CN111130460A - SMD resonator quartz wafer appearance detection device and detection method - Google Patents
SMD resonator quartz wafer appearance detection device and detection method Download PDFInfo
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- CN111130460A CN111130460A CN201911395417.1A CN201911395417A CN111130460A CN 111130460 A CN111130460 A CN 111130460A CN 201911395417 A CN201911395417 A CN 201911395417A CN 111130460 A CN111130460 A CN 111130460A
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- 238000001514 detection method Methods 0.000 title claims abstract description 85
- 239000010453 quartz Substances 0.000 title claims abstract description 65
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 65
- 238000000034 method Methods 0.000 claims abstract description 15
- 238000004519 manufacturing process Methods 0.000 claims abstract description 7
- 239000000463 material Substances 0.000 claims description 37
- 238000007689 inspection Methods 0.000 claims description 28
- 230000002950 deficient Effects 0.000 claims description 22
- 230000007547 defect Effects 0.000 claims description 15
- 239000003638 chemical reducing agent Substances 0.000 claims description 12
- 239000013078 crystal Substances 0.000 claims description 9
- 230000005540 biological transmission Effects 0.000 claims description 7
- 230000033001 locomotion Effects 0.000 claims description 5
- 210000001503 joint Anatomy 0.000 claims description 3
- 238000013461 design Methods 0.000 abstract description 3
- 235000012431 wafers Nutrition 0.000 description 45
- 239000000306 component Substances 0.000 description 10
- 230000002146 bilateral effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- WSNMPAVSZJSIMT-UHFFFAOYSA-N COc1c(C)c2COC(=O)c2c(O)c1CC(O)C1(C)CCC(=O)O1 Chemical compound COc1c(C)c2COC(=O)c2c(O)c1CC(O)C1(C)CCC(=O)O1 WSNMPAVSZJSIMT-UHFFFAOYSA-N 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000033764 rhythmic process Effects 0.000 description 1
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- 238000012360 testing method Methods 0.000 description 1
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- H—ELECTRICITY
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- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
- H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
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Abstract
A SMD type resonator quartz wafer appearance detection device and detection method, set up loading attachment, feeding disc assembly, sidewall detection device, main surface detection device, categorised receiver and manipulator in its detection device; the feeding device conveys the workpieces to be detected to a feeding turntable of the feeding disc assembly one by one; a feeding motor is also arranged in the feeding disc assembly and drives the feeding turntable to rotate through the feeding motor; the rotating frame of the side wall detection device is driven by a rotating frame motor to operate and drives the laser detector to move up and down through a lifting mechanism; the main surface detection device is characterized in that a sorting disc is driven by a sorting disc motor to operate, a rotary suction nozzle is driven by a rotary suction nozzle motor to operate, and a main surface camera is arranged above the sorting disc. The detection equipment and the detection method of the invention are adopted to carry out appearance detection on the quartz wafer of the SMD resonator, thereby achieving the purposes of improving the reliability of the detection result, ensuring that the quartz wafer meets the design requirement and realizing the consistency of the detection process and the beat of the production line.
Description
Technical Field
The invention relates to a detection device and a detection method, in particular to a quartz wafer appearance detection device matched with an SMD type resonator and a detection method.
Background
The resonators mainly play a role in frequency control, all electronic products related to frequency transmission and reception need to be provided with the resonators, and the resonators can be divided into direct insertion type (with leads) and patch type (SMD type resonators without leads) according to the assembly mode. At present, as electronic products are rapidly developed towards miniaturization continuously, components matched with the electronic products also show miniaturization development situation, so that the SMD type resonator is favored in the field of middle and high-end electronic products.
The quartz crystal not only has piezoelectric effect, but also has excellent mechanical property, electrical property and temperature property, and the resonator designed and manufactured by the quartz crystal has outstanding advantages in frequency stabilization and frequency selection. The quartz wafer is a core component in the quartz crystal, the quartz wafers with different cut shapes have different electrical characteristics and temperature characteristics, wherein the AT cut quartz wafer has a larger frequency thermal overshoot phenomenon, has a larger amplitude frequency effect and cannot meet partial frequency points or special requirements, and the FC cut quartz wafer and the SC cut quartz wafer have more advantages compared with the AT cut quartz wafer, but the FC cut quartz wafer and the SC cut quartz wafer in the prior art are both round wafers, and are difficult to match with the mounting structure of an SMD type resonator by adopting a direct insertion shelf-mounting mode. In order to solve the above problems, SC and FC cut rectangular quartz wafers have been produced, and in order to meet the accuracy requirements of the SC and FC cut rectangular quartz wafers and to ensure that the wafer edges and sidewall chipping and pit sizes and numbers are within the ranges of the relevant standards, the main surfaces and sidewalls thereof need to be strictly inspected. At present, aiming at the detection problem of quartz wafers, a manual visual inspection mode is generally adopted, so that the reliability of detection results is poor, and the consistency of detection procedures and production line beats is difficult to realize.
Disclosure of Invention
The invention provides an appearance detection device and a detection method for a quartz wafer of an SMD resonator, and aims to achieve the purposes of improving the reliability of a detection result, ensuring that the quartz wafer meets the design requirement and realizing the consistency of a detection process and the rhythm of a production line through the appearance detection device and the detection method.
In order to achieve the purpose, the invention adopts the following technical scheme:
a SMD type resonator quartz wafer appearance detection device is sequentially provided with a feeding device, a feeding disc assembly, a side wall detection device, a main surface detection device and a classification storage box along the advancing direction of a workpiece, and a manipulator is arranged above the feeding disc assembly, the side wall detection device and the main surface detection device; the feeding device conveys the workpieces to be detected to a feeding turntable of the feeding disc assembly one by one; a feeding motor is further arranged in the feeding disc assembly and drives the feeding rotary disc to rotate through the feeding motor; the side wall detection device comprises a rotating assembly and a detector assembly, wherein a rotating frame is driven by a rotating frame motor to operate in the rotating assembly, a laser detector, a lifting mechanism and a supporting frame are arranged in the detector assembly, the laser detector and the rotating frame are arranged oppositely, and the lifting mechanism arranged on the supporting frame drives the laser detector to move up and down; the main surface detection device comprises a main surface camera, a sorting disc assembly and a rotary suction nozzle assembly, wherein the sorting disc assembly is provided with a sorting disc and a sorting disc motor, the sorting disc is driven by the sorting disc motor to operate, the rotary suction nozzle assembly is provided with a rotary suction nozzle and a rotary suction nozzle motor, the rotary suction nozzle is driven by the rotary suction nozzle motor to operate, and the main surface camera is arranged above the sorting disc.
According to the SMD type resonator quartz wafer appearance detection equipment, the lifting mechanism in the side wall detection device comprises a lifting motor, a speed reducer, a lead screw and a nut lifting block; the lifting motor is fixed on the support frame, and the power output end of the lifting motor is connected with the speed reducer; the output shaft of the speed reducer is fixedly assembled with the lead screw; the screw rod and the nut lifting block are matched to form a screw rod nut transmission unit; and the nut lifting block is fixedly assembled with the laser detector.
According to the SMD type resonator quartz wafer appearance detection equipment, the feeding device comprises a feeding frame, a vibration motor, a cam, a material storage disc and a return spring; a material guide groove is formed in the discharge port of the material storage disc, the discharge port of the material storage disc is in butt joint with a feeding turntable of a feeding disc assembly, the middle of the bottom surface of the material storage disc is hinged with a feeding frame through a pin shaft, and a reset spring is arranged between the other end of the bottom surface of the material storage disc and the feeding frame; the vibrating motor is fixed on the feeding frame, and a cam is installed on an output shaft of the vibrating motor.
According to the SMD type resonator quartz wafer appearance detection equipment, the bottom surface of the storage disc is an inclined surface which is convenient for a workpiece to slide towards the discharge hole.
According to the SMD type resonator quartz wafer appearance detection equipment, the manipulator comprises a left-right moving component, a front-back moving component, a lifting component and a suction head; the left-right moving assembly is provided with a left-right moving guide rail and a left-right moving slide block, the left-right moving guide rail is fixedly arranged on the appearance detection equipment rack, and the left-right moving slide block is assembled on the left-right moving guide rail; the front-back moving assembly comprises a front-back moving guide rail and a front-back moving slide block, the front-back moving guide rail is fixedly assembled with the left-right moving slide block, and the front-back moving guide rail is assembled with the front-back moving slide block; the lifting assembly comprises a lifting guide rail and a lifting slide block, the lifting guide rail is fixed at the bottom of the front-back moving slide block, and the lifting slide block is assembled on the lifting guide rail; the suction head is fixed at the bottom of the lifting slide block and is connected with a vacuum system pipeline of the production line.
In the SMD resonator quartz wafer appearance inspection apparatus, the first storage cassette for defective products is provided between the side wall inspection device and the main surface inspection device.
Above-mentioned SMD type syntonizer quartz wafer outward appearance check out test set, categorised receiver includes certified products receiver and defective products second receiver, certified products receiver and defective products second receiver bilateral symmetry arrange.
The SMD type resonator quartz wafer appearance inspection apparatus described above is further provided with a workpiece in-position recognition camera disposed above the feed turntable.
The method for detecting the appearance of the quartz wafer of the SMD type resonator realizes the detection of the defects of the main surface and the side wall of the quartz wafer by adopting the detection equipment and comprises the following operation steps:
a. feeding: starting a vibration motor in the feeding device, driving a cam to operate through the vibration motor, periodically applying thrust to a material storage disc through the cam, driving the material storage disc to swing back and forth around a pin shaft, enabling workpieces to enter discharge holes of the material storage disc one by one through a guide chute, and then feeding the workpieces onto a feeding turntable through the discharge holes of the material storage disc;
b. transferring the workpiece: starting a feeding motor, driving a workpiece to rotate by a set angle by a feeding turntable, adsorbing the workpiece by a suction head of a manipulator, and transferring the workpiece to a rotating frame of a side wall detection device;
c. side wall defect detection: starting a rotating frame motor, driving the rotating frame to operate by the rotating frame motor, simultaneously starting a lifting motor in a lifting mechanism, driving a laser detector to move a set distance from top to bottom or from bottom to top by the lifting motor, a speed reducer and a lead screw nut transmission unit, and comprehensively detecting the side wall of a workpiece by the laser detector in the process;
d. judging the state of the workpiece for the first time: when the laser detector detects that the side wall of the workpiece has defects, the workpiece is judged to be an unqualified product, then the manipulator acts, the workpiece is adsorbed by a suction head of the manipulator and is transferred to an unqualified product storage area, then the manipulator resets, when the laser detector detects that the side wall of the workpiece meets the standard requirement, the workpiece is judged to be a qualified product, then the manipulator acts, the workpiece is adsorbed by the suction head of the manipulator and is transferred to a sorting tray of a main surface detection device, and then the manipulator resets;
e. main surface defect detection: starting a sorting tray motor, driving the sorting tray to rotate by the sorting tray motor, and simultaneously shooting and detecting the main surface of the workpiece by a main surface camera;
f. and (3) judging the state of the workpiece for the second time: when the main surface camera detects that the main surface of the workpiece has defects, the workpiece is judged to be unqualified, then the rotary suction nozzle motor is started, the rotary suction nozzle is driven by the rotary suction nozzle motor to rotate to the position above the workpiece, the workpiece is sucked by the rotary suction nozzle and transferred to the unqualified second storage box of the classification storage box, when the main surface camera detects that the main surface of the workpiece meets the standard requirement, the workpiece is judged to be qualified, then the rotary suction nozzle motor is started, the rotary suction nozzle is driven by the rotary suction nozzle motor to rotate to the position above the workpiece, the workpiece is sucked by the rotary suction nozzle and transferred to the qualified storage box of the classification storage box, and then the rotary suction nozzle is reset, so.
In the method for detecting the appearance of the quartz wafer of the SMD resonator, in the step a, after the workpiece is sent to the feeding turntable from the discharge hole of the storage tray, the position of the workpiece is judged by the workpiece in-place recognition camera, so that the motion track of the manipulator is controlled; in the step c, every time the rotating frame rotates for 1 circle, the up-down movement distance of the laser detector is 0.06 mm; in the step d, when the workpiece is determined to be a defective product, the robot hand transfers the workpiece to the defective product first storage cassette.
The invention provides an SMD type resonator quartz wafer appearance detection device and a detection method, which realize automatic detection of the side wall and the main surface of a quartz wafer through the matching of a feeding device, a feeding disc component, a side wall detection device, a main surface detection device, a mechanical arm and a PLC control system. According to the quartz wafer appearance detection equipment, the material storage disc, the vibration motor, the cam and the return spring are arranged in the feeding device, the cam can be driven to operate through the vibration motor, the cam periodically applies thrust to the material storage disc to drive the material storage disc to swing around the pin shaft in a reciprocating mode, workpieces are made to vibrate in the material storage disc, and then the workpieces enter the discharge hole of the material storage disc one by one through the material guide groove, and therefore the automatic feeding process of the workpieces is achieved. According to the appearance detection equipment for the quartz wafer, the rotary frame motor and the detector assembly are arranged in the side wall detection device, the rotary frame can be driven to rotate by the rotary frame motor, and the laser detector in the detector assembly moves up and down, so that the side wall of the quartz wafer is detected in all directions. The quartz crystal appearance detection equipment is characterized in that a main surface camera, a sorting disc motor, a rotary suction nozzle and a rotary suction nozzle motor are arranged in a main surface detection device, the sorting disc can be driven to run by the sorting disc motor, the main surface camera can carry out omnibearing detection on the main surface of the quartz crystal qualified by side wall detection, and then the rotary suction nozzle is used for placing the quartz crystal into a classification storage box, so that the detection process of the quartz crystal is completed. According to the quartz wafer appearance detection equipment, the left-right moving component, the front-back moving component, the lifting component and the suction head are arranged in the manipulator, so that a workpiece can move in different directions under the suction of the suction head, and the problem of interference with other parts is solved. In conclusion, the invention achieves the purposes of improving the reliability of the detection result, ensuring that the quartz wafer meets the design requirement and realizing the consistency of the detection process and the production line beat.
Drawings
FIG. 1 is a schematic diagram of an SMD type resonator quartz wafer appearance inspection device;
FIG. 2 is a schematic view of the feeding device and the feeding tray assembly;
FIG. 3 is an enlarged view of the structure at I in FIG. 2;
FIG. 4 is a schematic view of a robot configuration;
FIG. 5 is a schematic view of a sidewall detection device;
FIG. 6 is an enlarged view of the structure II in FIG. 5;
fig. 7 is a schematic view of the structure of the main surface detection device and the classification cassette;
fig. 8 is a top view of fig. 7.
The list of labels in the figure is:
1. the feeding device comprises 1-1 parts of a feeding device, 1-2 parts of a vibration motor, 1-3 parts of a cam, 1-4 parts of a material storage disc, 1-5 parts of a return spring, 1-6 parts of a feeding frame and a pin shaft;
2. the feeding disc assembly 2-1, the feeding motor 2-2 and the feeding turntable;
3. a workpiece in-place recognition camera;
4. the device comprises a mechanical arm, 4-1 parts of a left-right moving guide rail, 4-2 parts of a left-right moving slide block, 4-3 parts of a front-back moving guide rail, 4-4 parts of a front-back moving slide block, 4-5 parts of a lifting guide rail, 4-6 parts of a lifting slide block, 4-7 parts of a suction head;
5. 5-1 parts of a rotating frame assembly, 5-2 parts of a rotating frame motor and 5-2 parts of a rotating frame;
6. the device comprises a detector assembly 6-1, a laser detector 6-2, a nut lifting block 6-3, a speed reducer 6-4, a lead screw 6-5, a lifting motor 6-6 and a support frame;
7. a first unqualified storage box;
8. a sorting disc assembly 8-1, a sorting disc motor 8-2 and a sorting disc;
9. a main surface camera;
10. a rotary suction nozzle component 10-1, a rotary suction nozzle 10-2 and a rotary suction nozzle motor;
11. a classification storage box 11-1, a qualified product storage box 11-2 and a defective product second storage box.
Detailed Description
The invention is further described with reference to the following figures and specific embodiments.
Referring to fig. 1, 2, 5, 6 and 7, the SMD type resonator quartz wafer appearance inspecting apparatus of the present invention is provided with a feeding device 1, a supply tray assembly 2, a side wall inspecting device, a main surface inspecting device and a sorting housing box 11 in this order along a traveling direction of a workpiece, and a robot arm 4 is provided above the supply tray assembly 2, the side wall inspecting device and the main surface inspecting device; the feeding device 1 conveys the workpieces to be detected to a feeding turntable 2-2 of the feeding disc assembly 2 one by one; the feeding disc component 2 is also provided with a feeding motor 2-1, and the feeding turntable 2-2 is driven to rotate by the feeding motor 2-1; the side wall detection device comprises a rotating assembly 5 and a detector assembly 6, wherein in the rotating assembly 5, a rotating frame 5-2 is driven by a rotating frame motor 5-1 to operate, a laser detector 6-1, a lifting mechanism and a supporting frame 6-6 are arranged in the detector assembly 6, the laser detector 6-1 is provided with a laser emitting end and a signal receiving end, the laser emitting end and the signal receiving end are positioned at two sides of the rotating frame 5-2, and the laser detector 6-1 is driven to move up and down by the lifting mechanism arranged on the supporting frame 6-6; the main surface detection device comprises a main surface camera 9, a sorting disc assembly 8 and a rotary suction nozzle assembly 10, wherein the sorting disc assembly 8 is provided with a sorting disc 8-2 and a sorting disc motor 8-1, the sorting disc 8-2 is driven by the sorting disc motor 8-1 to operate, the rotary suction nozzle assembly 10 is provided with a rotary suction nozzle 10-1 and a rotary suction nozzle motor 10-2, the rotary suction nozzle 10-1 is driven by the rotary suction nozzle motor 10-2 to operate, and the main surface camera 9 is arranged above the sorting disc 8-2.
Referring to fig. 2 and 3, the SMD type resonator quartz wafer appearance inspection apparatus according to the present invention includes a loading frame 1-5, a vibration motor 1-1, a cam 1-2, a material storage tray 1-3, and a return spring 1-4; a material guide groove is formed in the discharge port of the material storage disc 1-3, the discharge port of the material storage disc 1-3 is in butt joint with the feeding rotary disc 2-2 of the feeding disc assembly 2, the bottom surface of the material storage disc 1-3 is an inclined surface convenient for a workpiece to slide towards the discharge port, the middle of the bottom surface of the material storage disc 1-3 is hinged with the upper material rack 1-5 through a pin shaft 1-6, and a return spring 1-4 is arranged between the other end of the bottom surface of the material storage disc 1-3 and the upper material rack 1-5; the vibration motor 1-1 is fixed on the feeding frame 1-5, and the output shaft of the vibration motor is provided with the cam 1-2.
Referring to fig. 1 and 4, the SMD type resonator quartz wafer appearance inspection apparatus according to the present invention, wherein the robot 4 includes a left and right moving assembly, a front and rear moving assembly, a lifting assembly and a suction head 4-7; the left-right moving assembly is provided with a left-right moving guide rail 4-1 and a left-right moving slide block 4-2, the left-right moving guide rail 4-1 is fixedly arranged on the appearance detection equipment rack, and the left-right moving slide block 4-2 is assembled on the left-right moving guide rail 4-1; the front-back moving assembly comprises a front-back moving guide rail 4-3 and a front-back moving slide block 4-4, the front-back moving guide rail 4-3 is fixedly assembled with the left-right moving slide block 4-2, and the front-back moving guide rail 4-3 is assembled with the front-back moving slide block 4-4; the lifting assembly comprises a lifting guide rail 4-5 and a lifting slide block 4-6, the lifting guide rail 4-5 is fixed at the bottom of the front-back moving slide block 4-4, and the lifting slide block 4-6 is assembled on the lifting guide rail 4-5; the suction head 4-7 is fixed at the bottom of the lifting slide block 4-6, and the suction head 4-7 is connected with a vacuum system pipeline of a production line.
Referring to fig. 5 and 6, in the SMD resonator quartz wafer appearance inspection apparatus according to the present invention, the lifting mechanism of the sidewall inspection device includes a lifting motor 6-5, a speed reducer 6-3, a lead screw 6-4, and a nut lifting block 6-2; the lifting motor 6-5 is fixed on the support frame 6-6, and the power output end of the lifting motor is connected with the speed reducer 6-3; an output shaft of the speed reducer 6-3 is fixedly assembled with the screw rod 6-4; the screw 6-4 is matched with the nut lifting block 6-2 to form a screw nut transmission unit; and the nut lifting block 6-2 is fixedly assembled with the laser detector 6-1.
Referring to fig. 7 and 8, in the SMD type resonator quartz wafer appearance inspection apparatus according to the present invention, the classification cassette 11 includes a non-defective product cassette 11-1 and a defective product second cassette 11-2, and the non-defective product cassette 11-1 and the defective product second cassette 11-2 are arranged in bilateral symmetry, and workpieces of different types can be fed into the non-defective product cassette 11-1 or the defective product second cassette 11-2 of the classification cassette 11 by rotating the suction nozzle 10-1 of the main surface inspection device.
Referring to fig. 1, the SMD type resonator quartz wafer appearance inspection apparatus of the present invention is configured such that a defective first receiving case 7 is provided between the side wall inspection device and the main surface inspection device; a workpiece-in-position recognition camera 3 is provided above the feed turntable 2-2 of the feed tray assembly 2.
Referring to fig. 1 to 8, the present invention further provides an SMD type resonator quartz wafer appearance inspection method, which uses the above SMD type resonator quartz wafer appearance inspection apparatus to realize inspection of defects on the major surface and the sidewall of the quartz wafer, and the operation steps are as follows:
a. feeding: starting a vibration motor 1-1 in a feeding device 1, driving a cam 1-2 to operate through the vibration motor 1-1, periodically applying thrust to a material storage disc 1-3 through the cam 1-2, driving the material storage disc 1-3 to reciprocate around a pin shaft 1-6, enabling workpieces to enter a discharge port of the material storage disc 1-3 one by one through a guide chute, then feeding the workpieces onto a feeding turntable 2-2 through the discharge port of the material storage disc 1-3, and then judging the positions of the workpieces through a workpiece in-place recognition camera 3;
b. transferring the workpiece: starting a feeding motor 2-1, driving a workpiece to rotate by a set angle by a feeding turntable 2-2, adsorbing the workpiece by a suction head 4-7 of a manipulator 4, and transferring the workpiece to a rotating frame 5-2 of a side wall detection device;
c. side wall defect detection: starting a rotating frame motor 5-1, driving a rotating frame 5-2 to operate by the rotating frame motor 5-1, simultaneously starting a lifting motor 6-5 in a lifting mechanism, driving a laser detector 6-1 to move from top to bottom or from bottom to top by a set distance through the lifting motor 6-5, a speed reducer 6-3 and a lead screw nut transmission unit, wherein in the process, the up-and-down movement distance of the laser detector 6-1 is 0.06 mm every 1-circle rotation of the rotating frame 5-2, so that the laser detector 6-1 can comprehensively detect the side wall of the workpiece;
d. judging the state of the workpiece for the first time: when the laser detector 6-1 detects that the side wall of the workpiece has a defect, the workpiece is judged to be an unqualified product, then the mechanical arm 4 acts, the workpiece is adsorbed by a suction head 4-7 of the mechanical arm 4 and is transferred into a first storage box 7 of the unqualified product, then the mechanical arm 4 resets, when the laser detector 4 detects that the side wall of the workpiece meets the standard requirement, the workpiece is judged to be an qualified product, then the mechanical arm 4 acts, the workpiece is adsorbed by the suction head 4-7 of the mechanical arm 4 and is transferred onto a sorting tray 8-2 of the main surface detection device, and then the mechanical arm 4 resets;
e. main surface defect detection: starting a sorting tray motor 8-1, driving a sorting tray 8-2 to rotate by the sorting tray motor 8-1, and simultaneously shooting and detecting the main surface of the workpiece by a main surface camera 9;
f. and (3) judging the state of the workpiece for the second time: when the main surface camera 9 detects that the main surface of the workpiece has defects, the workpiece is judged to be unqualified, then the rotary suction nozzle motor 10-2 is started, the rotary suction nozzle 10-1 is driven by the rotary suction nozzle motor 10-2 to rotate to the position above the workpiece, the work is sucked by the rotary suction nozzle 10-1 and transferred to a second storage cassette 11-2 of the classification storage cassette 11, when the main surface camera 9 detects that the main surface of the workpiece meets the standard requirement, the workpiece is judged to be qualified, then the rotary suction nozzle motor 10-2 is started, the rotary suction nozzle motor 10-2 drives the rotary suction nozzle 10-1 to rotate to the upper part of the workpiece, the rotary suction nozzle 10-1 sucks the workpiece and transfers the workpiece to a qualified product storage box 11-1 of the classification storage box 11, and then the rotary suction nozzle 10-1 is reset, so that a working cycle is completed.
Claims (10)
1. An SMD type resonator quartz wafer appearance detection device is characterized in that a feeding device (1), a feeding disc assembly (2), a side wall detection device, a main surface detection device and a classification storage box (11) are sequentially arranged along the advancing direction of a workpiece, and a manipulator (4) is arranged above the feeding disc assembly (2), the side wall detection device and the main surface detection device; the feeding device (1) conveys the workpieces to be detected to a feeding turntable (2-2) of the feeding disc assembly (2) one by one; a feeding motor (2-1) is further arranged in the feeding disc assembly (2), and the feeding turntable (2-2) is driven to rotate by the feeding motor (2-1); the side wall detection device comprises a rotating assembly (5) and a detector assembly (6), wherein in the rotating assembly (5), a rotating frame (5-2) is driven by a rotating frame motor (5-1) to operate, a laser detector (6-1), a lifting mechanism and a supporting frame (6-6) are arranged in the detector assembly (6), the laser detector (6-1) and the rotating frame (5-2) are arranged oppositely, and the laser detector (6-1) is driven to move up and down by the lifting mechanism arranged on the supporting frame (6-6); the main face detection device comprises a main face camera (9), a sorting disc assembly (8) and a rotary suction nozzle assembly (10), wherein the sorting disc assembly (8) is provided with a sorting disc (8-2) and a sorting disc motor (8-1), the sorting disc (8-2) is driven by the sorting disc motor (8-1) to operate, the rotary suction nozzle assembly (10) is provided with a rotary suction nozzle (10-1) and a rotary suction nozzle motor (10-2), the rotary suction nozzle (10-1) is driven by the rotary suction nozzle motor (10-2) to operate, and the main face camera (9) is arranged above the sorting disc (8-2).
2. The SMD type resonator quartz wafer appearance inspection device according to claim 1, wherein the lifting mechanism in the side wall inspection device includes a lifting motor (6-5), a decelerator (6-3), a lead screw (6-4) and a nut lifting block (6-2); the lifting motor (6-5) is fixed on the support frame (6-6), and the power output end of the lifting motor is connected with the speed reducer (6-3); an output shaft of the speed reducer (6-3) is fixedly assembled with the screw rod (6-4); the screw rod (6-4) is matched with the nut lifting block (6-2) to form a screw rod nut transmission unit; the nut lifting block (6-2) is fixedly assembled with the laser detector (6-1).
3. The SMD type resonator quartz wafer appearance inspection device according to claim 1 or 2, wherein said loading means (1) comprises a loading frame (1-5), a vibration motor (1-1), a cam (1-2), a storage tray (1-3) and a return spring (1-4); a material guide groove is formed in the discharge port of the material storage disc (1-3), the discharge port of the material storage disc (1-3) is in butt joint with a feeding rotary disc (2-2) of the feeding disc assembly (2), the middle of the bottom surface of the material storage disc (1-3) is hinged with an upper material rack (1-5) through a pin shaft (1-6), and a reset spring (1-4) is arranged between the other end of the bottom surface of the material storage disc (1-3) and the upper material rack (1-5); the vibration motor (1-1) is fixed on the feeding frame (1-5), and the output shaft of the vibration motor is provided with the cam (1-2).
4. The SMD type resonator quartz crystal wafer appearance inspection device as claimed in claim 3, wherein said magazine (1-3) has an inclined surface at its bottom surface for facilitating the sliding of the workpiece towards the discharge opening.
5. The SMD type resonator quartz crystal wafer appearance inspection device according to claim 4, wherein said robot arm (4) comprises a left and right moving member, a front and rear moving member, a lifting member and a suction head (4-7); the left-right moving assembly is provided with a left-right moving guide rail (4-1) and a left-right moving slide block (4-2), the left-right moving guide rail (4-1) is fixedly arranged on the appearance detection equipment rack, and the left-right moving slide block (4-2) is assembled on the left-right moving guide rail (4-1); the front-back moving assembly comprises a front-back moving guide rail (4-3) and a front-back moving slide block (4-4), the front-back moving guide rail (4-3) is fixedly assembled with the left-right moving slide block (4-2), and the front-back moving guide rail (4-3) is assembled with the front-back moving slide block (4-4); the lifting assembly comprises a lifting guide rail (4-5) and a lifting slide block (4-6), the lifting guide rail (4-5) is fixed at the bottom of the front-back moving slide block (4-4), and the lifting slide block (4-6) is assembled on the lifting guide rail (4-5); the suction head (4-7) is fixed at the bottom of the lifting slide block (4-6), and the suction head (4-7) is connected with a vacuum system pipeline of the production line.
6. The SMD type resonator quartz wafer appearance inspection apparatus as set forth in claim 1, wherein a reject first receiving case (7) is provided between said side wall inspection means and main surface inspection means.
7. The SMD type resonator quartz wafer appearance inspecting apparatus and inspecting method according to claim 1, wherein said classification cassette (11) includes a non-defective product cassette (11-1) and a defective product second cassette (11-2), said non-defective product cassette (11-1) and defective product second cassette (11-2) being arranged in left-right symmetry.
8. The SMD type resonator quartz wafer appearance inspection device according to claim 1, wherein a workpiece-in-place recognition camera (3) is further provided, said workpiece-in-place recognition camera (3) being arranged above the feed turntable (2-2).
9. A method for inspecting the appearance of a quartz wafer of an SMD resonator, characterized in that the inspection of defects of the main faces and side walls of the quartz wafer is carried out using the inspection device according to any one of claims 1 to 8, and in that it operates as follows:
a. feeding: starting a vibration motor (1-1) in a feeding device (1), driving a cam (1-2) to operate through the vibration motor (1-1), periodically applying thrust to a storage disc (1-3) through the cam (1-2), driving the storage disc (1-3) to swing back and forth around a pin shaft (1-6), enabling workpieces to enter a discharge port of the storage disc (1-3) one by one through a guide chute, and then feeding the workpieces onto a feeding turntable (2-2) through the discharge port of the storage disc (1-3);
b. transferring the workpiece: starting a feeding motor (2-1), driving a workpiece to rotate by a set angle by a feeding turntable (2-2), adsorbing the workpiece by a suction head (4-7) of a manipulator (4), and transferring the workpiece to a rotating frame (5-2) of a side wall detection device;
c. side wall defect detection: starting a rotating frame motor (5-1), driving a rotating frame (5-2) to operate by the rotating frame motor (5-1), simultaneously starting a lifting motor (6-5) in a lifting mechanism, driving a laser detector (6-1) to move for a set distance from top to bottom or from bottom to top by the lifting motor (6-5), a speed reducer (6-3) and a lead screw nut transmission unit, and comprehensively detecting the side wall of a workpiece by the laser detector (6-1) in the process;
d. judging the state of the workpiece for the first time: when a laser detector (6-1) detects that the side wall of the workpiece has a defect, the workpiece is judged to be a defective product, then a mechanical arm (4) acts, the workpiece is adsorbed by a suction head (4-7) of the mechanical arm (4) and is transferred to a defective product storage area, then the mechanical arm (4) resets, when the laser detector (4) detects that the side wall of the workpiece meets the standard requirement, the workpiece is judged to be a defective product, then the mechanical arm (4) acts, the workpiece is adsorbed by the suction head (4-7) of the mechanical arm (4), is transferred to a sorting tray (8-2) of a main surface detection device, and then the mechanical arm (4) resets;
e. main surface defect detection: starting a sorting tray motor (8-1), driving a sorting tray (8-2) to rotate by the sorting tray motor (8-1), and simultaneously shooting and detecting the main surface of the workpiece by a main surface camera (9);
f. and (3) judging the state of the workpiece for the second time: when the main surface camera (9) detects that the main surface of the workpiece has defects, the workpiece is judged to be unqualified, then a rotary suction nozzle motor (10-2) is started, a rotary suction nozzle (10-1) is driven by the rotary suction nozzle motor (10-2) to rotate to the position above the workpiece, the workpiece is sucked by the rotary suction nozzle (10-1) and is transferred to a unqualified second storage box (11-2) of the classification storage box (11), when the main surface camera (9) detects that the main surface of the workpiece meets the standard requirement, the workpiece is judged to be qualified, then the rotary suction nozzle motor (10-2) is started, the rotary suction nozzle (10-1) is driven by the rotary suction nozzle motor (10-2) to rotate to the position above the workpiece, the workpiece is sucked by the rotary suction nozzle (10-1) and is transferred to a qualified product storage box (11-1) of the classification storage, then the rotary suction nozzle (10-1) is reset, and a work cycle is completed.
10. The SMD type resonator quartz wafer appearance inspecting method as set forth in claim 9, wherein in said step a, after the workpiece is fed from the discharge port of the stocker tray (1-3) onto the feed turntable (2-2), the position of the workpiece is judged by the workpiece-in-position recognition camera (3), thereby controlling the movement trace of the robot (4); in the step c, every time the rotating frame (5-2) rotates for 1 circle, the up-and-down movement distance of the laser detector (6-1) is 0.06 mm; in the step d, when the workpiece is determined to be a defective product, the manipulator (4) transfers the workpiece to a defective first storage cassette (7).
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