CN113165142B - 清洗组件及具备清洗组件的基板处理装置 - Google Patents

清洗组件及具备清洗组件的基板处理装置 Download PDF

Info

Publication number
CN113165142B
CN113165142B CN201980075357.7A CN201980075357A CN113165142B CN 113165142 B CN113165142 B CN 113165142B CN 201980075357 A CN201980075357 A CN 201980075357A CN 113165142 B CN113165142 B CN 113165142B
Authority
CN
China
Prior art keywords
substrate
roller
cleaning
edge
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201980075357.7A
Other languages
English (en)
Chinese (zh)
Other versions
CN113165142A (zh
Inventor
水野稔夫
桧森洋辅
马场枝里奈
石桥知淳
小畠严贵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Publication of CN113165142A publication Critical patent/CN113165142A/zh
Application granted granted Critical
Publication of CN113165142B publication Critical patent/CN113165142B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00Cleaning of wafers, substrates or parts of devices
    • H10P70/50Cleaning of wafers, substrates or parts of devices characterised by the part to be cleaned
    • H10P70/54Cleaning of wafer edges
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • B24B37/345Feeding, loading or unloading work specially adapted to lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • B24B9/02Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
    • B24B9/06Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
    • B24B9/065Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0412Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0428Apparatus for mechanical treatment or grinding or cutting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/32Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
    • H10P72/3202Mechanical details, e.g. rollers or belts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7618Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Manufacturing Of Printed Wiring (AREA)
CN201980075357.7A 2018-11-16 2019-10-31 清洗组件及具备清洗组件的基板处理装置 Active CN113165142B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018215456A JP7265858B2 (ja) 2018-11-16 2018-11-16 洗浄モジュール、洗浄モジュールを備える基板処理装置と洗浄方法
JP2018-215456 2018-11-16
PCT/JP2019/042773 WO2020100609A1 (ja) 2018-11-16 2019-10-31 洗浄モジュール、洗浄モジュールを備える基板処理装置と洗浄方法

Publications (2)

Publication Number Publication Date
CN113165142A CN113165142A (zh) 2021-07-23
CN113165142B true CN113165142B (zh) 2023-12-22

Family

ID=70730502

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980075357.7A Active CN113165142B (zh) 2018-11-16 2019-10-31 清洗组件及具备清洗组件的基板处理装置

Country Status (7)

Country Link
US (1) US12033847B2 (https=)
JP (1) JP7265858B2 (https=)
KR (1) KR102778937B1 (https=)
CN (1) CN113165142B (https=)
SG (1) SG11202105091PA (https=)
TW (1) TWI822901B (https=)
WO (1) WO2020100609A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12138732B2 (en) 2020-12-14 2024-11-12 Applied Materials, Inc. Polishing system apparatus and methods for defect reduction at a substrate edge
CN112976266A (zh) * 2021-03-04 2021-06-18 王仕英 一种陶瓷生产用胚体修复装置
JP7623225B2 (ja) * 2021-06-11 2025-01-28 株式会社Screenホールディングス 基板洗浄装置
CN116689340B (zh) * 2022-02-28 2026-01-23 秦皇岛烟草机械有限责任公司 一种浸渍器端盖用维护装置及其控制方法
CN114887976B (zh) * 2022-05-25 2024-01-23 宁波芯丰精密科技有限公司 一种清洁装置
CN119609909B (zh) * 2024-08-06 2026-03-24 浙江创芯集成电路有限公司 晶圆研磨装置以及晶圆研磨设备

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1493334A (en) * 1974-03-30 1977-11-30 Schleifenbaum & Steinmetz Cleaning machine and process for cleaning metal sheets
JPH0645302A (ja) * 1992-07-24 1994-02-18 Tokyo Electron Ltd 処理装置
JPH1080668A (ja) * 1996-09-09 1998-03-31 Mitsubishi Chem Corp ディスク基板の洗浄ユニット及び連続洗浄装置
JP2003088811A (ja) * 2001-09-20 2003-03-25 Toshiba Corp ローラ清掃装置
JP2003151943A (ja) * 2001-11-19 2003-05-23 Speedfam Clean System Co Ltd スクラブ洗浄装置
JP2003151925A (ja) * 2001-11-12 2003-05-23 Yac Co Ltd ウェーハエッジ研磨処理装置
WO2006103859A1 (ja) * 2005-03-29 2006-10-05 Tokyo Electron Limited 基板洗浄方法および基板洗浄装置
JP2007317703A (ja) * 2006-05-23 2007-12-06 Fujifilm Corp ブラシ洗浄方法、半導体の製造方法及びブラシ洗浄装置
JP2008084934A (ja) * 2006-09-26 2008-04-10 Mitsumi Electric Co Ltd 半導体基板の洗浄方法
KR20080036903A (ko) * 2006-10-24 2008-04-29 주식회사 케이씨텍 대면적 기판의 접촉식 세정장치
JP2010040943A (ja) * 2008-08-07 2010-02-18 Tokyo Electron Ltd 基板洗浄装置及び基板洗浄方法
CN105382677A (zh) * 2014-08-26 2016-03-09 株式会社荏原制作所 抛光处理组件、基板处理装置及抛光垫清洗方法
JP2018113393A (ja) * 2017-01-13 2018-07-19 株式会社ディスコ ウエーハ洗浄装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5861066A (en) 1996-05-01 1999-01-19 Ontrak Systems, Inc. Method and apparatus for cleaning edges of contaminated substrates
JPH10335279A (ja) 1997-05-30 1998-12-18 Shibaura Eng Works Co Ltd 洗浄装置
JP2003317703A (ja) 2002-04-24 2003-11-07 Sony Corp 電池およびその製造方法

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1493334A (en) * 1974-03-30 1977-11-30 Schleifenbaum & Steinmetz Cleaning machine and process for cleaning metal sheets
JPH0645302A (ja) * 1992-07-24 1994-02-18 Tokyo Electron Ltd 処理装置
JPH1080668A (ja) * 1996-09-09 1998-03-31 Mitsubishi Chem Corp ディスク基板の洗浄ユニット及び連続洗浄装置
JP2003088811A (ja) * 2001-09-20 2003-03-25 Toshiba Corp ローラ清掃装置
JP2003151925A (ja) * 2001-11-12 2003-05-23 Yac Co Ltd ウェーハエッジ研磨処理装置
JP2003151943A (ja) * 2001-11-19 2003-05-23 Speedfam Clean System Co Ltd スクラブ洗浄装置
WO2006103859A1 (ja) * 2005-03-29 2006-10-05 Tokyo Electron Limited 基板洗浄方法および基板洗浄装置
JP2007317703A (ja) * 2006-05-23 2007-12-06 Fujifilm Corp ブラシ洗浄方法、半導体の製造方法及びブラシ洗浄装置
JP2008084934A (ja) * 2006-09-26 2008-04-10 Mitsumi Electric Co Ltd 半導体基板の洗浄方法
KR20080036903A (ko) * 2006-10-24 2008-04-29 주식회사 케이씨텍 대면적 기판의 접촉식 세정장치
JP2010040943A (ja) * 2008-08-07 2010-02-18 Tokyo Electron Ltd 基板洗浄装置及び基板洗浄方法
CN105382677A (zh) * 2014-08-26 2016-03-09 株式会社荏原制作所 抛光处理组件、基板处理装置及抛光垫清洗方法
JP2018113393A (ja) * 2017-01-13 2018-07-19 株式会社ディスコ ウエーハ洗浄装置

Also Published As

Publication number Publication date
US20220013352A1 (en) 2022-01-13
SG11202105091PA (en) 2021-06-29
TWI822901B (zh) 2023-11-21
CN113165142A (zh) 2021-07-23
JP2020088000A (ja) 2020-06-04
TW202027867A (zh) 2020-08-01
KR20210089671A (ko) 2021-07-16
JP7265858B2 (ja) 2023-04-27
KR102778937B1 (ko) 2025-03-11
US12033847B2 (en) 2024-07-09
WO2020100609A1 (ja) 2020-05-22

Similar Documents

Publication Publication Date Title
CN113165142B (zh) 清洗组件及具备清洗组件的基板处理装置
TWI585838B (zh) 基板背面之研磨方法及基板處理裝置
TW471994B (en) System and method for controlled polishing and planarization of semiconductor wafers
TWI790319B (zh) 基板處理系統及基板處理方法
CN105164793B (zh) 对于利用用于化学机械抛光的晶片及晶片边缘/斜角清洁模块的盘/垫清洁的设计
CN109382707B (zh) 基板背面研磨构件的修整装置和修整方法
TWI582844B (zh) 在清潔模組中調整襯墊
JP2002208572A (ja) 研磨装置
TW201812928A (zh) 研磨基板表面的裝置及方法
JP2016058724A (ja) 処理モジュール、処理装置、及び、処理方法
US6221171B1 (en) Method and apparatus for conveying a workpiece
JPWO2019013042A1 (ja) 基板処理システム、基板処理方法及びコンピュータ記憶媒体
US20190184517A1 (en) Substrate processing apparatus, substrate processing method, and storage medium storing program
US20250319569A1 (en) Chemical mechanical polishing correction tool
JP4660494B2 (ja) 研磨カートリッジ
WO2015061741A1 (en) Systems, methods and apparatus for post-chemical mechanical planarization substrate buff pre-cleaning
US10376929B2 (en) Apparatus and method for polishing a surface of a substrate
TWI763765B (zh) 基板的研磨裝置及研磨方法
KR102871758B1 (ko) 기판 처리 장치 및 기판 처리 장치에서 부분 연마되어야 할 영역을 특정하는 방법
JP2018114582A (ja) 研磨方法
WO2004059714A1 (ja) 研磨装置及び半導体デバイスの製造方法
CN116075394A (zh) 加工装置和加工方法
KR20030031790A (ko) 화학적 기계적 평탄화 설비의 크리너 장치
JP2000254856A (ja) 研磨装置及び研磨方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant