rack, first slider, connecting plate and probe, logical groove has been seted up to the upper surface of installing support, it installs the pivot to lead to rotate on the groove, fixed mounting has the gear in the pivot, first spout has been seted up to the side that leads to the groove, the side-mounting of rack has first slider, first slider and first spout sliding connection, rack and gear engagement connect. This contact pressure adjustable probe test device structure reliability is high, can promote the accurate degree that the probe moved down, still has the buffering effect to PCBA forms adjustable contact pressure, effect when promoting probe test PCBA can also adjust probe test PCBA's different positions, still conveniently dismantles the change probe and uses backup probe.

Description

Contact pressure adjustable probe testing arrangement

Technical Field

The utility model relates to a PCBA tests technical field, specifically is a contact pressure adjustable probe test device.

Background

The probe is a testing needle for testing the PCBA, the surface of the probe is plated with gold, a high-performance spring with the average service life of 3-10 ten thousand is arranged in the probe, the probe testing device is generally used for detecting the PCBA, the probe is required to be contacted with a circuit board during detection, and in order to prevent the probe from leaving a dent on the surface of the circuit board to be tested, the pressure of the probe testing device is required to be adjusted.

A probe testing device disclosed in the patent with the publication number CN210155257U in the prior art includes at least two mechanical arms, each of which is provided with a testing probe and a position detecting sensor, and the position detecting sensor can detect the position of a testing point of a sample to be tested, so that a control module controls each of the mechanical arms to drive the respective testing probe to move to the position of a different testing point of the sample to be tested, and inputs corresponding testing voltages to the different testing points of the sample to be tested, thereby realizing the testing of the sample to be tested.

The probe testing device has the advantages that the structure reliability is low, the accuracy of the probe moving is not improved, the buffering effect is not realized, the adjustable contact pressure cannot be formed on the PCBA, and different positions of the probe for testing the PCBA cannot be adjusted.

SUMMERY OF THE UTILITY MODEL

The to-be-solved technical problem of the utility model is to overcome current defect, provide a contact pressure adjustable probe test device, the reliable degree of structure is high, can promote the accurate degree that the probe moved down, still has the buffering effect to contact pressure with adjustable to PCBA formation, effect when promoting probe test PCBA can also adjust probe test PCBA's different positions, still conveniently dismantle change probe and use backup probe, can effectively solve the problem in the background art.

In order to achieve the above object, the utility model provides a following technical scheme: a probe testing device with adjustable contact pressure comprises a bottom plate, a testing unit and an adjusting unit;

a bottom plate: the upper surface of the bracket is fixedly provided with a mounting bracket;

a test unit: the probe fixing device comprises a gear, a rack, a first sliding block, a connecting plate and a probe, wherein a through groove is formed in the upper surface of an installation support, a rotating shaft is rotatably installed on the through groove, the gear is fixedly installed on the rotating shaft, a first sliding groove is formed in the side surface of the through groove, the first sliding block is installed on the side surface of the rack, the first sliding block is slidably connected with the first sliding groove, the rack is meshed with the gear, the connecting plate is installed at the lower end of the rack, a compression spring is installed on the lower surface of the connecting plate, an installation plate is installed at the other end of the compression spring, a limiting column is installed on the upper surface of the installation plate, and the probe is installed on the lower surface of the installation plate;

an adjusting unit: which is mounted on the upper surface of the base plate.

Further, the test unit still contains fixture block and spacing axle, the draw-in groove has been seted up on the mounting panel, the fixture block is installed to the upper end of probe, fixture block and draw-in groove buckle are connected, fixture block and draw-in groove still are through spacing axle joint. Conveniently change the probe through fixture block, draw-in groove and spacing axle, and install not co-altitude probe simultaneously, damage in the longer probe use of length, change when inconvenient, can dismantle it earlier, use the short backup probe of length, side promotion probe test PCBA's effect.

Furthermore, the test unit still contains motor and motor support, the side-mounting of installing support has motor support, the last motor of installing of motor support, the output shaft of motor has the one end of pivot through the coupling joint, the output of external control ware is connected to the input electricity of motor. Through the work of external controller control motor, motor work drives the pivot and rotates to can test PCBA, through the distance that moves down of motor intelligent control mounting panel, promote the test accuracy of probe.

Furthermore, the regulating unit contains second slider, threaded rod and handle, the second spout has been seted up to the upper surface of bottom plate, the second slider is installed to the lower extreme of installing support, second slider and second spout sliding connection, the threaded rod is installed to the side screw thread of second spout, the handle is installed to the one end of threaded rod, the other end of threaded rod rotates the side of installing at the second slider. The handle is rotated to drive the threaded rod to rotate, the threaded rod rotates to drive the second sliding block to move on the second sliding groove, and different positions of the probe for testing the PCBA can be adjusted.

Further, the adjusting unit still contains stopper and spacing groove, the spacing groove has been seted up to the inside both sides of second spout, the stopper is installed to the both sides of second slider, stopper and spacing groove sliding connection. Play limiting displacement through stopper and spacing groove, stability when promoting the installing support and removing.

Furthermore, the mounting structure further comprises mounting holes and mounting blocks, wherein the mounting blocks are mounted at four corners of the upper surface of the bottom plate, and the mounting holes are formed in the mounting blocks. Through mounting hole and installation piece easy to assemble and PMKD, promote probe test PCBA and make overall structure's stability.

Compared with the prior art, the beneficial effects of the utility model are that: this contact pressure adjustable probe testing arrangement has following benefit:

1. this contact pressure adjustable probe test device has the test element, installs the probe on the fixed slot through the bottom plate of test element to make the probe under the mounting panel test PCBA, accurate degree when promoting the mounting panel downstream through rack and gear, hold-down spring and spacing post play the cushioning effect, thereby form adjustable contact pressure to PCBA, effect when promoting probe test PCBA.

2. This contact pressure adjustable probe test device has the regulating unit, and the threaded rod through the regulating unit rotates and drives the second slider and remove on the second spout, can adjust probe test PCBA's different positions. The limiting block and the limiting groove play a limiting role, and the stability of the mounting bracket during moving is improved.

3. This contact pressure adjustable probe test device structure reliability is high, can promote the accurate degree that the probe moved down, still has the buffering effect to PCBA forms adjustable contact pressure, effect when promoting probe test PCBA can also adjust probe test PCBA's different positions, still conveniently dismantles the change probe and uses backup probe.

Drawings

Fig. 1 is a schematic structural diagram of the present invention.

In the figure: the device comprises a base plate 1, a test unit 2, a motor 21, a motor support 22, a gear 23, a rack 24, a first slide block 25, a connecting plate 26, a clamping block 27, a spacing shaft 28, a probe 29, an adjusting unit 3, a spacing block 31, a second slide block 32, a spacing groove 33, a threaded rod 34, a handle 35, a compression spring 4, a mounting plate 5, a mounting support 6, a spacing column 7, a mounting hole 8, a fixing groove 9 and a mounting block 10.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-1, the present embodiment provides a technical solution: a probe testing device with adjustable contact pressure comprises a bottom plate 1, a testing unit 2 and an adjusting unit 3;

bottom plate 1: the upper surface of the bracket is fixedly provided with a mounting bracket 6; the mounting structure further comprises mounting holes 8 and mounting blocks 10, the mounting blocks 10 are mounted at four corners of the upper surface of the bottom plate 1, and the mounting holes 8 are formed in the mounting blocks 10. The mounting holes 8 and the mounting blocks 10 facilitate mounting and fixing of the base plate 1, and the lift probes 29 test the PCBA to stabilize the overall structure.

The test unit 2: the device comprises a gear 23, a rack 24, a first sliding block 25, a connecting plate 26 and a probe 29, wherein a through groove is formed in the upper surface of an installation support 6, a rotating shaft is rotatably installed on the through groove, the gear 23 is fixedly installed on the rotating shaft, a first sliding groove is formed in the side surface of the through groove, the first sliding block 25 is installed on the side surface of the rack 24, the first sliding block 25 is slidably connected with the first sliding groove, the rack 24 is meshed with the gear 23, the connecting plate 26 is installed at the lower end of the rack 24, a compression spring 4 is installed on the lower surface of the connecting plate 26, an installation plate 5 is installed at the other end of the compression spring 4, a limiting column 7 is installed on the upper surface of the installation plate 5, and the probe 29 is installed on the lower surface of the installation plate 5; drive rack 24 through rotating gear 23 and remove under the effect of first slider 25 and first spout, rack 24 removes and drives connecting plate 26 and remove, connecting plate 26 removes and drives pressure spring 4 and remove, pressure spring 4 removes and drives mounting panel 5 and remove, install probe 29 on the fixed slot 9 of bottom plate 1, thereby make probe 29 under the mounting panel 5 test PCBA, accurate degree when promoting mounting panel 5 downstream through rack 24 and gear 23, pressure spring 4 and spacing post 7 play the cushioning effect, thereby contact pressure with adjustable formation to PCBA, effect when promoting probe 29 test PCBA. The test unit 2 further comprises a clamping block 27 and a limiting shaft 28, a clamping groove is formed in the mounting plate 5, the clamping block 27 is mounted at the upper end of the probe 29, the clamping block 27 is connected with the clamping groove in a clamping mode, and the clamping block 27 is clamped with the clamping groove through the limiting shaft 28. Conveniently change probe 29 through fixture block 27, draw-in groove and spacing axle 28, and install not the probe 29 of co-altitude simultaneously, damage in the longer probe 29 use of length, change when inconvenient, can dismantle it earlier, use the backup probe 29 that length is shorter, side promotion probe 29 tests PCBA's effect. The test unit 2 further comprises a motor 21 and a motor support 22, the motor support 22 is installed on the side face of the installation support 6, the motor 21 is installed on the motor support 22, an output shaft of the motor 21 is connected with one end of a rotating shaft through a coupler, and an input end of the motor 21 is electrically connected with an output end of an external controller. Through the work of external controller control motor 21, motor 21 work drives the pivot and rotates to can test PCBA, through the distance that moves down of motor 21 intelligent control mounting panel 5, promote probe 29's test accuracy.

The adjusting unit 3: which is mounted on the upper surface of the base plate 1. The adjusting unit 3 comprises a second sliding block 32, a threaded rod 34 and a handle 35, a second sliding groove is formed in the upper surface of the bottom plate 1, the second sliding block 32 is installed at the lower end of the installing support 6, the second sliding block 32 is connected with the second sliding groove in a sliding mode, the threaded rod 34 is installed on the side face of the second sliding groove in a threaded mode, the handle 35 is installed at one end of the threaded rod 34, and the other end of the threaded rod 34 is installed on the side face of the second sliding block 32 in a rotating mode. The handle 35 is rotated to drive the threaded rod 34 to rotate, the threaded rod 34 rotates to drive the second sliding block 32 to move on the second sliding groove, and different positions of the probe 29 for testing the PCBA can be adjusted. The adjusting unit 3 further comprises a limiting block 31 and a limiting groove 33, the limiting groove 33 is formed in two sides of the inner portion of the second sliding groove, the limiting block 31 is installed on two sides of the second sliding block 32, and the limiting block 31 is connected with the limiting groove 33 in a sliding mode. The limiting function is achieved through the limiting block 31 and the limiting groove 33, and the stability of the mounting bracket 6 during moving is improved.

The utility model provides a pair of contact force adjustable probe test device's theory of operation as follows: drive rack 24 through rotating gear 23 and remove under the effect of first slider 25 and first spout, rack 24 removes and drives connecting plate 26 and remove, connecting plate 26 removes and drives pressure spring 4 and remove, pressure spring 4 removes and drives mounting panel 5 and remove, install probe 29 on the fixed slot 9 of bottom plate 1, thereby make probe 29 under the mounting panel 5 test PCBA, accurate degree when promoting mounting panel 5 downstream through rack 24 and gear 23, pressure spring 4 and spacing post 7 play the cushioning effect, thereby contact pressure with adjustable formation to PCBA, effect when promoting probe 29 test PCBA. The probe 29 is convenient to replace through the clamping block 27, the clamping groove and the limiting shaft 28, the probes 29 with different heights are installed at the same time, when the longer probe 29 is damaged in the using process and is inconvenient to replace, the longer probe 29 can be detached firstly, the shorter backup probe 29 is used, and the effect of testing the PCBA by the probe 29 is improved laterally. Through the work of external controller control motor 21, motor 21 work drives the pivot and rotates to can test PCBA, through the distance that moves down of motor 21 intelligent control mounting panel 5, promote probe 29's test accuracy. The handle 35 is rotated to drive the threaded rod 34 to rotate, the threaded rod 34 rotates to drive the second sliding block 32 to move on the second sliding groove, and different positions of the probe 29 for testing the PCBA can be adjusted. The limiting function is achieved through the limiting block 31 and the limiting groove 33, and the stability of the mounting bracket 6 during moving is improved. The mounting holes 8 and the mounting blocks 10 facilitate mounting and fixing of the base plate 1, and the lift probes 29 test the PCBA to stabilize the overall structure.

It should be noted that in this embodiment, the core chip of the external controller is an STC single chip microcomputer, the specific model is STC15W204S, the motor 21 can be freely configured according to the actual application scenario, and the motor 21 can be a JE series single-phase servo motor manufactured by mitsubishi motor (china) ltd, beijing. The external controller controls the operation of the motor 21 in a manner commonly used in the art.

The above only is the embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structures or equivalent processes of the present invention are used in the specification and the attached drawings, or directly or indirectly applied to other related technical fields, and the same principle is included in the protection scope of the present invention.

Claims

1. The utility model provides a contact pressure adjustable probe testing arrangement which characterized in that: comprises a bottom plate (1), a testing unit (2) and an adjusting unit (3);

base plate (1): the upper surface of the bracket is fixedly provided with a mounting bracket (6);

test unit (2): comprises a gear (23), a rack (24), a first sliding block (25), a connecting plate (26) and a probe (29), a through groove is arranged on the upper surface of the mounting bracket (6), a rotating shaft is rotatably arranged on the through groove, a gear (23) is fixedly arranged on the rotating shaft, a first sliding groove is arranged on the side surface of the through groove, a first sliding block (25) is arranged on the side surface of the rack (24), the first sliding block (25) is connected with the first sliding groove in a sliding manner, the rack (24) is meshed with the gear (23), the lower end of the rack (24) is provided with a connecting plate (26), a compression spring (4) is arranged on the lower surface of the connecting plate (26), a mounting plate (5) is arranged at the other end of the compression spring (4), the upper surface of the mounting plate (5) is provided with a limiting column (7), and the lower surface of the mounting plate (5) is provided with a probe (29);

adjusting unit (3): which is mounted on the upper surface of the base plate (1).

2. The probe test device with adjustable contact pressure according to claim 1, wherein: the test unit (2) further comprises a clamping block (27) and a limiting shaft (28), a clamping groove is formed in the mounting plate (5), the clamping block (27) is mounted at the upper end of the probe (29), the clamping block (27) is connected with the clamping groove in a buckled mode, and the clamping block (27) is connected with the clamping groove through the limiting shaft (28) in a clamped mode.

3. The probe test device with adjustable contact pressure according to claim 2, wherein: test unit (2) still contain motor (21) and motor support (22), the side-mounting of installing support (6) has motor support (22), install motor (21) on motor support (22), the output shaft of motor (21) has the one end of pivot through the coupling joint, the output of external control ware is connected to the input electricity of motor (21).

4. The probe test device with adjustable contact pressure according to claim 1, wherein: adjusting element (3) contain second slider (32), threaded rod (34) and handle (35), the second spout has been seted up to the upper surface of bottom plate (1), second slider (32) are installed to the lower extreme of installing support (6), second slider (32) and second spout sliding connection, threaded rod (34) are installed to the side screw thread of second spout, handle (35) are installed to the one end of threaded rod (34), the other end of threaded rod (34) is rotated and is installed the side at second slider (32).

5. The probe test device with adjustable contact pressure according to claim 4, wherein: regulating unit (3) still contain stopper (31) and spacing groove (33), spacing groove (33) have been seted up to the inside both sides of second spout, stopper (31) are installed to the both sides of second slider (32), stopper (31) and spacing groove (33) sliding connection.

6. The probe test device with adjustable contact pressure according to claim 1, wherein: the mounting structure is characterized by further comprising mounting holes (8) and mounting blocks (10), wherein the mounting blocks (10) are mounted at four corners of the upper surface of the bottom plate (1), and the mounting holes (8) are formed in the mounting blocks (10).