JP2020518822A - 信号分配装置 - Google Patents
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- G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
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- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
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- G—PHYSICS
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C11/00—Non-adjustable liquid resistors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/60—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being bipolar transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/78—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled
- H03K17/785—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled controlling field-effect transistor switches
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0063—High side switches, i.e. the higher potential [DC] or life wire [AC] being directly connected to the switch and not via the load
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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- Testing Of Individual Semiconductor Devices (AREA)
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- Radar Systems Or Details Thereof (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
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Abstract
Description
本出願は、全ての目的のためにその全てが参照として本明細書に援用される、2017年5月3日出願の同時係属中の米国仮出願第62/500,659号の優先権を主張する。
Claims (16)
- ストレス電圧信号を複数の被検査装置(DUT)に提供するための信号分配装置であって、
分配される前記ストレス電圧信号を受信する単一入力と、
前記ストレス電圧信号を前記複数のDUTに分配する複数の出力と、
複数の統合電流リミッタ・スイッチ回路であって、各統合電流リミッタ・スイッチ回路は、前記複数のDUTのうちの1つのDUTを前記複数の出力のうちの1つを通じて前記単一入力に接続し、少なくとも1つの複合スイッチング・電流制限素子を含む、複数の統合電流リミッタ・スイッチ回路と、
を備える、信号分配装置。 - 請求項1に記載の信号分配装置あって、
前記少なくとも1つの複合スイッチング・電流制限素子は、前記DUTを行き来するバイポーラ電流を制限し切り替えるための一対のトランジスタである、信号分配装置。 - 請求項2に記載の信号分配装置であって、さらに、
前記一対のトランジスタに接続されたバイアス回路を備え、前記バイアス回路は、前記一対のトランジスタをオン状態またはオフ状態にバイアスするための光起電絶縁体を備える、信号分配装置。 - 請求項3に記載の信号分配装置であって、さらに、
時間制御されたバイアス信号を前記一対のトランジスタに提供するために前記光起電絶縁体の前記出力に接続された抵抗器コンデンサネットワークを備える、信号分配装置。 - 請求項3に記載の信号分配装置であって、
前記統合電流リミッタ・スイッチ回路は、各々、前記一対のトランジスタの前記バイアスを妨げ、前記一対のトランジスタを流れる電流を制限するために、前記一対のトランジスタに接続された2つの直列抵抗器を備える、信号分配装置。 - 請求項5に記載の信号分配装置であって、
前記2つの直列抵抗器は、前記統合電流リミッタ・スイッチ回路の電流制限レベルを調節するための可調整抵抗器である、信号分配装置。 - 請求項6に記載の信号分配装置であって、
前記2つの可調整抵抗器は、機械ポテンショメータである、信号分配装置。 - 請求項6に記載の信号分配装置であって、
前記2つの可調整抵抗器は、デジタルポテンショメータである、信号分配装置。 - 請求項1に記載の信号分配装置であって、
前記少なくとも1つの複合スイッチング・電流制限素子は、単向電流を制限し切り替えるための単一トランジスタである、信号分配装置。 - 請求項1に記載の信号分配装置であって、さらに、
各DUTの電圧を測定するための選択可能な電圧測定回路を備え、前記選択可能な電圧測定回路は、
各々が前記複数の出力の1つに接続されている複数の電圧測定スイッチと、
前記複数の電圧測定スイッチのスイッチングを制御するスイッチ制御回路と、
前記複数の電圧測定スイッチの各々に接続されている電圧測定回路と、
を含む、信号分配装置。 - ストレス電圧信号を複数の被検査装置(DUT)に分配するための方法であって、
分配される前記ストレス電圧信号を単一入力で受信することと、
前記ストレス電圧信号を複数の出力を通じて前記複数のDUTに分配することと、
前記複数のDUTのうちの1つのDUTを、前記複数の出力のうちの1つの出力を通じて、および、複数の統合電流リミッタ・スイッチ回路のうちの1つの統合電流リミッタ・スイッチ回路を通じて、前記単一入力に接続することであって、各統合電流リミッタ・スイッチ回路は、少なくとも1つの複合スイッチング・電流制限素子を含むことと、
を含む、方法。 - 請求項11に記載の方法であって、
前記少なくとも1つの複合スイッチング・電流制限素子は、前記DUTを行き来するバイポーラ電流を制限し切り替えるための一対のトランジスタである、方法。 - 請求項12に記載の方法であって、さらに、
バイアス回路を前記一対のトランジスタに接続することを含み、前記バイアス回路は、前記一対のトランジスタをオン状態またはオフ状態にバイアスするための光起電絶縁体を備える、方法。 - 請求項13に記載の方法であって、さらに、
時間制御されたバイアス信号を前記一対のトランジスタに提供するために、抵抗器コンデンサネットワークを前記光起電絶縁体の前記出力に接続することを含む、方法。 - 請求項13に記載の方法であって、さらに、
前記一対のトランジスタの前記バイアスを妨げ、前記一対のトランジスタを流れる電流を制限するために、2つの直列抵抗器を前記一対のトランジスタに接続することを含む、方法。 - 請求項11に記載の方法であって、さらに、
選択可能な電圧測定回路を用いて各DUTの電圧を測定することを含み、前記選択可能な電圧測定回路は、
各々が前記複数の出力の1つに接続されている複数の電圧測定スイッチと、
前記複数の電圧測定スイッチのスイッチングを制御するスイッチ制御回路と、
前記複数の電圧測定スイッチの各々に接続されている電圧測定回路と、を含む、方法。
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US11162989B2 (en) * | 2020-02-12 | 2021-11-02 | Rohde & Schwarz Gmbh & Co. Kg | Measurement device |
CN112798927A (zh) * | 2020-12-24 | 2021-05-14 | 武汉大学 | 一种限幅器芯片大信号指标的测试系统及方法 |
CN115902567B (zh) * | 2023-02-15 | 2023-06-13 | 苏州联讯仪器股份有限公司 | 一种高压晶体管测试电路及系统 |
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- 2018-05-02 WO PCT/US2018/030625 patent/WO2018204481A1/en unknown
- 2018-05-02 KR KR1020197035768A patent/KR20190138699A/ko not_active IP Right Cessation
- 2018-05-02 US US15/969,088 patent/US10690715B2/en active Active
- 2018-05-02 KR KR1020247012670A patent/KR20240056768A/ko not_active Application Discontinuation
- 2018-05-02 SG SG11201910036Y patent/SG11201910036YA/en unknown
- 2018-05-02 TW TW107114858A patent/TWI816672B/zh active
- 2018-05-02 CN CN201880035967.XA patent/CN110662974A/zh active Pending
- 2018-05-02 EP EP18794290.9A patent/EP3619545A4/en active Pending
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2024
- 2024-04-09 JP JP2024062461A patent/JP2024074954A/ja active Pending
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Also Published As
Publication number | Publication date |
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JP2024074954A (ja) | 2024-05-31 |
KR20240056768A (ko) | 2024-04-30 |
CN110662974A (zh) | 2020-01-07 |
WO2018204481A1 (en) | 2018-11-08 |
TWI816672B (zh) | 2023-10-01 |
KR20190138699A (ko) | 2019-12-13 |
SG11201910036YA (en) | 2019-11-28 |
EP3619545A4 (en) | 2021-01-20 |
TW201907176A (zh) | 2019-02-16 |
EP3619545A1 (en) | 2020-03-11 |
US10690715B2 (en) | 2020-06-23 |
US20180321300A1 (en) | 2018-11-08 |
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