CN112086047A - Low-power liquid crystal screen Gamma high-impedance measurement method - Google Patents
Low-power liquid crystal screen Gamma high-impedance measurement method Download PDFInfo
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- CN112086047A CN112086047A CN202010831959.5A CN202010831959A CN112086047A CN 112086047 A CN112086047 A CN 112086047A CN 202010831959 A CN202010831959 A CN 202010831959A CN 112086047 A CN112086047 A CN 112086047A
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 36
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000002847 impedance measurement Methods 0.000 title claims abstract description 22
- 238000012360 testing method Methods 0.000 claims abstract description 33
- 238000009413 insulation Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 5
- 238000013461 design Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 238000003199 nucleic acid amplification method Methods 0.000 description 1
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
The invention discloses a low-power liquid crystal screen Gamma high-impedance measurement method, which relates to the field of high-impedance measurement.A low-power liquid crystal screen comprises a terminal and a test end, wherein the terminal comprises at least two terminal array points, and the test end comprises at least four test array points; the measuring method comprises the following steps: providing a plurality of first wires, sequentially connecting at least two terminal array points of the terminals in series to form a series circuit, wherein the wires form combination points at the combination positions with the terminals; providing a self-control circuit, wherein the self-control circuit comprises: gamma PAD, operational amplifier, LM324, ox horn and NI collecting card; providing a conductive plate, and electrically connecting the test end with the PAD through the conductive plate; providing a plurality of second wires, and electrically connecting the Gamma PAD and the LM324 through the second wires; the NI acquisition card acquires an impedance value. According to the invention, the operational amplifier is added between the connection of the horn and the Gamma PAD, so that the high impedance is converted into the low impedance for acquisition and test, the accuracy is increased, and the measured data is not lower than Spec.
Description
Technical Field
The invention relates to the technical field of high-impedance measurement, in particular to a low-power liquid crystal screen Gamma high-impedance measurement method.
Background
The liquid crystal screen is a basic component made of liquid crystal material, and the liquid crystal screen has not only solid crystal optical characteristics but also liquid flow characteristics due to the fact that liquid crystal is between solid and liquid states, and the characteristics can generate higher impedance, so that the liquid crystal screen is more and more interested in high impedance measurement of researchers.
The existing testing Gamma is tested by connecting ox horn with NI, because the electric products are more and more energy-saving, the part of the liquid crystal panel has low power consumption, the required current of the liquid crystal is low, the resistance value of the GMA resistor part of the circuit design is increased, the original resistance value is from hundreds of ohms to the current kiloohm level, the internal resistance is 1M ohm when NI is collected, when the VGMA resistor reaches above kiloohm when the measurement is carried out, NI can consume a part of power, the measured data is lower than Spec, the measurement is inaccurate, and certain limitation exists.
Disclosure of Invention
The invention aims to provide a low-power liquid crystal screen Gamma high-impedance measurement method, the existing Gamma test is tested by a ox horn connection NI, because electric products are more and more energy-saving, the part of a liquid crystal panel is also low in power consumption and requires low liquid crystal demand current, the resistance value of a GMA resistor part in circuit design is increased, the internal resistance is 1M ohm when NI is collected from the original hundreds ohm to the current kiloohm level, and NI consumes a part of power when VGMA resistor reaches over kiloohm during measurement, so that the measured data is lower than Spec, thereby causing the inaccurate measurement and having certain limitation.
In order to solve the technical problems, the invention is realized by the following technical scheme:
the invention relates to a low-power liquid crystal screen Gamma high impedance measurement method, wherein the low-power liquid crystal screen comprises a terminal and a test end, the terminal comprises at least two terminal array points, and the test end comprises at least four test array points;
the measuring method comprises the following steps:
providing a plurality of first wires, sequentially connecting at least two terminal array points of the terminals in series to form a series circuit, wherein the wires form a combination point at the combination part of the wires and each terminal;
providing a homemade circuit, comprising: gamma PAD, operational amplifier, LM324, ox horn and NI collecting card;
providing a conductive plate, electrically connecting the test terminal and the PAD through the conductive plate:
providing a plurality of second wires, and electrically connecting the Gamma PAD and the LM324 through the second wires;
providing a plurality of third conducting wires, electrically connecting the LM324 with the horn through the third conducting wires, wherein the horn comprises a horn wire, and connecting the LM324 with the NI acquisition card through the horn wire;
and the NI acquisition card acquires an impedance value.
Preferably, the first conducting wire and the second conducting wire are both standard conducting wires, and the sum of the lengths of the two first conducting wires is equal to the sum of the lengths of the two first conducting wires.
Preferably, the Gamma PAD tested by the board to be tested is PCB GMA.
Preferably, the operational amplifier is a high impedance input, a low impedance output.
Preferably, the LM324 passes through the Layout PCB and then is fixed on a surface of the jig, one of the LMs 324 can support one Gamma point, and the Layout of the Layout supports at most a plurality of channels.
Preferably, the horn has an insulation resistance of 10M Ω, a maximum speed of mechanical operation of 10mm/s, and 30s at intervals without interposing.
Preferably, the ox horn wire is a strip-shaped standard wire, and the conductivity of the ox horn wire is more than 99%.
Preferably, the NI acquisition card acquires data by using a differential test system.
Compared with the prior art, the invention has the following beneficial effects:
in the invention, the operational amplifier is added between the connection of the horn and the Gamma PAD to convert high impedance into low impedance for acquisition and test, thereby increasing the accuracy and ensuring that the measured data is not lower than Spec.
Drawings
FIG. 1 is a schematic view of the overall structure of a low-power liquid crystal display Gamma high impedance measurement device according to the present invention;
fig. 2 is a schematic view of an orthographic structure of the low-power liquid crystal display Gamma high-impedance measuring device of the invention.
In the figure: 100. a low-power liquid crystal screen; 110. a terminal; 111. a terminal array point; 120. a test end; 121. testing the array points; 200. a self-made circuit; 210. gamma PAD; 220. an operational amplifier; 230. LM 324; 240. a horn; 241. ox horn wire; 250. an NI acquisition card; 300. a wire; 400. a conductive plate; 500. a second conductive line; 600. and a third conductive line.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the invention easy to understand, the invention is further described with the specific embodiments.
In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "connected," and the like are to be construed broadly, such as "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The first embodiment is as follows:
referring to fig. 1-2, the present invention is a low power liquid crystal display Gamma high impedance measurement method, the low power liquid crystal display 100 includes a terminal 110 and a test end 120, the terminal 110 includes at least two terminal array points 111, and the test end 120 includes at least four test array points 121;
the measuring method comprises the following steps:
providing a plurality of first conductive lines 300, sequentially connecting at least two terminal array points 111 of the terminals 110 in series to form a series circuit, the conductive lines 300 forming a junction point at a junction with each terminal 110;
providing a home-made circuit 200, wherein the home-made circuit 200 comprises: gamma PAD210, operational amplifier 220, LM324230, ox horn 240 and NI acquisition card 250;
providing a conductive plate 400, electrically connecting the testing terminal 120 and the PAD210 through the conductive plate 400:
providing a plurality of second wires 500, and electrically connecting the Gamma PAD210 and the LM324230 through the second wires 500;
providing a plurality of third conducting wires 600, electrically connecting the LM324230 with the horn 240 through the third conducting wires 600, wherein the horn 240 comprises a horn wire 241, and connecting the LM324230 with the NI acquisition card 250 through the horn wire 241;
the NI acquisition card 250 acquires the impedance value.
Further, the first conductive line 300 and the second conductive line 500 are both standard conductive lines, and the sum of the lengths of the two first conductive lines 300 is equal to the sum of the lengths of the two first conductive lines.
Further, the Gamma PAD210 for the board under test is the PCB GMA.
Further, the operational amplifier 220 is a high impedance input and a low impedance output.
Further, LM324230 is fixed on one surface of the jig through a Layout PCB, one LM324 can support 4 Gamma points, and the Layout of Layout supports 16 channels at most.
Further, the horn 240 has an insulation resistance of 10M Ω, a maximum speed of mechanical operation of 10mm/s, and 30s at intervals of time without interposing.
Further, the ox horn wire 241 is a standard strip wire, and the conductivity is 99% or more.
Further, the NI acquisition card 250 acquires data using a differential test system.
Example two:
the invention relates to a high-impedance measuring method of low-power liquid crystal screen Gamma, the high-impedance Gamma adds LM324 follower to carry out voltage amplification comparison, the output voltage of the voltage isolator is approximate to the input voltage amplitude, and presents a high-impedance state to the front stage circuit, and presents a low-impedance state to the rear stage circuit, thereby playing an isolating role to the front and rear stage circuits, the voltage follower is often used as the middle stage to isolate the influence between the front and rear stages, which is called as the buffer stage at this time, and the basic principle utilizes the characteristics of high input impedance and low output impedance. The input resistor Ri is approximately equal to infinity, the output resistor Ro is approximately equal to 0, and the output voltage Uo is approximately equal to the input voltage Ui.
Example three:
aiming at the low-power liquid crystal screen Gamma high impedance measurement method, the invention relates to a low-power liquid crystal screen Gamma high impedance measurement method, a low-power liquid crystal screen 100 comprises a terminal 110 and a test end 120, the terminal 110 comprises at least two terminal array points 111, and the test end 120 comprises at least four test array points 121; the measuring method comprises the following steps: providing a plurality of first conductive lines 300, sequentially connecting at least two terminal array points 111 of the terminals 110 in series to form a series circuit, the conductive lines 300 forming a junction point at a junction with each terminal 110; providing a home-made circuit 200, wherein the home-made circuit 200 comprises: gamma PAD210, operational amplifier 220, LM324230, ox horn 240 and NI acquisition card 250; providing a conductive plate 400, electrically connecting the testing terminal 120 and the PAD210 through the conductive plate 400: providing a plurality of second wires 500, and electrically connecting the Gamma PAD210 and the LM324230 through the second wires 500; LM324230 passes through a Layout PCB and then is fixed on one surface of the jig, one LM324230 can support 4 Gamma points, a plate of the Layout can support 16 channels at most, when the GRR is less than 10 percent, the system is acceptable, the GRR is between 10 percent and 30 percent, and the analysis and the maximum contributor are made according to the application importance and the improved cost; if the GRR exceeds 30%, the measurement system is unacceptable and corrective action is mandatory. The remaining test items were normal, as indicated by the 4 points of data selected in the GRR table below, as shown in the following table:
table one 4 point data selected for 4 groups of GRRs:
as can be seen from Table 1, the VGMA voltage tested after the LM324 was introduced in the present invention is consistent with the RD test SPEC, and the GRR is less than 10%.
Example four:
aiming at the low-power liquid crystal screen Gamma high impedance measurement method, the first conducting wire 300 and the second conducting wire 500 are both standard conducting wires, the sum of the lengths of the two first conducting wires 300 is equal to the sum of the lengths of the two conducting wires, the Gamma PAD210 to be tested by a board to be tested is PCB GMA, the operational amplifier 220 is high impedance input and low impedance output, the insulation resistance of the ox horn 240 is 10M omega, the maximum speed of mechanical operation is 10mm/s, 30s when interval time is not inserted, the ox horn 241 is a strip standard wire, the conductivity is more than 99 percent, and the NI acquisition card 250 utilizes a differential test system to acquire data.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (8)
1. A low-power liquid crystal screen Gamma high impedance measurement method is characterized in that: the low-power liquid crystal display (100) comprises a terminal (110) and a test terminal (120), wherein the terminal (110) comprises at least two terminal array points (111), and the test terminal (120) comprises at least four test array points (121);
the measuring method comprises the following steps:
providing a plurality of first wires (300) connecting at least two terminal array points (111) of the terminals (110) in series in sequence to form a series circuit, the wires (300) forming a junction at the junction with each of the terminals (110);
providing a homemade circuit (200), the homemade circuit (200) comprising: gamma PAD (210), an operational amplifier (220), LM324(230), ox horn (240) and NI acquisition card (250);
providing a conductive plate (400), and electrically connecting the test terminal (120) and the PAD (210) through the conductive plate (400):
providing a plurality of second conductive lines (500), and electrically connecting the Gamma PAD (210) and the LM324(230) through the second conductive lines (500);
providing a plurality of third conducting wires (600), electrically connecting the LM324(230) with the horn (240) through the third conducting wires (600), wherein the horn (240) comprises a horn wire (241), and connecting the LM324(230) with the NI acquisition card (250) through the horn wire (241);
the NI acquisition card (250) acquires an impedance value.
2. The low-power liquid crystal screen Gamma high impedance measurement method according to claim 1, characterized in that: the first conducting wire (300) and the second conducting wire (500) are both standard conducting wires, and the sum of the lengths of the two first conducting wires (300) is equal to the sum of the lengths of the two conducting wires.
3. The low-power liquid crystal screen Gamma high impedance measurement method according to claim 1, characterized in that: the Gamma PAD (210) of the board to be tested is PCB GMA.
4. The low-power liquid crystal screen Gamma high impedance measurement method according to claim 1, characterized in that: the operational amplifier (220) is a high impedance input, low impedance output.
5. The low-power liquid crystal screen Gamma high impedance measurement method according to claim 1, characterized in that: the LM324(230) passes through the Layout PCB and is then fixed on one surface of the jig, one LM324 can support 4 Gamma points, and the Layout of the Layout supports 16 channels at most.
6. The low-power liquid crystal display Gamma high impedance measurement method according to claim 5, characterized in that: the insulation resistance of the horn (240) is 10M omega, the maximum speed of mechanical operation is 10mm/s, and the interval time is 30s when not inserted.
7. The low-power liquid crystal display Gamma high impedance measurement method according to claim 5, characterized in that: the ox horn wire (241) is a strip-shaped standard wire, and the electric conductivity is more than 99%.
8. The low-power liquid crystal display Gamma high impedance measurement method according to claim 5, characterized in that: the NI acquisition card (250) acquires data by using a differential test system.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010831959.5A CN112086047A (en) | 2020-08-18 | 2020-08-18 | Low-power liquid crystal screen Gamma high-impedance measurement method |
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| CN202010831959.5A CN112086047A (en) | 2020-08-18 | 2020-08-18 | Low-power liquid crystal screen Gamma high-impedance measurement method |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3633121A (en) * | 1969-09-05 | 1972-01-04 | Motorola Inc | Gamma control circuit |
| KR20050104757A (en) * | 2004-04-29 | 2005-11-03 | 엘지.필립스 엘시디 주식회사 | Gamma reference voltage generator and the driving ic and the driving method thereof |
| TW200614137A (en) * | 2004-10-29 | 2006-05-01 | Himax Tech Inc | Measuring system for measuring gamma resistance of a driver IC of a display device and method thereof |
| JP2007241235A (en) * | 2006-08-30 | 2007-09-20 | Renesas Technology Corp | Display drive unit |
| CN101793933A (en) * | 2010-03-26 | 2010-08-04 | 浙江大学 | Online measuring system for contact resistors of electric connector |
| CN109633274A (en) * | 2018-12-10 | 2019-04-16 | 武汉精立电子技术有限公司 | Gamma debugging system and method based on OLED screen impedance detection technology |
| CN111308209A (en) * | 2020-03-13 | 2020-06-19 | 深圳市华星光电半导体显示技术有限公司 | Contact impedance measuring method for liquid crystal display panel joint and liquid crystal display panel |
-
2020
- 2020-08-18 CN CN202010831959.5A patent/CN112086047A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3633121A (en) * | 1969-09-05 | 1972-01-04 | Motorola Inc | Gamma control circuit |
| KR20050104757A (en) * | 2004-04-29 | 2005-11-03 | 엘지.필립스 엘시디 주식회사 | Gamma reference voltage generator and the driving ic and the driving method thereof |
| TW200614137A (en) * | 2004-10-29 | 2006-05-01 | Himax Tech Inc | Measuring system for measuring gamma resistance of a driver IC of a display device and method thereof |
| JP2007241235A (en) * | 2006-08-30 | 2007-09-20 | Renesas Technology Corp | Display drive unit |
| CN101793933A (en) * | 2010-03-26 | 2010-08-04 | 浙江大学 | Online measuring system for contact resistors of electric connector |
| CN109633274A (en) * | 2018-12-10 | 2019-04-16 | 武汉精立电子技术有限公司 | Gamma debugging system and method based on OLED screen impedance detection technology |
| CN111308209A (en) * | 2020-03-13 | 2020-06-19 | 深圳市华星光电半导体显示技术有限公司 | Contact impedance measuring method for liquid crystal display panel joint and liquid crystal display panel |
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