CN113039605A - 存储器和存取方法 - Google Patents
存储器和存取方法 Download PDFInfo
- Publication number
- CN113039605A CN113039605A CN201980076064.0A CN201980076064A CN113039605A CN 113039605 A CN113039605 A CN 113039605A CN 201980076064 A CN201980076064 A CN 201980076064A CN 113039605 A CN113039605 A CN 113039605A
- Authority
- CN
- China
- Prior art keywords
- magnetic memory
- voltage
- layer
- memory cell
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Magnetic active materials
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
Abstract
本申请提供了一种磁电阻随机存取存储器,能够节约芯片面积。该磁电阻随机存取存储器包括:多个堆叠的叠加层,每个叠加层包括呈二维排布的多个磁记忆体单元;多个选择金属层,每个叠加层设置于两个选择金属层之间且与所述两个选择金属层相邻,每个选择金属层与相邻的叠加层中的磁记忆体单元相连,并用于对所述磁记忆体单元进行读写操作。
Description
PCT国内申请,说明书已公开。
Claims (22)
- PCT国内申请,权利要求书已公开。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2019/076591 WO2020172891A1 (zh) | 2019-02-28 | 2019-02-28 | 存储器和存取方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN113039605A true CN113039605A (zh) | 2021-06-25 |
Family
ID=72238760
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201980076064.0A Pending CN113039605A (zh) | 2019-02-28 | 2019-02-28 | 存储器和存取方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20210390994A1 (zh) |
EP (1) | EP3923288A4 (zh) |
CN (1) | CN113039605A (zh) |
WO (1) | WO2020172891A1 (zh) |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6611453B2 (en) * | 2001-01-24 | 2003-08-26 | Infineon Technologies Ag | Self-aligned cross-point MRAM device with aluminum metallization layers |
SE531384C2 (sv) * | 2006-02-10 | 2009-03-17 | Vnk Innovation Ab | Multipla magnetoresistansanordningar baserade på metalldopad magnesiumoxid |
US8508984B2 (en) * | 2006-02-25 | 2013-08-13 | Avalanche Technology, Inc. | Low resistance high-TMR magnetic tunnel junction and process for fabrication thereof |
US7888756B2 (en) * | 2007-03-22 | 2011-02-15 | Everspin Technologies, Inc. | MRAM tunnel barrier structure and methods |
CN102314927B (zh) * | 2010-07-06 | 2014-02-05 | 中国科学院物理研究所 | 一种磁性随机存储单元阵列、存储器及其读写方法 |
US8730719B1 (en) * | 2010-12-03 | 2014-05-20 | Iii Holdings 1, Llc | MRAM with metal gate write conductors |
CN102487124B (zh) * | 2011-09-19 | 2014-07-23 | 中国科学院物理研究所 | 纳米多层膜、场效应管、传感器、随机存储器及制备方法 |
US9853053B2 (en) * | 2012-09-10 | 2017-12-26 | 3B Technologies, Inc. | Three dimension integrated circuits employing thin film transistors |
TWI569484B (zh) * | 2014-01-24 | 2017-02-01 | 國立臺灣大學 | 具超晶格勢壘之磁穿隧接面及包含具超晶格勢壘磁穿隧接面之裝置 |
KR102235043B1 (ko) * | 2014-06-09 | 2021-04-05 | 삼성전자주식회사 | 반도체 메모리 장치 |
US9978931B2 (en) * | 2015-02-13 | 2018-05-22 | Inston Inc. | Systems and methods for implementing robust magnetoelectric junctions |
US10134808B2 (en) * | 2015-11-02 | 2018-11-20 | Qualcomm Incorporated | Magnetic tunnel junction (MTJ) devices with heterogeneous free layer structure, particularly suited for spin-torque-transfer (STT) magnetic random access memory (MRAM) (STT MRAM) |
KR102437781B1 (ko) * | 2015-12-10 | 2022-08-30 | 삼성전자주식회사 | 자기 메모리 장치 및 그 제조 방법 |
US10134457B1 (en) * | 2017-08-31 | 2018-11-20 | Sandisk Technologies Llc | Cross-point spin accumulation torque MRAM |
US10585630B2 (en) * | 2017-09-11 | 2020-03-10 | Samsung Electronics Co., Ltd. | Selectorless 3D stackable memory |
CN107910439B (zh) * | 2017-11-07 | 2019-12-06 | 北京航空航天大学 | 拓扑绝缘磁电阻器件 |
US10381406B1 (en) * | 2018-02-17 | 2019-08-13 | GlobalFoundries, Inc. | Integrated circuits including magnetic random access memory structures having reduced switching energy barriers for dual bit operation and methods for fabricating the same |
-
2019
- 2019-02-28 WO PCT/CN2019/076591 patent/WO2020172891A1/zh unknown
- 2019-02-28 EP EP19916906.1A patent/EP3923288A4/en active Pending
- 2019-02-28 CN CN201980076064.0A patent/CN113039605A/zh active Pending
-
2021
- 2021-08-26 US US17/412,904 patent/US20210390994A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2020172891A1 (zh) | 2020-09-03 |
EP3923288A1 (en) | 2021-12-15 |
US20210390994A1 (en) | 2021-12-16 |
EP3923288A4 (en) | 2022-08-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10600460B2 (en) | Perpendicular magnetic memory using spin-orbit torque | |
CN106875969B (zh) | 磁存储器 | |
Kawahara et al. | 2 Mb SPRAM (SPin-transfer torque RAM) with bit-by-bit bi-directional current write and parallelizing-direction current read | |
US7236386B2 (en) | System and method for transferring data to and from a magnetic shift register with a shiftable data column | |
US6633498B1 (en) | Magnetoresistive random access memory with reduced switching field | |
US8976577B2 (en) | High density magnetic random access memory | |
US8378438B2 (en) | Method and system for providing magnetic elements having enhanced magnetic anisotropy and memories using such magnetic elements | |
US8120950B2 (en) | Semiconductor device | |
US11790968B2 (en) | Spintronic device, SOT-MRAM storage cell, storage array and in-memory computing circuit | |
US7457149B2 (en) | Methods and apparatus for thermally assisted programming of a magnetic memory device | |
US20080239782A1 (en) | Semiconductor memory device | |
US9129692B1 (en) | High density magnetic random access memory | |
WO2013154564A1 (en) | Selector for low voltage embedded memory | |
KR20120048482A (ko) | 하이브리드 자기 터널 접합 소자의 제조 방법 및 시스템 | |
CN105355780A (zh) | 一种磁性元件、存储器系统及其写操作方法 | |
US9620189B2 (en) | Magnetic memory | |
US20100328986A1 (en) | Magnetic shift register memory in stack structure | |
US10290338B2 (en) | Tilted synthetic antiferromagnet polarizer/reference layer for STT-MRAM bits | |
KR102318275B1 (ko) | 수직 스핀 전달 토크 mram 메모리 셀 | |
TWI422083B (zh) | Magnetic memory lattice and magnetic random access memory | |
CN112514090B (zh) | 磁电阻随机存储单元、存储器和存取方法 | |
CN113039605A (zh) | 存储器和存取方法 | |
JP2007088000A (ja) | 不揮発性メモリ | |
US20230337548A1 (en) | Sot-driven field-free switching mram and array thereof | |
CN116250040A (zh) | 一种存储器及电子设备 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |