CN111129243B - GaN基紫外LED外延结构 - Google Patents

GaN基紫外LED外延结构 Download PDF

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CN111129243B
CN111129243B CN201911210806.2A CN201911210806A CN111129243B CN 111129243 B CN111129243 B CN 111129243B CN 201911210806 A CN201911210806 A CN 201911210806A CN 111129243 B CN111129243 B CN 111129243B
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付羿
刘卫
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Jiangxi Jingliang Optical Electronic Science And Technology Cooperative Innovation Co ltd
Jingneng Optoelectronics Co ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26Materials of the light emitting region
    • H01L33/30Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
    • H01L33/32Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
    • H01L33/325Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen characterised by the doping materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
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    • H01L33/0062Processes for devices with an active region comprising only III-V compounds
    • H01L33/0075Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
    • HELECTRICITY
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    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • H01L33/06Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26Materials of the light emitting region
    • H01L33/30Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table

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Abstract

本发明提供了一种GaN基紫外LED的外延结构,包括:在生长衬底表面依次生长的应力控制层、n型电流扩展层、有源区发光层及p型电流扩展层;其中,有源区发光层为由InaGa1‑aN量子阱层和AlGaN突变阶梯势垒层形成的周期性结构;其中,0.01<a<0.05;AlGaN突变阶梯势垒层由多层AlGaN组成,且从下至上各层AlGaN中的Al组分逐渐增加,0.08<b<0.16。在外延结构中,AlGaN突变阶梯势垒层采用Al组分从低到高的突变阶梯结构,在阶梯Al组分突变量子垒中间引入二维电子气以部分抵消紫外多量子阱垒中的极化电场,缓解厚量子阱结构应用于紫外LED中受到的应力限制,改善紫外LED的电流扩展能力,从而提高紫外LED的内量子效率。

Description

GaN基紫外LED外延结构
技术领域
本发明涉及半导体技术领域,尤其是一种GaN基紫外LED的外延结构。
背景技术
UVA波段的GaN基紫外LED一般以低In组分的InGaN层或GaN层作量子阱、以更大禁带宽度的AlGaN层作势垒。由于量子阱中的富In点很少甚至没有,导致紫外LED的内量子效率比蓝光LED低很多。此外,由于AlGaN势垒层有较大的压电常数,因此紫外LED中GaN/AlGaN多量子阱垒(或者低In组分的InGaN/AlGaN多量子阱垒)的量子限制斯塔克效应比蓝光LED中InGaN/GaN多量子阱垒更严重,加剧了紫外LED量子阱中电子和空穴的分离,进一步降低了紫外LED的光电复合效率。
通常来说,增加量子阱的厚度是提高LED复合效率的有效手段之一,但是紫外LED中的量子限制斯塔克效应会随着量子阱厚度的增加而加剧,限制了厚量子阱结构在紫外LED上的应用。
发明内容
为了克服以上不足,本发明提供了一种GaN基紫外LED的外延结构,有效改善紫外LED的电流扩展能力,提高紫外LED的内量子效率。
本发明提供的技术方案为:
一种GaN基紫外LED的外延结构,包括:在生长衬底表面依次生长的应力控制层、n型电流扩展层、有源区发光层及p型电流扩展层;其中,有源区发光层为由InaGa1-aN量子阱层和AlGaN突变阶梯势垒层形成的周期性结构; 0.01<a<0.05;AlGaN突变阶梯势垒层由多层AlGaN组成,且从下至上各层AlGaN中的Al组分x逐渐增加,0.08≤x≤0.16。
进一步优选地,所述有源区发光层由5~8个InaGa1-aN量子阱层和AlGaN突变阶梯势垒层形成的周期性结构组成。
进一步优选地,所述AlGaN突变阶梯势垒层由三层AlGaN组成,从下至上分别为AlbGa1-bN势垒层、AlcGa1-cN势垒层和AldGa1-dN势垒层,且b为0.08,c为0.12,d为0.16。
进一步优选地,所述InaGa1-aN量子阱层的厚度为1~5nm,AlGaN突变阶梯势垒层的总厚度为10~20nm。
进一步优选地,所述AlGaN突变阶梯势垒层中掺杂有浓度在5×1016~5×1018cm-2之间的硅。
在本发明提供的GaN基紫外LED的外延结构中,AlGaN突变阶梯势垒层采用Al组分从低到高(从n型电流扩展层到p型电流扩展层方向)的突变阶梯结构,在阶梯Al组分突变量子垒中间引入二维电子气(改善紫外LED的电流扩展)以部分抵消紫外多量子阱垒中的极化电场,降低现有紫外GaN/AlGaN多量子阱垒(或者低In组分的InGaN/AlGaN多量子阱垒)中的晶格失配应力,减轻量子限制斯塔克效应,缓解厚量子阱结构应用于紫外LED中受到的应力限制,改善紫外LED的电流扩展能力,从而提高紫外LED的内量子效率。
附图说明
图1为本发明中紫外LED的外延结构示意图;
图2为一实例中有源区发光层结构示意图。
附图标记:
1-生长衬底层,2-应力控制层,3-n型电流扩展层,4-有源区发光层,5-p型电流扩展层。
具体实施方式
为了更清楚地说明本发明实施案例或现有技术中的技术方案,下面将对照附图说明本发明的具体实施方式。显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图,并获得其他的实施方式。
如图1所示为本发明提供的GaN基紫外LED的外延结构示意图,从图中可以看出,该外延结构中包括:在生长衬底(图示中,为硅衬底层1)表面依次生长的应力控制层2、n型电流扩展层3、有源区发光层4及p型电流扩展层5;其中,有源区发光层为由InaGa1-aN量子阱层和AlGaN突变阶梯势垒层形成的周期性结构,周期为5~8;0.01<a<0.05;AlGaN突变阶梯势垒层由多层AlGaN组成,且从下至上各层AlGaN中的Al组分x逐渐增加,0.08≤x≤0.16。具体,如图2所示,AlGaN突变阶梯势垒层由三层AlGaN组成,从下至上分别为AlbGa1-bN势垒层、AlcGa1-cN势垒层和AldGa1-dN势垒层,且b约为0.08,c约为0.12,d约为0.16。且AlGaN突变阶梯势垒层中掺杂有浓度在5×1016~5×1018cm-2之间的硅,InaGa1-aN量子阱层的厚度为1~5nm,AlGaN突变阶梯势垒层的总厚度为10~20nm。
在一实例中,使用MOCVD生长设备、选用Si(111)衬底为硅衬底层1、非掺杂AlN/AlGaN层为应力控制层2,Si掺杂的AlGaN层作为n型电流扩展层3,InaGa1-aN量子阱层和AlGaN突变阶梯势垒层组成的多量子阱结构作为有源区发光层4,Mg掺杂的AlGaN层作为p型电流扩展层5,具体:
首先,将硅衬底层1放置到MOCVD反应室中,升温到1100℃,并通入H2进行高温表面清洁处理。
随后,将反应室温度设定在800~1200℃,往反应室中通入三甲基铝(TMAl)、氨气(NH3),在H2作为载气的条件下生长一层AlN,相同条件下在AlN上通过三甲基铝(TMAl)、三甲基镓(TMGa)、氨气(NH3)生长一层AlGaN,形成应力控制层2。
紧接着,以硅烷(SiH4)作为掺杂剂,掺杂浓度为8×1018cm-3,生长温度在900~1100℃,实现n型电流扩展层3的生长,生长出来的n型电流扩展层3为Al组分7%的n型Al0.07Ga0.93N层,厚度3000nm。
之后,反应室温度为750℃,以氮气(N2)作为载气,通入三甲基铟(TMIn)、三乙基镓(TEGa)、氨气(NH3)生长厚度为3nm的In0.02Ga0.98N量子阱层;接着将反应室温度升高到850℃,通入三甲基铝(TMAl)、三乙基镓(TEGa)、氨气(NH3)生长厚度为4nm的Al0.08Ga0.92N势垒层,同时通入硅烷(SiH4)进行掺杂,掺杂浓度2×1018cm-3。之后,以相同的生长条件下通过调整TMAl的流量,分别生长厚度为4nm的Al0.12Ga0.88N势垒层和厚度为4nm的Al0.16Ga0.84N势垒层,形成AlGaN突变阶梯势垒层,完成一个周期的生长。之后,将Al0.08Ga0.92N势垒层和AlGaN突变阶梯势垒层形成的结构重复生长5对得到有源区发光层4。该量子阱结构的发光波长365nm,属于近紫外波段。
最后,以H2或者N2作为载气,通入TMAl、TMGa及NH3,且以二茂镁(Cp2Mg)作为掺杂剂在外延生长温度为900℃~1000℃的条件下生长p型电流扩展层5,厚度为80nm。
将紫外LED芯片(包括本实例中GaN基紫外LED的外延结构制备的紫外LED芯片和普通InGaN/AlGaN量子阱结构制备的紫外LED芯片)切割成1.125*1.125mm大小,在350mA电流下进行光功率测量,本实例中LED芯片的光功率为430mW,普通InGaN/AlGaN量子阱结构的紫外LED芯片的光功率为405mW,可见,使用本发明方法制备得到的紫外LED芯片的光功率得到了提升。
应当说明的是,上述实施例均可根据需要自由组合。以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。

Claims (5)

1.一种GaN基紫外LED的外延结构,其特征在于,包括:在生长衬底表面依次生长的应力控制层、n型电流扩展层、有源区发光层及p型电流扩展层;其中,有源区发光层为由InaGa1- aN量子阱层和AlGaN突变阶梯势垒层形成的周期性结构;0.01<a<0.05;AlGaN突变阶梯势垒层由多层AlGaN组成,且从下至上各层AlGaN中的Al组分x逐渐增加,0.08≤x≤0.16;在阶梯Al组分突变量子垒中间引入二维电子气。
2.如权利要求1所述的GaN基紫外LED的外延结构,其特征在于,所述有源区发光层由5~8个InaGa1-aN量子阱层和AlGaN突变阶梯势垒层形成的周期性结构组成。
3.如权利要求1所述的GaN基紫外LED的外延结构,其特征在于,所述AlGaN突变阶梯势垒层由三层AlGaN组成,从下至上分别为AlbGa1-bN势垒层、AlcGa1-cN势垒层和AldGa1-dN势垒层,且b为0.08,c为0.12,d为0.16。
4.如权利要求1或2或3所述的GaN基紫外LED的外延结构,其特征在于,所述InaGa1-aN量子阱层的厚度为1~5nm,AlGaN突变阶梯势垒层的总厚度为10~20nm。
5.如权利要求1或2或3所述的GaN基紫外LED的外延结构,其特征在于,所述AlGaN突变阶梯势垒层中掺杂有浓度在5×1016~5×1018cm-2之间的硅。
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