TWI407851B - Method and equipment for manufacturing the backlight - Google Patents

Method and equipment for manufacturing the backlight Download PDF

Info

Publication number
TWI407851B
TWI407851B TW99115208A TW99115208A TWI407851B TW I407851 B TWI407851 B TW I407851B TW 99115208 A TW99115208 A TW 99115208A TW 99115208 A TW99115208 A TW 99115208A TW I407851 B TWI407851 B TW I407851B
Authority
TW
Taiwan
Prior art keywords
emitting diode
light
light emitting
circuit board
manufacturing
Prior art date
Application number
TW99115208A
Other languages
Chinese (zh)
Other versions
TW201141331A (en
Inventor
Gang-Tao Gu
zhong-hai Xiao
min cheng Wang
Original Assignee
Innolux Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Innolux Corp filed Critical Innolux Corp
Priority to TW99115208A priority Critical patent/TWI407851B/en
Publication of TW201141331A publication Critical patent/TW201141331A/en
Application granted granted Critical
Publication of TWI407851B publication Critical patent/TWI407851B/en

Links

Landscapes

  • Led Device Packages (AREA)

Abstract

A method and an equipment for manufacturing a backlight are provided, wherein the method includes the steps of: providing a plurality of light-emitting diodes(LED), testing the LEDs, providing a receiver to receive the LEDs which have passed the previous testing, providing a circuit board where the receiver aims at certain positions of the circuit board that the LEDs could be mounted on said positions from the receiver, and applying an external forces on the LEDs to fasten the LEDs on the circuit board. The method and the equipment are applied for manufacturing a circuit board where LEDs are mounted on automatically. Furthermore, the LEDs have been selected and tested before the LEDs are mounted on the circuit board, so that the product quality and backlight efficiency are improved.

Description

背光源的製造方法和製造設備 Backlight manufacturing method and manufacturing equipment

本發明涉及一種背光源的製造方法和製造設備。 The present invention relates to a method of manufacturing a backlight and a manufacturing apparatus.

背光源通常包括複數發光二極體及用於驅動發光二極體的電路板。目前,業界普遍應用表面封裝技術(Surface Mount Technology,SMT)來製造背光模組的背光源,包括半自動或全自動機械化流程。在安裝背光源時,先前流程需將這些發光二極體設置於電路板上,首先封裝機械臺上的機械手吸取卷料上的發光二極體片,然後對應設置到電路板上的某一位置,多次重複此步驟,直到完成一片電路上發光二極體的全部組裝。然而,採用此製造方法,由於組裝後的電路板在後序的測試發現,一片電路板的所有發光二極體並不能全部通過點亮測試,這樣生產製造方法會造成多次返工,生產效率低下,不能滿足生產要求。再者,藉由機械手一次僅取一顆發光二極體進行設置,組裝效率低。另外,需採用發光二極體卷料以致製造成本較高。 The backlight typically includes a plurality of light emitting diodes and a circuit board for driving the light emitting diodes. At present, the surface mount technology (SMT) is widely used in the industry to manufacture backlights for backlight modules, including semi-automatic or fully automated mechanization processes. In the installation of the backlight, the previous process needs to set these LEDs on the circuit board. First, the robot on the packaging mechanical table sucks the LED pieces on the coil, and then correspondingly set to a certain circuit board. Position, repeat this step multiple times until the complete assembly of the light-emitting diodes on one circuit is completed. However, with this manufacturing method, since the assembled circuit board is tested in the subsequent order, all the LEDs of one circuit board cannot pass the lighting test, so that the manufacturing method will cause multiple rework and the production efficiency is low. Can not meet the production requirements. Furthermore, since the robot only takes one light-emitting diode at a time for setting, the assembly efficiency is low. In addition, it is necessary to use a light-emitting diode coil material so that the manufacturing cost is high.

本發明提供一種減少返工次數,提升生產效率的背光源的製造方法。 The present invention provides a method of manufacturing a backlight that reduces the number of rework and improves production efficiency.

另,提供一種用於上述製造方法的製造設備。 In addition, a manufacturing apparatus for the above manufacturing method is provided.

一種背光源的製造方法,是在一可將發光二極體自動化地組 裝於電路板的製造設備中執行以下步驟:提供多顆發光二極體;將多顆發光二極體進行檢測;提供一承載器,將通過檢測並且合格的多顆發光二極體填入該承載器內;提供一電路板,將該承載器對準電路板預設發光二極體的位置;施加一外力於該發光二極體,使其貼合在該電路板上。 A method for manufacturing a backlight is an automated group of light emitting diodes Performing the following steps in a manufacturing device mounted on a circuit board: providing a plurality of light emitting diodes; detecting a plurality of light emitting diodes; providing a carrier for filling the plurality of light emitting diodes that have passed the detection and passing Inside the carrier; providing a circuit board, aligning the carrier with the position of the preset LED of the circuit board; applying an external force to the LED to be attached to the circuit board.

一種適用於上述的背光源的製造方法的製造設備,其包括上料機構、檢測機構及貼合機構以將發光二極體自動化地組裝於電路板,該上料機構將散裝的電子元件按照預定方向排列後待測;檢測機構對電子元件進行檢測;貼合機構包括一承載器與一壓件器;該承載器收容檢測合格的電子元件;承載器與一待組裝的電路板預設電子元件的位置對應;該壓件器將該承載器內的電子元件與電路板完成組裝。可選擇地,該製造設備更包括一運輸機構,以運輸該電路板完成與電子元件的組裝。 A manufacturing apparatus suitable for the manufacturing method of the backlight described above, comprising a loading mechanism, a detecting mechanism, and a bonding mechanism for automatically assembling the light emitting diode to the circuit board, the loading mechanism presetting the bulk electronic component The detection mechanism is to be tested; the detecting mechanism detects the electronic component; the bonding mechanism comprises a carrier and a presser; the carrier houses the qualified electronic component; the carrier and a predetermined electronic component of the circuit board to be assembled The position corresponds to; the presser completes assembly of the electronic components in the carrier with the circuit board. Optionally, the manufacturing apparatus further includes a transport mechanism for transporting the circuit board to complete assembly with the electronic components.

與先前技術相比,上述製造方法將電子元件,如發光二極體自動設置於電路板上,在設置前進行了工作測試並篩選出合格的發光二極體然後將合格的發光二極體進行貼合設置,使每個發光二極體都能正常工作,不用返工,提高了背光源的產品品質與生產效率。 Compared with the prior art, the above manufacturing method automatically sets an electronic component such as a light-emitting diode on a circuit board, performs a work test before setting, selects a qualified light-emitting diode, and then performs a qualified light-emitting diode. The fitting setting enables each LED to work normally without rework, which improves the product quality and production efficiency of the backlight.

請參閱圖1,係背光源的製造設備一較佳實施方式的立體示意圖。該背光源的製造設備10包括上料機構11、檢測機構13及貼合機構15。該上料機構11將發光二極體傳送給該檢測機構13,該檢 測機構13檢測由該上料機構11提供的發光二極體,將能符合檢測條件的發光二極體傳送給貼合機構15。該貼合機構15把由該檢測機構13檢測合格後的發光二極體貼合到電路板上。可選擇地,該製造設備更包括一運輸機構17以運輸電路板在該貼合機構15處完成發光二極體的貼合。 Please refer to FIG. 1 , which is a perspective view of a preferred embodiment of a manufacturing device for a backlight. The manufacturing apparatus 10 of the backlight includes a loading mechanism 11, a detecting mechanism 13, and a bonding mechanism 15. The loading mechanism 11 transmits the light emitting diode to the detecting mechanism 13, and the detecting The measuring mechanism 13 detects the light-emitting diodes supplied from the loading mechanism 11, and transmits the light-emitting diodes that can meet the detection conditions to the bonding mechanism 15. The bonding mechanism 15 bonds the light-emitting diodes that have been tested by the detecting mechanism 13 to the circuit board. Optionally, the manufacturing apparatus further includes a transport mechanism 17 at which the transport circuit board completes the bonding of the light emitting diodes.

優選地,該上料機構11包括一振動盤(未標示),該振動盤包括料斗112、螺旋軌道113及出料口114。該螺旋軌道113圍繞該料斗112的內壁。該出料口114位於該螺旋軌道113的上部引出端。該振動盤在電磁振動器作用下,料斗112作扭轉式上下振動,使散料的電子元件,如發光二極體沿著螺旋軌道由低到高移動,並自動排列定向,直至上部的出料口114而進入第一輸料槽101,由該第一輸料槽101將多顆發光二極體按照一定的方向傳送給該檢測機構13。 Preferably, the loading mechanism 11 includes a vibrating plate (not shown) including a hopper 112, a spiral track 113, and a discharge port 114. The spiral track 113 surrounds the inner wall of the hopper 112. The discharge port 114 is located at the upper lead end of the spiral track 113. The vibrating plate is vibrated by the electromagnetic vibrator, and the hopper 112 is twisted up and down to vibrate, so that the electronic components of the bulk material, such as the light-emitting diodes, move from low to high along the spiral track, and are automatically aligned until the upper discharge is performed. The port 114 enters the first infeed tank 101, and the plurality of light emitting diodes are transported to the detecting mechanism 13 in a certain direction by the first infeed tank 101.

請參閱圖2,係背光源的製造設備10的檢測機構13的立體示意圖。該檢測機構13用於檢測發光二極體是否為需求的型號、極性方位等參數是否符合要求以及是否能夠正常工作。在一種實施例中,該檢測機構13對於發光二極體型號的判斷可以應用電荷耦合裝置(Charge Coupled Device,CCD)攝取待檢測的發光二極體的影像,並與預設影像做比較,進而得出檢測的發光二極體的大小及型號是否符合要求。在另一種實施例中,該檢測機構13也可以從不同方向將待檢測的發光二極體的各表面卡位,計算待檢測的發光二極體相對表面的距離,將此距離與預設數值做比較,進而得出檢測的發光二極體的大小及型號是否符合要求。判斷發光二極 體是否是需求的大小、型號等方法很多,不一一列舉。下面以發光二極體為例來介紹檢測機構13的運作原理。 Please refer to FIG. 2 , which is a perspective view of the detecting mechanism 13 of the manufacturing device 10 of the backlight. The detecting mechanism 13 is configured to detect whether the LED, whether the required model, polarity orientation, and the like meet the requirements and whether it can work normally. In an embodiment, the detecting mechanism 13 can determine the image of the LED model by using a Charge Coupled Device (CCD) to capture the image of the LED to be detected and compare it with the preset image. It is determined whether the size and model of the detected light-emitting diode meet the requirements. In another embodiment, the detecting mechanism 13 can also latch the surfaces of the LED to be detected from different directions, calculate the distance of the opposite surface of the LED to be detected, and set the distance to a preset value. Compare and determine whether the size and model of the detected LEDs meet the requirements. Judging light dipole Whether the body is the size, model and other methods of demand, not enumerated. The operation principle of the detecting mechanism 13 will be described below by taking a light-emitting diode as an example.

該檢測機構13包括旋轉台130和檢測盤135。該旋轉台130將由上料機構11通過該第一輸料槽101供給的呈一定方向排列的發光二極體在該檢測盤135上作尺寸和點亮檢測,並將檢測合格的發光二極體通過第二輸料槽103供給貼合機構15。該旋轉台130和檢測盤135的結構設計保證檢測機構的迴圈檢測,提升檢測效率。 The detecting mechanism 13 includes a rotating table 130 and a detecting disk 135. The rotating table 130 aligns the light-emitting diodes arranged in a certain direction by the loading mechanism 11 through the first feeding slot 101 on the detecting disk 135, and detects the qualified light-emitting diodes. The bonding mechanism 15 is supplied through the second feed slot 103. The structural design of the rotating table 130 and the detecting plate 135 ensures the detection of the loop of the detecting mechanism and improves the detection efficiency.

該旋轉台130包括旋轉盤131、旋轉軸132、複數吸晶棒133、制動器134及真空管137。該旋轉盤131平水準設置並可繞該旋轉軸132旋轉。該複數吸晶棒133部分收容於該旋轉盤131內,並可在該旋轉盤131的帶動下繞該旋轉軸132旋轉。該制動器134的主體收容於該旋轉軸132內。該真空管137的一端與吸晶棒133的一端相連,且該真空管137內填充真空為該吸晶棒133提供吸附發光二極體的力。該真空管137的另一端連接制動器134,用於獲取該複數吸晶棒133的制動力。該吸晶棒133包括棒體1331、吸晶頭1332、限位件1335。該棒體1331一端與真空管137的一端相連接,另一端設置該吸晶頭1332,該限位件1335設置於該棒體1331上並且鄰近該真空管137,該限位件1335大體呈圓柱形,該圓柱的中心軸與該棒體1331的中心軸為同一條線,同時,該限位件1335的底面直徑大於該棒體1331的橫截面直徑。 The rotary table 130 includes a rotary disk 131, a rotary shaft 132, a plurality of absorption rods 133, a brake 134, and a vacuum tube 137. The rotary disk 131 is horizontally disposed and rotatable about the rotary shaft 132. The plurality of crystal rods 133 are partially housed in the rotating disk 131, and are rotatable about the rotating shaft 132 by the rotating disk 131. The main body of the brake 134 is housed in the rotating shaft 132. One end of the vacuum tube 137 is connected to one end of the absorption rod 133, and the vacuum tube 137 is filled with a vacuum to provide the absorption rod 133 with a force for adsorbing the light-emitting diode. The other end of the vacuum tube 137 is connected to a brake 134 for acquiring the braking force of the plurality of crystal rods 133. The aspiration rod 133 includes a rod body 1331, a crystal absorption head 1332, and a stopper 1335. The rod body 1331 is connected to one end of the vacuum tube 137, and the other end is provided with the crystal head 1332. The limiting member 1335 is disposed on the rod body 1331 and adjacent to the vacuum tube 137. The limiting member 1335 is substantially cylindrical. The central axis of the cylinder is the same line as the central axis of the rod 1331, and the diameter of the bottom surface of the limiting member 1335 is larger than the cross-sectional diameter of the rod 1331.

該旋轉盤131包括複數圓柱孔136,該複數圓柱孔136的中心到 該旋轉盤的中心的距離相等。該圓柱孔136孔徑大於或者略大於該棒體1331的橫截面直徑,但小於該限位件1335的底面直徑。該複數棒體1331的吸晶頭1332一端穿過該複數圓柱孔從而分別收容於該複數圓柱孔136內。由於該限位件1335的底面直徑大於該圓柱孔136底面直徑,因此該限位件1335在該旋轉盤131的上方限定該棒體1331穿越該旋轉盤131的長短,保證每個棒體1331穿越該旋轉盤131的長短一致。該限位件1335與該旋轉盤131之間設置緩衝件(圖未示),如彈簧以在限位件1335與該旋轉盤131碰撞時起到緩衝作用。 The rotating disk 131 includes a plurality of cylindrical holes 136, and the center of the plurality of cylindrical holes 136 is The distance of the center of the rotating disk is equal. The cylindrical hole 136 has a larger or smaller diameter than the cross-sectional diameter of the rod 1331 but smaller than the bottom surface of the limiting member 1335. One end of the crystal head 1332 of the plurality of rods 1331 passes through the plurality of cylindrical holes to be received in the plurality of cylindrical holes 136, respectively. Since the diameter of the bottom surface of the limiting member 1335 is larger than the diameter of the bottom surface of the cylindrical hole 136, the limiting member 1335 defines the length of the rod 1331 passing through the rotating plate 131 above the rotating disk 131 to ensure that each of the rods 1331 passes through. The length of the rotating disk 131 is uniform. A cushioning member (not shown) is disposed between the limiting member 1335 and the rotating disc 131, such as a spring to serve as a buffer when the limiting member 1335 collides with the rotating disc 131.

該檢測盤135包括一底盤1351和複數檢測台1352。該底盤1351與該旋轉盤131平行設置,該複數檢測台1352對應該旋轉盤131的複數圓柱孔136設置於該底盤1351上。該檢測台1352的高度略小於該吸晶棒133的吸晶頭1332到該底盤1351的距離。該檢測台1352的數量可根據工作效率的要求進行固定倍數的增加或者減少。 The detection disk 135 includes a chassis 1351 and a plurality of detection stations 1352. The chassis 1351 is disposed in parallel with the rotating disk 131. The plurality of detecting holes 1352 are disposed on the chassis 1351 corresponding to the plurality of cylindrical holes 136 of the rotating disk 131. The height of the inspection station 1352 is slightly smaller than the distance from the crystal absorption head 1332 of the absorption rod 133 to the chassis 1351. The number of the detection stations 1352 can be increased or decreased by a fixed factor according to the requirements of the work efficiency.

在一種實施例中,該檢測台1352可以包括尺寸檢測台1353、第一下料台1354、第一次點亮檢測台1355、第二次點亮檢測台1356及第二下料台1357。該尺寸檢測台1353可檢測來料,即待測發光二極體是否為設定大小,其檢測方法可以利用前述列舉的方法來檢測待測發光二極體的尺寸,並且判斷是否與預設值相同,自動記錄該判斷結果。該第一下料台1354回收由該尺寸檢測台1353檢測的不符合尺寸要求的發光二極體。該第一次點亮檢測台1355對該發光二極體進行第一次點亮檢測,如能夠點亮,則由吸晶頭1332 吸取發光二極體傳送給第二輸料槽103供給貼合機構15。如不能夠點亮,發光二極體的電極可能與第一次點亮檢測台1355的電極不匹配,則該第一次點亮檢測台1355帶動位於其上的發光二極體水準旋轉180度,改變發光二極體的正負電極方位,然後該正負電極方位已改變的發光二極體由吸晶頭1332吸取進入第二次點亮檢測台1356進行點亮測試。而該第一次點亮檢測台1355自動復位,接受下個發光二極體的檢測。在第二次點亮檢測台1356進行點亮測試時如能夠點亮,則由吸晶頭1332吸取發光二極體傳送給第二輸料槽103供給貼合機構15。如果在第二次點亮檢測台1356進行點亮測試時仍然不能點亮,則由吸晶頭1332吸取發光二極體傳送給該第二下料台1357以回收。該第一下料台1354和第二下料台1357根據上述的檢測結果接收廢料,不接收合格料。 In one embodiment, the inspection station 1352 can include a size inspection station 1353, a first unloading station 1354, a first lighting detection station 1355, a second lighting detection station 1356, and a second unloading station 1357. The size detecting station 1353 can detect the incoming material, that is, whether the light emitting diode to be tested is of a set size, and the detecting method can detect the size of the light emitting diode to be tested by using the foregoing enumerated method, and determine whether it is the same as the preset value. , the judgment result is automatically recorded. The first unloading stage 1354 recovers the light-emitting diodes that are not in conformity with the size requirements detected by the size detecting station 1353. The first lighting detection station 1355 performs the first lighting detection on the light emitting diode, and if it can be lit, the liquid crystal head 1332 The sucking light-emitting diode is sent to the second feed slot 103 to supply the bonding mechanism 15. If the LED cannot be lit, the electrode of the LED may not match the electrode of the first lighting detection station 1355, and the first lighting detection station 1355 drives the LED on the LED to rotate 180 degrees. The orientation of the positive and negative electrodes of the light-emitting diode is changed, and then the light-emitting diode whose orientation of the positive and negative electrodes has been changed is sucked by the crystal head 1332 into the second lighting detection stage 1356 for the lighting test. The first lighting detection station 1355 is automatically reset to accept the detection of the next LED. When the second lighting detection stand 1356 performs the lighting test, if the light can be turned on, the light-emitting diode is taken up by the crystal head 1332 and sent to the second transfer tank 103 to supply the bonding mechanism 15. If the lighting test is still not performed when the lighting test is performed on the second lighting inspection stand 1356, the light-emitting diode is taken up by the liquid crystal head 1332 and transferred to the second discharging table 1357 for recycling. The first unloading stage 1354 and the second unloading stage 1357 receive the waste according to the above-described detection result, and do not receive the qualified material.

請一併參閱圖3及圖4,圖3係圖2所示背光源的製造設備10的貼合機構15的局部示意圖,圖4係圖2所示背光源的製造設備10的貼合機構15的另一部分的局部示意圖。貼合機構15包括自動導料器151和壓件器155,自動導料器151接收由檢測機構13傳送的發光二極體並將發光二極體植入到設置有錫膏的電路板上,壓件器155將該發光二極體壓合到電路板上。 3 and FIG. 4, FIG. 3 is a partial schematic view of the bonding mechanism 15 of the manufacturing apparatus 10 of the backlight shown in FIG. 2, and FIG. 4 is a bonding mechanism 15 of the manufacturing apparatus 10 of the backlight shown in FIG. 2. A partial schematic of another part of it. The fitting mechanism 15 includes an automatic guide 151 and a presser 155. The automatic guide 151 receives the light emitting diodes transmitted by the detecting mechanism 13 and implants the light emitting diodes on the circuit board provided with the solder paste. The presser 155 presses the light emitting diode onto the circuit board.

該自動導料器151包括轉料器1512、植入器1514和承載器1516。該轉料器1512將該檢測機構13通過第二輸料槽103提供的檢測合格的發光二極體傳送給植入器1514,植入器1514將接收的發光二極體傳送給承載器1516。可以人為設定轉料器1512每次傳送 給植入器1514發光二極體的數量,也可以人為設定植入器1514每次接收發光二極體的數量,上述數量的設定根據電路板上每單元發光二極體的需求數量。優選地,設定植入器1514每次能運送的發光二極體的數量為電路板上每單元發光二極體個數的整數倍。該承載器1516可以準確地將來料定位到預要壓合電路板的上方位置。 The automatic guide 151 includes a hopper 1512, an implanter 1514, and a carrier 1516. The hopper 1512 delivers the qualified LEDs provided by the detection mechanism 13 through the second delivery slot 103 to the implanter 1514, which delivers the received LEDs to the carrier 1516. Can manually set the hopper 1512 to transmit each time The number of light-emitting diodes for the implanter 1514 can also be artificially set by the implanter 1514 each time receiving the number of light-emitting diodes, which is set according to the required number of light-emitting diodes per unit on the circuit board. Preferably, the number of light-emitting diodes that can be transported by the implanter 1514 is set to be an integral multiple of the number of light-emitting diodes per unit on the circuit board. The carrier 1516 can accurately position the material to a position above the pre-pressed circuit board.

該轉料器1512包括移載槽1521、轉料盤1522、馬達1523和十字導軌1524。該移載槽1521呈條形並且設置於該轉料盤1522的邊緣可在轉料盤1522帶動繞轉料盤1522中心軸旋轉,轉料盤1522設置在十字導軌1524上,並且可在馬達1523的制動下在十字導軌1524上做上下及左右運動。轉料盤1522與移載槽1521連接處包括一小轉軸1529,該小轉軸1529的軸心與轉料盤1522的軸心垂直。該小轉軸1529使得該移載槽1521繞小轉軸1529中心軸旋轉。小轉軸1529帶動該移載槽1521旋轉並與轉料盤1522在馬達1523帶動下實現該移載槽1521與該第二輸料槽103對接,以接收發光二極體。接收後馬達1523帶動轉料盤1522與小轉軸1529運動,實現該移載槽1521與該植入器1514對接,以將發光二極體傳送至該植入器1514。 The hopper 1512 includes a transfer tank 1521, a transfer tray 1522, a motor 1523, and a cross rail 1524. The transfer groove 1521 is strip-shaped and disposed at an edge of the transfer tray 1522 to rotate the central axis of the rotating tray 1522 at the transfer tray 1522. The transfer tray 1522 is disposed on the cross rail 1524 and is at the motor 1523. The brakes are moved up and down and left and right on the cross rail 1524. The transfer tray 1522 and the transfer slot 1521 are connected to each other to include a small shaft 1529 whose axis is perpendicular to the axis of the transfer tray 1522. The small rotating shaft 1529 rotates the transfer groove 1521 about the central axis of the small rotating shaft 1529. The small rotating shaft 1529 drives the transfer slot 1521 to rotate and the transfer tray 1522 is driven by the motor 1523 to realize the transfer slot 1521 and the second feed slot 103 to receive the light emitting diode. After receiving, the motor 1523 drives the transfer tray 1522 and the small rotating shaft 1529 to move, and the transfer slot 1521 is docked with the implanter 1514 to transfer the LED to the implanter 1514.

植入器1514用於給承載器1516填料。優選地,該植入器1514內部包括傾斜狀的槽體,此設計可以借助重力的作用令發光二極體逐個下料。該植入器1514接收移載槽1521傳送的發光二極體,並在馬達(未標示)及導軌(未標示)的帶動下,運送到承載器1516。 優選地,該承載器1516包括與發光二極體尺寸對應的複數導槽1517,該複數導槽1517的位置可以根據電路板上預設的發光二極體的設置位置對應。該植入器1514將複數發光二極體植入該複數導槽1517。 The implanter 1514 is used to prime the carrier 1516. Preferably, the interior of the implanter 1514 includes a slanted trough body, and the design can cause the illuminating diodes to be blanked one by one by the action of gravity. The implanter 1514 receives the LEDs transmitted from the transfer slot 1521 and transports them to the carrier 1516, driven by motors (not shown) and rails (not shown). Preferably, the carrier 1516 includes a plurality of guiding channels 1517 corresponding to the size of the LED, and the position of the plurality of guiding channels 1517 can be corresponding according to the set position of the preset LEDs on the circuit board. The implanter 1514 implants a plurality of light emitting diodes into the plurality of channels 1517.

該壓件器155可在其導軌1557的帶動下運動到該承載器1516的上方,對準該複數導槽1517進行壓合。優選地,該壓件器155包括一氣缸,利用氣缸的伸縮腳(未標示)直接接觸壓合對位好的發光二極體,使其貼合在設置有錫膏的電路板上。每次在完成貼合步驟時,可以設置複數壓件器155對整排的將發光二極體進行貼合,如此,可以根據需要完成一個發光條,或者一片發光板的貼合。 The presser 155 can be moved by the guide rail 1557 to the upper side of the carrier 1516, and the plurality of guide grooves 1517 are aligned for pressing. Preferably, the presser 155 includes a cylinder, and the telescopic legs of the cylinders are directly contacted with the telescopic legs (not labeled) of the cylinders to be attached to the circuit board provided with the solder paste. Each time the bonding step is completed, the plurality of stampers 155 can be disposed to fit the entire row of the LEDs, so that one of the strips or one of the strips can be completed as needed.

該運輸機構17用於傳送電路板到該貼合機構15處完成發光二極體的貼合。該運輸機構17包括若干運送單元170與一送電路板與貼合機構15完成發光二極體組裝的運送機構179,每個運動單元170包括運送帶171、運送馬達172和運送軸173。該運送馬達172帶動該運送軸173旋轉,該運送帶171套設於該運送軸173上,並可在運送軸173的帶動下運送電路板。該運送機構179包括設置於該運動單元170下方的條軌175和伺服馬達177。該運送機構179的條軌175和伺服馬達177可將每個運送單元170運送到承載器1516的上方,使電路板與承載器1516的對位,並帶動電路板成排的進行發光二極體的逐行勻速壓合。 The transport mechanism 17 is configured to transfer the circuit board to the bonding mechanism 15 to complete the bonding of the light emitting diodes. The transport mechanism 17 includes a plurality of transport units 170 and a transport circuit board and a mating mechanism 15 for completing the assembly of the light-emitting diodes. Each of the motion units 170 includes a transport belt 171, a transport motor 172, and a transport shaft 173. The transport motor 172 drives the transport shaft 173 to rotate. The transport belt 171 is sleeved on the transport shaft 173 and can be transported by the transport shaft 173. The transport mechanism 179 includes a rail 175 and a servo motor 177 disposed below the motion unit 170. The rail 175 of the transport mechanism 179 and the servo motor 177 can transport each transport unit 170 above the carrier 1516, align the circuit board with the carrier 1516, and drive the circuit board into rows for the light-emitting diode. The line is pressed at a constant speed.

本發明不限上述實施方式,如對檢測機構13改進進行對電阻 的測試,電容的測試等各種電子元件的測試,則該背光源的製造設備10可對各種電子元件進行電路板的貼合。如背光源的製造設備10對電阻進行電路板的貼合,則對檢測機構13更改為利用萬能表檢測電阻的阻值,如背光源的製造設備10對連接器進行電路板的貼合,則對檢測機構13更改為利用CCD檢測連接器的尺寸或者型號。 The present invention is not limited to the above embodiments, such as improving the resistance of the detecting mechanism 13 The test of the various electronic components such as the test of the capacitor, the test of the capacitor, and the like, the manufacturing apparatus 10 of the backlight can perform the bonding of the board to various electronic components. If the manufacturing device 10 of the backlight performs the bonding of the circuit board to the resistor, the detection mechanism 13 is changed to use the resistance of the universal meter to detect the resistance. For example, if the manufacturing device 10 of the backlight performs the bonding of the board to the connector, The detection mechanism 13 is changed to use the CCD to detect the size or model of the connector.

再者,在另一種實施例中,該植入器1514將複數發光二極體植入該複數導槽1517下方的電路板上,並由該複數導槽1517為複數發光二極體定位。 Furthermore, in another embodiment, the implanter 1514 implants a plurality of light-emitting diodes on a circuit board below the plurality of channels 1517, and the plurality of light-emitting diodes are positioned by the plurality of channels 1517.

請參閱圖5,以發光二極體為例介紹本發明的背光源的製造方法及製造設備運作原理及步驟:上料:提供多顆發光二極體;散裝的發光二極體在振動盤的振動下按照一定方向的呈隊形排列並被該第一輸料槽101傳送給該檢測機構13;檢測:將多顆發光二極體進行檢測;提供一檢測機構13檢測由該上料機構11提供的發光二極體,將能符合檢測條件的發光二極體傳送給貼合機構15;該檢測機構13的吸晶棒133上的吸晶頭1332吸取一顆由第一輸料槽101傳送的發光二極體並帶動該發光二極體旋轉到尺寸檢測台1353進行尺寸型號的檢測,並記錄檢測結果;吸晶頭1332吸取尺寸檢測台1353檢測後的發光二極體並旋轉到第一下料台 1354,該第一下料台1354根據對發光二極體的尺寸型號的檢測結果,接收不合格的發光二極體,而不接收合格的發光二極體;吸晶頭1332從該尺寸檢測台1353合格的發光二極體進行第一次點亮檢測,而被該第一下料台1354接收的不合格的發光二極體所對應的吸晶頭1332之後空轉,直到返回第一輸料槽101並重新吸取第一輸料槽101傳送的發光二極體;當第一次點亮檢測台1355接收吸晶頭1332傳送的尺寸合格的發光二極體後為該發光二極體的電極提供電能,如果能點亮則由吸晶頭1332傳送至第二輸料槽103,如果不能點亮則該第一次點亮檢測台1355水準自轉180度,進而帶動其上的發光二極體進行極性旋轉,改變了極性的發光二極體由吸晶頭1332吸取進入第二次點亮檢測台1356進行點亮測試。在第二次點亮檢測台1356進行點亮測試時如能夠點亮,則由吸晶頭1332吸取發光二極體傳送給第二輸料槽103供給貼合機構15。如果在第二次點亮檢測台1356進行點亮測試時仍然不能點亮,則由吸晶頭1332吸取發光二極體傳送給該第二下料台1357以回收。該第一下料台1354和第二下料台1357根據上述的檢測結果接收廢料,不接收合格料。 Referring to FIG. 5 , a method for manufacturing a backlight and a working principle and a manufacturing device of the backlight of the present invention are described by taking a light-emitting diode as an example: feeding: providing a plurality of light-emitting diodes; and the bulk of the light-emitting diodes in the vibration plate Aligned in a certain direction in a certain direction under vibration and transmitted to the detecting mechanism 13 by the first feeding slot 101; detecting: detecting a plurality of light emitting diodes; providing a detecting mechanism 13 for detecting the feeding mechanism 11 The light-emitting diode transmits the light-emitting diode that can meet the detection condition to the bonding mechanism 15; the crystal-absorbing head 1332 on the absorption rod 133 of the detecting mechanism 13 picks up one of the first transfer tanks 101. The light-emitting diode drives the light-emitting diode to rotate to the size detecting station 1353 for detecting the size and type, and records the detection result; the crystal-absorbing head 1332 sucks the light-emitting diode detected by the size detecting station 1353 and rotates to the first one. Material table 1354, the first unloading station 1354 receives the unqualified light-emitting diode according to the detection result of the size and type of the light-emitting diode, and does not receive the qualified light-emitting diode; the crystal-injecting head 1332 is from the size detecting station 1353 qualified light-emitting diodes perform the first lighting detection, and the crystal-absorbing heads 1332 corresponding to the unqualified light-emitting diodes received by the first unloading stage 1354 are idling until after returning to the first feeding trough And re-absorbing the light-emitting diodes conveyed by the first feeding tank 101; providing the electrodes of the light-emitting diodes after the first lighting detecting station 1355 receives the qualified light-emitting diodes transmitted by the crystal-absorbing heads 1332 The electric energy, if it can be lighted, is transmitted from the crystal atomizing head 1332 to the second feeding trough 103. If it is not lit, the first lighting detecting station 1355 is rotated by 180 degrees, thereby driving the LEDs thereon. The polarity rotation, the polarity-changing light-emitting diode is sucked by the crystal head 1332 into the second lighting detection stage 1356 for the lighting test. When the second lighting detection stand 1356 performs the lighting test, if the light can be turned on, the light-emitting diode is taken up by the crystal head 1332 and sent to the second transfer tank 103 to supply the bonding mechanism 15. If the lighting test is still not performed when the lighting test is performed on the second lighting inspection stand 1356, the light-emitting diode is taken up by the liquid crystal head 1332 and transferred to the second discharging table 1357 for recycling. The first unloading stage 1354 and the second unloading stage 1357 receive the waste according to the above-described detection result, and do not receive the qualified material.

貼合:提供一承載器1514,將通過檢測並且合格的多顆發光二極體填入該承載器1514內;提供一貼合機構15把由經由該檢測機構13檢測合格後的發光二極體貼合到電路板上;該貼合機構15的轉料盤1522在馬達1523的驅動下在十字導軌1524上運動,運動到該第二輸料槽103的鄰近 位置,小轉軸1529調整該移載槽1521的旋轉角度,使該移載槽1521的一端與該第二輸料槽103對接,進而接收第二輸料槽103傳送的發光二極體。該轉料盤1522和小轉軸1529帶動該移載槽1521進行旋轉,使該移載槽1521傾斜與植入器1514對接,並將其承載的發光二極體傳送給植入器1514。 Alignment: a carrier 1514 is provided, and a plurality of light-emitting diodes that have passed the detection and pass are filled into the carrier 1514; and a bonding mechanism 15 is provided to affix the light-emitting diodes that have passed the detection by the detecting mechanism 13 Coupling to the circuit board; the transfer tray 1522 of the bonding mechanism 15 is moved on the cross rail 1524 by the motor 1523, and moved to the vicinity of the second delivery slot 103. The position, the small rotating shaft 1529 adjusts the rotation angle of the transfer groove 1521, and the one end of the transfer groove 1521 is docked with the second feeding groove 103, and further receives the light emitting diode transmitted by the second feeding groove 103. The transfer tray 1522 and the small rotating shaft 1529 drive the transfer slot 1521 to rotate, and the transfer slot 1521 is inclined to interface with the implanter 1514, and the light-emitting diode carried thereon is transmitted to the implanter 1514.

提供一電路板,將承載器1514對準電路板預設發光二極體的位置。該電路板上預先設置發光二極體的位置,在相應位置處設置電極,並在該電極處設置錫膏。 A circuit board is provided to align the carrier 1514 with the position of the circuit board preset light-emitting diode. The position of the light-emitting diode is preset on the circuit board, an electrode is disposed at the corresponding position, and a solder paste is disposed at the electrode.

請一併參閱圖6至圖9,係植入器1514給其承載器1516填料,其壓件器155將發光二極體壓合到電路板上的流程示意圖。該植入器1514包括馬達及導軌(未標示)。該植入器1514接收發光二極體後在馬達及導軌的帶動下,運動到該承載器1516的上方,將發光二極體沿著一定的方向填充到該承載器1516的複數導槽1517裏。完成電路板的一個單元如一排的填充後,該植入器1514在馬達的驅動下移開,露出該承載器1516的上方空間。 Referring to FIG. 6 to FIG. 9 together, the implanter 1514 is filled with a carrier 1516, and the presser 155 presses the LEDs onto the circuit board. The implanter 1514 includes a motor and a rail (not labeled). The implanter 1514 receives the light-emitting diode and moves it to the upper side of the carrier 1516 under the driving of the motor and the guide rail, and fills the light-emitting diode in a certain direction into the plurality of guide grooves 1517 of the carrier 1516. . After completing the filling of a unit of the circuit board, such as a row, the implanter 1514 is removed by the motor to expose the space above the carrier 1516.

施加一外力於該發光二極體,使其貼合在該電路板上。 An external force is applied to the light emitting diode to be attached to the circuit board.

該壓件器155包括馬達和導軌(未標示),該壓件器155在其馬達和導軌的帶動下運動到該承載器1516的上方,對準每個導槽1517裏的發光二極體進行壓合,發光二極體受到擠壓後下沉,與電路板完成貼合。 The presser 155 includes a motor and a guide rail (not shown) that is moved by the motor and the guide rail to the carrier 1516 to align the light-emitting diodes in each of the guide grooves 1517. Pressing, the light-emitting diode is squeezed and then sinks, and the circuit board is finished.

運輸:提供一運輸機構17運輸電路板在該貼合機構15處完成 發光二極體的貼合。 Transportation: providing a transport mechanism 17 transport circuit board is completed at the fitting mechanism 15 The bonding of the light-emitting diodes.

電路板在該運送帶171運送到伺服馬達177和條軌175上方並在伺服馬達177和條軌175的帶動下,將電路板運送到與承載器對應的位置,進行每個單元的貼合,由伺服馬達177的驅動下,等速度沿某方向運動,完成整片電路板的貼合。 The circuit board is transported above the servo motor 177 and the rail 175 by the transport belt 171, and driven by the servo motor 177 and the rail 175, the circuit board is transported to a position corresponding to the carrier, and the fitting of each unit is performed. Driven by the servo motor 177, the iso-speed moves in a certain direction to complete the bonding of the entire circuit board.

應用上述背光源的製造方法及製造設備將發光二極體自動貼合於電路板上,多顆發光二極體同時貼附,提高了生產效率,又由於在貼合前進行了工作測試並篩選出合格的發光二極體然後將合格的發光二極體進行貼合,使每個發光二極體都能正常工作,不用返工,提高了產品品質。 The light-emitting diode is automatically attached to the circuit board by using the above-mentioned backlight manufacturing method and manufacturing equipment, and a plurality of light-emitting diodes are attached at the same time, thereby improving production efficiency, and performing work test and screening before bonding. The qualified light-emitting diodes are then attached to the qualified light-emitting diodes, so that each of the light-emitting diodes can work normally without rework, thereby improving product quality.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,故本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.

10‧‧‧背光源的製造設備 10‧‧‧Backlight manufacturing equipment

11‧‧‧上料機構 11‧‧‧Feeding agency

13‧‧‧檢測機構 13‧‧‧Test institutions

15‧‧‧貼合機構 15‧‧‧Fitting organization

17‧‧‧運輸機構 17‧‧‧Transportation agencies

101‧‧‧第一輸料槽 101‧‧‧First feed trough

103‧‧‧第二輸料槽 103‧‧‧Second feed trough

112‧‧‧料斗 112‧‧‧ hopper

113‧‧‧螺旋軌道 113‧‧‧Spiral track

114‧‧‧出料口 114‧‧‧Outlet

130‧‧‧旋轉台 130‧‧‧Rotary table

135‧‧‧檢測盤 135‧‧‧Detection disk

131‧‧‧旋轉盤 131‧‧‧ rotating disk

132‧‧‧旋轉軸 132‧‧‧Rotary axis

133‧‧‧吸晶棒 133‧‧‧Inhalation rod

136‧‧‧圓柱孔 136‧‧‧ cylindrical hole

137‧‧‧真空管 137‧‧‧vacuum tube

151‧‧‧自動導料器 151‧‧‧Automatic feeder

155‧‧‧壓件器 155‧‧‧Parts

171‧‧‧運送帶 171‧‧‧Transportation belt

172‧‧‧運送馬達 172‧‧‧Carriage motor

173‧‧‧運送軸 173‧‧‧Transportation shaft

170‧‧‧運送單元 170‧‧‧Transportation unit

175‧‧‧條軌 175‧‧‧ Track

177‧‧‧伺服馬達 177‧‧‧Servo motor

179‧‧‧運送機構 179‧‧‧Transportation agency

1331‧‧‧棒體 1331‧‧‧rod

1332‧‧‧吸晶頭 1332‧‧‧Sucker head

1335‧‧‧限位件 1335‧‧‧Limited parts

134‧‧‧制動器 134‧‧‧ brake

1351‧‧‧底盤 1351‧‧‧Chassis

1352‧‧‧檢測台 1352‧‧‧Testing station

1353‧‧‧尺寸檢測台 1353‧‧‧Size inspection table

1354‧‧‧第一下料台 1354‧‧‧First unloading station

1355‧‧‧第一次點亮檢測台 1355‧‧‧The first lighting test stand

1356‧‧‧第二次點亮檢測台 1356‧‧‧Second lighting test bench

1357‧‧‧第二下料台 1357‧‧‧Second loading station

1512‧‧‧轉料器 1512‧‧‧Transfer

1514‧‧‧植入器 1514‧‧‧ implanter

1516‧‧‧承載器 1516‧‧‧carrier

1517‧‧‧導槽 1517‧‧‧ Guide slot

1557‧‧‧導軌 1557‧‧‧rail

1521‧‧‧移載槽 1521‧‧‧Transfer trough

1522‧‧‧轉料盤 1522‧‧‧Transfer tray

1523‧‧‧馬達 1523‧‧‧Motor

1524‧‧‧十字導軌 1524‧‧‧ cross rail

1529‧‧‧小轉軸 1529‧‧‧Small shaft

圖1係一種背光源的製造設備一較佳實施方式的立體示意圖。 1 is a perspective view of a preferred embodiment of a manufacturing apparatus for a backlight.

圖2係背光源的製造設備的檢測機構的立體示意圖。 2 is a perspective view of a detecting mechanism of a manufacturing apparatus of a backlight.

圖3係圖2所示背光源的製造設備的貼合機構的局部示意圖。 3 is a partial schematic view showing a fitting mechanism of a manufacturing apparatus of the backlight shown in FIG. 2.

圖4係圖2所示背光源的製造設備的貼合機構的另一部分的局部示意圖。 4 is a partial schematic view showing another portion of the bonding mechanism of the manufacturing apparatus of the backlight shown in FIG. 2.

圖5係本發明背光源的製造方法步驟流程圖。 Fig. 5 is a flow chart showing the steps of a method for manufacturing a backlight of the present invention.

圖6至圖9係貼合機構給其承載器填料,其壓件器將發光二極體壓合到電路板上的流程示意圖。 6 to FIG. 9 are schematic diagrams showing the flow of the carrier to the carrier, and the presser for pressing the LED to the circuit board.

10‧‧‧背光源的製造設備 10‧‧‧Backlight manufacturing equipment

11‧‧‧上料機構 11‧‧‧Feeding agency

13‧‧‧檢測機構 13‧‧‧Test institutions

15‧‧‧貼合機構 15‧‧‧Fitting organization

17‧‧‧運輸結構 17‧‧‧Transport structure

101‧‧‧第一輸料槽 101‧‧‧First feed trough

103‧‧‧第二輸料槽 103‧‧‧Second feed trough

112‧‧‧料斗 112‧‧‧ hopper

113‧‧‧螺旋軌道 113‧‧‧Spiral track

114‧‧‧出料口 114‧‧‧Outlet

Claims (15)

一種背光源的製造方法,是在一可將發光二極體自動化地組裝於電路板的製造設備中執行以下步驟:提供多顆發光二極體;將多顆發光二極體進行檢測;提供一承載器,將通過檢測並且合格的多顆發光二極體填入該承載器內;提供一電路板,將該承載器對準電路板預設發光二極體的位置;施加一外力於該發光二極體,使其貼合在該電路板上。 A manufacturing method of a backlight is to perform the following steps in a manufacturing apparatus capable of automatically assembling a light emitting diode to a circuit board: providing a plurality of light emitting diodes; detecting a plurality of light emitting diodes; providing one a carrier that fills the carrier with a plurality of light-emitting diodes that are inspected and qualified; a circuit board is provided to align the carrier with the position of the preset light-emitting diode of the circuit board; and an external force is applied to the light-emitting device The diode is attached to the circuit board. 如申請專利範圍第1項所述之背光源的製造方法,其中提供一上料機構,用以將散裝的多顆發光二極體按照預定方向排列後待測。 The method for manufacturing a backlight according to claim 1, wherein a loading mechanism is provided for arranging the plurality of light-emitting diodes in a predetermined direction to be tested. 如申請專利範圍第1項所述之背光源的製造方法,其中發光二極體的檢測包括尺寸、型號、極性或點亮至少其中之一。 The method of manufacturing a backlight according to claim 1, wherein the detecting of the light emitting diode comprises at least one of size, model, polarity, or lighting. 如申請專利範圍第3項所述之背光源的製造方法,其中該發光二極體的尺寸或型號檢測方式,是應用電荷耦合裝置攝取待檢測的發光二極體的影像,並與預設影像做比較,進而得出檢測的發光二極體的尺寸或者型號是否符合要求。 The method for manufacturing a backlight according to claim 3, wherein the size or type of the light emitting diode is detected by using a charge coupled device to capture an image of the light emitting diode to be detected, and the preset image. A comparison is made to determine whether the size or model of the detected light-emitting diode meets the requirements. 如申請專利範圍第3項所述之背光源的製造方法,其中該發光二極體的尺寸或型號另一檢測方式,是從不同方向將待檢測的發光二極體的各表面卡位,計算待檢測的發光二極體相對表面的距離,將此距離與預設數值做比較,進而得出檢測的發光二極體的尺寸或者型號是否符合要求。 The method for manufacturing a backlight according to claim 3, wherein another detection method of the size or model of the light emitting diode is to calculate the position of each surface of the light emitting diode to be detected from different directions, and calculate The distance from the opposite surface of the light-emitting diode to be detected is compared with a preset value to determine whether the size or model of the detected light-emitting diode meets the requirements. 如申請專利範圍第3項所述之背光源的製造方法,其中該發光二極體的極性檢測方式,是將極性不符合預定方位的發光二極體調整為極性符合預定方位。 The method for manufacturing a backlight according to claim 3, wherein the polarity detecting method of the light emitting diode is to adjust the light emitting diode whose polarity does not conform to a predetermined orientation to a polarity conforming to a predetermined orientation. 如申請專利範圍第3項所述之背光源的製造方法,其中該發光二極體的點亮檢測方式,是對極性檢測合格的發光二極 體進行點亮檢測,淘汰不能通過點亮檢測的發光二極體。 The method for manufacturing a backlight according to the third aspect of the invention, wherein the light-emitting diode is illuminated and the light-emitting diode is qualified for polarity detection. The body performs lighting detection, and the light-emitting diode that cannot be detected by lighting is eliminated. 一種適用於申請專利範圍第1項所述的背光源的製造方法的製造設備,其包括上料機構、檢測機構及貼合機構以將發光二極體自動化地組裝於電路板,該上料機構將散裝的電子元件按照預定方向排列後待測;檢測機構對電子元件進行檢測;貼合機構包括一承載器與一壓件器;該承載器收容檢測合格的電子元件;承載器與一待組裝的電路板預設電子元件的位置對應;該壓件器將該承載器內的電子元件與電路板完成組裝。 A manufacturing apparatus suitable for a method of manufacturing a backlight according to claim 1, comprising a loading mechanism, a detecting mechanism, and a bonding mechanism to automatically assemble the light emitting diode to the circuit board, the loading mechanism The bulk electronic components are arranged in a predetermined direction and are to be tested; the detecting mechanism detects the electronic components; the bonding mechanism comprises a carrier and a presser; the carrier accommodates the qualified electronic components; the carrier and a device to be assembled The circuit board presets the position of the electronic component; the presser assembles the electronic component in the carrier with the circuit board. 如申請專利範圍第8項所述之製造設備,其中該製造設備更包括一運輸機構以運輸該電路板完成與電子元件的組裝。 The manufacturing apparatus of claim 8, wherein the manufacturing apparatus further comprises a transport mechanism for transporting the circuit board to complete assembly with the electronic component. 如申請專利範圍第8或9項所述之製造設備,其中該上料機構為振動盤,該振動盤包括料斗、螺旋軌道及出料口,該螺旋軌道圍繞該料斗的內壁,該出料口位於該螺旋軌道的上部引出端,該振動盤將電子元件沿著螺旋軌道由低到高移動,並自動排列定向,直至上部的出料口,使電子元件按照預定方向排列傳送給檢測機構。 The manufacturing apparatus of claim 8 or 9, wherein the loading mechanism is a vibrating plate, the vibrating plate comprises a hopper, a spiral track and a discharge opening, the spiral track surrounding an inner wall of the hopper, the discharging The port is located at the upper lead end of the spiral track. The vibrating plate moves the electronic components from low to high along the spiral track and automatically orients them until the upper discharge port, so that the electronic components are arranged in a predetermined direction and transmitted to the detecting mechanism. 如申請專利範圍第8或9項所述之製造設備,其中電子元件為發光二極體,該檢測機構包括吸晶棒、尺寸檢測台、第一下料台、第一次點亮檢測台、第二次點亮檢測台及第二下料台,吸晶棒吸取由上料機構提供的發光二極體,按照上述檢測台的順序,進行檢測。 The manufacturing device of claim 8 or 9, wherein the electronic component is a light emitting diode, the detecting mechanism comprises an inhalation bar, a size detecting station, a first unloading table, a first lighting detecting station, The second lighting inspection table and the second material discharging table are used, and the liquid absorption diode sucks the light emitting diodes provided by the loading mechanism, and performs detection according to the order of the above detecting stations. 如申請專利範圍第11項所述之製造設備,其中吸晶棒吸取發光二極體進行點亮測試第一次點亮檢測,如能夠點亮,則由吸晶棒吸取發光二極體傳送給貼合機構,如不能夠點亮,則該第一次點亮檢測台水準自轉,改變了極性的發光二極體在吸晶棒吸取下進入第二次點亮檢測台進行點亮測試,在第二次點亮檢測台進行點亮測試時如能夠點亮,則由吸晶棒吸取發光 二極體傳送給貼合機構,如果在第二次點亮檢測台進行點亮測試時仍然不能點亮,則由吸晶棒吸取發光二極體傳送給該第二下料台以回收。 The manufacturing apparatus according to claim 11, wherein the liquid absorption rod sucks the light emitting diode to perform the first lighting detection of the lighting test, and if it can be lit, the light absorption diode is sucked by the liquid absorption rod to be transmitted to the light emitting diode. If the bonding mechanism fails to illuminate, the first time the lighting detection level is rotated, and the polarity-changing light-emitting diode enters the second lighting detection station for the lighting test under the suction of the suction rod. When the second lighting detection station performs the lighting test, if it can be lit, the light is absorbed by the absorption rod. The diode is transferred to the bonding mechanism. If the lighting test is still not performed when the lighting test is performed for the second time, the light-emitting diode is sucked by the absorption rod to be transferred to the second discharging station for recycling. 如申請專利範圍第12項所述之製造設備,其中第一次點亮檢測台包括對發光二極體的極性進行檢測,其可帶動其上的發光二極體進行轉動,進而改變發光二極體的極性。 The manufacturing apparatus of claim 12, wherein the first lighting detection station comprises detecting the polarity of the light emitting diode, which can drive the light emitting diode thereon to rotate, thereby changing the light emitting diode The polarity of the body. 如申請專利範圍第12項所述之製造設備,其中吸晶棒與一真空管相連接,該真空管為該吸晶棒提供吸附力。 The manufacturing apparatus of claim 12, wherein the suction rod is connected to a vacuum tube, and the vacuum tube provides an adsorption force for the absorption rod. 如申請專利範圍第8或9項所述之製造設備,其中承載器包括與電子元件尺寸對應的導槽,該導槽與該電路板上預設的電子元件的位置對應,該導槽收容該電子元件。 The manufacturing apparatus of claim 8 or 9, wherein the carrier comprises a guiding slot corresponding to the size of the electronic component, the guiding slot corresponding to a position of a predetermined electronic component on the circuit board, the guiding slot receiving the guiding slot Electronic component.
TW99115208A 2010-05-12 2010-05-12 Method and equipment for manufacturing the backlight TWI407851B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99115208A TWI407851B (en) 2010-05-12 2010-05-12 Method and equipment for manufacturing the backlight

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99115208A TWI407851B (en) 2010-05-12 2010-05-12 Method and equipment for manufacturing the backlight

Publications (2)

Publication Number Publication Date
TW201141331A TW201141331A (en) 2011-11-16
TWI407851B true TWI407851B (en) 2013-09-01

Family

ID=46760504

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99115208A TWI407851B (en) 2010-05-12 2010-05-12 Method and equipment for manufacturing the backlight

Country Status (1)

Country Link
TW (1) TWI407851B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106938255A (en) * 2017-04-28 2017-07-11 扬州爱迪秀自动化科技有限公司 Chip testing classifier device people
CN112788940A (en) * 2019-11-07 2021-05-11 北京小米移动软件有限公司 Production system and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5982092A (en) * 1997-10-06 1999-11-09 Chen; Hsing Light Emitting Diode planar light source with blue light or ultraviolet ray-emitting luminescent crystal with optional UV filter
TWI288281B (en) * 2006-08-15 2007-10-11 Au Optronics Corp Backlight source
TW200813552A (en) * 2006-09-05 2008-03-16 Ind Tech Res Inst Color backlight device and liquid crystal display thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5982092A (en) * 1997-10-06 1999-11-09 Chen; Hsing Light Emitting Diode planar light source with blue light or ultraviolet ray-emitting luminescent crystal with optional UV filter
TWI288281B (en) * 2006-08-15 2007-10-11 Au Optronics Corp Backlight source
TW200813552A (en) * 2006-09-05 2008-03-16 Ind Tech Res Inst Color backlight device and liquid crystal display thereof

Also Published As

Publication number Publication date
TW201141331A (en) 2011-11-16

Similar Documents

Publication Publication Date Title
CN102221161B (en) Method and equipment for manufacturing backlight source
CN1159594C (en) Horizontal transfer test handler
CN209239466U (en) A kind of automation mobile phone assembling production equipment
CN108855962B (en) A detection machine that is used for pressing in electric ceramic particle capacitive tool board
KR101338181B1 (en) Device Inspection Apparatus
CN115743720B (en) Screening equipment and screening method
CN108494071A (en) Mobile power mechanized production system
CN211281608U (en) Inductance automatic test spouts a yard equipment for packing
CN105327865A (en) Processing and separating device for LED antique lamps good in lighting effect
CN114985294B (en) Full-automatic chip detection equipment
KR20110013904A (en) Apparatus and method of mounting electronic parts
CN219216741U (en) Full-automatic chip detection disc arranging machine
CN106623001B (en) A kind of automation preliminary filling and test equipment
TWI407851B (en) Method and equipment for manufacturing the backlight
CN114950991A (en) Detection mechanism and corresponding IC chip detection device
CN214150485U (en) Integrated detection equipment
KR101216365B1 (en) Apparatus for handling device and device transferring method
CN112083013A (en) Integrated visual detection equipment
CN219173393U (en) Bulk vibration feeding, detecting and classifying equipment
CN215035208U (en) Assembly equipment for water valve control head
CN211887970U (en) Automatic chip appearance inspection device
CN210899083U (en) SMD type resonator quartz wafer appearance detection equipment
CN109348215B (en) Full-automatic vision inspection machine
CN208940131U (en) Full-automatic vision detection machine
CN218486605U (en) Full-automatic capacitor welding quality detection and material receiving equipment