CN1113253C - 振幅掩膜及用该掩膜制作长周期光栅滤波器的装置和方法 - Google Patents
振幅掩膜及用该掩膜制作长周期光栅滤波器的装置和方法 Download PDFInfo
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Abstract
振幅掩膜及用该掩膜制作长周期光栅滤波器的设备和方法。在使激光以选择方式传播到光纤中制作长周期光栅时,振幅掩膜周期地使激光传播到光纤上。振幅掩膜包括两个具有周期性交替的通过激光的透过区和防止激光通过的非透过区的掩膜,二掩膜按相反方向转动,使透过区的周期改变,从而给出一个与转角有关的振幅掩膜周期。
Description
本发明涉及一种被动式光学元件,具体地说,涉及一种振幅掩膜,以及使用该掩膜制作长周期光栅滤波器的装置和方法。
随着近来光学通讯的发展,长周期光栅滤波器作为被动式光学元件引起很大的关注。长周期光栅滤波器把芯线模式与包层模式联系起来,所谓芯线模式光是在光纤的芯线中传播,通过周期性地改变光纤芯线对紫外线灵敏的折射率制作长周期光栅滤波器。这就是说,曝光部分的折射率增加,非曝光部分的折射率不改变,因而折射率就周期性地改变。为了把芯线模式与包层模式联系在一起,必须满足下式:
其中βco是芯线模式的传播常数,βn c1是第n级包层模式的传播常数,Λ是光栅周期。
当以2π∏/λ(此处的n是折射率)替换上式(1)中的β时,式(1)就变成nco-nc1=λ/Λ。因此,必须确定周期Λ和折射率的差(nco-nc1),以使某种波长与包层模式相联系。通过对紫外光敏感的光纤适当地照射紫外激光可以获得所述折射率的差。
图1是传统的长周期光栅滤波器制作设备的框图。参照图1,这种传统的长周期光栅制作设备包括高输出激基缔合物的激光光源100,反射镜102,透镜104,二氧化硅掩膜106和光纤108。光源100发射紫外激光。反射镜102改变光源100所发射的激光的路径。透镜104调节其路径已被反射镜102改变的激光的焦点。二氧化硅掩膜106以选择的方式透过穿过透镜的激光。光纤108具有芯线,借助使透过二氧化硅掩膜106的激光照射到光纤中,在芯线中形成长周期光栅。
当激光穿过透镜104照射到与二氧化硅掩膜106接触的光纤108时,光纤108的折射率就按规则的周期改变,并在光纤108上形成长周期光栅。这里,利用光源110把光传播到光纤108,并由检测器112检测,于是得到长周期光栅滤波器的光学特性。
在上述长周期光栅滤波器的制作设备中,二氧化硅掩膜106包括在二氧化硅基片上涂布铬并形成图样所得到的镀铬图样。激光选择性地透过这些铬图样。然而,所述铬图样的损伤阈值为100mJ/cm2,这就使它不可能有效利用高输出激基缔合物激光。另外,二氧化硅掩膜是通过在二氧化硅基片上形成铬图样而被制作的,因而就只有一个由最初设计的图样确定的周期。于是,需要具有不同周期的振幅掩膜,以得到具有不同周期的长周期光栅滤波器,从而使制作成本增加。
为解决上述问题,本发明的目的是提供一种振幅掩膜,它包括两个耦联的各自具有规则周期的掩膜,通过以相反的方向使两个掩膜转过预定的量,其周期就随之改变,还提供一种使用所述掩膜制作长周期光栅滤波器的设备和方法。
因此,为实现上述目的,提供一种振幅掩膜,用于在选择性地使激光透过到光纤上制作长周期光栅的情况下,使激光周期性地透过到光纤上,所述掩膜包括两个掩膜,它们具有周期性交替透过激光的透过面积和避免激光透过的非透过面积,其中所述二掩膜按相反方向连续转动,因而使透过面积的周期也连续改变。
为实现上述目的,提供一种长周期光栅滤波器的制作设备,包括:发射激光的激光源;振幅掩膜部件,通过彼此交叠两个各有预定周期的掩膜并使该二交叠掩膜转到预定的角度,以控制其周期,根据受到控制的周期选择性地使激光透过到形成长周期光栅的光纤上;旋转设备,用来以相反的方向使二掩膜旋转到预定的角度。
为实现上述目的,提供一种长周期光栅滤波器的制作设备,包括:激光光源;用于改变激光光源发出的激光的路径的反射镜;用于调节路径改变的激光的焦点的透镜;振幅掩膜部件,通过彼此交叠两个有预定周期的掩膜并使该二交叠掩膜转到预定的角度,以控制其周期,根据受到控制的周期选择性地使激光穿过透镜传播到形成长周期光栅的光纤上;检测器,用于检测光纤中所形成的长周期光栅滤波器的耦联峰;控制器,用于控制振幅掩膜的周期,以便利用从检测器接收的耦联峰处的波长获得所需的耦联峰波长。
为实现上述目的,提供一种制作长周期光栅的方法,包括如下步骤:交叠两个掩膜,其中每一个掩膜的透过区和非透过区都交替地被激光通过,并按相反方向旋转该二掩膜;经在两个旋转掩膜的预定周期下形成的透过区把激光照射到光纤上,在光纤上形成长周期光栅;使光通过其上形成长周期光栅的光纤,测定长周期光栅的耦联峰,并控制两个掩膜旋转的转角,在所需波长下获得所测定的耦联峰。
图1是说明传统的长周期光栅滤波器制作设备的示意框图;
图2表示形成本发明的掩膜的结构;
图3示出按不同方向旋转图2的两个掩膜到预定的角度,得到所需的周期;
图4表示根据图3的旋转角确定振幅掩膜周期;
图5示出按大于图3的角度旋转的两个掩膜;
图6是表示在使用周期Λ0为100μm的掩膜的情况下,振幅掩膜的周期随旋转角(α)变化的曲线;
图7以示意的方式表示根据本发明使用振幅掩膜部件的长周期光栅滤波器制作设备的框图。
图2表示形成本发明之掩膜的结构。图3表示按相反的方向使图2的两个掩膜转过预定角度,以获得所需周期的结果。图2的掩膜包括透过区202,按几百微米(Λ0=2d)的周期透过光,和约0.2mm厚的薄金属基片200,即不锈钢基片上的非透过区204。透过区202由二氧化碳激光光刻法或化学蚀刻法形成。金属基片200不受损伤阈值的限制,可使用高功率紫外激光器作为光源。激光通过透过区202,从而提高了光波导的折射率。非透过区204是金属部分,阻挡紫外激光。
在本发明中,振幅掩膜包括图2的两个掩膜,它们被交叠地安装在一个旋转夹具(未示出)上,然后各自精确地转动。图3表示两个掩膜转过α°。图中的参考标号302是光纤或光波导的方向,参考标号304和306代表各转过α°的第一基片和第二基片,参考标号308代表透过激光的区域,Λ代表本发明振幅掩膜的周期。
如图4所示,振幅掩膜周期Λ关于旋转角(α)被确定如下:
xcosα=a1=a2
xsin2α=d
2d=Λ0 其中Λ0是掩膜周期。
图5表示两个掩膜转过的角度β°比图3的转角(α°)大。图中的参考标号502是光纤或光波导的方向。可以看出,由于所述转角比图3中的大,所以振幅掩膜的周期变小。图6是表示当使用周期为100μm的掩膜时,振幅掩膜周期随转角(α)变化的曲线。参照图6,振幅掩膜的光栅周期可以从140μm,经10°转角下的600μm,到大于600μm连续受到控制(当α是0°,所述周期为无穷大)。
图7示出本发明使用振幅掩膜部件制作长周期光栅滤波器的设备的示意框图。参照图7,所述长周期光栅滤波器的制作设备包括激基缔合物的激光光源700,反射镜702,透镜704,振幅掩膜部件706,光纤708,光源710,检测器712和控制器714。反射镜702改变激基缔合物激光光源700发射之激光的路径。透镜704调节路径已被反射镜702改变之激光的焦点。振幅掩膜部件706选择地透过穿过透镜的激光,它由图2的两个掩膜组成,该二掩膜被交叠地安装在旋转夹具(未示出)上,然后各自精确地转动。光纤708具有芯线,借助透过振幅掩膜706的激光的照射在所述芯线中形成长周期光栅。检测器712检测通过其上已形成长周期光栅之光纤708的光学特性。控制器714根据检测器712测得的耦联峰控制振幅掩膜部件706的周期。
这里,耦联峰意思是,由于在长周期光栅中,每种波长的芯线模式都与的包层模式相联系,使得消光比率变为最大。
下面将描述用所述长周期光栅制作设备制作长周期光栅滤波器。首先,经反射镜702和透镜704将激基缔合物激光光源700产生的激光照射到与振幅掩膜部件706接触的光纤708上。使被透过振幅掩膜部件706照射的光纤部分的折射率改变,从而形成长周期光栅。与此同时,其中已形成长周期光栅的光纤708通过光源710所产生的光,检测器712检测通过光纤708的光的强度和波长。控制器714控制振幅掩膜的周期,以得到来自光纤708的所需耦联峰。
在本发明的振幅掩膜中,各具有规则周期的两个掩膜按相反的方向转动,致使其周期与转角有关。因此,可以连续改变振幅的周期。另外,制作长周期光栅时,用周期可调的振幅掩膜代替只有一个周期的二氧化硅掩膜,从而可以得到对周期灵敏的耦联峰的波长。
Claims (9)
1.一种振幅掩膜,在使激光以选择的方式传播到光纤中制作长周期光栅时,该振幅掩膜周期性地把激光传播到光纤上,所述掩膜包括:
具有周期交替的透过激光的透过区和防止透过激光的非透过区的两个掩膜,
其中这两个掩膜沿相反的方向以相同的角度连续转动,因而所述透过区的周期连续地改变。
2.按照权利要求1所述的振幅掩膜,其特征在于所述掩膜的基片由金属制成。
3.按照权利要求1所述的振幅掩膜,其特征在于所述振幅掩膜的周期由下式确定: 其中Λ0是掩膜周期,α是两个掩膜的转角。
4.一种长周期光栅滤波器的制作设备,包括:
发射激光的激光源;
振幅掩膜,通过彼此交叠两个有预定周期的掩膜,并使所述二交叠的掩膜按相反的方向转动相同的预定角度,以控制其周期,根据受到控制的周期以选择的方式把激光传播到其中要形成长周期光栅的光纤上;
转动装置,用来按相反的方向使所述二掩膜转动相同的预定角度。
5.按照权利要求4所述的长周期光栅滤波器制作设备,还包括:
第二光源;
检测器,当第二光源产生的光入射到其中已形成长周期光栅之光纤的另一端时,用于从其中已形成长周期光栅之光纤的一端检测长周期光栅滤波器的耦联峰;
控制器,通过接收来自所述检测器的耦联峰的波长,控制所述转动装置,获得所需的耦联峰波长。
6.按照权利要求4所述的长周期光栅滤波器制作设备,其特征在于所述掩膜的基片材料为金属。
7.按照权利要求5所述的长周期光栅滤波器制作设备,其特征在于所述振幅掩膜的周期(Λ)由下式决定: 其中Λ0是掩膜周期,α是两个掩膜的转角。
8.一种长周期光栅滤波器的制作设备,包括:
发射激光的激光源;
反射镜,用来改变激光光源发出的激光的路径;
透镜,用来调节路径被改变之激光的焦点;
振幅掩膜部分,通过彼此交叠两个具有预定周期的掩膜,并使所述二交叠的掩膜按相反的方向转动相同的预定角度,以控制其周期,根据受到控制的周期使激光以选择的方式通过所述透镜,传播到其中已形成长周期光栅的光纤;
检测器,用来检测光纤中形成的长周期光栅滤波器的耦联峰;
控制器,通过接收来自所述检测器的耦联峰的波长,用以控制所述振幅掩膜的周期,以得到所需的耦联峰波长。
9.一种制作长周期光栅的方法,包括如下步骤:
交叠两个掩膜,其中每一个掩膜的激光通过的透过区与非透过区交替,并按相反方向以相同的角度转动两个掩膜;
经在两个被转动的掩膜中按预定周期形成的透过区使激光照射到光纤,并在光纤上形成长周期光栅;
使光通过其上已形成长周期光栅的光纤,测量长周期光栅所引起的耦联峰,并控制两个掩膜转过的转角,以便在所需波长下实现被测量的耦联峰。
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CA2311586C (en) | 2003-04-08 |
KR100265794B1 (ko) | 2000-09-15 |
TW408232B (en) | 2000-10-11 |
JP3328648B2 (ja) | 2002-09-30 |
AU740410B2 (en) | 2001-11-01 |
AU1510299A (en) | 1999-06-28 |
US6204969B1 (en) | 2001-03-20 |
AR016975A1 (es) | 2001-08-01 |
AU740410C (en) | 2002-06-06 |
WO1999030189A1 (en) | 1999-06-17 |
JP2001526403A (ja) | 2001-12-18 |
KR19980086448A (ko) | 1998-12-05 |
CA2311586A1 (en) | 1999-06-17 |
EP1038196B1 (en) | 2005-08-03 |
BR9813405A (pt) | 2000-11-14 |
EP1038196A1 (en) | 2000-09-27 |
RU2193220C2 (ru) | 2002-11-20 |
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