CN111308209B - Contact impedance measuring method for liquid crystal display panel joint and liquid crystal display panel - Google Patents
Contact impedance measuring method for liquid crystal display panel joint and liquid crystal display panel Download PDFInfo
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- CN111308209B CN111308209B CN202010173448.9A CN202010173448A CN111308209B CN 111308209 B CN111308209 B CN 111308209B CN 202010173448 A CN202010173448 A CN 202010173448A CN 111308209 B CN111308209 B CN 111308209B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The embodiment of the application provides a contact impedance measurement method of a joint of a liquid crystal display panel and the liquid crystal display panel, wherein at least two terminal array points of a terminal array are sequentially connected in series by a conductive wire to form a series circuit, and the conductive wire forms a joint at the joint of each terminal array point; connecting any two joint points with two test array points in a test array by two first connecting wires in the four connecting wires respectively, and measuring a first impedance value between the two test array points; one ends of the other two second connecting wires in the four connecting wires are respectively connected with the other two test array points in the test array, the other ends of the other two second connecting wires are connected with each other, a second impedance value between the other two test array points is measured, and because the sum of the impedances of the two first connecting wires is equal to the sum of the impedances of the two second connecting wires, the contact impedance between any two joints in the series circuit can be accurately obtained through the difference between the first impedance value and the second impedance value.
Description
Technical Field
The embodiment of the application relates to the technical field of display, in particular to a contact impedance measuring method for a joint of a liquid crystal display panel and the liquid crystal display panel.
Background
In the manufacturing stage of the liquid crystal display panel, in order to monitor the characteristic value of the effective light emitting area of the liquid crystal display panel, some test keys are designed around the surface of the liquid crystal display panel, and the RC characteristics of the contact impedance between different conductors in the circuit of the liquid crystal display panel are monitored through the test keys.
Referring to fig. 1, fig. 1 is a schematic diagram illustrating a method for measuring contact resistance of a joint of a conventional liquid crystal display panel. At present, generally, a test key is disposed in a peripheral area of a surface of a liquid crystal display panel, then two connecting wires are provided, one end of each connecting wire is connected to two test keys, the other end of each connecting wire is connected to two different conductors in a circuit of the liquid crystal display panel, and a resistance between the two test keys is obtained by testing a voltage and a current between the two test keys, so as to obtain a contact impedance between the two different conductors.
However, the contact impedance measured by this test method at present actually includes not only the contact impedance between the two different conductors but also the impedance of the two connecting wires leading from the two different conductors to the two test keys, and therefore the actual contact impedance between the different conductors in the circuit of the liquid crystal display panel cannot be accurately measured.
Disclosure of Invention
In order to solve the problem that the contact impedance between different conductors in a circuit of a liquid crystal display panel cannot be accurately measured by the conventional test method, the embodiment of the application provides a contact impedance measurement method for a joint of the liquid crystal display panel, wherein the liquid crystal display panel comprises a terminal array and a test array, the terminal array comprises at least two terminal array points, and the test array comprises at least four test array points; the measuring method comprises the following steps:
providing electrically conductive wires connecting at least two of said terminal array points of said terminal array in series in sequence to form a series line, said electrically conductive wires forming a junction at a junction with each of said terminal array points;
providing four connecting wires, wherein one end of each connecting wire is respectively connected with four different test array points in the test array; the four connecting wires are respectively two first connecting wires and two second connecting wires, the other ends of the two first connecting wires are respectively connected with any two joints, and the other ends of the two second connecting wires are connected with each other; wherein the sum of the impedances of the two first connecting wires is equal to the sum of the impedances of the two second connecting wires;
acquiring a first impedance value between two test array points connected with two first connecting wires by using the test array; and acquiring a second impedance value between two test array points connected with two second connecting wires by using the test array;
calculating a difference between the first impedance value and the second impedance value, the difference being a contact impedance between any two of the junctions in the series line.
In some embodiments, the four connecting wires are all standard wires, and the sum of the lengths of the two first connecting wires is equal to the sum of the lengths of the two second connecting wires.
In some embodiments, the liquid crystal display panel further comprises a surface and a side surface disposed around the surface, the terminal array is disposed on the surface, and the test array is disposed on the surface or the side surface.
In some embodiments, the termination array points are metal terminals of the thin film transistors, TFTs, on the surface.
In some embodiments, the test array dots are printed Ag lines.
In some embodiments, the conductive line is disposed on the surface or the side.
In some embodiments, the conductive lines are printed Ag lines.
In some embodiments, the test array is disposed on the surface, and the measuring method further includes, after acquiring a contact impedance between any two of the junctions in the series line using the test array: and cutting off the area occupied by the test array on the liquid crystal display panel.
In addition, an embodiment of the present application further provides a liquid crystal display panel, including:
a terminal array including at least two terminal array points;
a test array comprising at least four test array points;
electrically conductive lines connecting at least two of said terminal array points of said terminal array in series in sequence to form a series line, said electrically conductive lines forming junctions at junctions with respective ones of said terminal array points;
one end of each connecting wire is connected with four different test array points in the test array respectively; the four connecting wires are respectively two first connecting wires and two second connecting wires, the other ends of the two first connecting wires are respectively connected with any two joints, and the other ends of the two second connecting wires are connected with each other; wherein the sum of the impedances of the two first connecting wires is equal to the sum of the impedances of the two second connecting wires.
The liquid crystal display panel comprises a terminal array, a test array, a conducting wire and four connecting conducting wires, wherein the terminal array comprises at least two terminal array points, and the test array comprises at least four test array points; the measuring method comprises the steps that at least two terminal array points of a terminal array are sequentially connected in series through a conductive wire to form a series circuit, and the conductive wire forms a joint point at the joint of each terminal array point; connecting any two joint points with two test array points in a test array by two first connecting wires in the four connecting wires respectively, and measuring a first impedance value between the two test array points; one ends of the other two second connecting wires in the four connecting wires are respectively connected with the other two test array points in the test array, the other ends of the other two second connecting wires are connected with each other, a second impedance value between the other two test array points is measured, and because the sum of the impedances of the two first connecting wires is equal to the sum of the impedances of the two second connecting wires, the contact impedance between any two joints in the series circuit can be accurately obtained through the difference between the first impedance value and the second impedance value.
Drawings
The technical solution and other advantages of the present application will become apparent from the detailed description of the embodiments of the present application with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a conventional method for measuring contact resistance of a joint of a liquid crystal display panel;
FIG. 2 is a schematic diagram of a method for measuring contact resistance of a liquid crystal display panel joint according to an embodiment of the present disclosure;
FIG. 3 is another schematic diagram of a method for measuring contact resistance of a liquid crystal display panel joint according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram of a method for measuring contact resistance of a liquid crystal display panel joint according to an embodiment of the present disclosure;
fig. 5 is a further schematic diagram of a method for measuring contact resistance of a liquid crystal display panel joint according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 2, fig. 2 is a schematic diagram of a contact impedance measuring method for joints of a liquid crystal display panel 4 according to an embodiment of the present disclosure, in which the liquid crystal display panel 4 includes a terminal array 1 and a test array 2, the terminal array 1 includes at least two terminal array points 101, and the test array 2 includes at least four test array points 201; the measuring method comprises the following steps:
providing a conductive line 3 to serially connect at least two terminal array points 101 of the terminal array 1 in sequence to form a serial line, the conductive line 3 forming a junction point at the junction with each terminal array point 101;
providing four connecting wires 11, 12, 13, 14, wherein one end of each connecting wire is respectively connected with four different test array points 201 in the test array 2, the connecting wires 11 and 14 are two first connecting wires, the connecting wires 12 and 13 are two second connecting wires, the other ends of the connecting wires 11 and 14 are respectively connected with any two joints, and the other ends of the connecting wires 12 and 13 are connected with each other; and the sum of the impedances of the connection wire 11 and the connection wire 14 is equal to the sum of the impedances of the connection wire 12 and the connection wire 13;
acquiring a first impedance value between two test array points 201 connected with a connecting lead 11 and a connecting lead 14 respectively by using a test array 2; and a second impedance value between the two test array points 201 connected to the connection wires 12 and 13 is acquired by the test array 2;
a difference between the first impedance value and the second impedance value is calculated, the difference being a contact impedance between any two junctions within the series line.
Specifically, a terminal array 1, which needs to be subjected to a contact resistance test, and a test array 2 for measuring contact resistance are determined on the liquid crystal display panel 4. At least two terminal array points 101 of the terminal array 1 are connected in series in sequence with conductive lines 3 to form a series line, each conductive line 3 forming a junction at the junction with its adjacent two terminal array points 101 for connection, i.e. conductive lines 3 forming a junction at the junction with the respective terminal array point 101. It will be appreciated that the respective junction points within the series line correspond to respective ones of the termination array points 101 in the termination array point 1, i.e. the respective junction points substantially coincide with the respective termination array points. The present embodiment requires a contact resistance to be measured, that is, a contact resistance referring to each junction formed by the conductive line 3 at the junction with each terminal array point 101.
Four connecting wires 11, 12, 13, 14 are provided and any two of the first connecting wires, i.e. connecting wire 11 and connecting wire 14, are used to connect any two of the bonding pads with two of the test array pads 201 in the test array 2, respectively, and two of the second connecting wires, i.e. connecting wire 12 and connecting wire 13, have one end connected with two of the other test array pads 201 in the test array 2, respectively, and have the other ends connected to each other.
The contact impedance between any two joints and the sum of the impedances of connecting lead 11 and connecting lead 14, i.e. the first impedance value, are measured at two test array points 201 where connecting lead 11 and connecting lead 14 are connected, and the sum of the impedances of connecting lead 12 and connecting lead 13, i.e. the second impedance value, is measured at two other test array points 201 where connecting lead 12 and connecting lead 13 are connected. Since the sum of the impedances of the connection wire 11 and the connection wire 14 is equal to the sum of the impedances of the connection wire 12 and the connection wire 13, the contact impedance between any two joints can be obtained by subtracting the first impedance value from the second impedance value, that is, the contact impedance between any two joints in the series circuit can be obtained by using the test array 2.
The embodiment of the application can accurately measure the contact impedance between any two joints in the series circuit, and avoids the inaccuracy caused by the fact that the contact impedance measured by the connecting wires with different lengths comprises the impedance of the connecting wires, so that the contact impedances measured by the connecting wires with different lengths can be compared with each other.
It should be noted that the distribution positions of the terminal array points 101 of the terminal array 1 and the test array points 201 of the test array 2 on the liquid crystal display panel 4 may be arbitrary, but it should be understood that, for convenience of testing, the terminal array points 101 of the terminal array 1 are generally arranged in sequence, and the test array points 201 in the test array 2 are also generally arranged in sequence.
In some embodiments, referring to fig. 3, fig. 3 is another schematic diagram of a method for measuring contact impedance of joints of a liquid crystal display panel 4 according to an embodiment of the present disclosure, for example, a terminal array point 101 of a terminal array 1 includes six terminal array points A, B, C, D, E, F sequentially arranged, the terminal array points A, B, C, D, E, F are sequentially connected in series by conductive wires 3 to form a series circuit, and the conductive wires 3 form a joint on the terminal array points A, B, C, D, E, F, respectively. Wherein, conductive line 3 includes five sections of wire 21, wire 22, wire 23, wire 24 and wire 25, wire 21 joins terminal array point a and terminal array point B, wire 22 joins terminal array point B and terminal array point C, wire 23 joins terminal array point C and terminal array point D, wire 24 joins terminal array point D and terminal array point E, and wire 25 joins terminal array point E and terminal array point F. In addition, test array spot 201 of test array 2 includes four test array spots G, H, I, J arranged in series.
The terminal array point (junction point) a and the test array point G are connected with the connection wire 11, the terminal array point (junction point) F and the test array point J are connected with the connection wire 14, one end of the connection wire 12 and the test array point H are connected, one end of the connection wire 13 and the test array point I are connected, and the other end of the connection wire 12 and the other end of the connection wire 13 are connected to each other. The sum of the impedances of the connection wire 11 and the connection wire 14 is equal to the sum of the impedances of the connection wire 12 and the connection wire 13.
Testing between the test array point G and the test array point J by using a voltmeter and an ammeter to obtain the voltage and the current between the test array point G and the test array point J; and testing between the test array point H and the test array point I by using a voltmeter and an ammeter, and measuring the voltage and the current between the test array point H and the test array point I. A first impedance value between the test array point G and the test array point J, which is the sum of the contact impedance between the termination array point 101 (junction point) a and the termination array point (junction point) F and the impedance of the connection wire 11 and the connection wire 14, is obtained from the voltage and the current between the test array point G and the test array point J. And obtaining a second impedance value between the test array point H and the test array point I according to the voltage and the current between the test array point H and the test array point I, wherein the second impedance value is the sum of the impedances of the connecting lead 12 and the connecting lead 13. Since the sum of the impedances of connection wire 11 and connection wire 14 is equal to the sum of the impedances of connection wire 12 and connection wire 13, the contact impedance between termination array point (junction point) a and termination array point (junction point) F in the series circuit can be obtained by subtracting the second impedance value from the first impedance value.
In some embodiments, the four connecting wires 11, 12, 13, 14 are standard wires, and the sum of the lengths of two connecting wires respectively connected to any two junctions is equal to the sum of the lengths of the other two connecting wires. That is, in fig. 3, if the four connection wires 11, 12, 13, 14 are all made of standard wires, the resistivity and the sectional area of the four connection wires 11, 12, 13, 14 are all the same, and the sum of the impedances of the connection wire 11 and the connection wire 14 is equal to the sum of the impedances of the connection wire 12 and the connection wire 13 according to the impedance value of the conductive wire 3 related to the resistivity and the sectional area, the sum of the lengths of the connection wire 11 and the connection wire 14 is equal to the sum of the lengths of the connection wire 12 and the connection wire 13.
In order to take the effective utilization rate of the glass substrate of the liquid crystal display panel into consideration, the smaller the area occupied by the test key on the glass substrate, the better. At present, with the development of glass printed circuit technology, the area occupied by the test key on the liquid crystal display panel is smaller and smaller, but if the test key is still arranged on the front surface of the glass substrate of the liquid crystal display panel, the test key cannot be widely applied to the liquid crystal display panel with a narrow frame or even without a frame.
Therefore, in some embodiments, the liquid crystal display panel 4 further includes a surface and a side surface disposed around the surface, the terminal array 1 is disposed on the surface of the liquid crystal display panel 4, and the test array 2 is disposed on the surface or the side surface of the liquid crystal display panel 4.
Specifically, according to the frame size requirement of the liquid crystal display panel 4, the test array 2 is disposed on the surface or the side surface of the liquid crystal display panel 4 with a larger frame size, and the test array 2 is disposed on the side surface of the liquid crystal display panel 4 with a smaller frame size, so as to meet the requirement of the liquid crystal display panel 4 with different frame sizes, that is, the embodiment of the present application is applicable to the measurement of the contact impedance between different conductors in the circuit of the liquid crystal display panel 4 with a narrow frame or without a frame.
In some embodiments, the termination array point 101 is a metal terminal on the surface of the TFT, the metal terminals on the surface of the liquid crystal display panel 4 of the TFT are connected in series by conductive lines 3, each conductive line 3 forms a joint with two adjacent metal terminals of the TFT, and the contact impedance of all joints between any two metal terminals of the TFT is measured by a contact impedance measuring method of the joints of the liquid crystal display panel 4. The metal terminals on the surface of the thin film transistor TFT are sequentially arranged in the same row or the same column of the thin film transistor TFT array at equal distances.
In some embodiments, if the test array dot 201 is a printed Ag line, the printed Ag line may be printed on the side of the glass substrate, so if the test array dot 201 is a printed Ag line, the test array dot 201 may be disposed on the front or side of the liquid crystal display panel 4. Referring to fig. 4, fig. 4 is a further schematic diagram of a method for measuring contact impedance of joints of a liquid crystal display panel 4 according to an embodiment of the present invention, in which if the test array dots 201 are printed with Ag lines and disposed on the side of the liquid crystal display panel 4, the distance between the test array dots 201 can be ensured to be close enough for performing a needle insertion test on the side of the liquid crystal display panel 4.
Specifically, fig. 5 is a further schematic diagram of the method for measuring contact impedance of the liquid crystal display panel junction according to the embodiment of the present application, and with reference to fig. 2 and 5, four test array points G, H, I, J are all printed with Ag lines and disposed on the side surface of the liquid crystal display panel 4, so that the distance between the four test array points G, H, I, J is ensured to be close enough, and the four test array points G, H, I, J are convenient for performing a pricking test on the side surface of the liquid crystal display panel 4.
In some embodiments, the conductive lines 3 for connecting the terminal array dots 101 are disposed on the surface or the side. As the printed array dots, printed Ag lines may be used, and the conductive lines 3 may also be printed Ag lines. If the conductive lines 3 are printed Ag lines, the conductive lines 3 may be provided on the front surface or the side surface of the liquid crystal display panel 4. In fig. 1 to 5, the conductive lines 3 are provided on the side surface of the liquid crystal display panel 4 by using printed Ag lines.
In some embodiments, the test array 2 is disposed on the surface, and the measuring method further includes, after acquiring the contact impedance between any two junctions in the series circuit by using the test array 2: the area 5 occupied by the test array 2 on the liquid crystal display panel 4 is cut out.
Specifically, referring to fig. 2 and 4, if the test array 2 is disposed on the surface of the liquid crystal display panel 4, after the contact resistance of the joint between any two joints in the terminal array 1 is obtained by using the test array 2, the area 5 occupied by the test array 2 on the liquid crystal display panel 4 may be cut off, so as to reduce the frame of the liquid crystal display panel 4.
It will be appreciated that, with reference to fig. 2 and 5, if the test array dots 201 are printed Ag lines and arranged on the side of the liquid crystal display panel 4, this step is not required, i.e. the area 5 occupied by the test array 2 on the liquid crystal display panel 4 does not need to be cut off after measuring the contact resistance between any two junctions in the series connection, since the test array dots 201 themselves do not occupy the area on the front of the liquid crystal display panel 4.
In addition, the embodiment of the present application further provides a liquid crystal display panel 4, where the liquid crystal display panel 4 includes:
a terminal array 1 including at least two terminal array points 101;
a test array 2 comprising at least four test array points 201;
a conductive line connecting at least two terminal array points 101 of the terminal array in series in sequence to form a series line, the conductive line forming a junction at a junction with each terminal array point 101;
four connecting wires 11, 12, 13, 14, one end of each connecting wire is respectively connected with four different test array points in the test array; wherein, the connecting wire 11 and the connecting wire 14 are two first connecting wires, the connecting wire 12 and the connecting wire 13 are two second connecting wires, the other ends of the connecting wire 11 and the connecting wire 14 are respectively connected with any two joints, and the other ends of the connecting wire 12 and the connecting wire 13 are connected with each other; and, the sum of the impedances of the connection wire 11 and the connection wire 14 is equal to the sum of the impedances of the connection wire 12 and the connection wire 13.
Specifically, at least two terminal array points 101 of the terminal array 1 are connected in series in sequence via the conductive lines 3 to form a series line, each conductive line 3 forms a junction at a junction with two adjacent terminal array points 101 for connection, that is, the conductive line 3 forms a junction at a junction with each terminal array point 101, and the embodiment of the present application requires a measured contact impedance, that is, the contact impedance refers to the contact impedance of each junction formed by the conductive line 3 at a junction with each terminal array point 101.
Any two bonding wires are connected to two test array points 201 in the test array 2 by two first connection wires, i.e. connection wire 11 and connection wire 14, of the four connection wires 11, 12, 13, 14, respectively, and one ends of two other second connection wires, i.e. connection wire 12 and connection wire 13, are connected to two other test array points 201 in the test array 2, respectively, and the other ends are connected to each other.
The contact impedance between any two joints and the sum of the impedances of connecting lead 11 and connecting lead 14, i.e. the first impedance value, are measured at two test array points 201 where connecting lead 11 and connecting lead 14 are connected, and the sum of the impedances of connecting lead 12 and connecting lead 13, i.e. the second impedance value, is measured at two other test array points 201 where connecting lead 12 and connecting lead 13 are connected. Since the sum of the impedances of the connection wire 11 and the connection wire 14 is equal to the sum of the impedances of the connection wire 12 and the connection wire 13, the contact impedance between any two joints can be obtained by subtracting the first impedance value from the second impedance value, that is, the contact impedance between any two joints in the series circuit can be obtained by using the test array 2.
The embodiment of the application can accurately measure the contact impedance between any two joints in the series circuit, and avoids the inaccuracy caused by the fact that the contact impedance measured by the connecting wires with different lengths comprises the impedance of the connecting wires, so that the contact impedances measured by the connecting wires with different lengths can be compared with each other.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
The above description of the embodiments is only for assisting understanding of the technical solutions and the core ideas thereof; those of ordinary skill in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications or substitutions do not depart from the spirit and scope of the present disclosure as defined by the appended claims.
Claims (8)
1. The method for measuring the contact impedance of the joint of the liquid crystal display panel is characterized in that the liquid crystal display panel comprises a terminal array and a test array, wherein the terminal array comprises at least two terminal array points, and the test array comprises at least four test array points;
the measuring method comprises the following steps:
providing electrically conductive wires connecting at least two of said terminal array points of said terminal array in series in sequence to form a series line, said electrically conductive wires forming a junction at a junction with each of said terminal array points;
providing four connecting wires, wherein one end of each connecting wire is respectively connected with four different test array points in the test array; the four connecting wires are respectively two first connecting wires and two second connecting wires, the other ends of the two first connecting wires are respectively connected with any two joints, and the other ends of the two second connecting wires are connected with each other; the sum of the impedances of the two first connecting wires is equal to the sum of the impedances of the two second connecting wires, the four connecting wires are standard wires, and the sum of the lengths of the two first connecting wires is equal to the sum of the lengths of the two second connecting wires;
acquiring a first impedance value between two test array points connected with two first connecting wires by using the test array; and acquiring a second impedance value between two test array points connected with two second connecting wires by using the test array;
calculating a difference between the first impedance value and the second impedance value, the difference being a contact impedance between any two of the junctions in the series line.
2. The method of measuring the contact resistance of a liquid crystal display panel of claim 1, wherein the liquid crystal display panel further comprises a surface and a side surface disposed around the surface, the terminal array is disposed on the surface, and the test array is disposed on the surface or the side surface.
3. The method for measuring the contact resistance of a liquid crystal display panel junction according to claim 2, wherein the termination array point is a metal terminal of a thin film transistor on the surface.
4. The method for measuring the contact resistance of the joints of the liquid crystal display panel according to claim 2, wherein the test array dots are printed Ag lines.
5. The method for measuring the contact resistance of a liquid crystal display panel junction according to claim 2, wherein the conductive line is provided on the surface or the side surface.
6. The method for measuring the contact resistance of a liquid crystal display panel junction according to claim 5, wherein the conductive line is a printed Ag line.
7. The method of measuring the contact resistance of a junction of a liquid crystal display panel according to claim 2, wherein the test array is disposed on the surface, and after the contact resistance between any two of the junctions in the series line is obtained by the test array, the method further comprises:
and cutting off the area occupied by the test array on the liquid crystal display panel.
8. A liquid crystal display panel, comprising:
a terminal array including at least two terminal array points;
a test array comprising at least four test array points;
electrically conductive lines connecting at least two of said terminal array points of said terminal array in series in sequence to form a series line, said electrically conductive lines forming junctions at junctions with respective ones of said terminal array points;
one end of each connecting wire is connected with four different test array points in the test array respectively; the four connecting wires are respectively two first connecting wires and two second connecting wires, the other ends of the two first connecting wires are respectively connected with any two joints, and the other ends of the two second connecting wires are connected with each other; the sum of the impedances of the two first connecting wires is equal to the sum of the impedances of the two second connecting wires, the four connecting wires are standard wires, and the sum of the lengths of the two first connecting wires is equal to the sum of the lengths of the two second connecting wires.
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