CN207611103U - A kind of active information component test device and test fixture - Google Patents
A kind of active information component test device and test fixture Download PDFInfo
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- CN207611103U CN207611103U CN201721857253.6U CN201721857253U CN207611103U CN 207611103 U CN207611103 U CN 207611103U CN 201721857253 U CN201721857253 U CN 201721857253U CN 207611103 U CN207611103 U CN 207611103U
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Abstract
The utility model provides a kind of active information component test device and test fixture, and test device includes n test input interface, is connected one to one to n input terminal of the roads m switching switch；The n test input interface corresponds n pull down resistor R and is connected to negative supply, and connection forms n A node between n test input interface and the n pull down resistor R；N input terminal of the roads the m switching switch corresponds n pull-up resistor r and is connected to positive supply, and connection forms n B node between the n input terminal and n pull-up resistor r；Series resistance Z, total n series resistance Z are in series between A nodes and B node correspondingly.It is easy to implement the whether lossy test of MUT module under test, and is ensured in signal acquisition and test process, new damage will not be brought to MUT module under test.
Description
Technical field
The utility model is related to a kind of active information component test device and test fixtures, are related to module testing field.
Background technology
Active signal components：Grafting or welding are installed on other circuit boards, are referred to and are needed externally fed and can lead to outside
The circuit unit of news, such as WIFI components, GPS component, bluetooth module, tuner pack, common trait are that power supply is needed to supply
It answers, input signal can be handled and be exported, carrying out shake communication can be carried out with peripheral control unit, execute the corresponding command.
In the production process of active signal components, need by：4 process procedures such as patch, assembly, test, packaging,
Middle test session is critical process link, needs whether the performance quality of checking assembly meets specification requirement.
Performance test process needs to power on component in test, so that component is entered working condition, at which in normal work
Make to carry out related performance indicators test to it under state, including receiving sensitivity, anti-interference, communications protocol, power supply power consumption etc..
For more than a large amount of pin numbers and intensive component, such as WIFI, GPS component, performance test, which finishes, enters packet
Fill process.The not high component of less and pin density for part pin, such as tuner pack, in above-mentioned testing performance index
After the completion, it needs again to test it using digital multimeter, specific test method is：
1）Red test pencil is inserted into multimeter voltage/resistance port, black meter pen is inserted into the publicly port of multimeter；
2）Multimeter is switched to 1k resistance measurement shelves, presses multimeter power key, makes it into working condition；
3）MUT module under test is steadily contacted such as tuner in the black meter pen of multimeter, such as metallic shield, by general-purpose
Table red test pencil, which contacts MUT module under test, needs pin to be tested, such as power supply, communication pin；
4）The measured value that multimeter is shown is read, judges whether it meets Eligibility requirements；
5）Certified products enter subsequent processing, and defective work takes out and is isolated.
6）It must assure that electrostatic protection is good during the test
Why after the completion of performance test, needs to reuse digital multimeter and component is tested, the reason for this is that：
1）When being tested for the property to component, needs to carry out normal power-up, initialization to MUT module under test, be completed in test
It needs to power off component, due to measurement jig ground connection, power source performance, powered on and off process are lack of standardization etc., there is certain ratio
Regular meeting causes the device being connected with package pin port inside MUT module under test to be damaged, and these damage may be explicit damage or
Implicit damage.
Explicit damage may directly result in MUT module under test reduced performance or damage, have certain proportion by follow-up performance test
Station is found, for implicit damage, has no effect on MUT module under test performance in a short time, it is difficult to be found before component manufacture.
2）Before MUT module under test enters test step, the processes such as patch, assembly are had already passed through, due to operating error, are had
Certain probability causes component to damage, for implicit damage since it does not show in a short time, so being difficult to be surveyed by subsequent performance
Trial work sequence is found.
3）Component is tested using digital multimeter, during the test, the supply pin of component is not added
Electricity, component do not enter working condition, new damage will not be theoretically caused to component.
4）Using digital multimeter resistance grade measuring to ground resistance to component external pin, to check the pin
Whether earth impedance meets normal product requirement, to which detection is by the MUT module under test of implicit damage.
However, being tested for the property to component using general digital table, there are the following problems：
1）Test accuracy consistency is poor
Digital multimeter uses battery powered, and cell voltage can change during use, and the battery electricity changed
Pressure directly affects the accuracy of measurement result；
2）Testing efficiency is low
It is measured, a pin of MUT module under test can only be measured every time, testing efficiency using digital multimeter
It is relatively low, be not suitable for batch production and use；
3）It is not suitable for having more pin to need component to be tested
For having more external pin and the closely spaced component of pin, such as WIFI components, GPS component, it is difficult to use ten thousand
It is tested with table；
4）Test result is difficult to preserve, and can not trace
Ordinary numbers multimeter does not support the operations such as external control, data exchange, only as an independent measuring instrumentss
It can be by manually being operated, reading data and differentiation, test data cannot preserve, and test result can not trace；
5）Easily cause test erroneous judgement
Operation is measured using digital multimeter, the operating mistake in operating process can not be found, and using artificial
Differentiate, easily causes test erroneous judgement.
Utility model content
The utility model proposes a kind of active information component test device, have it is simple in structure, it is easy to use, can be very
The information of active information component is easily and accurately collected, consequently facilitating further realizing the whether lossy survey of MUT module under test
Examination, and ensure in signal acquisition and test process, the feature of new damage will not be brought to MUT module under test.
The utility model also proposed a kind of test fixture, and for MUT module under test to be arranged, having can be with the utility model
The matched feature of active information component test device of proposition.
The technical solution adopted in the utility model is as follows：
A kind of active information component test device, including n test input interface, connect one to one to the switching of the roads m and open
N input terminal of pass；The n test input interface corresponds n pull down resistor R and is connected to negative supply, and n test is defeated
Connection forms n A node between incoming interface and the n pull down resistor R；The n input terminal one of the roads the m switching switch is a pair of
N pull-up resistor r is answered to be connected to positive supply, and connection forms n B node between the n input terminal and n pull-up resistor r；
Series resistance Z, total n series resistance Z are in series between A nodes and B node correspondingly；The n is the nature more than 1
Number, the m are the natural number more than or equal to n；The positive supply, negative supply, pull-up resistor r, series resistance Z and pull down resistor R
Parameter setting should meet when testing MUT module under test, the voltage-to-ground of node A is negative voltage, the voltage-to-ground of node B
For positive voltage.
Further include control module, the control module includes the first controller being connected with the roads m switching switch, can be to m
The switch of road switching switch carries out selection control switch motion.
Further include the AD analog-digital converters that signal input part is connected with the output end of the roads m switching switch；AD analog-digital converters
The signal for choosing channel is sampled, sampled result is exported；The control module further includes second controller, with institute
The control terminal for stating AD analog-digital converters is connected, and control AD analog-digital converters are acquired the output end signal of the roads m switching switch.
The control module further includes sample-information processing module, and the signal of signal input part and AD analog-digital converters exports
End is connected, and handles the sample information after AD analog-to-digital conversions.
Further include test information display module, signal input part is connected with the signal output end of sample-information processing module.
Further include signal amplification circuit, input terminal is connected with the output end of the roads m switching switch, output end and AD analog-to-digital conversions
The signal input part of device is connected.
A kind of test fixture is matched with above-mentioned active information component test device, it is characterised in that：It is tested for being arranged
Component, and when needing to test MUT module under test, by the q of q test pin of MUT module under test and the test device
Test input interface connects one to one together；Including leg signal input terminal and leg signal output end；The pin letter
The pin of number input terminal and MUT module under test connects one to one；The leg signal output end and the test input interface are one by one
It is correspondingly connected with；The q is the natural number more than 1, and is less than or equal to n.
Compared with prior art, the utility model has the beneficial effects that：It is simple in structure, it is easy to use, it can be easily accurate
The information of active information component really is collected, consequently facilitating further realizing the whether lossy test of MUT module under test, and is protected
Card will not bring new damage in signal acquisition and test process to MUT module under test.
Description of the drawings
Fig. 1 is the theory structure schematic diagram that the utility model wherein one is implemented.
Specific implementation mode
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, below in conjunction with attached drawing and implementation
Example, the present invention will be further described in detail.It should be appreciated that specific embodiment described herein is only explaining this
Utility model is not used to limit the utility model.
This specification（Including any abstract and attached drawing）Disclosed in any feature unless specifically stated can be by other
Equivalent or with similar purpose alternative features are replaced.That is, unless specifically stated, each feature is a series of equivalent
An or example in similar characteristics.
Specific embodiment 1
As shown in Figure 1, a kind of active information component test device, including n test input interface, connect one to one to
N input terminal of the roads m switching switch；The n test input interface corresponds n pull down resistor R and is connected to negative supply, and
Connection forms n A node between n test input interface and the n pull down resistor R；N of the roads the m switching switch are defeated
Enter end n pull-up resistor r of one-to-one correspondence and be connected to positive supply, and shape is connected between the n input terminal and n pull-up resistor r
At n B node；Series resistance Z, total n series resistance Z are in series between A nodes and B node correspondingly；The n is big
In 1 natural number, the m is the natural number more than or equal to n；The positive supply, negative supply, pull-up resistor r, series resistance Z and
The parameter setting of pull down resistor R should meet when testing MUT module under test, and the voltage-to-ground of node A is negative voltage, node B's
Voltage-to-ground is positive voltage.
According to above-mentioned apparatus, when testing MUT module under test, by the measurement of the positive voltage to node B, obtain indirectly
The negative voltage of node A, to obtain flowing through the electric current of pull down resistor R.It can be used for judging according to the electric current for flowing through pull down resistor R
Whether get damaged for MUT module under test pin.On the one hand, due to being the form using negative supply, be not directly by positive supply be added to by
It surveys on component, the damage brought to MUT module under test when can be applied directly to be tested on MUT module under test to avoid positive supply itself；
On the other hand, it is pair by the test conversion of negative current by the resistance test network of another positive supply and negative supply composition
The test of positive current, so as to avoid the complexity directly to negative electricity current test.The apparatus structure is simple, easy to use, can
The information of active information component is accurately easily collected, consequently facilitating further realizing the whether lossy survey of MUT module under test
Examination, and ensure in signal acquisition and test process, new damage will not be brought to MUT module under test.
Specific embodiment 2
Further include control module on the basis of specific embodiment 1, the control module includes switching switch phase with the roads m
The first controller even, the switch that can switch switch to the roads m carry out selection control switch motion, realize to selecting switch from
Dynamic switching.
Specific embodiment 3
Further include the AD moulds that signal input part is connected with the output end of the roads m switching switch on the basis of specific embodiment 2
Number converter；AD analog-digital converters export sampled result to choosing the signal in channel to sample；The control module
Further include second controller, be connected with the control terminal of the AD analog-digital converters, control AD analog-digital converters, which switch the roads m, to be switched
Output end signal be acquired.
Specific embodiment 4
On the basis of specific embodiment 3, the control module further includes sample-information processing module, signal input part with
The signal output end of AD analog-digital converters is connected, and handles the sample information after AD analog-to-digital conversions, the test needed
Information.
Specific embodiment 5
Further include test information display module, signal input part and sample-information processing on the basis of specific embodiment 4
The signal output end of module is connected, and is shown to test information.
Specific embodiment 6
Further include signal amplification circuit, input terminal and the roads m switching switch on the basis of one of specific embodiment 3 to 5
Output end be connected, output end is connected with the signal input part of AD analog-digital converters, thus realization to after the amplification of small-signal again
It is sampled.
Specific embodiment 7
On the basis of one of specific embodiment 1 to 6, a kind of test fixture, with above-mentioned active information component test device
It matches, for MUT module under test to be arranged, and when needing to test MUT module under test, by q test pin of MUT module under test
It connects one to one together with q test input interface of the test device；Believe including leg signal input terminal and pin
Number output end；The pin of the leg signal input terminal and MUT module under test connects one to one；The leg signal output end with
The test input interface connects one to one；The q is the natural number more than 1, and is less than or equal to n.
In test operation, MUT module under test is placed on test fixture, by socket or connecting cable, MUT module under test needs to survey
The port pinout of examination and the test input interface of test device, which are realized, to be electrically connected.
As shown in Figure 1, when test, MUT module under test is placed on test fixture, between the ground of ground wire and test device
In electrical connection state.The tested pin of MUT module under test is connected to resistor network by the input port of test device, with resistance
A1 ... the An node sequences of network are connected, while being connect with negative supply by pull down resistor R1 ... Rn, pass through series resistance Z1 ...
Zn is connected with B1 ... the Bn nodes of resistor network, and B1 ... Bn nodes are connected by pull-up resistor r1 ... rn with positive supply, are connected simultaneously
The multiplexer channel end of multi-channel switch is connect, control module controls variable connector action, it would be desirable to which the channel of measurement is selected logical
Multi-channel switch access AD analog-digital converters are crossed, AD analog-digital converters tie sampling to choosing the signal in channel to sample
Fruit is transmitted to control module, externally output or publication.For too small signal, can turn in multi-channel switch and AD moduluses
Amplifier circuit can be increased between parallel operation, realized to carrying out sampled measurements again after the amplification of small-signal.
Resistor network is designed with one group of pull-up resistor r1 ... r n, is connect with positive supply by pull-up resistor, makes resistor network
B1 ... Bn points be rendered as positive voltage, meet the sampling request of multi-channel switch and analog-digital converter；The electricity of B1 ... Bn nodes
It forces down in positive voltage, electric current reaches node B1 ... Bn from positive supply, through pull-up resistor r1 ... r n.
Resistor network is designed with one group of series resistance Z1 ... Zn, realizes the negative voltage and B1 ... Bn nodes of A1 ... An nodes
Isolation between positive voltage.
When not accessing MUT module under test, electric current reaches B1 ... Bn nodes from positive supply, through pull-up resistor r1 ... r n,
It is concatenated resistance Z1 ... Zn again and reaches A1 ... An nodes, most reaches negative supply through pull down resistor R1 ... Rn afterwards, forms current loop.
After accessing MUT module under test, since MUT module under test ground levels are higher than the negative pressure level of the connect node of tested pin,
From the tested pin of MUT module under test to the node Ax for connecting the pin（X is 1 natural number for arriving n）Output current, referred to as negative current.
Due to the addition of negative current, pull-down current increases, and according to Ohm's law V=IR, pull down resistor pressure drop rise, resistor network corresponds to
The voltage of node Ax increases, and the voltage difference between positive supply and node Ax is caused to reduce, and pull-up current reduces, and falls in pull-up resistor
On pressure difference reduce, node Bx voltages rise, that is, tested pin x（X is 1 natural number for arriving n）Negative current size and resistance
The voltage change of network corresponding node Bx is linearly related, and negative current is bigger, and the voltage of corresponding node B is higher.By to node
The voltage sample of B1 ... Bn can extrapolate the negative current size of corresponding tested pin.For being damaged including implicit damage
Device such as two triodes, integrated circuit etc., internal PN junction has been damaged, accessed this test device, be damaged device
Negative current and normal value have larger difference, by this test device, the variation of negative current can be accurately detected, to realize pair
The purpose of impaired undesired component detection.
Before volume production test, using known good assembly, so that it is accessed test fixture, record its pin port test number
According to, test the known good assembly of enough quantity, its test data summarized, confirm each tested pin up and down
Acceptability limit is limited, being written into controller becomes examination criteria.In volume production test, MUT module under test is carried out according to examination criteria
Screening, defective products is detected.
Claims (7)
1. a kind of active information component test device, it is characterised in that：Including n test input interface, connect one to one to m
N input terminal of road switching switch；The n test input interface corresponds n pull down resistor R and is connected to negative supply, and n
Connection forms n A node between a test input interface and the n pull down resistor R；N input of the roads the m switching switch
End corresponds n pull-up resistor r and is connected to positive supply, and connection forms n between the n input terminal and n pull-up resistor r
A B node；Series resistance Z, total n series resistance Z are in series between A nodes and B node correspondingly；The n is more than 1
Natural number, the m is natural number more than or equal to n；The positive supply, negative supply, pull-up resistor r, series resistance Z and drop-down
The parameter setting of resistance R should meet when testing MUT module under test, and the voltage-to-ground of node A is negative voltage, and node B is over the ground
Voltage is positive voltage.
2. active information component test device according to claim 1, it is characterised in that：Further include control module, it is described
Control module includes the first controller being connected with the roads m switching switch, and the switch that can switch switch to the roads m carries out selection control
Switch motion.
3. active information component test device according to claim 2, it is characterised in that：Further include signal input part and m
The AD analog-digital converters that the output end of road switching switch is connected；AD analog-digital converters, will to choosing the signal in channel to sample
Sampled result is exported；The control module further includes second controller, is connected with the control terminal of the AD analog-digital converters,
Control AD analog-digital converters are acquired the output end signal of the roads m switching switch.
4. active information component test device according to claim 3, it is characterised in that：The control module further includes adopting
Sample message processing module, signal input part are connected with the signal output end of AD analog-digital converters, to the sampling after AD analog-to-digital conversions
Information is handled.
5. active information component test device according to claim 4, it is characterised in that：It further include test presentation of information mould
Block, signal input part are connected with the signal output end of sample-information processing module.
6. the active information component test device according to one of claim 3 to 5, it is characterised in that：Further include that signal is put
Big circuit, input terminal are connected with the output end of the roads m switching switch, and output end is connected with the signal input part of AD analog-digital converters.
7. a kind of test fixture, matched with the active information component test device described in one of claim 1 to 6, feature
It is：For MUT module under test to be arranged, and when needing to test MUT module under test, by q test pin of MUT module under test with
Q test input interface of the test device connects one to one together；Including leg signal input terminal and leg signal
Output end；The pin of the leg signal input terminal and MUT module under test connects one to one；The leg signal output end and institute
Test input interface is stated to connect one to one；The q is the natural number more than 1, and is less than or equal to n.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721857253.6U CN207611103U (en) | 2017-12-27 | 2017-12-27 | A kind of active information component test device and test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721857253.6U CN207611103U (en) | 2017-12-27 | 2017-12-27 | A kind of active information component test device and test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207611103U true CN207611103U (en) | 2018-07-13 |
Family
ID=62798208
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721857253.6U Expired - Fee Related CN207611103U (en) | 2017-12-27 | 2017-12-27 | A kind of active information component test device and test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207611103U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107942177A (en) * | 2017-12-27 | 2018-04-20 | 四川福润得数码科技有限责任公司 | A kind of active information component test device and test method |
| CN110346614A (en) * | 2019-08-23 | 2019-10-18 | 深圳市新威尔电子有限公司 | The test fixture of precision resistance is provided |
-
2017
- 2017-12-27 CN CN201721857253.6U patent/CN207611103U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107942177A (en) * | 2017-12-27 | 2018-04-20 | 四川福润得数码科技有限责任公司 | A kind of active information component test device and test method |
| CN110346614A (en) * | 2019-08-23 | 2019-10-18 | 深圳市新威尔电子有限公司 | The test fixture of precision resistance is provided |
| CN110346614B (en) * | 2019-08-23 | 2024-02-02 | 深圳市新威尔电子有限公司 | Test fixture for providing precise resistance |
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