JPH08340175A - Manufacturing device and method of electronic part provided with bump - Google Patents

Manufacturing device and method of electronic part provided with bump

Info

Publication number
JPH08340175A
JPH08340175A JP14602495A JP14602495A JPH08340175A JP H08340175 A JPH08340175 A JP H08340175A JP 14602495 A JP14602495 A JP 14602495A JP 14602495 A JP14602495 A JP 14602495A JP H08340175 A JPH08340175 A JP H08340175A
Authority
JP
Japan
Prior art keywords
flux
bumps
solder ball
transfer means
solder balls
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14602495A
Other languages
Japanese (ja)
Other versions
JP3129151B2 (en
Inventor
Masao Hidaka
雅夫 日高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP14602495A priority Critical patent/JP3129151B2/en
Publication of JPH08340175A publication Critical patent/JPH08340175A/en
Application granted granted Critical
Publication of JP3129151B2 publication Critical patent/JP3129151B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3478Applying solder preforms; Transferring prefabricated solder patterns
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3489Composition of fluxes; Methods of application thereof; Other methods of activating the contact surfaces

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE: To provide a method and a device for manufacturing an electronic part provided with bumps, wherein a series of steps where solder balls used for forming bumps on a work are picked up and mounted collectively on the work for the formation of an electronic part provided with bumps are automatically and continuously carried out. CONSTITUTION: There are provided a solder ball feeding section 4, a flux applying section 6, and a guide rail which positions a board. The flux applying section 6 is equipped with a storing tank 7 of flux 9, an endless belt 8, and a smoothing head 10 possessed of a sqeegee 18. The smoothing head 10 is provided outside a range of movement of a head 21. A first light source 40, a second light source, a light emitting section, and a photodetecting section are provided for checking solder balls for pickup failures, dropping, and mounting failures.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ワークの電極にバンプ
を形成してバンプ付電子部品を製造するためのバンプ付
電子部品の製造装置および製造方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a bumper-equipped electronic component manufacturing apparatus and method for forming bumps on electrodes of a workpiece to manufacture bumped electronic components.

【0002】[0002]

【従来の技術】ワークの電極にバンプ(突出電極)を形
成してバンプ付電子部品を製造する方法として、半田ボ
ールを用いる方法が知られている。この方法は、半田ボ
ールを移送手段によりワークの電極上に移送搭載した
後、ワークを加熱炉で加熱して半田ボールを溶融固化さ
せ、バンプを生成する。この方法は、ワークの電極に多
数個のバンプを一括形成してバンプ付電子部品を製造で
きるので、作業能率上きわめて有利である。
2. Description of the Related Art As a method of manufacturing a bumped electronic component by forming bumps (protruding electrodes) on electrodes of a work, a method using solder balls is known. In this method, the solder balls are transferred and mounted on the electrodes of the work by the transfer means, and then the work is heated in a heating furnace to melt and solidify the solder balls to generate bumps. This method is extremely advantageous in terms of work efficiency because a large number of bumps can be collectively formed on the electrodes of the work to manufacture the bumped electronic component.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、現在の
ところ、バンプ付電子部品を製造するための全工程を自
動化した技術は未だ確立されていない実情にある。
However, at present, a technique in which all the steps for manufacturing electronic components with bumps are automated has not been established yet.

【0004】そこで本発明は、半田ボールをワークの電
極に作業性よく自動搭載してバンプ付電子部品を製造で
きるバンプ付電子部品の製造装置および製造方法を提供
することを目的とする。
It is therefore an object of the present invention to provide a bumper-equipped electronic component manufacturing apparatus and method capable of automatically mounting a solder ball on an electrode of a work with good workability to manufacture a bumped electronic component.

【0005】[0005]

【課題を解決するための手段】このために本発明は、半
田ボールの供給部と、フラックスの塗布部と、ワークの
位置決め部と、半田ボールを移送する移送手段と、この
移送手段を前記半田ボールの供給部と前記フラックスの
塗布部と前記ワークの位置決め部の間を移動させる移動
手段とを備えたバンプ付電子部品の製造装置であって、
前記フラックスの塗布部が、その表面にフラックスが付
着される無端ベルトと、この無端ベルトを回動させる動
力部と、この無端ベルトに付着したフラックスの表面を
平滑するスキージとから成る。
To this end, the present invention provides a solder ball supply section, a flux coating section, a work positioning section, a transfer means for transferring a solder ball, and the transfer means for the solder. A manufacturing apparatus for a bumped electronic component, comprising: a ball supply unit, a flux coating unit, and a moving unit that moves between the workpiece positioning unit,
The flux applying section is composed of an endless belt having a surface to which the flux is attached, a power unit for rotating the endless belt, and a squeegee for smoothing the surface of the flux attached to the endless belt.

【0006】また移送手段が移動手段に駆動されて半田
ボールの供給部の上方へ移動し、半田ボールをピックア
ップする工程と、その表面にフラックスが付着された無
端ベルトが動力部に駆動されて回動し、その際、スキー
ジによりこのフラックスの液面を平滑する工程と、前記
移送手段が前記無端ベルトの上方へ移動し、そこで前記
移送手段の下面に保持された半田ボールを前記平滑ヘッ
ドにより平滑されたフラックスの液面に着水させてフラ
ックスを付着させる工程と、前記移送手段をワークの位
置決め部の上方へ移動させ、そこで保持状態を解除する
ことにより、半田ボールをワークの上面に搭載する工程
とからバンプ付電子部品の製造方法を構成した。
Further, the transfer means is driven by the moving means to move above the solder ball supply section to pick up the solder balls, and the endless belt having flux adhered to its surface is driven by the power section to rotate. And the step of smoothing the liquid level of this flux with a squeegee, and the transfer means moving above the endless belt, where the solder balls held on the lower surface of the transfer means are smoothed by the smoothing head. The solder ball is mounted on the upper surface of the work by causing the flux to adhere to the liquid surface of the formed flux and adhering the flux, and moving the transfer means above the positioning portion of the work and releasing the holding state there. A method of manufacturing an electronic component with bumps was configured from the steps.

【0007】[0007]

【作用】上記構成によれば、移送手段が半田ボールの供
給部の半田ボールをピックアップしてからワークに搭載
してバンプ付電子部品を製造するまでの工程を自動的に
行える。また無端ベルトの表面にフラックスを所定厚さ
の層状に付着させ、このフラックスを半田ボールに転着
することにより、半田ボールに適量のフラックスを付着
させ、バンプを良好に形成することができる。
According to the above construction, the steps from picking up the solder balls of the solder ball supply portion to mounting them on the work to manufacture the electronic component with bumps can be automatically performed. Further, by depositing the flux in a layered form having a predetermined thickness on the surface of the endless belt and transferring the flux onto the solder balls, an appropriate amount of flux is deposited on the solder balls and the bumps can be formed well.

【0008】[0008]

【実施例】次に、本発明の実施例を図面を参照しながら
説明する。図1は、本発明の一実施例のバンプ付電子部
品の製造工程図、図2は同バンプ付電子部品の製造装置
の平面図、図3は同バンプ付電子部品の製造装置に備え
られたフラックスの塗布部の側面図である。また図4
(a)(b)は同半田ボールの下面にフラックスを塗布
中の要部断面図、図5(a)(b)は同半田ボールを基
板の電極に搭載中の要部断面図、図6は同ヘッドと第1
の光源の正面図、図7は同ヘッドと発光部および受光部
の正面図である。
Embodiments of the present invention will now be described with reference to the drawings. 1 is a manufacturing process diagram of an electronic component with bumps according to an embodiment of the present invention, FIG. 2 is a plan view of a manufacturing apparatus for the electronic component with bumps, and FIG. 3 is provided for the manufacturing device for the electronic component with bumps. It is a side view of a flux application part. FIG. 4
FIGS. 5A and 5B are cross-sectional views of main parts of the lower surface of the solder ball while flux is being applied, and FIGS. 5A and 5B are cross-sectional views of main parts of the solder ball being mounted on electrodes of the substrate. Is the same as the head
FIG. 7 is a front view of the light source of FIG. 7, and FIG. 7 is a front view of the head, a light emitting unit and a light receiving unit.

【0009】まず図1を参照して、バンプ付電子部品の
全製造工程を簡単に説明する。図1(a)において、3
はワークとしての基板であり、図1(b)に示すように
その上面と下面に電極20を形成するとともに、電極2
0同士を電気的に接続するスルーホール3aを形成す
る。
First, with reference to FIG. 1, a brief description will be given of the whole manufacturing process of the electronic component with bumps. In FIG. 1 (a), 3
Is a substrate as a work. As shown in FIG. 1B, the electrodes 20 are formed on the upper and lower surfaces of the substrate, and the electrode 2
A through hole 3a for electrically connecting 0s is formed.

【0010】次に基板3の上面にチップCを搭載し(図
1(c))、チップCの上面の電極と基板3の上面の電
極20をワイヤWで接続する(図1(d))。次いでチ
ップCとワイヤWを保護するモールド体Mを合成樹脂に
より形成する(図1(e))。次いで基板3を上下反転
させて電極20の上面に半田ボール5を搭載する(図1
(f))。次いで基板3を加熱炉へ送って加熱し、半田
ボール5を溶融固化させることによりバンプ5’を形成
する(図1(g))。
Next, the chip C is mounted on the upper surface of the substrate 3 (FIG. 1C), and the electrode on the upper surface of the chip C and the electrode 20 on the upper surface of the substrate 3 are connected by the wire W (FIG. 1D). . Next, a mold body M that protects the chip C and the wire W is formed of synthetic resin (FIG. 1E). Next, the substrate 3 is turned upside down to mount the solder balls 5 on the upper surface of the electrode 20 (see FIG. 1).
(F)). Next, the substrate 3 is sent to a heating furnace and heated to melt and solidify the solder balls 5 to form bumps 5 '(FIG. 1 (g)).

【0011】以上によりバンプ付電子部品が完成する。
次に、各図を参照して、図1(f)(g)の工程、すな
わちバンプ用の電極20に半田ボール5を搭載し、バン
プ5’を形成する工程について詳しく説明する。
Through the above steps, the bumped electronic component is completed.
Next, the steps of FIGS. 1F and 1G, that is, the step of mounting the solder balls 5 on the bump electrodes 20 and forming the bumps 5 ′ will be described in detail with reference to the drawings.

【0012】図2において、3は図1(e)に示す基板
であって上下反転されており、その下面にはチップCを
モールドするモールド体Mが形成されている。1はテー
ブルであり、その上面中央にはガイドレール2が2本配
設されている。基板3はガイドレール2に沿って搬送さ
れ、またガイドレール2にクランプされて所定の位置に
位置決めされる。本発明では、ガイドレール2による基
板3の搬送方向をX方向、これに直交する方向をY方向
とする。テーブル1の隅部には半田ボールの供給部4が
設けられている。図3に示すように、供給部4はボック
スから成り、その内部には半田ボール5が大量に貯溜さ
れている。
In FIG. 2, reference numeral 3 denotes the substrate shown in FIG. 1 (e), which is turned upside down, and a mold body M for molding the chip C is formed on the lower surface thereof. Reference numeral 1 is a table, and two guide rails 2 are arranged in the center of the upper surface of the table. The substrate 3 is conveyed along the guide rail 2 and is clamped by the guide rail 2 to be positioned at a predetermined position. In the present invention, the conveyance direction of the substrate 3 by the guide rail 2 is the X direction, and the direction orthogonal to this is the Y direction. A solder ball supply unit 4 is provided at a corner of the table 1. As shown in FIG. 3, the supply unit 4 is composed of a box, and a large amount of solder balls 5 are stored therein.

【0013】図2および図3において、テーブル1の他
方の隅部にはフラックスの塗布部6が設けられている。
フラックスの塗布部6は、フラックス9の貯溜槽7と、
無端ベルト8と、平滑ヘッド10を備えている。無端ベ
ルト8はプーリ11に調帯されており、動力部であるモ
ータ12に駆動されて回動する。13は伝動ベルトであ
る。無端ベルト8の下部は貯溜槽7に貯溜されたフラッ
クス9に浸漬している。したがって無端ベルト8の下側
走行部をフラックス9に浸漬させて走行させることによ
り、無端ベルト8の表面に適量のフラックス9を安定的
に付着させることができる。また無端ベルト8の上側走
行部はフラックス9の液面上に露呈しており、水平なプ
レート14により下方から支持されて上側走行部を水平
に保つ。
2 and 3, a flux coating section 6 is provided at the other corner of the table 1.
The flux applying section 6 includes a storage tank 7 for the flux 9,
An endless belt 8 and a smoothing head 10 are provided. The endless belt 8 is tuned to a pulley 11 and is driven by a motor 12 which is a power unit to rotate. 13 is a transmission belt. The lower part of the endless belt 8 is immersed in the flux 9 stored in the storage tank 7. Therefore, by dipping the lower running portion of the endless belt 8 in the flux 9 and running the flux, a proper amount of the flux 9 can be stably attached to the surface of the endless belt 8. The upper running portion of the endless belt 8 is exposed on the liquid surface of the flux 9, and is supported from below by the horizontal plate 14 to keep the upper running portion horizontal.

【0014】平滑ヘッド10は、貯溜槽7上に架設され
た台板15を備えている。台板15上には高さ調整具1
6が設置されており、そのロッド17の下端部にスキー
ジ18が結合されている。この高さ調整具16でスキー
ジ18の高さを調整することにより、スキージ18の下
端部と無端ベルト8の表面のギャップの大きさを調整す
る。図3において、無端ベルト8を時計方向に回動させ
ることにより、無端ベルト8の表面に付着したフラック
ス9の液面は平らに平滑される。図2において、ガイド
レール2の下方には、半田ボールの回収部19が設置さ
れている。この回収部19はボックスから成っている。
The smoothing head 10 is provided with a base plate 15 which is installed above the storage tank 7. Height adjusting tool 1 on the base plate 15
6 is installed, and a squeegee 18 is coupled to the lower end of the rod 17. By adjusting the height of the squeegee 18 with the height adjuster 16, the size of the gap between the lower end of the squeegee 18 and the surface of the endless belt 8 is adjusted. In FIG. 3, by rotating the endless belt 8 in the clockwise direction, the liquid surface of the flux 9 attached to the surface of the endless belt 8 is made flat and smooth. In FIG. 2, a solder ball recovery unit 19 is installed below the guide rail 2. The recovery unit 19 is composed of a box.

【0015】次に、半田ボールの移送手段としてのヘッ
ドとその移動手段について説明する。図2および図3に
おいて、21は箱形のヘッドである。ヘッド21の下面
には、半田ボール5を真空吸着して保持する吸着孔22
がマトリクス状に多数個形成されている(図4(a)も
参照)。ヘッド21はチューブ23を介してブロア装置
(図外)に接続されており、ブロア装置が作動すること
により、ヘッド21の内部は真空引きされ、その吸着孔
22に半田ボール5を真空吸着して保持する。またブロ
ア装置の真空吸引を解除し、あるいはブロア装置を逆方
向に作動させてヘッド21の内部にエアを吹き込むこと
により、ヘッド21の真空吸引による保持状態は解除さ
れて、半田ボール5は吸着孔22から落下する。なお半
田ボールの移送手段としては、上記ヘッド21以外に
も、粘着テープに半田ボールを付着させて移送する方式
なども知られている。
Next, a head as a solder ball transfer means and its moving means will be described. In FIGS. 2 and 3, reference numeral 21 is a box-shaped head. A suction hole 22 for vacuum-sucking and holding the solder ball 5 is provided on the lower surface of the head 21.
Are formed in a matrix (see also FIG. 4A). The head 21 is connected to a blower device (not shown) via a tube 23, and the inside of the head 21 is evacuated by the operation of the blower device, and the solder balls 5 are vacuum-sucked to the suction holes 22. Hold. Further, the vacuum suction of the blower device is released, or the blower device is operated in the reverse direction to blow air into the inside of the head 21, so that the holding state of the head 21 due to the vacuum suction is released, and the solder ball 5 holds the suction hole. It drops from 22. As a means for transferring the solder balls, in addition to the head 21, a method of attaching the solder balls to an adhesive tape and transferring the solder balls is also known.

【0016】図2において、テーブル1の上方には長尺
のフレーム24が架設されている。フレーム24には送
りねじ25とガイドレール26が平行に配設されてい
る。27は送りねじ25を回転させるモータである。ヘ
ッド21には、送りねじ25に螺合するナット28が結
合されている。したがってモータ27が駆動して送りね
じ25が回転すると、ナット28は送りねじ25に沿っ
てX方向へ水平移動し、ヘッド21もガイドレール26
に沿ってX方向へ水平移動する。
In FIG. 2, a long frame 24 is installed above the table 1. A feed screw 25 and a guide rail 26 are arranged in parallel on the frame 24. 27 is a motor for rotating the feed screw 25. A nut 28 that is screwed into the feed screw 25 is coupled to the head 21. Therefore, when the motor 27 is driven and the feed screw 25 rotates, the nut 28 horizontally moves in the X direction along the feed screw 25, and the head 21 also moves in the guide rail 26.
Move horizontally in the X direction.

【0017】フレーム24の両側端部は、ガイドレール
29、30上にスライド自在に設置されている。このガ
イドレール29、30は上記ガイドレール26と直交し
ている。またガイドレール29と平行に送りねじ31が
配設されている。フレーム24の下面にはこの送りねじ
31が螺合するナット(図示せず)が設けられている。
したがってモータ32が駆動して送りねじ31が回転す
ると、フレーム24およびこれに結合されたヘッド21
はガイドレール29、30に沿ってY方向に水平移動す
る。
Both ends of the frame 24 are slidably installed on the guide rails 29 and 30. The guide rails 29 and 30 are orthogonal to the guide rail 26. Further, a feed screw 31 is arranged in parallel with the guide rail 29. A nut (not shown) with which the feed screw 31 is screwed is provided on the lower surface of the frame 24.
Therefore, when the motor 32 is driven to rotate the feed screw 31, the frame 24 and the head 21 connected to the frame 24 are rotated.
Moves horizontally in the Y direction along the guide rails 29 and 30.

【0018】上述のように、送りねじ25、31、ガイ
ドレール26、29、30、モータ27、32などは、
ヘッド21をX方向やY方向へ水平移動させる移動手段
を構成しており、これによりヘッド21は半田ボールの
供給部4、フラックスの塗布部6、ガイドレール2に位
置決めされた基板3の間を自由に移動する。図2におい
て、Aはヘッド21の移動範囲である。図示するよう
に、平滑ヘッド10はヘッド21の移動範囲Aの外に配
置されており、このように配置することにより、ヘッド
21がその移動範囲A内を自由に移動しても、平滑ヘッ
ド10に衝突することがないようにしている。
As described above, the feed screws 25 and 31, the guide rails 26, 29 and 30, the motors 27 and 32, etc.
A moving means for horizontally moving the head 21 in the X direction and the Y direction is configured, whereby the head 21 moves between the solder ball supply portion 4, the flux application portion 6, and the substrate 3 positioned on the guide rail 2. Move freely. In FIG. 2, A is a moving range of the head 21. As shown in the figure, the smoothing head 10 is arranged outside the movement range A of the head 21, and by arranging in this way, even if the head 21 freely moves within the movement range A, the smoothing head 10 I try not to collide with.

【0019】次に検査手段について説明する。図2にお
いて、40は長尺の第1の光源である。この第1の光源
40は半田ボールの供給部4とフラックスの塗布部6の
間に設置されており、下方からヘッド21の下面へ向っ
て光を照射する(図6参照)。ヘッド21の内部には光
学センサ41が内蔵されている。したがってすべての吸
着孔22に半田ボール5が真空吸着されているときは、
吸着孔22は半田ボール5で完全に遮光されて光学セン
サ41には光は入射しないが、何れかの吸着孔22に半
田ボール5が真空吸着されていないときは、第1の光源
40から照射された光はその吸着孔22を通過して光学
センサ41に入射する。これにより、半田ボール5のピ
ックアップミスがあったことが判明する。すなわち第1
の光源40と光学センサ41はすべての吸着孔22に半
田ボール5が正しく真空吸着されているか否か、すなわ
ちピックアップミスの有無を検査する検査手段である。
Next, the inspection means will be described. In FIG. 2, reference numeral 40 denotes a long first light source. The first light source 40 is installed between the solder ball supplying section 4 and the flux applying section 6 and emits light from below toward the lower surface of the head 21 (see FIG. 6). An optical sensor 41 is built in the head 21. Therefore, when the solder balls 5 are vacuum-sucked in all the suction holes 22,
The suction holes 22 are completely shielded by the solder balls 5 and light does not enter the optical sensor 41. However, when the solder balls 5 are not vacuum-sucked to any of the suction holes 22, the first light source 40 emits light. The generated light passes through the suction hole 22 and enters the optical sensor 41. This reveals that the solder ball 5 has been picked up incorrectly. Ie the first
The light source 40 and the optical sensor 41 are inspection means for inspecting whether the solder balls 5 are correctly vacuum-sucked in all the suction holes 22, that is, whether or not there is a pickup error.

【0020】図2において、フラックスの塗布部6とガ
イドレール2の間には、第2の光源42が設置されてい
る。第2の光源42は第1の光源40と同様に、ヘッド
21の下面へ向って光を照射し、すべての吸着孔22に
半田ボール5が正しく真空吸着されているか否か、すな
わち半田ボール5の落下の有無を検査する(図6を参
照)。
In FIG. 2, a second light source 42 is installed between the flux applying section 6 and the guide rail 2. Similarly to the first light source 40, the second light source 42 emits light toward the lower surface of the head 21, and whether or not the solder balls 5 are properly vacuum-sucked in all the suction holes 22, that is, the solder balls 5 Inspect for drop (see FIG. 6).

【0021】この第2の光源42の設置理由は次のとお
りである。すなわち、ヘッド21を無端ベルト8の上方
で上下動作させて、その下面に真空吸着された半田ボー
ル5をフラックス9に着水させ、その下面にフラックス
9を付着させるが(図4(a)(b)を参照)、フラッ
クス9は粘性が大きいため、半田ボール5をフラックス
9に着水させると、その粘性のために半田ボール5は吸
着孔22から落下することがある。このように半田ボー
ル5が脱落したヘッド21を基板3の上方へ移動させ
て、半田ボール5を基板3に搭載すると、基板3は半田
ボール5が不足する不良品となってしまう。そこでヘッ
ド21を基板3へ移動させる途中において、第2の光源
42と光学センサ41により、すべての吸着孔22に半
田ボール5が正しく真空吸着されているか否かを検査す
る。すなわち光学センサ41および第2の光源42は、
半田ボール5の落下の有無を検査する検査手段である。
The reason for installing the second light source 42 is as follows. That is, the head 21 is moved up and down above the endless belt 8 to cause the solder balls 5 vacuum-adsorbed on the lower surface thereof to land on the flux 9 and to attach the flux 9 to the lower surface (see FIG. Since the flux 9 has a large viscosity, the solder ball 5 may drop from the suction hole 22 due to the viscosity when the solder ball 5 is brought into contact with the flux 9. When the head 21 from which the solder balls 5 have fallen off is moved above the substrate 3 to mount the solder balls 5 on the substrate 3, the substrate 3 becomes a defective product in which the solder balls 5 are insufficient. Therefore, during the movement of the head 21 to the substrate 3, it is inspected by the second light source 42 and the optical sensor 41 whether or not the solder balls 5 are correctly vacuum-sucked in all the suction holes 22. That is, the optical sensor 41 and the second light source 42 are
It is an inspection means for inspecting whether or not the solder ball 5 has fallen.

【0022】図2において、ガイドレール2と供給部4
の間には発光部43と受光部44が設けられている。図
7に示すように、発光部43から受光部44へ向って光
が水平に照射される。ヘッド21は基板3に半田ボール
5を搭載した後、この発光部43と受光部44の間をそ
の光路に直交する方向へ移動して半田ボールの供給部4
上へ復帰するが、そのとき、ヘッド21の下面に半田ボ
ール5が残存付着していると光は遮られ、受光部44は
受光しない。また半田ボール5がすべて基板3に搭載さ
れ、ヘッド21の下面に半田ボール5がまったく残存付
着していないと、発光部43から照射された光は受光部
44に受光される。これにより、ヘッド21の下面に半
田ボール5が残存付着しているか否か、すなわちヘッド
21がすべての半田ボール5を基板3に搭載したか否か
の搭載ミスの有無を検査する。
In FIG. 2, the guide rail 2 and the supply unit 4 are shown.
A light emitting portion 43 and a light receiving portion 44 are provided between them. As shown in FIG. 7, light is emitted horizontally from the light emitting unit 43 toward the light receiving unit 44. The head 21 mounts the solder balls 5 on the substrate 3 and then moves between the light emitting portion 43 and the light receiving portion 44 in a direction orthogonal to the optical path to move the solder ball supplying portion 4 to the solder ball supplying portion 4.
However, if the solder balls 5 remain attached to the lower surface of the head 21, the light is blocked and the light receiving portion 44 does not receive the light. If all the solder balls 5 are mounted on the substrate 3 and no solder balls 5 remain on the lower surface of the head 21, the light emitted from the light emitting section 43 is received by the light receiving section 44. As a result, it is inspected whether or not the solder balls 5 remain attached to the lower surface of the head 21, that is, whether or not the head 21 has mounted all the solder balls 5 on the substrate 3 and whether or not there is a mounting error.

【0023】このバンプ付電子部品の製造装置は上記の
ように構成されており、次に図1(f)(g)に示す工
程を行うための動作を説明する。図2において、ヘッド
21は半田ボールの供給部4の上方へ移動する(矢印
イ)。そこでヘッド21は上下動作を行って、その下面
の吸着孔22に半田ボール5を真空吸着してピックアッ
プする。なおヘッド21に上下動作を行わせる機構の説
明は省略している。
This bumper-equipped electronic component manufacturing apparatus is configured as described above. Next, the operation for performing the steps shown in FIGS. 1F and 1G will be described. In FIG. 2, the head 21 moves above the solder ball supply portion 4 (arrow B). Therefore, the head 21 moves up and down, and the solder balls 5 are vacuum sucked and picked up by the suction holes 22 on the lower surface thereof. The description of the mechanism for causing the head 21 to move up and down is omitted.

【0024】図2において、次にヘッド21は左方(第
1の光源40の上方)へ移動し(矢印ロ)、図6を参照
しながら説明したように、半田ボール5のピックアップ
ミスの有無を検査する。ピックアップミスがあれば、ヘ
ッド21は半田ボールの供給部4の上方へ戻り(矢印
ハ)、そこで再度上下動作を行って、半田ボール5をピ
ックアップし、再度左方へ移動する。そして第1の光源
40によりピックアップミスの有無を再検査する。
In FIG. 2, the head 21 then moves to the left (above the first light source 40) (arrow B), and as described with reference to FIG. To inspect. If there is a pick-up error, the head 21 returns to above the solder ball supply unit 4 (arrow C), and again performs vertical movement to pick up the solder ball 5 and move it to the left again. Then, the first light source 40 is used to re-examine the presence or absence of a pickup error.

【0025】ピックアップミスがなく、すべての吸着孔
22に半田ボール5が正しく真空吸着して保持されてい
るときは、ヘッド21は無端ベルト8の上方へ移動する
(矢印ニ)。これと前後して、図3を参照しながら説明
したように、無端ベルト8が回動してフラックス9の液
面の平滑がスキージ18により行われる。そこでヘッド
21は上下動作を行って、その下面に真空吸着された半
田ボール5の下面にフラックス9を付着させる。図4
(a)(b)は、その動作を示している。
When there is no pick-up error and the solder balls 5 are correctly vacuum-sucked and held in all the suction holes 22, the head 21 moves above the endless belt 8 (arrow D). Before and after this, as described with reference to FIG. 3, the endless belt 8 rotates and the squeegee 18 smoothes the liquid surface of the flux 9. Then, the head 21 moves up and down to attach the flux 9 to the lower surface of the solder ball 5 which is vacuum-adsorbed on the lower surface thereof. FIG.
(A) and (b) show the operation.

【0026】次に図2において、ヘッド21は無端ベル
ト8の上方から第2の光源42の上方へ移動し(矢印
ホ)、図6を参照しながら説明したように、半田ボール
5の落下の有無を検査する。もし1個もしくはそれ以上
の半田ボール5がヘッド21の下面から落下しているこ
とが判明したならば、ヘッド21は回収部19の上方へ
移動し(矢印チ)、その下面に真空吸着している半田ボ
ール5をすべて回収部19に落下させる。すべての半田
ボール5を落下させたヘッド21は、半田ボールの供給
部4の上方へ移動し、上述した動作をやり直す。
Next, in FIG. 2, the head 21 moves from above the endless belt 8 to above the second light source 42 (arrow E), and as described with reference to FIG. Inspect for presence. If it is found that one or more solder balls 5 are falling from the lower surface of the head 21, the head 21 moves above the collecting portion 19 (arrow C) and is vacuum-adsorbed on the lower surface. All the solder balls 5 present are dropped onto the recovery unit 19. The head 21 that has dropped all the solder balls 5 moves to above the solder ball supply unit 4 and repeats the above-described operation.

【0027】さて、図2において、第2の光源42によ
り半田ボール5の落下がなかったことが検出されたなら
ば、ヘッド21は基板3の上方へ移動し(矢印ヘ)、そ
こで上下動作を行うとともに、半田ボール5の真空吸着
状態を解除することにより、すべての半田ボール5を一
括して基板3の搭載する。
Now, in FIG. 2, when it is detected by the second light source 42 that the solder balls 5 have not fallen, the head 21 moves above the substrate 3 (to the arrow) and moves up and down there. At the same time, the vacuum suction state of the solder balls 5 is released, so that all the solder balls 5 are collectively mounted on the substrate 3.

【0028】次にヘッド21は発光部43と受光部44
の手前へ移動し(矢印ト)、次に供給部4へ向って移動
する(矢印イ)。このとき、図7を参照して説明したよ
うに、ヘッド21の下面に半田ボール5が残存付着して
保持していないか否かを検査する。ここで、半田ボール
5が残存付着しているのが検出されたならば、この半田
ボール5は基板3に搭載し損ったもの、すなわち搭載ミ
スによるものであり、ヘッド21は回収部19の上方へ
移動してこの半田ボール5を回収部19に落下させて回
収する。また上記基板3は、半田ボール5が欠落してい
るので不良品であり、ライン外へ除去される。
Next, the head 21 includes a light emitting portion 43 and a light receiving portion 44.
(Arrow B), and then toward the supply unit 4 (arrow B). At this time, as described with reference to FIG. 7, it is inspected whether or not the solder balls 5 remain attached to and are held on the lower surface of the head 21. Here, if it is detected that the solder balls 5 remain adhered, it is because the solder balls 5 have been improperly mounted on the substrate 3, that is, due to a mounting error, and the head 21 of the recovery unit 19 is not mounted. The solder balls 5 are moved upward and dropped into the collecting portion 19 to be collected. The board 3 is defective because the solder balls 5 are missing, and is removed to the outside of the line.

【0029】次に、ヘッド21は半田ボールの供給部4
の上方へ移動し、上述した動作が繰り返される。また半
田ボール5が正しく搭載された基板3は、ガイドレール
2に沿って次の工程へ向って搬送される。以上のように
このバンプ付電子部品の製造装置によれば、ヘッドが供
給部の半田ボールをピックアップし、半田ボールにフラ
ックスを付着させて基板に搭載するまでの一連の作業を
自動的に連続して行うことができる。また半田ボールの
ピックアップミスや途中での落下、あるいは基板への搭
載ミスの有無を各工程の間において速かに検出し、もし
もこれらのミスがあったときには、速かにリカバリー動
作を行うことができる。
Next, the head 21 is connected to the solder ball supply unit 4
, And the above operation is repeated. The board 3 on which the solder balls 5 are properly mounted is conveyed along the guide rail 2 toward the next step. As described above, according to this bumper-equipped electronic component manufacturing apparatus, the head automatically picks up the solder balls in the supply section, attaches the flux to the solder balls, and automatically mounts a series of operations on the board. Can be done by In addition, the presence or absence of a solder ball pickup error, a drop in the middle of the solder ball, or a mounting error on the board can be quickly detected during each process, and if there is such a mistake, a recovery operation can be performed quickly. it can.

【0030】[0030]

【発明の効果】本発明によれば、移送手段が半田ボール
の供給部の半田ボールをピックアップしてからワークに
搭載されるまでの全工程を自動的に行える。またフラッ
クスの塗布部を無端ベルトやスキージにより構成するこ
とにより、半田ボールに適量のフラックスを塗布するこ
とができ、さらに無端ベルトを貯溜槽のフラックスに浸
漬することにより、その表面にフラックスを安定的に付
着させることができる。またヘッドが平滑ヘッドに衝突
するのを回避し、移送手段を自由に移動させながら、半
田ボールの搭載作業を行うことができる。また半田ボー
ルのピックアップミスや途中での落下、あるいは基板な
どのワークへの搭載ミスの有無を各工程の間において速
かに検出し、もしもこれらのミスがあったときには、速
かにリカバリー(やり直し)動作を行うことができる。
According to the present invention, all the steps from picking up the solder balls of the solder ball supply portion to mounting them on the work can be automatically performed according to the present invention. Also, by configuring the flux application part with an endless belt or squeegee, it is possible to apply an appropriate amount of flux to the solder balls, and by further immersing the endless belt in the flux of the storage tank, the flux is stabilized on the surface. Can be attached to. Further, the head can be prevented from colliding with the smooth head, and the solder balls can be mounted while freely moving the transfer means. In addition, the presence or absence of a solder ball pick-up error, a drop in the middle, or a mounting error on a work such as a board is quickly detected during each process. ) Can perform actions.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例のバンプ付電子部品の製造工
程図
FIG. 1 is a manufacturing process diagram of an electronic component with bumps according to an embodiment of the present invention.

【図2】本発明の一実施例のバンプ付電子部品の製造装
置の平面図
FIG. 2 is a plan view of an apparatus for manufacturing electronic components with bumps according to an embodiment of the present invention.

【図3】本発明の一実施例のバンプ付電子部品の製造装
置に備えられたフラックスの塗布部の側面図
FIG. 3 is a side view of a flux applying section provided in the bumped electronic component manufacturing apparatus according to one embodiment of the present invention.

【図4】本発明の一実施例のバンプ付電子部品の製造装
置の半田ボールの下面にフラックスを塗布中の要部断面
FIG. 4 is a cross-sectional view of an essential part of the solder ball of the manufacturing apparatus of the electronic component with bumps according to the embodiment of the present invention, in which flux is applied to the lower surface of the solder ball.

【図5】本発明の一実施例のバンプ付電子部品の製造装
置の半田ボールを基板の電極に搭載中の要部断面図
FIG. 5 is a cross-sectional view of essential parts of a solder ball of an electronic component manufacturing apparatus with bumps according to an embodiment of the present invention being mounted on electrodes of a substrate.

【図6】本発明の一実施例のバンプ付電子部品の製造装
置のヘッドと第1の光源の正面図
FIG. 6 is a front view of a head and a first light source of an apparatus for manufacturing electronic components with bumps according to an embodiment of the present invention.

【図7】本発明の一実施例のバンプ付電子部品の製造装
置のヘッドと発光部および受光部の正面図
FIG. 7 is a front view of a head, a light emitting section, and a light receiving section of a bumper-equipped electronic component manufacturing apparatus according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

2 ガイドレール(ワークの位置決め部) 3 基板(ワーク) 4 半田ボールの供給部 5 半田ボール 6 フラックスの塗布部 7 貯溜槽 8 無端ベルト 9 フラックス 10 平滑ヘッド 12 モータ 18 スキージ 19 回収部 21 ヘッド(移送手段) 22 吸着孔 25 送りねじ 27 モータ 28 ナット 31 送りねじ 32 モータ 40 第1の光源 41 光学センサ 42 第2の光源 43 発光部 44 受光部 2 Guide rail (workpiece positioning part) 3 Board (workpiece) 4 Solder ball supply part 5 Solder ball 6 Flux applying part 7 Storage tank 8 Endless belt 9 Flux 10 Smoothing head 12 Motor 18 Squeegee 19 Collecting part 21 Head (transferring) 22) suction hole 25 feed screw 27 motor 28 nut 31 feed screw 32 motor 40 first light source 41 optical sensor 42 second light source 43 light emitting unit 44 light receiving unit

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】半田ボールの供給部と、フラックスの塗布
部と、ワークの位置決め部と、半田ボールを移送する移
送手段と、この移送手段を前記半田ボールの供給部と前
記フラックスの塗布部と前記ワークの位置決め部の間を
移動させる移動手段とを備えたバンプ付電子部品の製造
装置であって、前記フラックスの塗布部が、その表面に
フラックスが付着される無端ベルトと、この無端ベルト
を回動させる動力部と、この無端ベルトに付着したフラ
ックスの表面を平滑するスキージとから成ることを特徴
とするバンプ付電子部品の製造装置。
1. A solder ball supply section, a flux application section, a workpiece positioning section, a transfer means for transferring a solder ball, and the transfer means for the solder ball supply section and the flux application section. A device for manufacturing an electronic component with bumps, comprising: a moving means for moving between the positioning parts of the work, wherein the flux applying part has an endless belt to which flux is attached, and the endless belt. An apparatus for manufacturing electronic components with bumps, comprising: a power unit that rotates and a squeegee that smoothes the surface of the flux attached to the endless belt.
【請求項2】前記無端ベルトがフラックスの貯溜槽に設
置されることを特徴とする請求項1記載のバンプ付電子
部品の製造装置。
2. The manufacturing apparatus for electronic components with bumps according to claim 1, wherein the endless belt is installed in a flux storage tank.
【請求項3】前記半田ボールの供給部と前記フラックス
の塗布部の間に、前記移送手段に半田ボールが正しく保
持されているか否かを検査する検査手段を設けたことを
特徴とする請求項1記載のバンプ付電子部品の製造装
置。
3. An inspection means for inspecting whether or not the solder ball is properly held by the transfer means is provided between the solder ball supply portion and the flux application portion. 1. A manufacturing apparatus for electronic components with bumps according to 1.
【請求項4】前記フラックスの塗布部と前記ワークの位
置決め部の間に、前記移送手段に半田ボールが正しく保
持されているか否かを検査する検査手段を設けたことを
特徴とする請求項1記載のバンプ付電子部品の製造装
置。
4. An inspection means for inspecting whether or not the solder balls are properly held by the transfer means is provided between the flux coating section and the work positioning section. The manufacturing apparatus for the electronic component with bumps described.
【請求項5】前記ワークの位置決め部と前記半田ボール
の供給部の間に、前記移送手段に半田ボールが残存保持
されていないか否かを検査する検査手段を設けたことを
特徴とする請求項1記載のバンプ付電子部品の製造装
置。
5. An inspection means is provided between the positioning portion of the work and the solder ball supply portion to inspect whether the solder balls remain in the transfer means. Item 1. An apparatus for manufacturing an electronic component with bumps according to Item 1.
【請求項6】移送手段が移動手段に駆動されて半田ボー
ルの供給部の上方へ移動し、半田ボールをピックアップ
する工程と、 その表面にフラックスが付着された無端ベルトが動力部
に駆動されて回動し、その際、スキージによりこのフラ
ックスの液面を平滑する工程と、 前記移送手段が前記無端ベルトの上方へ移動し、そこで
前記移送手段に保持された半田ボールを前記スキージに
より平滑されたフラックスの液面に着水させてフラック
スを付着させる工程と、 前記移送手段をワークの位置決め部の上方へ移動させ、
そこで保持状態を解除することにより、半田ボールをワ
ークの上面に搭載する工程と、 を含むことを特徴とするバンプ付電子部品の製造方法。
6. A step of driving the transfer means to move above the solder ball supply section by being driven by the moving means to pick up the solder ball, and an endless belt having flux adhered to its surface driven by the power section. Rotating, and at that time, a step of smoothing the liquid surface of this flux by a squeegee, and the transfer means moved above the endless belt, where the solder balls held by the transfer means were smoothed by the squeegee. A step of causing water to adhere to the liquid surface of the flux to attach the flux, and moving the transfer means above the positioning portion of the work,
Therefore, the method of manufacturing an electronic component with bumps, comprising: mounting the solder ball on the upper surface of the work by releasing the holding state.
【請求項7】バンプが形成される基板を備えたワークを
形成する工程と、この電極上にバンプを形成する工程と
から成るバンプ付電子部品の製造方法であって、移送手
段が移動手段に駆動されて半田ボールの供給部の上方へ
移動し、半田ボールをピックアップする工程と、 その表面にフラックスが付着された無端ベルトが動力部
に駆動されて回動し、その際、スキージによりこのフラ
ックスの液面を平滑する工程と、 前記移送手段が前記無端ベルトの上方へ移動し、そこで
前記移送手段に保持された半田ボールを前記スキージに
より平滑されたフラックスの液面に着水させてフラック
スを付着させる工程と、 前記移送手段をワークの位置決め部の上方へ移動させ、
そこで保持状態を解除することにより、半田ボールをワ
ークの上面に搭載する工程と、 を含むことを特徴とするバンプ付電子部品の製造方法。
7. A method for manufacturing an electronic component with bumps, comprising: a step of forming a work having a substrate on which bumps are formed; and a step of forming bumps on the electrodes. The process of being driven to move above the solder ball supply unit and picking up the solder ball, and the endless belt having the flux adhered to its surface is driven by the power unit to rotate, and at this time, this flux is generated by the squeegee. And a step of smoothing the liquid surface of the flux, the transfer means moves above the endless belt, where the solder balls held by the transfer means are allowed to land on the liquid surface of the flux smoothed by the squeegee to form the flux. A step of adhering, moving the transfer means above the positioning part of the work,
Therefore, the method of manufacturing an electronic component with bumps, comprising: mounting the solder ball on the upper surface of the work by releasing the holding state.
【請求項8】前記移送手段が、前記フラックスの塗布部
から前記ワークの位置決め部へ移動する途中において、
半田ボールが前記移送手段から落下していないか否かを
検査手段により検査し、半田ボールが落下しているとき
は、前記移送手段を半田ボールの回収部の上方へ移動さ
せ、そこで保持状態を解除して半田ボールを前記回収部
に落下させて回収する工程を含むことを特徴とする請求
項6または7のいずれかに記載のバンプ付電子部品の製
造方法。
8. The transfer means is in the process of moving from the flux coating section to the workpiece positioning section,
Whether or not the solder balls have fallen from the transfer means is inspected by an inspection means, and when the solder balls are dropped, the transfer means is moved to above the solder ball recovery part and the holding state is maintained there. 8. The method of manufacturing an electronic component with bumps according to claim 6, further comprising the step of releasing the solder balls and dropping the solder balls into the collecting portion to collect the solder balls.
JP14602495A 1995-06-13 1995-06-13 Manufacturing apparatus and manufacturing method of electronic component with bump Expired - Fee Related JP3129151B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14602495A JP3129151B2 (en) 1995-06-13 1995-06-13 Manufacturing apparatus and manufacturing method of electronic component with bump

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14602495A JP3129151B2 (en) 1995-06-13 1995-06-13 Manufacturing apparatus and manufacturing method of electronic component with bump

Publications (2)

Publication Number Publication Date
JPH08340175A true JPH08340175A (en) 1996-12-24
JP3129151B2 JP3129151B2 (en) 2001-01-29

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Country Link
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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0789391A3 (en) * 1996-02-08 1998-01-07 Zevatech, Incorporated Method and apparatus for application of flux, paste, or adhesive to bump array interconnections
US6031242A (en) * 1998-01-23 2000-02-29 Zevatech, Inc. Semiconductor die in-flight registration and orientation method and apparatus
US6077022A (en) * 1997-02-18 2000-06-20 Zevatech Trading Ag Placement machine and a method to control a placement machine
US6129040A (en) * 1997-09-05 2000-10-10 Esec Sa Semi-conductor mounting apparatus for applying adhesive to a substrate
US6135339A (en) * 1998-01-26 2000-10-24 Esec Sa Ultrasonic transducer with a flange for mounting on an ultrasonic welding device, in particular on a wire bonder
US6157870A (en) * 1997-02-18 2000-12-05 Zevatech Trading Ag Apparatus supplying components to a placement machine with splice sensor
US6185815B1 (en) 1997-12-07 2001-02-13 Esec Sa Semiconductor mounting apparatus with a chip gripper travelling back and forth
US6302316B1 (en) 1999-01-27 2001-10-16 Nippon Micrometal Co., Ltd. Ball arrangement method and arrangement apparatus
JP2007103866A (en) * 2005-10-07 2007-04-19 Juki Corp Device for transferring flux in electronic component packaging equipment
JP2007109757A (en) * 2005-10-12 2007-04-26 Juki Corp Flux coating apparatus
JP2007294775A (en) * 2006-04-27 2007-11-08 Hitachi High-Tech Instruments Co Ltd Flux transfer device
EP2808114A3 (en) * 2013-05-30 2015-09-02 Lucas-Milhaupt, Inc. Process for flux coating braze preforms and discrete parts

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0789391A3 (en) * 1996-02-08 1998-01-07 Zevatech, Incorporated Method and apparatus for application of flux, paste, or adhesive to bump array interconnections
US6077022A (en) * 1997-02-18 2000-06-20 Zevatech Trading Ag Placement machine and a method to control a placement machine
US6157870A (en) * 1997-02-18 2000-12-05 Zevatech Trading Ag Apparatus supplying components to a placement machine with splice sensor
US6129040A (en) * 1997-09-05 2000-10-10 Esec Sa Semi-conductor mounting apparatus for applying adhesive to a substrate
US6185815B1 (en) 1997-12-07 2001-02-13 Esec Sa Semiconductor mounting apparatus with a chip gripper travelling back and forth
US6031242A (en) * 1998-01-23 2000-02-29 Zevatech, Inc. Semiconductor die in-flight registration and orientation method and apparatus
US6135339A (en) * 1998-01-26 2000-10-24 Esec Sa Ultrasonic transducer with a flange for mounting on an ultrasonic welding device, in particular on a wire bonder
US6302316B1 (en) 1999-01-27 2001-10-16 Nippon Micrometal Co., Ltd. Ball arrangement method and arrangement apparatus
JP2007103866A (en) * 2005-10-07 2007-04-19 Juki Corp Device for transferring flux in electronic component packaging equipment
JP2007109757A (en) * 2005-10-12 2007-04-26 Juki Corp Flux coating apparatus
JP2007294775A (en) * 2006-04-27 2007-11-08 Hitachi High-Tech Instruments Co Ltd Flux transfer device
EP2808114A3 (en) * 2013-05-30 2015-09-02 Lucas-Milhaupt, Inc. Process for flux coating braze preforms and discrete parts

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