CN110662974A - 信号分配装置 - Google Patents

信号分配装置 Download PDF

Info

Publication number
CN110662974A
CN110662974A CN201880035967.XA CN201880035967A CN110662974A CN 110662974 A CN110662974 A CN 110662974A CN 201880035967 A CN201880035967 A CN 201880035967A CN 110662974 A CN110662974 A CN 110662974A
Authority
CN
China
Prior art keywords
transistors
circuit
voltage
pair
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201880035967.XA
Other languages
English (en)
Chinese (zh)
Inventor
J.博思威克
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
QualiTau Inc
Original Assignee
QualiTau Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by QualiTau Inc filed Critical QualiTau Inc
Publication of CN110662974A publication Critical patent/CN110662974A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C11/00—Non-adjustable liquid resistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/60—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being bipolar transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/78—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled
    • H03K17/785—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled controlling field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0063—High side switches, i.e. the higher potential [DC] or life wire [AC] being directly connected to the switch and not via the load
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Input Circuits Of Receivers And Coupling Of Receivers And Audio Equipment (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Medicines That Contain Protein Lipid Enzymes And Other Medicines (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electronic Switches (AREA)
CN201880035967.XA 2017-05-03 2018-05-02 信号分配装置 Pending CN110662974A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762500659P 2017-05-03 2017-05-03
US62/500659 2017-05-03
PCT/US2018/030625 WO2018204481A1 (en) 2017-05-03 2018-05-02 Signal distribution apparatus

Publications (1)

Publication Number Publication Date
CN110662974A true CN110662974A (zh) 2020-01-07

Family

ID=64015234

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201880035967.XA Pending CN110662974A (zh) 2017-05-03 2018-05-02 信号分配装置

Country Status (8)

Country Link
US (1) US10690715B2 (ko)
EP (1) EP3619545A4 (ko)
JP (2) JP2020518822A (ko)
KR (2) KR20190138699A (ko)
CN (1) CN110662974A (ko)
SG (1) SG11201910036YA (ko)
TW (1) TWI816672B (ko)
WO (1) WO2018204481A1 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10725105B2 (en) * 2017-09-29 2020-07-28 Keithley Instruments, Llc Current leakage and charge injection mitigating solid state switch
US12025663B2 (en) * 2019-12-16 2024-07-02 Celerint, Llc Method for semiconductor device interface circuitry functionality and compliance testing
US11162989B2 (en) * 2020-02-12 2021-11-02 Rohde & Schwarz Gmbh & Co. Kg Measurement device
CN112798927A (zh) * 2020-12-24 2021-05-14 武汉大学 一种限幅器芯片大信号指标的测试系统及方法
CN115902567B (zh) * 2023-02-15 2023-06-13 苏州联讯仪器股份有限公司 一种高压晶体管测试电路及系统

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2024462A (en) * 1978-05-08 1980-01-09 Bendix Corp Integrated Closed Loop Engine Control System
JPS6480123A (en) * 1987-09-22 1989-03-27 Matsushita Electric Ind Co Ltd Signal switching circuit
US5391984A (en) * 1991-11-01 1995-02-21 Sgs-Thomson Microelectronics, Inc. Method and apparatus for testing integrated circuit devices
US5880540A (en) * 1995-09-01 1999-03-09 Hewlett-Packard Company Switching apparatus with current limiting circuit
US6329785B1 (en) * 2000-02-29 2001-12-11 Gas Research Institute Pulse width modulated controlled induction motor
US6339236B1 (en) * 1999-09-27 2002-01-15 Matsushita Electric Works, Ltd. Light responsive semiconductor switch with shorted load protection
CN1973206A (zh) * 2004-03-05 2007-05-30 夸利陶公司 用于半导体设备测试的双通道电源测量装置
CN1980059A (zh) * 2005-12-07 2007-06-13 万国半导体股份有限公司 具有经减小的开关电阻和更低的制造成本的电流限制双向mosfet开关
TW200836036A (en) * 2007-01-26 2008-09-01 Advantest Corp A voltage generator with current restrictor and semiconductor testing apparatus
CN101629979A (zh) * 2008-07-15 2010-01-20 中芯国际集成电路制造(上海)有限公司 测试装置
CN101923141A (zh) * 2009-06-11 2010-12-22 国际商业机器公司 应力测试方法和测试装置
US20140125298A1 (en) * 2012-11-06 2014-05-08 Volterra Semiconductor Corporation Fault-rejecting mixer and applications
US20150108960A1 (en) * 2010-08-18 2015-04-23 Volterra Semiconductor Corporation Switching Circuits For Extracting Power From An Electric Power Source And Associated Methods
US20160161548A1 (en) * 2011-03-21 2016-06-09 Ridgetop Group, Inc. Programmable test structure for characterization of integrated circuit fabrication processes

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (ja) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 素子測定装置
US6211627B1 (en) * 1997-07-29 2001-04-03 Michael Callahan Lighting systems
JP2001119283A (ja) * 1999-10-15 2001-04-27 Matsushita Electric Works Ltd 半導体リレー
US6608445B2 (en) * 2001-12-12 2003-08-19 Honeywell International Inc. Efficient solid state switching and control system for retractable aircraft landing lights
JP4218386B2 (ja) * 2003-03-25 2009-02-04 株式会社ジェイテクト Ｄ級アンプ出力回路及び磁気軸受制御装置
JP5312227B2 (ja) * 2009-06-29 2013-10-09 株式会社日本マイクロニクス プローブカード及び検査装置
CN103809114B (zh) * 2014-01-21 2017-01-04 清华大学 一种模块化多电平换流器换流阀的功率对冲试验装置
US9398647B2 (en) * 2014-12-08 2016-07-19 Phoseon Technology, Inc. Automatic power controller

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2024462A (en) * 1978-05-08 1980-01-09 Bendix Corp Integrated Closed Loop Engine Control System
JPS6480123A (en) * 1987-09-22 1989-03-27 Matsushita Electric Ind Co Ltd Signal switching circuit
US5391984A (en) * 1991-11-01 1995-02-21 Sgs-Thomson Microelectronics, Inc. Method and apparatus for testing integrated circuit devices
US5880540A (en) * 1995-09-01 1999-03-09 Hewlett-Packard Company Switching apparatus with current limiting circuit
US6339236B1 (en) * 1999-09-27 2002-01-15 Matsushita Electric Works, Ltd. Light responsive semiconductor switch with shorted load protection
US6329785B1 (en) * 2000-02-29 2001-12-11 Gas Research Institute Pulse width modulated controlled induction motor
CN1973206A (zh) * 2004-03-05 2007-05-30 夸利陶公司 用于半导体设备测试的双通道电源测量装置
CN1980059A (zh) * 2005-12-07 2007-06-13 万国半导体股份有限公司 具有经减小的开关电阻和更低的制造成本的电流限制双向mosfet开关
TW200836036A (en) * 2007-01-26 2008-09-01 Advantest Corp A voltage generator with current restrictor and semiconductor testing apparatus
CN101629979A (zh) * 2008-07-15 2010-01-20 中芯国际集成电路制造(上海)有限公司 测试装置
CN101923141A (zh) * 2009-06-11 2010-12-22 国际商业机器公司 应力测试方法和测试装置
US20150108960A1 (en) * 2010-08-18 2015-04-23 Volterra Semiconductor Corporation Switching Circuits For Extracting Power From An Electric Power Source And Associated Methods
US20160161548A1 (en) * 2011-03-21 2016-06-09 Ridgetop Group, Inc. Programmable test structure for characterization of integrated circuit fabrication processes
US20140125298A1 (en) * 2012-11-06 2014-05-08 Volterra Semiconductor Corporation Fault-rejecting mixer and applications

Also Published As

Publication number Publication date
TW201907176A (zh) 2019-02-16
JP2024074954A (ja) 2024-05-31
JP2020518822A (ja) 2020-06-25
SG11201910036YA (en) 2019-11-28
US10690715B2 (en) 2020-06-23
US20180321300A1 (en) 2018-11-08
WO2018204481A1 (en) 2018-11-08
KR20190138699A (ko) 2019-12-13
EP3619545A1 (en) 2020-03-11
EP3619545A4 (en) 2021-01-20
KR20240056768A (ko) 2024-04-30
TWI816672B (zh) 2023-10-01

Similar Documents

Publication Publication Date Title
US10690715B2 (en) Signal distribution apparatus
US10042002B2 (en) System and method for contact measurement circuit
EP1175624B1 (en) Integrated circuit with test interface
JP6095199B2 (ja) 選択可能閾値リセット回路
US11431162B2 (en) Smart electronic switch
US8582265B2 (en) Protection circuit and method for electronic devices
US11539357B2 (en) Smart electronic switch
US11112464B2 (en) Signal output device
US20200244259A1 (en) Multi-functional pin of an integrated circuit
TW201531030A (zh) 用於使用積體電路接腳作為限流輸入及汲極開路輸出之系統及方法
CN215344364U (zh) 功率器件驱动电路及电子设备
US11114880B2 (en) Current regulating circuit and power supply management circuit including the same
US20200303916A1 (en) Communication controller short protection
US11349471B2 (en) Smart electronic switch
US8488288B2 (en) Input protection method with variable tripping threshold and low parasitic elements
EP1901409A2 (en) Apparatus and method for overload protection of electronic circuitry
CN108693906B (zh) 电压调节器
US11054444B2 (en) System and method for limiting voltage
CN113315356A (zh) 功率器件驱动电路
US11018459B2 (en) Protection circuit against high voltages for USB type C receiver
US8330483B2 (en) Semiconductor device to detect abnormal leakage current caused by a defect
US20240094751A1 (en) Current controlled voltage regulator testing
CN220042973U (zh) 可切换量程的电流保护电路
KR20000034530A (ko) 반도체 장치를 테스트하기 위한 퍼포먼스 보드
CN113711063A (zh) 功率器件监测系统和监测方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination