CN111289830A - TO-3P packaging element's waveform test mechanism - Google Patents

TO-3P packaging element's waveform test mechanism Download PDF

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Publication number
CN111289830A
CN111289830A CN202010199762.4A CN202010199762A CN111289830A CN 111289830 A CN111289830 A CN 111289830A CN 202010199762 A CN202010199762 A CN 202010199762A CN 111289830 A CN111289830 A CN 111289830A
Authority
CN
China
Prior art keywords
feeding
pipe
testing
cylinder
component waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010199762.4A
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Chinese (zh)
Inventor
吴习山
沈向辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taicang Chen Kai Electronics Precision Machinery Co ltd
Original Assignee
Taicang Chen Kai Electronics Precision Machinery Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taicang Chen Kai Electronics Precision Machinery Co ltd filed Critical Taicang Chen Kai Electronics Precision Machinery Co ltd
Priority to CN202010199762.4A priority Critical patent/CN111289830A/en
Publication of CN111289830A publication Critical patent/CN111289830A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • G01R31/2603Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67121Apparatus for making assemblies not otherwise provided for, e.g. package constructions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring

Abstract

The invention provides a waveform testing mechanism of a TO-3P packaging element, which comprises: the device comprises a rack, a feeding mechanism, a reversing mechanism, a testing mechanism and a storage mechanism, wherein the feeding mechanism, the reversing mechanism, the testing mechanism and the storage mechanism are fixedly installed on the rack, a feeding pipe is placed on the feeding mechanism, and the component conveying direction in the feeding pipe is sequentially the feeding mechanism, the reversing mechanism, the testing mechanism and the storage mechanism. The TO-3P packaging element waveform testing mechanism provided by the invention has the advantages that the elements for waveform testing are classified by using machine vision instead of manpower, and the detection and classification efficiency of the elements is greatly improved.

Description

TO-3P packaging element's waveform test mechanism
Technical Field
The invention relates TO a waveform testing mechanism, in particular TO a waveform testing mechanism of a TO-3P packaging element.
Background
The TO-3P package is a common electronic component packaging method. TO-3P packaged components need TO undergo a wave test after production TO check the performance of the components TO distinguish between good and bad products.
When the elements are subjected to waveform testing, each element is tested, and waveforms are displayed through an oscilloscope. Whether the component is qualified is judged by mainly manually observing the waveform at present, so that the component is classified, the requirement on the quality of personnel is high, and the classification efficiency is low.
Disclosure of Invention
In view of the above, the invention provides a waveform testing mechanism for a TO-3P packaged element, which is used for classifying elements subjected TO waveform testing by using machine vision instead of manpower, so that the detection and classification efficiency of the elements is greatly improved.
TO this end, the invention provides a waveform testing mechanism of a TO-3P packaging element, comprising: the device comprises a rack, a feeding mechanism, a reversing mechanism, a testing mechanism and a storage mechanism, wherein the feeding mechanism, the reversing mechanism, the testing mechanism and the storage mechanism are fixedly installed on the rack, a feeding pipe is placed on the feeding mechanism, and the component conveying direction in the feeding pipe is sequentially the feeding mechanism, the reversing mechanism, the testing mechanism and the storage mechanism.
Further, the feeding mechanism comprises a feeding box, a pipe changing cylinder, a pipe jacking cylinder, a pipe transferring mechanism and an empty pipe box, the feeding box is fixedly installed on the rack, the feeding pipe is placed in the feeding box, a push plate is arranged at the end part of the pipe changing cylinder, a material feeding position is arranged on the feeding mechanism, the two ends of the material feeding position are respectively provided with the pipe jacking cylinder and the pipe transferring mechanism, the pipe transferring mechanism is rotatably installed on the rack, and the moving directions of the pipe changing cylinder and the pipe jacking cylinder are perpendicular to each other.
Further, the pipe rotating mechanism comprises a base, a first air cylinder and a second air cylinder, the base is rotatably installed on the rack, the first air cylinder penetrates through the top of the base, and a piston rod of the second air cylinder is fixedly installed at the bottom of the base.
Furthermore, the reversing mechanism comprises a first feeding rail, a rotary table and a second feeding rail, the first feeding rail and the second feeding rail are symmetrically arranged on two sides of the rotary table, and the rotary table is rotatably arranged on the rack.
Further, be provided with two parallel arrangement's bar hole on the carousel, bar hole and first pay-off track parallel arrangement.
Further, the test mechanism comprises a test unit and an evaluation unit, the test unit is fixedly installed on one side of the second feeding track, the evaluation unit is fixedly installed on the rack, and the evaluation unit comprises an oscilloscope and a camera.
Further, receiving mechanism includes feed mechanism and receiving agencies.
Further, the material distribution mechanism comprises a driving motor, a synchronous belt and a movable rail, the driving motor is fixedly installed on the rack, the movable rail is fixedly installed on the synchronous belt, and the driving motor drives the synchronous belt to rotate.
Further, the driving motor is a stepping motor.
Further, the material receiving mechanism is fixedly installed on one side of the material distributing mechanism and comprises a qualified product receiving portion, a second-class product receiving portion and a defective product receiving portion, and the qualified product receiving portion, the second-class product receiving portion and the defective product receiving portion are arranged in parallel along the length direction of the material distributing mechanism.
According TO the TO-3P packaging component waveform testing mechanism provided by the invention, a feeding pipe provided with components which are not detected and are TO be classified is manually placed in a feeding mechanism, the components enter a reversing mechanism through the feeding mechanism TO be reversed, waveform testing is carried out on the testing mechanism, and finally the components are classified and stored by a storage mechanism. The elements are counted during operation of the waveform testing mechanism.
The working process of the feeding mechanism is as follows: the feeding pipe is placed into the feeding box, and the pipe replacing cylinder sends the feeding pipe to a feeding position through a push plate at the end part; the pipe jacking cylinder jacks the feeding pipe into a base of the pipe rotating mechanism, and the pipe jacking cylinder returns; the first cylinder positions the feeding pipe in the base, the second cylinder pushes the base to rotate upwards, the base inclines, and elements in the feeding pipe slide onto a first feeding rail of the reversing mechanism to perform blanking; after the blanking is finished, the second cylinder returns, the empty feed pipe is put back to the material feeding position, and the pipe replacing cylinder sends the empty feed pipe into the empty pipe box to finish the feeding.
The work flow of the reversing mechanism is as follows: and conveying the elements on the first feeding rail into the rotary table, rotating the rotary table by 180 degrees, reversing the elements, and feeding the reversed elements into the second feeding rail. In order to facilitate the turnover of the feeding pipe, the feeding pipe and the receiving pipe are the same, and the waveform testing mechanism is provided with a reversing mechanism.
The working process of the testing mechanism is as follows: the test unit pressurizes the elements, displays the electrical parameter waveforms of the elements through the oscilloscope, detects the waveforms by using the CCD camera, and classifies the elements according to set standards.
The working process of the storage mechanism is as follows: the detected elements enter the movable track, the driving motor drives the synchronous belt to rotate to drive the movable track to move, and the movable track is conveyed to a qualified product storage part, a second-class product storage part or a defective product storage part of the storage mechanism according to the detection result of the elements to be stored in a classified mode. Qualified products are automatically replaced by pipes and received, second-grade products are manually replaced by pipes and received, and defective products are received in bulk by material boxes.
The TO-3P packaging element waveform testing mechanism provided by the invention has the advantages that the elements for waveform testing are classified by using machine vision instead of manpower, and the detection and classification efficiency of the elements is greatly improved.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a schematic structural diagram of a waveform testing mechanism of a TO-3P package device according TO an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a top view of a feeding mechanism in a wave testing mechanism for a TO-3P package device according TO an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a front view of a feeding mechanism in a waveform testing mechanism of a TO-3P package device according TO an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a reversing mechanism, a testing mechanism and a receiving mechanism in a waveform testing mechanism of a TO-3P packaged component according TO an embodiment of the present invention;
FIG. 5 is an enlarged view of a portion of FIG. 4 at A;
FIG. 6 is a partial enlarged view of the portion B in FIG. 4;
FIG. 7 is a schematic structural diagram of a judging unit in a waveform testing mechanism of a TO-3P package device according TO an embodiment of the present invention
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The first embodiment is as follows:
referring TO fig. 1 TO 7, a waveform testing mechanism for a TO-3P packaged device according TO an embodiment of the present invention is shown, including: frame 1, feed mechanism 2, reversing mechanism 3, accredited testing organization 4 and receiving mechanism 5 fixed mounting are in frame 1, and feed pipe 6 is placed on feed mechanism 3, and the 62 directions of transportation of component in the feed pipe 6 are feed mechanism 2, reversing mechanism 3, accredited testing organization 4 and receiving mechanism 5 in proper order.
Specifically, referring to fig. 1 to 7, the feeding mechanism 2 includes a feeding box 21, a tube changing cylinder 22, a tube pushing cylinder 23, a tube rotating mechanism 24 and an empty tube box 25, the feeding box 21 is fixedly mounted on the frame 1, the feeding tube 6 is placed in the feeding box 21, a push plate 221 is disposed at an end of the tube changing cylinder 22, a material feeding position 26 is disposed on the feeding mechanism 2, the tube pushing cylinder 23 and the tube rotating mechanism 24 are disposed at two ends of the material feeding position 26, the tube rotating mechanism 25 is rotatably mounted on the frame 1, and moving directions of the tube changing cylinder 22 and the tube pushing cylinder 23 are perpendicular to each other.
Specifically, referring to fig. 1 to 7, the pipe rotating mechanism 24 includes a base 241, a first cylinder 242 and a second cylinder 243, the base 241 is rotatably installed on the frame 1, the first cylinder 242 penetrates through the top of the base 241, and a piston rod of the second cylinder 243 is fixedly installed at the bottom of the base 241.
Specifically, referring to fig. 1 to 7, the reversing mechanism 3 includes a first feeding rail 31, a rotating disc 32 and a second feeding rail 33, the first feeding rail 31 and the second feeding rail 33 are symmetrically disposed on two sides of the rotating disc 32, and the rotating disc 32 is rotatably mounted on the frame 1.
Specifically, referring to fig. 1 to 7, the testing mechanism 4 includes a testing unit 41 and an evaluating unit 42, the testing unit 41 is fixedly installed on one side of the second feeding rail 33, the evaluating unit 42 is fixedly installed on the rack 1, and the evaluating unit 42 includes an oscilloscope 421 and a camera 422.
Specifically, referring to fig. 1 to 7, the receiving mechanism 5 includes a material separating mechanism 51 and a material collecting mechanism 52.
Specifically, referring to fig. 1 to 7, the material separating mechanism 51 includes a driving motor 511, a timing belt 512 and a movable rail 513, the driving motor 511 is fixedly installed on the frame 1, the movable rail 513 is fixedly installed on the timing belt 512, and the driving motor 511 drives the timing belt 512 to rotate.
Specifically, referring to fig. 1 to 7, the receiving mechanism 52 is fixedly installed at one side of the material separating mechanism 51, the receiving mechanism 52 includes a non-defective product receiving portion 521, an equal-quality product receiving portion 522 and a defective product receiving portion 523, and the non-defective product receiving portion 521, the equal-quality product receiving portion 522 and the defective product receiving portion 523 are arranged in parallel along the length direction of the material separating mechanism 51.
According TO the TO-3P packaging component waveform testing mechanism provided by the invention, a feeding pipe provided with components which are not detected and are TO be classified is manually placed in a feeding mechanism, the components enter a reversing mechanism through the feeding mechanism TO be reversed, waveform testing is carried out on the testing mechanism, and finally the components are classified and stored by a storage mechanism. The elements are counted during operation of the waveform testing mechanism.
The working process of the feeding mechanism is as follows: the feeding pipe is placed into the feeding box, and the pipe replacing cylinder sends the feeding pipe to a feeding position through a push plate at the end part; the pipe jacking cylinder jacks the feeding pipe into a base of the pipe rotating mechanism, and the pipe jacking cylinder returns; the first cylinder positions the feeding pipe in the base, the second cylinder pushes the base to rotate upwards, the base inclines, and elements in the feeding pipe slide onto a first feeding rail of the reversing mechanism to perform blanking; after the blanking is finished, the second cylinder returns, the empty feed pipe is put back to the material feeding position, and the pipe replacing cylinder sends the empty feed pipe into the empty pipe box to finish the feeding.
The work flow of the reversing mechanism is as follows: and conveying the elements on the first feeding rail into the rotary table, rotating the rotary table by 180 degrees, reversing the elements, and feeding the reversed elements into the second feeding rail. In order to facilitate the turnover of the feeding pipe, the feeding pipe and the receiving pipe are the same, and the waveform testing mechanism is provided with a reversing mechanism.
The working process of the testing mechanism is as follows: the test unit pressurizes the elements, displays the electrical parameter waveforms of the elements through the oscilloscope, detects the waveforms by using the CCD camera, and classifies the elements according to set standards.
The working process of the storage mechanism is as follows: the detected elements enter the movable track, the driving motor drives the synchronous belt to rotate to drive the movable track to move, and the movable track is conveyed to a qualified product storage part, a second-class product storage part or a defective product storage part of the storage mechanism according to the detection result of the elements to be stored in a classified mode. Qualified products are automatically replaced by pipes and received, second-grade products are manually replaced by pipes and received, and defective products are received in bulk by material boxes.
The TO-3P packaging element waveform testing mechanism provided by the invention has the advantages that the elements for waveform testing are classified by using machine vision instead of manpower, and the detection and classification efficiency of the elements is greatly improved.
Example two:
referring TO fig. 1 TO fig. 7, a waveform testing mechanism of a TO-3P package device according TO a second embodiment of the present invention is shown, and the present embodiment further adopts the following as an improved technical solution on the basis of the above embodiment: the feeding mechanism 2 is integrally installed on the first panel 7, the first panel 7 is fixedly installed on the rack 1, the reversing mechanism 3, the testing mechanism 4 and the receiving mechanism 5 are fixedly installed on the second panel 8, and the second panel 8 is fixedly installed on the rack 1.
The feeding mechanism is fixedly mounted on the rack through the first panel, the reversing mechanism, the testing mechanism and the storage mechanism are fixedly mounted on the rack through the second panel machine, and all parts of the waveform testing mechanism are modularized and convenient to mount and dismount. The second panel is obliquely arranged on the frame, so that the elements can be transported more smoothly under the action of gravity.
Example three:
referring TO fig. 1 TO fig. 7, a waveform testing mechanism of a TO-3P package device according TO a third embodiment of the present invention is shown, and the present embodiment further adopts the following as an improved technical solution on the basis of the above embodiment: the turntable 32 is provided with two strip-shaped holes 321 arranged in parallel, and the strip-shaped holes 321 are arranged in parallel with the first feeding track 31.
The two strip-shaped holes which are arranged in parallel are arranged on the rotary disc, so that people can conveniently observe the arrangement of the elements in the rotary disc, and the rotary disc is convenient to repair when the rotary disc breaks down.
Example four:
referring TO fig. 1 TO fig. 7, a waveform testing mechanism of a TO-3P package device according TO a fourth embodiment of the present invention is shown, and the present embodiment further adopts the following as an improved technical solution on the basis of the above embodiment: the driving motor 511 is a stepping motor.
The stepping motor is used as a driving device of the material distribution mechanism, so that the control is more accurate, and the movable rail can accurately convey elements into corresponding accommodating positions.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.

Claims (10)

1. A TO-3P packaged component waveform testing mechanism, comprising: frame (1), feeding mechanism (2), reversing mechanism (3), accredited testing organization (4) and receiving mechanism (5), feeding mechanism (2) reversing mechanism (3) accredited testing organization (4) with receiving mechanism (5) fixed mounting is in on frame (1), feed pipe (6) are placed on feeding mechanism (2), component (61) direction of transportation in feed pipe (6) do in proper order feeding mechanism (2) reversing mechanism (3) accredited testing organization (4) with receiving mechanism (5).
2. A TO-3P packaged component waveform testing mechanism as claimed in claim 1, it is characterized in that the feeding mechanism (2) comprises a feeding box (21), a pipe changing cylinder (22), a pipe jacking cylinder (23), a pipe rotating mechanism (24) and an empty pipe box (25), the feeding box (21) is fixedly arranged on the frame (1), the feeding pipe (6) is arranged in the feeding box (21), a push plate (221) is arranged at the end part of the tube replacing cylinder (22), a material feeding position (26) is arranged on the feeding mechanism (2), the two ends of the material inlet position (26) are respectively provided with the pipe jacking cylinder (23) and the pipe rotating mechanism (24), the rotating pipe mechanism (24) is rotatably arranged on the frame (1), the motion directions of the tube changing cylinder (22) and the tube jacking cylinder (23) are mutually vertical.
3. A TO-3P package component waveform testing mechanism according TO claim 2, wherein said rotating tube mechanism (24) comprises a base (241), a first cylinder (242) and a second cylinder (243), said base (241) is rotatably mounted on said frame (1), said first cylinder (242) is inserted into the top of said base (241), and the piston rod of said second cylinder (243) is fixedly mounted on the bottom of said base (241).
4. A TO-3P packaging component waveform testing mechanism according TO claim 1, characterized in that the reversing mechanism (3) comprises a first feeding rail (31), a turntable (32) and a second feeding rail (33), the first feeding rail (31) and the second feeding rail (33) are symmetrically arranged at two sides of the turntable (32), and the turntable (32) is rotatably mounted on the frame (1).
5. A TO-3P package component waveform testing mechanism according TO claim 4, characterized in that two strip-shaped holes (321) are arranged in parallel on the turntable (32), and the strip-shaped holes (321) are arranged in parallel with the first feeding rail (31).
6. The TO-3P packaging component waveform testing mechanism according TO claim 1, wherein the testing mechanism (4) comprises a testing unit (41) and an evaluation unit (42), the testing unit (41) is fixedly installed on one side of the second feeding rail (33), the evaluation unit (42) is fixedly installed on the rack (1), and the evaluation unit (42) comprises an oscilloscope (421) and a camera (422).
7. The TO-3P packaging component waveform testing mechanism according TO claim 1, wherein the receiving mechanism (5) comprises a material separating mechanism (51) and a material collecting mechanism (52).
8. The TO-3P packaging component waveform testing mechanism according TO claim 7, wherein the material separating mechanism (51) comprises a driving motor (511), a synchronous belt (512) and a movable rail (513), the driving motor (511) is fixedly installed on the rack (1), the movable rail (513) is fixedly installed on the synchronous belt (512), and the driving motor (511) drives the synchronous belt (512) TO rotate.
9. A TO-3P packaged component waveform testing mechanism as claimed in claim 8, characterized in that said driving motor (511) is a stepping motor.
10. The TO-3P packaging component waveform testing mechanism according TO claim 7 or 8, wherein the material receiving mechanism (52) is fixedly installed on one side of the material distributing mechanism (51), the material receiving mechanism (52) comprises a qualified product receiving portion (521), a second-class product receiving portion (522) and a defective product receiving portion (523), and the qualified product receiving portion (521), the second-class product receiving portion (522) and the defective product receiving portion (523) are arranged in parallel along the length direction of the material distributing mechanism (51).
CN202010199762.4A 2020-03-20 2020-03-20 TO-3P packaging element's waveform test mechanism Pending CN111289830A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010199762.4A CN111289830A (en) 2020-03-20 2020-03-20 TO-3P packaging element's waveform test mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010199762.4A CN111289830A (en) 2020-03-20 2020-03-20 TO-3P packaging element's waveform test mechanism

Publications (1)

Publication Number Publication Date
CN111289830A true CN111289830A (en) 2020-06-16

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Country Status (1)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116183992A (en) * 2022-05-30 2023-05-30 太仓市晨启电子精密机械有限公司 Intelligent waveform detector and detection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116183992A (en) * 2022-05-30 2023-05-30 太仓市晨启电子精密机械有限公司 Intelligent waveform detector and detection method

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