CN211887970U - Automatic chip appearance inspection device - Google Patents
Automatic chip appearance inspection device Download PDFInfo
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- CN211887970U CN211887970U CN201921847108.9U CN201921847108U CN211887970U CN 211887970 U CN211887970 U CN 211887970U CN 201921847108 U CN201921847108 U CN 201921847108U CN 211887970 U CN211887970 U CN 211887970U
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- chip
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- electric putter
- push rod
- appearance
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Abstract
The utility model discloses an automatic outward appearance device that inspects of chip, including braced frame, first detection camera lens and second detection camera lens, the shaping of braced frame below has the groove, braced frame is U type structure, cross inslot top one side and have first electric putter through the screw connection, there is first detection camera lens first electric putter below through the screw connection, first electric putter one side is provided with second electric putter, second electric putter with braced frame passes through the screw connection. Has the advantages that: the utility model discloses can be when the chip of magazine or film dish top flows through second detection camera lens, detect the camera lens through the second and go on rechecking to the chip that the letter sorting finishes, and then can improve the quality of chip inspection, simultaneously, realization that can automize can improve letter sorting efficiency to the visual inspection and the letter sorting operation of chip.
Description
Technical Field
The utility model relates to a chip visual inspection technical field, concretely relates to chip automatic check outward appearance device.
Background
Chips are a general term for semiconductor device products, and are a way in electronics to miniaturize circuits (including primarily semiconductor devices, including passive components, etc.) and are often fabricated on the surface of a semiconductor wafer. In the production process of chips, the appearance of the chips needs to be checked to pick out defective products.
But present chip visual inspection device is examining the back that finishes to the chip, mostly does not set up the recheck device, has some to omit in the inspection process, influences the yields of chip production, simultaneously, mostly adopts manually to go on when checking the letter sorting, sorts the efficiency lower.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
In order to overcome prior art not enough, present a chip automatic check outward appearance device, solved current chip outward appearance inspection device and examine the back that finishes to the chip, mostly do not set up the reinspection device, have the part to omit in the inspection process, influence the yields of chip production to and mostly adopt manual going on when checking the letter sorting, the lower problem of letter sorting efficiency.
(II) technical scheme
The utility model discloses a following technical scheme realizes: the utility model provides an automatic outward appearance device of examining of chip, including braced frame, first detection camera lens and second detection camera lens, the shaping of braced frame below has the groove, braced frame is U type structure, it has first electric putter through the screw connection to cross inslot top one side, there is first electric putter below through the screw connection first detection camera lens, first electric putter one side is provided with second electric putter, second electric putter with braced frame passes through the screw connection, there is the second detection camera lens second electric putter below through the screw connection, first detection camera lens with second detection camera lens is the CCD camera lens.
By adopting the technical scheme, the chip appearance above the material box or the film plate can be automatically checked through the first detection lens, then information is fed back to the PLC, the sorting sucker is controlled to move to adsorb the chip to the waste product placing box, and then when the chip above the material box or the film plate flows through the second detection lens, the chip after sorting is rechecked through the second detection lens, so that the chip checking quality can be improved.
Furthermore, a transparent glass plate is connected to one side wall of the supporting frame through a clamping groove, and a PLC (programmable logic controller) is connected to one side of the transparent glass plate through a screw.
By adopting the technical scheme, the inside dynamic state of the inspection device can be observed through the transparent glass plate.
Furthermore, a sliding seat is arranged between the first electric push rod and the second electric push rod, and the sliding seat is connected with the supporting frame through a guide rail.
By adopting the technical scheme, the sliding seat can be ensured to slide below the through groove.
Furthermore, the middle part of the sliding seat is connected with a lead screw through threads, one end part of the lead screw is connected with a support in a rolling manner, and the support is connected with the supporting frame through screws.
Furthermore, the other end of the lead screw is connected with a stepping motor through a coupler, and the stepping motor is connected with the supporting frame through a bolt.
Through adopting above-mentioned technical scheme, step motor rotates, drives the lead screw rotates, and then drives the slide is along the lead screw removes.
Furthermore, a lifting push rod is arranged below the sliding seat and connected with the sliding seat through screws.
By adopting the technical scheme, the lifting push rod mainly controls the sorting sucker seat to move up and down.
Furthermore, a sorting sucker is arranged below the lifting push rod and connected with the lifting push rod through a screw.
Through adopting above-mentioned technical scheme, the letter sorting sucking disc mainly is used for adsorbing the chip and releases the operation, and then sorts unqualified chip, and the realization that can automize can improve letter sorting efficiency to the visual inspection and the letter sorting operation of chip, labour saving and time saving.
(III) advantageous effects
Compared with the prior art, the utility model, following beneficial effect has:
1. in order to solve the problems that after the existing chip appearance inspection device finishes the inspection of the chip, most of the existing chip appearance inspection devices are not provided with a rechecking device, and part of the chips are omitted in the inspection process to influence the yield of chip production, the utility model can recheck the sorted chip through the second detection lens when the chip above the material box or the film tray flows through the second detection lens, thereby improving the quality of chip inspection;
2. for solving current chip visual inspection device and mostly adopting manual going on when checking the letter sorting, the lower problem of letter sorting efficiency, the utility model discloses realization that can automize can improve letter sorting efficiency to the visual inspection and the letter sorting operation of chip, labour saving and time saving.
Drawings
Fig. 1 is a front view of an apparatus for automatically inspecting appearance of a chip according to the present invention;
fig. 2 is a front cross-sectional view of an apparatus for automatically inspecting appearance of a chip according to the present invention;
fig. 3 is a left side cross-sectional view of an apparatus for automatically inspecting an appearance of a chip according to the present invention.
The reference numerals are explained below:
1. a support frame; 2. a transparent glass plate; 3. a PLC controller; 4. passing through a groove; 5. a first electric push rod; 6. a first detection lens; 7. a second electric push rod; 8. a second detection lens; 9. a stepping motor; 10. a lead screw; 11. a slide base; 12. a support; 13. a lifting push rod; 14. and (5) sorting the suckers.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1-3, the device for automatically inspecting the appearance of a chip in this embodiment includes a supporting frame 1, a first inspection lens 6 and a second inspection lens 8, a through-groove 4 is formed below the supporting frame 1, the supporting frame 1 is of a U-shaped structure, a first electric push rod 5 is connected to one side of the through-groove 4 through a screw, the first inspection lens 6 is connected to the lower side of the first electric push rod 5 through a screw, a second electric push rod 7 is arranged on one side of the first electric push rod 5, the second electric push rod 7 is connected to the supporting frame 1 through a screw, a second inspection lens 8 is connected to the lower side of the second electric push rod 7 through a screw, the first inspection lens 6 and the second inspection lens 8 are CCD lenses, the appearance of the chip above a material box or a film tray can be automatically inspected through the first inspection lens 6, and then information is fed back to the PLC controller 3, the chip is adsorbed to the waste product by controlling the sorting sucker 14 to move, and then when the chip above the material box or the film plate flows through the second detection lens 8, the sorted chip is rechecked through the second detection lens 8, so that the chip inspection quality can be improved.
As shown in fig. 1 to 3, in this embodiment, a transparent glass plate 2 is connected to a side wall of a supporting frame 1 through a clamping groove, a PLC controller 3 is connected to one side of the transparent glass plate 2 through a screw, the inside dynamic state of the inspection apparatus can be observed through the transparent glass plate 2, a sliding seat 11 is disposed between a first electric push rod 5 and a second electric push rod 7, and the sliding seat 11 is connected to the supporting frame 1 through a guide rail, so that the sliding seat 11 can be ensured to slide below in the through groove 4.
As shown in fig. 2-3, in this embodiment, a screw rod 10 is connected to the middle of a slide 11 through a screw thread, a support 12 is connected to one end of the screw rod 10 in a rolling manner, the support 12 is connected to a support frame 1 through a screw, the other end of the screw rod 10 is connected to a stepping motor 9 through a coupler, the stepping motor 9 is connected to the support frame 1 through a bolt, the stepping motor 9 rotates to drive the screw rod 10 to rotate, and further drive the slide 11 to move along the screw rod 10, a lifting push rod 13 is arranged below the slide 11, the lifting push rod 13 is connected to the slide 11 through a screw, the lifting push rod 13 mainly controls lifting and lowering of a sorting suction cup 14, a sorting suction cup 14 is arranged below the lifting push rod 13, the sorting suction cup 14 is connected to the lifting push rod 13 through a screw, the sorting suction cup 14 is mainly used for absorbing and releasing a chip, and further sorting, time and labor are saved, and the sorting efficiency can be improved.
The specific implementation process of this embodiment is as follows: when the appearance inspection device is used, the appearance inspection device is placed above a conveyor belt, then a PLC (programmable logic controller) 3 is connected with an external power supply, a sorting sucker 14 is connected with an external air pressure control loop, a chip needing to be inspected can be placed on a material box or a film plate, the chip is conveyed to the lower part of the appearance inspection device through the conveyor belt, a first detection lens 6 automatically inspects the appearance of the chip above the material box or the film plate, then information is fed back to the PLC 3, the PLC 3 controls a stepping motor 9 to start, a lead screw 10 is driven to rotate, a slide seat 11 is further controlled to move to the upper part of an unqualified chip, a lifting push rod 13 pushes the sorting sucker 14 to move downwards, the sorting sucker 14 is controlled to suck the chip through an external air pressure control element, then the sorting sucker 14 is controlled to move to the upper part of the unqualified chip placing plate, and, when the chip above magazine or film dish flows through second detection camera lens 8, detect the chip that the camera lens 8 finished sorting through the second and reinsert, and then can improve the quality of chip inspection, and automatic operation can be realized to whole inspection letter sorting process, and labour saving and time saving can improve letter sorting efficiency.
The above-described embodiments are merely illustrative of the preferred embodiments of the present invention and are not intended to limit the spirit and scope of the present invention. Without departing from the design concept of the present invention, various modifications and improvements made by the technical solution of the present invention by those skilled in the art should fall into the protection scope of the present invention, and the technical contents claimed by the present invention have been fully recorded in the claims.
Claims (7)
1. An automatic chip appearance inspection device is characterized in that: including braced frame (1), first detection camera lens (6) and second detection camera lens (8), braced frame (1) below shaping has groove (4), braced frame (1) is U type structure, it has first electric putter (5) to cross top one side in groove (4) through screw connection, there is first detection camera lens (6) first electric putter (5) below through screw connection, first electric putter (5) one side is provided with second electric putter (7), second electric putter (7) with braced frame (1) passes through screw connection, there is second detection camera lens (8) below through screw connection second electric putter (7), first detection camera lens (6) with second detection camera lens (8) are the CCD camera lens.
2. The apparatus for automatically inspecting the appearance of a chip according to claim 1, wherein: the supporting frame is characterized in that a transparent glass plate (2) is connected to one side wall of the supporting frame (1) through a clamping groove, and a PLC (programmable logic controller) is connected to one side of the transparent glass plate (2) through a screw.
3. The apparatus for automatically inspecting the appearance of a chip according to claim 1, wherein: a sliding seat (11) is arranged between the first electric push rod (5) and the second electric push rod (7), and the sliding seat (11) is connected with the supporting frame (1) through a guide rail.
4. The apparatus for automatically inspecting the appearance of a chip as set forth in claim 3, wherein: the middle part of the sliding seat (11) is connected with a lead screw (10) through threads, one end part of the lead screw (10) is connected with a support (12) in a rolling mode, and the support (12) is connected with the supporting frame (1) through screws.
5. The apparatus for automatically inspecting the appearance of a chip as set forth in claim 4, wherein: the other end of the lead screw (10) is connected with a stepping motor (9) through a coupler, and the stepping motor (9) is connected with the supporting frame (1) through a bolt.
6. The apparatus for automatically inspecting the appearance of a chip as set forth in claim 5, wherein: a lifting push rod (13) is arranged below the sliding seat (11), and the lifting push rod (13) is connected with the sliding seat (11) through a screw.
7. The apparatus for automatically inspecting the appearance of a chip as set forth in claim 6, wherein: a sorting sucker (14) is arranged below the lifting push rod (13), and the sorting sucker (14) is connected with the lifting push rod (13) through a screw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921847108.9U CN211887970U (en) | 2019-10-30 | 2019-10-30 | Automatic chip appearance inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921847108.9U CN211887970U (en) | 2019-10-30 | 2019-10-30 | Automatic chip appearance inspection device |
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| Publication Number | Publication Date |
|---|---|
| CN211887970U true CN211887970U (en) | 2020-11-10 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201921847108.9U Active CN211887970U (en) | 2019-10-30 | 2019-10-30 | Automatic chip appearance inspection device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114273242A (en) * | 2021-11-30 | 2022-04-05 | 张大为 | Intelligent manufacturing defective product quick sorting device |
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2019
- 2019-10-30 CN CN201921847108.9U patent/CN211887970U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114273242A (en) * | 2021-11-30 | 2022-04-05 | 张大为 | Intelligent manufacturing defective product quick sorting device |
| CN114273242B (en) * | 2021-11-30 | 2024-05-28 | 创益(广东)智能设备有限公司 | Intelligent manufacturing defective product quick sorting device |
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