SG11201910036YA - Signal distribution apparatus - Google Patents

Signal distribution apparatus

Info

Publication number
SG11201910036YA
SG11201910036YA SG11201910036YA SG11201910036YA SG 11201910036Y A SG11201910036Y A SG 11201910036YA SG 11201910036Y A SG11201910036Y A SG 11201910036YA SG 11201910036Y A SG11201910036Y A SG 11201910036YA
Authority
SG
Singapore
Prior art keywords
international
duts
outputs
single input
voltage signal
Prior art date
Application number
Inventor
James Borthwick
Original Assignee
Qualitau Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualitau Inc filed Critical Qualitau Inc
Publication of SG11201910036YA publication Critical patent/SG11201910036YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/78—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled
    • H03K17/785—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled controlling field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0063—High side switches, i.e. the higher potential [DC] or life wire [AC] being directly connected to the switch and not via the load
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Abstract

coO O C (12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 08 November 2018 (08.11.2018) WIPO I PCT ill IIIIIl °mons ono o HoloimmomE oimIE (10) International Publication Number WO 2018/204481 Al (51) International Patent Classification: GO1R 31/317 (2006.01) GO1R 31/319 (2006.01) (21) International Application Number: PCT/US2018/030625 (22) International Filing Date: 02 May 2018 (02.05.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 62/500,659 03 May 2017 (03.05.2017) US (71) Applicant: QUALITAU, INC. [US/US]; 830 W Maude Avenue, Mountain View, California 94043 (US). (72) Inventor: BORTHWICK, James; 564 Park Court, Santa Clara, California 95050 (US). (74) Agent: CHEN, Tina; BEYER LAW GROUP LLP, P.O. Box 51887, Palo Alto, California 94303-1887 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Published: — with international search report (Art. 21(3)) (54) Title: SIGNAL DISTRIBUTION APPARATUS 700 Receive at a single input a stress voltage signal to be distributed 702 Distribute the stress voltage signal to a plurality of DUTs through a plurality of outputs 704 V Connect a DUT of the plurality of DUTs to the single input through an output of the plurality of outputs and through an integrated current limiter and switch circuit 706 Fig. 7 (57) : A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.
SG11201910036Y 2017-05-03 2018-05-02 Signal distribution apparatus SG11201910036YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762500659P 2017-05-03 2017-05-03
PCT/US2018/030625 WO2018204481A1 (en) 2017-05-03 2018-05-02 Signal distribution apparatus

Publications (1)

Publication Number Publication Date
SG11201910036YA true SG11201910036YA (en) 2019-11-28

Family

ID=64015234

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201910036Y SG11201910036YA (en) 2017-05-03 2018-05-02 Signal distribution apparatus

Country Status (8)

Country Link
US (1) US10690715B2 (en)
EP (1) EP3619545A4 (en)
JP (1) JP2020518822A (en)
KR (1) KR20190138699A (en)
CN (1) CN110662974A (en)
SG (1) SG11201910036YA (en)
TW (1) TWI816672B (en)
WO (1) WO2018204481A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10725105B2 (en) * 2017-09-29 2020-07-28 Keithley Instruments, Llc Current leakage and charge injection mitigating solid state switch
US20210181252A1 (en) * 2019-12-16 2021-06-17 Celerint, Llc Method for semiconductor device interface circuitry functionality and compliance testing
US11162989B2 (en) * 2020-02-12 2021-11-02 Rohde & Schwarz Gmbh & Co. Kg Measurement device
CN112798927A (en) * 2020-12-24 2021-05-14 武汉大学 System and method for testing large signal index of amplitude limiter chip
CN115902567B (en) * 2023-02-15 2023-06-13 苏州联讯仪器股份有限公司 High-voltage transistor test circuit and system

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2024462B (en) * 1978-05-08 1983-03-30 Bendix Corp Integrated closed loop engine control system
JPH0721526B2 (en) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 Element measuring device
JPS6480123A (en) * 1987-09-22 1989-03-27 Matsushita Electric Ind Co Ltd Signal switching circuit
US5391984A (en) * 1991-11-01 1995-02-21 Sgs-Thomson Microelectronics, Inc. Method and apparatus for testing integrated circuit devices
JP3558425B2 (en) * 1995-09-01 2004-08-25 アジレント・テクノロジーズ・インク Signal switching device and switch circuit
US6211627B1 (en) * 1997-07-29 2001-04-03 Michael Callahan Lighting systems
TW457767B (en) * 1999-09-27 2001-10-01 Matsushita Electric Works Ltd Photo response semiconductor switch having short circuit load protection
JP2001119283A (en) * 1999-10-15 2001-04-27 Matsushita Electric Works Ltd Semiconductor relay
US6329785B1 (en) * 2000-02-29 2001-12-11 Gas Research Institute Pulse width modulated controlled induction motor
US6608445B2 (en) * 2001-12-12 2003-08-19 Honeywell International Inc. Efficient solid state switching and control system for retractable aircraft landing lights
JP4218386B2 (en) * 2003-03-25 2009-02-04 株式会社ジェイテクト Class D amplifier output circuit and magnetic bearing control device
US7151389B2 (en) * 2004-03-05 2006-12-19 Qualitau, Inc. Dual channel source measurement unit for semiconductor device testing
US7457092B2 (en) * 2005-12-07 2008-11-25 Alpha & Omega Semiconductor, Lld. Current limited bilateral MOSFET switch with reduced switch resistance and lower manufacturing cost
US7834607B2 (en) * 2007-01-26 2010-11-16 Advantest Corporation Voltage generator with current limiting and semiconductor testing device
CN101629979B (en) * 2008-07-15 2011-07-13 中芯国际集成电路制造(上海)有限公司 Testing device
US8120356B2 (en) * 2009-06-11 2012-02-21 International Business Machines Corporation Measurement methodology and array structure for statistical stress and test of reliabilty structures
JP5312227B2 (en) * 2009-06-29 2013-10-09 株式会社日本マイクロニクス Probe card and inspection device
US8872384B2 (en) * 2010-08-18 2014-10-28 Volterra Semiconductor Corporation Switching circuits for extracting power from an electric power source and associated methods
US10082535B2 (en) * 2011-03-21 2018-09-25 Ridgetop Group, Inc. Programmable test structure for characterization of integrated circuit fabrication processes
US9529372B2 (en) * 2012-11-06 2016-12-27 Volterra Semiconductor Corporation Fault-rejecting mixer and applications
CN103809114B (en) * 2014-01-21 2017-01-04 清华大学 The power of a kind of modularization multi-level converter converter valve liquidates assay device
US9398647B2 (en) * 2014-12-08 2016-07-19 Phoseon Technology, Inc. Automatic power controller

Also Published As

Publication number Publication date
US20180321300A1 (en) 2018-11-08
US10690715B2 (en) 2020-06-23
KR20190138699A (en) 2019-12-13
CN110662974A (en) 2020-01-07
TWI816672B (en) 2023-10-01
EP3619545A1 (en) 2020-03-11
TW201907176A (en) 2019-02-16
WO2018204481A1 (en) 2018-11-08
EP3619545A4 (en) 2021-01-20
JP2020518822A (en) 2020-06-25

Similar Documents

Publication Publication Date Title
SG11201910036YA (en) Signal distribution apparatus
SG11201805186VA (en) Compositions and methods for immune cell modulation in adoptive immunotherapies
SG11201808968WA (en) Time division multiplexing of synchronization channels
SG11201900783PA (en) Devices, systems, and methods for training pelvic floor muscles
SG11201807679XA (en) Methods and devices for determining precoder parameters in a wireless communication network
SG11201909949XA (en) Targeted immunotolerance
SG11201907912YA (en) An appliance operation signal processing system and method
SG11201807389XA (en) System and method for beam management
SG11201807552YA (en) Solid-state impedance matching systems including a hybrid tuning network with a switchable coarse tuning network and a varactor fine tuning network
SG11201903604PA (en) Iot security service
SG11201906794TA (en) Systems and methods for issuing and tracking digital tokens within distributed network nodes
SG11201909116QA (en) Synchronization for wideband coverage enhancement
SG11201900310RA (en) Declaring quasi co-location among multiple antenna ports
SG11201710421WA (en) Vending machine
SG11201803073TA (en) Insect singulator system
SG11201908288XA (en) Configurable annotations for privacy-sensitive user content
SG11201805422WA (en) Multivalent and multispecific ox40-binding fusion proteins
SG11201806758VA (en) Vcn enhancer compositions and methods of using the same
SG11201810280YA (en) Spiro-lactam nmda receptor modulators and uses thereof
SG11201906413XA (en) Exposure apparatus
SG11201900917SA (en) Distributed resource electrical demand forecasting system and method
SG11201900554YA (en) Spiro-lactam nmda modulators and methods of using same
SG11201900551WA (en) Spiro-lactam nmda receptor modulators and uses thereof
SG11201810586XA (en) Enhanced device interaction
SG11201900611QA (en) Electrical connector