CN113498443A - 用于制造金属材料的系统以及金属材料的制造方法 - Google Patents

用于制造金属材料的系统以及金属材料的制造方法 Download PDF

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Publication number
CN113498443A
CN113498443A CN202080015895.XA CN202080015895A CN113498443A CN 113498443 A CN113498443 A CN 113498443A CN 202080015895 A CN202080015895 A CN 202080015895A CN 113498443 A CN113498443 A CN 113498443A
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China
Prior art keywords
information
metal plate
protrusion
electrolytic cell
electrolytic
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Pending
Application number
CN202080015895.XA
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English (en)
Chinese (zh)
Inventor
渡边邦男
行里武英
鹿田刚
长尾谕
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Jx Metal Smelting Co ltd
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Pan Pacific Copper Co Ltd
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Application filed by Pan Pacific Copper Co Ltd filed Critical Pan Pacific Copper Co Ltd
Publication of CN113498443A publication Critical patent/CN113498443A/zh
Pending legal-status Critical Current

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    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25C—PROCESSES FOR THE ELECTROLYTIC PRODUCTION, RECOVERY OR REFINING OF METALS; APPARATUS THEREFOR
    • C25C1/00—Electrolytic production, recovery or refining of metals by electrolysis of solutions
    • C25C1/12—Electrolytic production, recovery or refining of metals by electrolysis of solutions of copper
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25C—PROCESSES FOR THE ELECTROLYTIC PRODUCTION, RECOVERY OR REFINING OF METALS; APPARATUS THEREFOR
    • C25C7/00—Constructional parts, or assemblies thereof, of cells; Servicing or operating of cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/64—Analysis of geometric attributes of convexity or concavity
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P10/00—Technologies related to metal processing
    • Y02P10/20—Recycling

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Pathology (AREA)
  • Organic Chemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Geometry (AREA)
  • Metallurgy (AREA)
  • Medicinal Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Textile Engineering (AREA)
  • Electrolytic Production Of Metals (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Analysis (AREA)
CN202080015895.XA 2019-03-14 2020-03-06 用于制造金属材料的系统以及金属材料的制造方法 Pending CN113498443A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019047638A JP6936265B2 (ja) 2019-03-14 2019-03-14 金属材料を製造するためのシステム及び金属材料の製造方法
JP2019-047638 2019-03-14
PCT/JP2020/009779 WO2020184462A1 (ja) 2019-03-14 2020-03-06 金属材料を製造するためのシステム及び金属材料の製造方法

Publications (1)

Publication Number Publication Date
CN113498443A true CN113498443A (zh) 2021-10-12

Family

ID=72426267

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080015895.XA Pending CN113498443A (zh) 2019-03-14 2020-03-06 用于制造金属材料的系统以及金属材料的制造方法

Country Status (3)

Country Link
JP (1) JP6936265B2 (ja)
CN (1) CN113498443A (ja)
WO (1) WO2020184462A1 (ja)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001056297A (ja) * 1999-08-17 2001-02-27 Electro Techno Kk 表面検査方法及び装置
CN1516752A (zh) * 2001-06-25 2004-07-28 奥托库姆普联合股份公司 改进电解中阴极质量的方法
JP2009167532A (ja) * 2009-03-16 2009-07-30 Nippon Mining & Metals Co Ltd 不良陰極板の選別装置及び不良陰極板の選別方法
JP2010122225A (ja) * 2008-11-21 2010-06-03 Ls-Nikko Copper Inc 電解精錬された金属析出板の表面検査装置
CN102560534A (zh) * 2006-03-01 2012-07-11 Jx日矿日石金属株式会社 铜的电解精炼方法
JP2013111671A (ja) * 2011-11-25 2013-06-10 Kokusai Gijutsu Kaihatsu Co Ltd 製箔ローラ検査装置
JP2013181911A (ja) * 2012-03-02 2013-09-12 Dowa Metals & Mining Co Ltd 非鉄金属の表面状態の定量評価方法および定量評価装置、並びに、電着金属板
JP2015105429A (ja) * 2013-12-03 2015-06-08 三井金属エンジニアリング株式会社 析出金属板の表面検査装置および析出金属板の仕分けとカソード板の仕分けシステム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3670384B2 (ja) * 1996-03-22 2005-07-13 富士写真フイルム株式会社 写真フイルムカートリッジの製造情報管理方法
JP3806234B2 (ja) * 1997-09-19 2006-08-09 同和鉱業株式会社 電解精製方法及び電解槽
JP2002012996A (ja) * 2000-06-30 2002-01-15 Nippon Mining & Metals Co Ltd 電解製錬における異常電極の自動検出方法
JP5007750B2 (ja) * 2010-03-05 2012-08-22 オムロン株式会社 はんだ印刷状態の分析作業の支援方法およびはんだ印刷検査機
JP2012038005A (ja) * 2010-08-05 2012-02-23 Renesas Electronics Corp 半導体装置、電子機器、品質情報提供システム、および、プログラム

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001056297A (ja) * 1999-08-17 2001-02-27 Electro Techno Kk 表面検査方法及び装置
CN1516752A (zh) * 2001-06-25 2004-07-28 奥托库姆普联合股份公司 改进电解中阴极质量的方法
US20040173453A1 (en) * 2001-06-25 2004-09-09 Ari Rantala Method for improving the quality of cathodes in electrolysis
CN102560534A (zh) * 2006-03-01 2012-07-11 Jx日矿日石金属株式会社 铜的电解精炼方法
JP2010122225A (ja) * 2008-11-21 2010-06-03 Ls-Nikko Copper Inc 電解精錬された金属析出板の表面検査装置
JP2009167532A (ja) * 2009-03-16 2009-07-30 Nippon Mining & Metals Co Ltd 不良陰極板の選別装置及び不良陰極板の選別方法
JP2013111671A (ja) * 2011-11-25 2013-06-10 Kokusai Gijutsu Kaihatsu Co Ltd 製箔ローラ検査装置
JP2013181911A (ja) * 2012-03-02 2013-09-12 Dowa Metals & Mining Co Ltd 非鉄金属の表面状態の定量評価方法および定量評価装置、並びに、電着金属板
JP2015105429A (ja) * 2013-12-03 2015-06-08 三井金属エンジニアリング株式会社 析出金属板の表面検査装置および析出金属板の仕分けとカソード板の仕分けシステム

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JP2020147814A (ja) 2020-09-17
JP6936265B2 (ja) 2021-09-15
WO2020184462A1 (ja) 2020-09-17

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