CN111785316B - Method, system, storage medium and terminal for overcoming erasure interference - Google Patents
Method, system, storage medium and terminal for overcoming erasure interference Download PDFInfo
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- CN111785316B CN111785316B CN202010605503.7A CN202010605503A CN111785316B CN 111785316 B CN111785316 B CN 111785316B CN 202010605503 A CN202010605503 A CN 202010605503A CN 111785316 B CN111785316 B CN 111785316B
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
- G11C16/3409—Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3468—Prevention of overerasure or overprogramming, e.g. by verifying whilst erasing or writing
- G11C16/3477—Circuits or methods to prevent overerasing of nonvolatile memory cells, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate erasing
Abstract
The invention discloses a method, a system, a storage medium and a terminal for overcoming erasing interference, wherein when the application times of erasing pulses reach a preset value, a first refreshing programming process is started to solve the problem that the erasing interference is caused to a storage unit by multiple erasing pulses after the performance of a chip is deteriorated, so that the probability of permanent errors of chip data can be reduced, and the reliability of the chip is ensured.
Description
Technical Field
The present invention relates to the field of semiconductor memory technologies, and in particular, to a method, a system, a storage medium, and a terminal for overcoming erase interference.
Background
In a memory, typically a sector of 4096 bytes in size and a block of 65536 bytes in size, for a 128Mbit chip containing 256 blocks, we will usually place some of the blocks in the same array, for example 32 blocks in an array, with the memory cells in an array having their substrates tied together. In the following, a 128-Mbit capacity chip is taken as an example, and the size of one array is 16Mbit, that is, 32 blocks are located in the same array and 512 sectors are located in the same array.
When a sector erase is performed on a chip, a common erase flow is shown in fig. 1, and will be explained as follows:
1. judgment operation 1: judging whether the current sector needs to be erased, if so, erasing the sector, otherwise, the sector does not need to be erased, and exiting the algorithm flow;
2. an erasing pulse: applying an erase pulse to the sector;
3. judgment operation 2: judging whether the sector is successfully erased; if not, continuing to apply the pulse; if the erasing is successful, jumping to the next step;
4. soft programming: because the characteristics of the memory cells in the sector are not completely consistent (influenced by the process, the erasing times and the like), part of the memory cells which are easy to erase can be over-erased, and therefore the over-erased memory cells are subjected to soft programming to prevent electric leakage;
5. refreshing the programming unit: for the array in which the sector is located, if there are programming units in other sectors of the array, because the substrates of the entire array are connected together, and the gate voltages of the storage units in other sectors are not equal to the substrate voltage, there is a voltage difference between the gate and the substrate, and this voltage difference will have an erasing effect on the programming units in other sectors of the array, resulting in a lower threshold voltage of the programming units. Therefore, it is necessary to refresh the programmed cells and repair the erased cells so that their threshold voltages are restored to the original higher values.
When a chip is just used, the performance of the memory cells is better, namely, the memory cells are easier to erase, and as the use time increases and the use environment is harsh, the performance of the memory cells is worse, namely, the memory cells are harder to erase, which means that more and more erase pulses are generated, and the erase pulses cause more and more interference to other sectors of the array.
When the number of times the chip is used increases, the performance of the chip may deteriorate, in the conventional practice (such as the above-mentioned erase algorithm), the refresh program unit operation is performed only after the chip completes the erase success, and if the chip is used tens of thousands of times, it may need thousands of erase pulses to change the memory cells into erase cells, and the influence of the thousands of erase pulses on other sectors of the array is: every time an erase pulse comes, the program cells in other sectors of the array will also generate an erase effect, and thousands of erase pulses will generate thousands of erase effects, and for some program cells, thousands of erase effects will turn them into erase cells (i.e. the threshold voltage is reduced to the threshold side of the erase cells), and then when the refresh program cell operation is performed, the chip will regard itself as the erase cells when the program cells are programmed, and will not perform any refresh operation, which results in data errors inside the chip, and also permanent errors.
Therefore, the prior art still needs to be improved and developed.
Disclosure of Invention
The invention aims to provide a method, a system, a storage medium and a terminal for overcoming erasing interference, and aims to solve the problem that multiple erasing pulses cause erasing interference on a storage unit after the performance of a chip is deteriorated.
The technical scheme of the invention is as follows: a method for overcoming erase interference specifically comprises the following steps:
s1: the chip receives an erasing instruction;
s2: pre-programming the chip;
s3: judging whether a unit needing to be erased exists in the chip, if so, jumping to S4, otherwise, jumping to S12;
s4: erasing the erased unit;
s5: judging whether the erasing times reach a preset value, if so, jumping to S6, otherwise, jumping to S8;
s6: performing first refreshing treatment on other programming units in the same array with the erased unit in the chip;
s7: resetting the preset value of the erasing times;
s8: judging whether the erased unit is successfully erased, if so, jumping to S9, otherwise, jumping to S4;
s9: judging whether an over-erased unit exists in the erased unit, if so, jumping to S10, otherwise, jumping to S11;
s10: repairing an over-erased cell within the erased cell and jumping to S11;
s11: performing second refreshing treatment on other programming units in the same array with the erased unit in the chip;
s12: the chip enters a standby state.
The method for overcoming the erase disturbance specifically includes, in S3, the following steps: and judging whether a programming unit exists in the chip, if so, jumping to S4, and if not, jumping to S12.
The method for overcoming the erasing interference is characterized in that the unit needing to be erased is a sector erasing unit or a block erasing unit.
The method for overcoming erase disturb, wherein in S4, the erasing process is performed on the erased unit by applying an erase pulse to the erased unit.
The method for overcoming erase disturb, wherein in S10, repairing the over-erased cells in the erased cells is performed by soft programming the over-erased cells.
The method for overcoming the erase disturbance, wherein the S11 specifically includes the following steps:
s 11: judging whether other units in the same array with the erased unit in the chip are the erased units or the programmed units, if the other units are the erased units, jumping to S12, and if the other units are the programmed units, jumping to S12;
s 12: judging whether the programming unit is interfered by erasing, if so, jumping to S13, otherwise, jumping to S12;
s 13: the refresh programming process is performed on the program cell, and the flow goes to S12.
The method for overcoming the erase disturbance, wherein the S6 specifically includes the following steps:
s 61-1: judging whether other units in the same array with the erased unit in the chip are the erased units or the programmed units, if the other units are the erased units, jumping to S7, and if the other units are the programmed units, jumping to S61-2;
s 61-2: judging whether the programming unit is interfered by erasing, if so, jumping to S61-3, otherwise, jumping to S7;
s 61-3: the refresh programming process is performed on the program cell, and the flow goes to S7.
A system for employing a method of overcoming erase interference as claimed in any one of the preceding claims, comprising:
a pre-programming module for performing pre-programming processing on the chip;
a judging module for judging whether a unit needing to be erased exists in the chip;
an erasing module for erasing the erased unit;
an erasing frequency judging module for judging whether the erasing frequency reaches a preset value;
the first refreshing processing module is used for refreshing other programming units in the same array with the erased unit for the first time;
a times resetting module for resetting the preset value of the erasing times;
an erase success judging module for judging whether the erased unit is successfully erased;
an over-erase judging module for judging whether an over-erase unit exists in the erased unit;
an over-erase repair module for repairing an over-erase unit in the erased unit;
and the second refreshing processing module is used for performing second refreshing processing on other programming units in the same array with the erased unit in the chip.
A storage medium having stored therein a computer program which, when run on a computer, causes the computer to perform any of the methods described above.
A terminal comprising a processor and a memory, the memory having stored therein a computer program, the processor being adapted to perform the method of any preceding claim by invoking the computer program stored in the memory.
The invention has the beneficial effects that: the invention provides a method, a system, a storage medium and a terminal for overcoming the erasing interference, wherein the first refreshing programming processing is started when the applying times of the erasing pulse reach the preset value, so that the problem of the erasing interference on a storage unit caused by multiple erasing pulses after the performance of a chip is deteriorated is solved, the probability of permanent errors of chip data can be reduced, and the reliability of the chip is ensured.
Drawings
Fig. 1 is a schematic diagram of an erase flow in the prior art.
FIG. 2 is a flow chart of steps of a method of overcoming erase disturb in the present invention.
Fig. 3 is a schematic diagram of the system of the present invention.
Fig. 4 is a schematic structural diagram of a terminal in the present invention.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures. Meanwhile, in the description of the present application, the terms "first", "second", and the like are used only for distinguishing the description, and are not to be construed as indicating or implying relative importance.
As shown in fig. 2, a method for overcoming erase interference specifically includes the following steps:
s1: the chip receives an erasing instruction;
s2: pre-programming the chip;
s3: judging whether a unit needing to be erased exists in the chip, if so, jumping to S4, otherwise, jumping to S12;
s4: erasing the erased unit;
s5: judging whether the erasing times reach a preset value, if so, jumping to S6, otherwise, jumping to S8;
s6: performing first refreshing treatment on other programming units in the same array with the erased unit in the chip;
s7: resetting the preset value of the erasing times;
s8: judging whether the erased unit is successfully erased, if so, jumping to S9, otherwise, jumping to S4;
s9: judging whether an over-erased unit exists in the erased unit, if so, jumping to S10, otherwise, jumping to S11;
s10: repairing an over-erased cell within the erased cell and jumping to S11;
s11: performing second refreshing treatment on other programming units in the same array with the erased unit in the chip;
s12: the chip enters a standby state.
In some specific embodiments, the step S3 specifically includes the following steps: and judging whether a programming unit exists in the chip or not, if so, erasing the programming unit, and if not, executing the erasing process.
In some embodiments, the method for overcoming erase interference of the present disclosure may be applied to different chip erase modes, such as sector erase, block erase, and full chip erase. The sector erasure is the minimum erasure unit of the current mainstream chip, and the larger erasure unit can be block erasure or full chip erasure; the problem of erasing pulse interference exists in sector erasing and block erasing, so that the technical scheme can solve the problem of erasing pulse interference, and the problem of erasing pulse interference does not exist in full-chip erasing, so that the method is not needed in full-chip erasing.
In S5, after the erase pulse is ended, directly jumping to the stage of determining the erase count, determining whether the erase count is greater than N (the setting of N is set according to the actual condition of the chip), if so, performing a refresh programming unit operation, after the refresh programming unit operation is ended, resetting the erase count N, and then entering a subsequent normal determination link (i.e., S8 to S12).
In S7, assuming that the initial setting N is 100 times, when the erase pulse is accumulated to 100 times, a refresh program unit operation is performed once, and at this time, if the reset erase count N is 150 times, the next refresh program operation is performed when the erase pulse is accumulated to 150 times, instead of 200 times, so that it is possible to more flexibly adjust when to start the refresh program unit operation according to the characteristics of the chip.
In certain embodiments, the step of S11 specifically includes the following steps:
s 11: judging whether other units in the same array with the erased unit in the chip are the erased units or the programmed units, if the other units are the erased units, jumping to S12, and if the other units are the programmed units, jumping to S12;
s 12: judging whether the programming unit is interfered by erasing, if so, jumping to S13, otherwise, jumping to S12;
s 13: the refresh programming process is performed on the program cell, and the flow goes to S12.
Wherein s11 to s13 are illustrated by the following examples: firstly, judging the units of other sectors of the array, and if the units are erasing units, not performing any treatment; if the cell is a programmed cell, continuing to judge next step, if the cell is a programmed cell which is not subjected to the erase interference (namely the threshold voltage is high enough and is generally more than 6.5 v), not performing any treatment; if the cells are programmed by erase disturbance (i.e. the threshold voltage is lower than 6.5v but higher than 6 v), the cells are subjected to a refresh programming operation to return the threshold voltage to 6.5v or higher; the above 6.5v, 6v are for explanation only, and the actual threshold voltage depends on the specific chip.
In some embodiments, the specific step of S6 may be identical to the specific step of S11, namely:
s 61-1: judging whether other units in the same array with the erased unit in the chip are the erased units or the programmed units, if the other units are the erased units, jumping to S7, and if the other units are the programmed units, jumping to S61-2;
s 61-2: judging whether the programming unit is interfered by erasing, if so, jumping to S61-3, otherwise, jumping to S7;
s 61-3: the refresh programming process is performed on the program cell, and the flow goes to S7.
When the chip is used for a short time, the performance of the chip is good at this time, and the number of erase pulses is often from several to hundreds, for convenience of description, 100 are taken as an example for description: when the chip is initially used, after 100 erasing pulses, the chip finishes the erasing operation, and then the refresh programming unit operation is carried out, and after the chip is used for a period of time, the chip can be erased by 500 erasing pulses, while the traditional method needs to wait until the 500 erasing pulses are applied, the chip can carry out the refresh programming unit operation, and the technical scheme is that the refresh programming unit operation is implemented once after the chip carries out 100 erasing pulses, and the refresh programming operation is implemented for the second time after the chip carries out 200 erasing pulses, and so on; thus, the probability of permanent errors of the chip data can be reduced.
As shown in fig. 3, a system employing the method for overcoming erase disturb as described above, includes:
a pre-programming module A1 for pre-programming the chip;
a determining module A2 for determining whether there is a cell to be erased in the chip;
an erasing module a3 for performing an erasing process on the erased cells;
an erasing frequency judging module A4 for judging whether the erasing frequency reaches a preset value;
the first refresh processing module A5 for performing the first refresh processing to other programming units in the same array with the erased unit in the chip;
a number resetting module a6 for resetting the preset value of the erasing number;
an erase success determining module a7 for determining whether the erased unit is successfully erased;
an over-erase judgment module A8 for judging whether an over-erased cell exists in the erased cell;
an over-erase repair module a9 for repairing an over-erased cell in the erased cells;
and a second refresh processing module A10 for performing a second refresh process on other programmed cells in the same array as the erased cell in the chip.
The present invention also provides a storage medium having a computer program stored therein, which when run on a computer causes the computer to perform the method of any of the above to implement the following functions: the chip is powered on; pre-programming the chip; judging whether a unit needing to be erased exists in the chip, if not, the chip enters a standby state, and if so, erasing the erased unit; judging whether the erasing times reach a preset value or not, if not, entering to judge whether the erased unit is successfully erased or not, if so, performing first refreshing treatment on other programming units in the same array with the erased unit in the chip and resetting the preset value of the erasing times, then entering to judge whether the erased unit is successfully erased or not, if not, performing erasing treatment again, if so, judging whether an over-erased unit exists in the erased unit or not, if so, repairing the over-erased unit in the erased unit, otherwise, performing second refreshing treatment on other programming units in the same array with the erased unit in the chip, and finally, entering the standby state by the chip.
Referring to fig. 4, an embodiment of the present invention further provides a terminal. As shown, terminal B300 includes a processor B301 and a memory B302. The processor B301 is electrically connected to the memory B302. The processor B301 is a control center of the terminal B300, connects various parts of the entire terminal using various interfaces and lines, and performs various functions of the terminal and processes data by running or calling a computer program stored in the memory B302 and calling data stored in the memory B302, thereby performing overall monitoring of the terminal.
In this embodiment, the processor B301 in the terminal loads instructions corresponding to one or more computer program processes into the memory B302 according to the following steps, and the processor B301 runs the computer program stored in the memory B302, so as to implement various functions: the chip is powered on; pre-programming the chip; judging whether a unit needing to be erased exists in the chip, if not, the chip enters a standby state, and if so, erasing the erased unit; judging whether the erasing times reach a preset value or not, if not, entering to judge whether the erased unit is successfully erased or not, if so, performing first refreshing treatment on other programming units in the same array with the erased unit in the chip and resetting the preset value of the erasing times, then entering to judge whether the erased unit is successfully erased or not, if not, performing erasing treatment again, if so, judging whether an over-erased unit exists in the erased unit or not, if so, repairing the over-erased unit in the erased unit, otherwise, performing second refreshing treatment on other programming units in the same array with the erased unit in the chip, and finally, entering the standby state by the chip.
Memory B302 may be used to store computer programs and data. The memory B302 stores a computer program containing instructions executable in the processor. The computer program may constitute various functional modules. The processor B301 executes various functional applications and data processing by calling a computer program stored in the memory B302.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
In addition, units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
Furthermore, the functional modules in the embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
In this document, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (10)
1. A method for overcoming erasure interference is characterized by comprising the following steps:
s1: the chip receives an erasing instruction;
s2: pre-programming the chip;
s3: judging whether a unit needing to be erased exists in the chip, if so, jumping to S4, otherwise, jumping to S12;
s4: erasing the erased unit;
s5: judging whether the erasing times reach a preset value, if so, jumping to S6, otherwise, jumping to S8;
s6: performing first refreshing treatment on other programming units in the same array with the erased unit in the chip;
s7: resetting the preset value of the erasing times;
s8: judging whether the erased unit is successfully erased, if so, jumping to S9, otherwise, jumping to S4;
s9: judging whether an over-erased unit exists in the erased unit, if so, jumping to S10, otherwise, jumping to S11;
s10: repairing an over-erased cell within the erased cell and jumping to S11;
s11: performing second refreshing treatment on other programming units in the same array with the erased unit in the chip;
s12: the chip enters a standby state.
2. The method according to claim 1, wherein the step S3 specifically includes the following steps: and judging whether a programming unit exists in the chip, if so, jumping to S4, and if not, jumping to S12.
3. The method of claim 1, wherein the cells to be erased are sector erase cells or block erase cells.
4. The method of claim 1, wherein in S4, the erasing process is performed on the erased unit by applying an erase pulse to the erased unit.
5. The method of claim 1, wherein the repairing of the over-erased cells in the erased cells at S10 is performed by soft programming the over-erased cells.
6. The method according to claim 1, wherein the step S11 specifically comprises the following steps:
s 11: judging whether other units in the same array with the erased unit in the chip are the erased units or the programmed units, if the other units are the erased units, jumping to S12, and if the other units are the programmed units, jumping to S12;
s 12: judging whether the programming unit is interfered by erasing, if so, jumping to S13, otherwise, jumping to S12;
s 13: the refresh programming process is performed on the program cell, and the flow goes to S12.
7. The method according to claim 1, wherein the step S6 specifically comprises the following steps:
s 61-1: judging whether other units in the same array with the erased unit in the chip are the erased units or the programmed units, if the other units are the erased units, jumping to S7, and if the other units are the programmed units, jumping to S61-2;
s 61-2: judging whether the programming unit is interfered by erasing, if so, jumping to S61-3, otherwise, jumping to S7;
s 61-3: the refresh programming process is performed on the program cell, and the flow goes to S7.
8. A system employing the method of overcoming erasure interference of any of claims 1 through 7, comprising:
a pre-programming module (A1) for pre-programming the chip;
a judging module (A2) for judging whether the cell to be erased exists in the chip;
an erasing module (A3) for erasing the erased unit;
an erasing frequency judging module (A4) for judging whether the erasing frequency reaches a preset value;
a first refresh processing module (A5) for performing a first refresh process on other programmed cells in the same array as the erased cell in the chip;
a number resetting module (A6) for resetting the preset value of the erasing number;
an erase success judgment module (a 7) for judging whether the erased cell is successfully erased;
an over-erase judgment module (A8) for judging whether an over-erased cell exists in the erased cell;
an over-erase repair module (A9) for repairing over-erased cells in the erased cells;
and a second refresh processing module (A10) for performing a second refresh process on other programmed cells in the same array as the erased cell in the chip.
9. A storage medium having stored thereon a computer program which, when run on a computer, causes the computer to perform the method of any one of claims 1 to 7.
10. A terminal, characterized in that it comprises a processor (B301) and a memory (B302), said memory (B302) having stored therein a computer program, said processor (B301) being adapted to perform the method of any of claims 1 to 7 by calling said computer program stored in said memory (B302).
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Address after: 518000 Room 101, building 10, Dayun software Town, 8288 Longgang Avenue, he'ao community, Yuanshan street, Longgang District, Shenzhen City, Guangdong Province Patentee after: XTX Technology Inc. Address before: 518000 1st floor, building 10, Dayun software Town, 8288 Longgang Avenue, Henggang street, Longgang District, Shenzhen City, Guangdong Province Patentee before: Paragon Technology (Shenzhen) Ltd. |