CN111272762B - 透光性构件的表面缺陷检查装置 - Google Patents

透光性构件的表面缺陷检查装置 Download PDF

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Publication number
CN111272762B
CN111272762B CN201911211712.7A CN201911211712A CN111272762B CN 111272762 B CN111272762 B CN 111272762B CN 201911211712 A CN201911211712 A CN 201911211712A CN 111272762 B CN111272762 B CN 111272762B
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defect
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CN111272762A (zh
Inventor
龟冈康弘
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Koito Manufacturing Co Ltd
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Koito Manufacturing Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201911211712.7A 2018-12-04 2019-12-02 透光性构件的表面缺陷检查装置 Active CN111272762B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018226965A JP2020091132A (ja) 2018-12-04 2018-12-04 透光性部材の表面欠陥検査装置
JP2018-226965 2018-12-04

Publications (2)

Publication Number Publication Date
CN111272762A CN111272762A (zh) 2020-06-12
CN111272762B true CN111272762B (zh) 2023-09-29

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Country Status (2)

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JP (1) JP2020091132A (ja)
CN (1) CN111272762B (ja)

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395309A (ja) * 1986-10-11 1988-04-26 Kanto Auto Works Ltd 塗面の平滑性測定方法
CN1520512A (zh) * 2001-07-05 2004-08-11 日本板硝子株式会社 片状透明体缺陷的检查方法与装置
WO2004081444A1 (ja) * 2003-03-14 2004-09-23 Zeon Corporation 導光板
CN1607434A (zh) * 2003-09-19 2005-04-20 夏普株式会社 导光体，照明装置，液晶显示装置以及电子设备
CN2696006Y (zh) * 2004-02-17 2005-04-27 科桥电子股份有限公司 调光元件的结构
JP2010060604A (ja) * 2008-09-01 2010-03-18 Oji Paper Co Ltd バックライトユニット用光拡散体およびバックライトユニット
JP2011226814A (ja) * 2010-04-15 2011-11-10 Fujitsu Ltd 表面欠陥検査装置及び表面欠陥検査方法
CN103574403A (zh) * 2012-07-31 2014-02-12 索尼公司 光源装置、显示单元以及电子设备
CN103649620A (zh) * 2011-06-29 2014-03-19 夏普株式会社 光源装置以及液晶显示装置
CN103712160A (zh) * 2013-12-24 2014-04-09 南京中电熊猫液晶显示科技有限公司 一种扩散板支架、背光模组
JP2014169977A (ja) * 2013-03-05 2014-09-18 Mecc Co Ltd 欠陥検査装置、欠陥検査方法、及び照明装置
JP3197766U (ja) * 2015-03-17 2015-06-04 バイスリープロジェクツ株式会社 表面検査装置
CN107407556A (zh) * 2015-06-23 2017-11-28 Ckd株式会社 三维测量装置

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395309A (ja) * 1986-10-11 1988-04-26 Kanto Auto Works Ltd 塗面の平滑性測定方法
CN1520512A (zh) * 2001-07-05 2004-08-11 日本板硝子株式会社 片状透明体缺陷的检查方法与装置
WO2004081444A1 (ja) * 2003-03-14 2004-09-23 Zeon Corporation 導光板
CN1607434A (zh) * 2003-09-19 2005-04-20 夏普株式会社 导光体，照明装置，液晶显示装置以及电子设备
CN2696006Y (zh) * 2004-02-17 2005-04-27 科桥电子股份有限公司 调光元件的结构
JP2010060604A (ja) * 2008-09-01 2010-03-18 Oji Paper Co Ltd バックライトユニット用光拡散体およびバックライトユニット
JP2011226814A (ja) * 2010-04-15 2011-11-10 Fujitsu Ltd 表面欠陥検査装置及び表面欠陥検査方法
CN103649620A (zh) * 2011-06-29 2014-03-19 夏普株式会社 光源装置以及液晶显示装置
CN103574403A (zh) * 2012-07-31 2014-02-12 索尼公司 光源装置、显示单元以及电子设备
JP2014169977A (ja) * 2013-03-05 2014-09-18 Mecc Co Ltd 欠陥検査装置、欠陥検査方法、及び照明装置
CN103712160A (zh) * 2013-12-24 2014-04-09 南京中电熊猫液晶显示科技有限公司 一种扩散板支架、背光模组
JP3197766U (ja) * 2015-03-17 2015-06-04 バイスリープロジェクツ株式会社 表面検査装置
CN107407556A (zh) * 2015-06-23 2017-11-28 Ckd株式会社 三维测量装置

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JP2020091132A (ja) 2020-06-11
CN111272762A (zh) 2020-06-12

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