CN111727366B - 信号处理装置和信号处理方法 - Google Patents

信号处理装置和信号处理方法 Download PDF

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Publication number
CN111727366B
CN111727366B CN201880076352.1A CN201880076352A CN111727366B CN 111727366 B CN111727366 B CN 111727366B CN 201880076352 A CN201880076352 A CN 201880076352A CN 111727366 B CN111727366 B CN 111727366B
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measurement
time
series signal
signal
reference data
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Chinese (zh)
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CN111727366A (zh
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吉田真希子
佐佐木俊辅
高仓树
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/272—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/76—Chemiluminescence; Bioluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7786—Fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N2035/0097—Control arrangements for automatic analysers monitoring reactions as a function of time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
CN201880076352.1A 2017-12-19 2018-11-21 信号处理装置和信号处理方法 Active CN111727366B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017-242815 2017-12-19
JP2017242815A JP6762927B2 (ja) 2017-12-19 2017-12-19 信号処理装置及び信号処理方法
PCT/JP2018/042940 WO2019123956A1 (ja) 2017-12-19 2018-11-21 信号処理装置及び信号処理方法

Publications (2)

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CN111727366A CN111727366A (zh) 2020-09-29
CN111727366B true CN111727366B (zh) 2023-06-27

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US (1) US20210102964A1 (enExample)
EP (1) EP3730930B1 (enExample)
JP (1) JP6762927B2 (enExample)
CN (1) CN111727366B (enExample)
WO (1) WO2019123956A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7346858B2 (ja) * 2019-03-14 2023-09-20 株式会社リコー 生体情報計測装置、生体情報計測システム、生体情報計測方法及び生体情報計測プログラム
JP7323816B2 (ja) * 2021-06-21 2023-08-09 東亜ディーケーケー株式会社 エンドトキシン測定方法
CN115754151A (zh) * 2022-11-18 2023-03-07 中冶赛迪工程技术股份有限公司 输出信号质量确定方法、报警方法、系统、设备及介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008146157A (ja) * 2006-12-06 2008-06-26 Mitsubishi Electric Corp ネットワーク異常判定装置
CN103748471A (zh) * 2011-09-01 2014-04-23 株式会社日立高新技术 自动分析装置
CN103760133A (zh) * 2014-01-24 2014-04-30 深圳市安鑫宝科技发展有限公司 检测农副产品异常成分的方法及装置
CN106442574A (zh) * 2016-08-31 2017-02-22 上海创和亿电子科技发展有限公司 一种基于微波水分仪的产品霉变检测系统和检测方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63101758A (ja) * 1986-10-20 1988-05-06 Toshiba Corp 自動化学分析装置
JPH1137921A (ja) * 1997-07-14 1999-02-12 Horiba Ltd 分析装置および分析装置の表示装置
JP2003524753A (ja) * 1998-04-23 2003-08-19 サンディア コーポレーション プラズマ処理操作を監視する方法及び装置
JP4248328B2 (ja) * 2002-08-07 2009-04-02 株式会社日立ハイテクノロジーズ サンプル分注装置およびそれを用いた自動分析装置
JP2004239790A (ja) * 2003-02-07 2004-08-26 Matsushita Electric Ind Co Ltd 分析装置
JP2005127757A (ja) * 2003-10-22 2005-05-19 Hitachi High-Technologies Corp 自動分析装置
JP4366261B2 (ja) * 2004-07-09 2009-11-18 株式会社日立ハイテクノロジーズ 測定反応過程の異常の有無判定方法，該方法を実行可能な自動分析装置及び該方法のプログラムを記憶した記憶媒体
JP4521339B2 (ja) 2005-09-21 2010-08-11 株式会社日立ハイテクノロジーズ 積分型データ演算法におけるチェック機能を備えたデータ処理方法
JP4856993B2 (ja) * 2006-03-14 2012-01-18 株式会社日立ハイテクノロジーズ 自己診断型自動分析装置
JP2008032582A (ja) * 2006-07-31 2008-02-14 Hitachi High-Technologies Corp 異物・欠陥検査装置および異物欠陥・検査方法
JP5020118B2 (ja) * 2008-02-18 2012-09-05 浜松ホトニクス株式会社 蛍光解析装置及び解析方法
JP2010069065A (ja) * 2008-09-19 2010-04-02 Panasonic Corp 非侵襲血糖測定装置
US9176156B2 (en) * 2008-09-30 2015-11-03 Hitachi High-Technologies Corporation Automatic analyzer including pressure sensor for washing solution
JP5501146B2 (ja) * 2010-08-03 2014-05-21 日鐵住金建材株式会社 フロック形成状態判定方法、フロック形成状態判定装置、凝集反応槽、ｐＨ調整槽、及び異常発生通報システム
JP5872816B2 (ja) * 2011-08-03 2016-03-01 シスメックス株式会社 検体分析装置
EP2620764B1 (en) 2012-01-25 2015-11-04 Roche Diagniostics GmbH A luminescence method of detecting an analyte in a liquid sample and analysis system
US10288637B2 (en) * 2014-05-15 2019-05-14 Hitachi High-Technologies Corporation Automatic analyzer
US10238322B2 (en) * 2014-06-06 2019-03-26 Dexcom, Inc. Fault discrimination and responsive processing based on data and context
WO2016117358A1 (ja) * 2015-01-21 2016-07-28 三菱電機株式会社 検査データ処理装置および検査データ処理方法
US9696204B2 (en) * 2015-08-03 2017-07-04 Spectrasensors, Inc. Determination and correction of frequency registration deviations for quantitative spectroscopy
JP6126290B1 (ja) * 2016-10-17 2017-05-10 ヴィスコ・テクノロジーズ株式会社 外観検査装置
WO2019008677A1 (ja) * 2017-07-04 2019-01-10 オリンパス株式会社 信号取得装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008146157A (ja) * 2006-12-06 2008-06-26 Mitsubishi Electric Corp ネットワーク異常判定装置
CN103748471A (zh) * 2011-09-01 2014-04-23 株式会社日立高新技术 自动分析装置
CN103760133A (zh) * 2014-01-24 2014-04-30 深圳市安鑫宝科技发展有限公司 检测农副产品异常成分的方法及装置
CN106442574A (zh) * 2016-08-31 2017-02-22 上海创和亿电子科技发展有限公司 一种基于微波水分仪的产品霉变检测系统和检测方法

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Publication number Publication date
EP3730930A4 (en) 2021-11-17
EP3730930B1 (en) 2023-08-09
JP2019109152A (ja) 2019-07-04
EP3730930A1 (en) 2020-10-28
US20210102964A1 (en) 2021-04-08
CN111727366A (zh) 2020-09-29
JP6762927B2 (ja) 2020-09-30
WO2019123956A1 (ja) 2019-06-27

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