CN110610950A - 固体摄像元件的制造方法 - Google Patents

固体摄像元件的制造方法 Download PDF

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CN110610950A
CN110610950A CN201910507651.2A CN201910507651A CN110610950A CN 110610950 A CN110610950 A CN 110610950A CN 201910507651 A CN201910507651 A CN 201910507651A CN 110610950 A CN110610950 A CN 110610950A
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photosensitive material
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川野裕行
荒川友章
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Abstract

本发明的一方式的固体摄像元件(100)的制造方法包括在除去周边电路区域(30)的感光材料(M)的同时,减少像素区域(20)的感光材料(M)中的多层配线层(5)上的感光材料(M)的厚度从而调整为希望的膜厚(T1)的显影工序。

Description

固体摄像元件的制造方法
技术领域
本发明涉及固体摄像元件的制造方法,特别涉及具有光学波导的固体摄像元件的制造方法。
背景技术
近年来提出了一种包括光学波导的固体摄像元件,该光学波导用于增加入射至光电转换部的光量。例如,专利文献1中公开了一种固体摄像元件的制造方法,该制造方法在像素区域设置有将形成光学波导的感光材料(波导材料)的一部分除去而形成的槽。另外,在专利文献2中公开了一种固体摄像元件的制造方法,该制造方法包括通过CMP(ChemicalMechanical Polishing,化学机械抛光)等方法使像素区域的感光材料平坦化的工序。
现有技术文献
专利文献
专利文献1:日本公开专利公报“2012-4368号公报”
专利文献2:日本公开专利公报“2015-144298号公报”
发明内容
发明要解决的问题
为了在光学波导中埋设感光材料,通常需要以相对于光学波导的开口直径大约二分之一至四分之一的膜厚涂布感光材料。因此,在专利文献1的制造方法中,形成于像素区域的层间绝缘膜上的感光材料的埋入膜的膜厚大。由此,存在配置在埋入膜上的彩色滤光片以及微透镜远离光学波导,朝向相邻像素的光泄露增加等不良。另外,在专利文献2的制造方法中,有必要增加利用CMP等调整埋入膜的膜厚的工序。因此,在制造成本、良率的方面是不利的。
本发明的一个方式目的在于提供一种固体摄像元件的制造方法,其不增加工序就能够调整像素区域的埋入膜的厚度。
用于解决问题的方案
(1)本发明的一方式的固体摄像元件的制造方法中,所述固体摄像元件包括像素区域以及配置有处理来自该像素区域的信号的电路的周边电路区域,在所述像素区域形成有光学波导,其特征在于,所述固体摄像元件的制造方法包括:涂布工序,对横跨所述像素区域以及所述周边电路区域形成的、具有用于形成所述光学波导的开口部的多层配线层,涂布感光材料M;曝光工序,对所述感光材料的一部分进行曝光;和显影工序,在除去所述周边电路区域的所述感光材料的同时,减少所述像素区域的所述感光材料中的所述多层配线层上的所述感光材料的厚度从而调整为希望的膜厚。
(2)本发明的一方式的固体摄像元件的制造方法特征在于,在所述(1)的构成的基础上,在所述显影工序中,将所述像素区域的所述多层配线层上的所述感光材料的厚度减少至三分之一以下的固体摄像元件的制造方法。
(3)本发明的一方式的固体摄像元件的制造方法特征在于,在所述(1)或(2)的构成的基础上,在所述涂布工序与所述显影工序之间,还包括对所述感光材料进行亲水化处理的亲水化处理工序的固体摄像元件的制造方法。
(4)本发明的一方式的固体摄像元件的制造方法特征在于,在所述(3)的构成的基础上,在所述亲水化处理工序与所述显影工序之间,还包括对所述感光材料进行水洗的水洗处理工序的固体摄像元件的制造方法。
(5)本发明的一方式的固体摄像元件的制造方法特征在于,在所述(1)或(2)的构成的基础上,在所述曝光工序与所述显影工序之间,还包括对涂布在所述多层配线层的所述感光材料进行水洗处理的水洗处理工序的固体摄像元件的制造方法。
(6)本发明的一方式的固体摄像元件的制造方法特征在于,在所述(1)至(5)的构成的基础上,所述显影工序将所述感光材料浸泡在显影液中,在所述显影工序中,通过控制所述感光材料的所述显影液的浸泡时间,能够减少所述多层配线层上的所述感光材料的厚度从而调整为希望的膜厚的固体摄像元件的制造方法。
发明效果
根据本发明的一个方式,能够提供一种固体摄像元件的制造方法,其不增加工序就能够调整像素区域的埋入膜的厚度。
附图说明
图1示出本发明的实施方式的固体摄像元件的截面图。
图2是表示上述固体摄像元件的制造工序的流程图的截面图。
图3是表示作为比较对照的固体摄像元件的截面图。
具体实施方式
下面,基于图1~图3,对本发明的一实施方式进行详细说明。
(固体摄像元件的构成)
以下参照图1,说明本发明的一方式的固体摄像元件的构成。图1是示出本发明的一个方式的固体摄像元件10的截面图。固体摄像元件100为例如CMOS(ComplementaryMetal Oxide Semiconductor,互补金属氧化物半导体)型图像传感器。固体摄像元件100包括半导体基板1、光电转换部3、多层配线层5、光学波导7、埋入膜9、彩色滤光片11以及微透镜13。
固体摄像元件100包括配置有多个光电转换部3的像素区域20、以及配置有处理来自像素区域20的信号的电路的周边电路区域30。像素区域20中配置有光电转换部3、形成于多层配线层5的开口部(通孔)52内的光学波导7、埋入膜9、彩色滤光片11以及微透镜13。
在像素区域20,多个光电转换部3形成在由硅等构成的半导体基板1中。各光电转换部3上分别配置有成为光的传播路径的光学波导7。
多层配线层5形成于半导体基板1上,包括层间绝缘膜51以及配线52。层间绝缘膜51为通过等离子CVD(Chemical Vapor Deposition,化学气相沉积)工序等形成的氧化膜等。层间绝缘膜51的材料,根据配线52的材料适当选择最合适的材料。配线52由导电部件构成。配线52配置在多层,各配线52之间存在层间绝缘膜51。由此,配线52分别被绝缘。作为配线52,例如能够列举Al(铝)配线、Cu(铜)配线等。此外,作为适用于Al配线的层间绝缘膜51的材料能够列举例如氧化硅膜等。另外,作为适用于Cu配线的层间绝缘膜51的材料能够列举例如氧化硅膜或者碳化硅膜等。
多层配线层5具有用于形成光学波导7的开口部53。开口部53对应于各光学转换部3形成有多个。开口部52利用光刻工序、干法刻蚀工序等来形成。
光学波导7以及埋入膜9均由感光材料(波导材料)M形成。光学波导7通过感光材料M被埋入开口部53内而形成。另外,埋入膜9通过不埋入开口部53内,而配置于开口部53上以及多层配线层5上的感光材料M形成。感光材料M能够列举例如聚酰亚胺、聚硅氧烷,也可以使用正型、负型的任意感光剂。
多个彩色滤光片11对应于光学转换部3形成在埋入膜9上。彩色滤光片能够根据用途逐个像素改变颜色。微透镜13形成于彩色滤光片11上。彩色滤光片11以及微透镜13均通过光刻工序等形成。
固体摄像元件100通过彩色滤光片11对微透镜13聚光的入射光进行分光。被分光的入射光通过埋入膜9以及光学波导7入射至光电转换部3。
此处,埋入膜9的厚度大时,配置于埋入膜9上的彩色滤光片11以及微透镜13远离光学波导7,向相邻像素的光泄露增加。因此,以往提出了为了抑制上述光泄露,利用CMP等减小埋入膜9的厚度。但是,在现有的方法中,需要另外增加减小埋入膜的厚度的工序,在制造成本、良率的方面是不利的。本实施方式的固体摄像元件100的制造方法实现了不增加工序,调整埋入膜9的厚度的目的。
(固体摄像元件的制造方法)
以下参照图2,说明本实施方式的固体摄像元件100的制造方法。此外,以下说明的固体摄像元件的制造方法中的各工序能够利用一般的固体摄像元件的制造装置来实施。
图2的(a)~(d)是表示固体摄像元件100的制造工序的流程图的截面图。如图2的(a)所示,首先,在半导体基板1的像素区域20形成多个光电转换部3。光电转换部3通过反复实施光刻工序、离子注入工序而形成。此外,在半导体基板1上也形成有像素、用于周边电路的动作的栅极电极等,其说明被省略。
接下来,利用CVD工序、CMP工序等在半导体基板1上形成层间绝缘膜51。接下来,利用溅射工序、光刻工序、干法刻蚀工序等来形成配线52。通过多次实施形成层间绝缘膜51与配线52的工序,形成配线52被多层化的多层配线层5。在配线52为Al配线的情况下,利用光刻工序、干法刻蚀工序等来形成配线52。在配线52为Cu配线的情况下,作为槽埋入配线构造,例如利用光刻工序、CVD工序、CMP工序等来形成配线52。此外,虽然在多层配线层5中也形成导通半导体基板1与配线52的接触孔等,但其说明被省略。
接下来,利用光刻工序、干法刻蚀工序等来在对应于光电转换部3的位置形成开口部53。此时,通过在层间绝缘膜51除去尖锥状,能够进一步增大光学波导7的效果。此外,虽然在通过干法蚀刻工序等形成开口部53之时的阻挡膜等也形成在半导体基板1上,其说明被省略。在形成开口部53之后,作为钝化膜通过CVD工序等形成SiN膜等,通过实施烧结模塑处理等能够使栅极电极等的悬挂键封端。
接下来,如图2的(b)所示,从多层配线层5的上表面5a侧涂布感光材料M(涂布工序)。利用被埋入开口部53的感光材料M形成光学波导7。另外,利用没有被埋入开口部53内的多层配线层5上(即,开口部53上以及上表面5a上)的感光材料M形成埋入膜9。
感光材料M能够通过向包含具有高折射率特性的氧化钛等的有机材料(例如聚酰亚胺、聚硅氧烷)中添加感光剂而生成。感光剂可以使用正型、负型的任意一种。
此外,期望在涂布工序中,为了不在光学波导7中产生空穴,注意材料粘度、涂布旋转数来涂布感光材料M。例如,在开口部53的开口宽度为3.5μm的情况下,以粘度6mPa·s、涂布旋转数500rpm来良好地涂布感光材料M。根据该涂布条件,埋入膜9的膜厚T2成为大致1200nm。此为,多层配线层5的上表面5a的开口部53的开口宽度的大约三分之一。
接下来,曝光(光照射)感光材料M(埋入膜9)(涂布工序)。在感光材料M为正型的情况下,在曝光工序中对周边电路区域30进行光照射。由此,在之后的显影工序中,曝光后的周边电路区域30的感光材料M被除去。另一方面,在感光材料M为负型的情况下,在曝光工中序对像素区域20进行光照射。由此,在之后的显影工序中,曝光后的周边电路区域30的感光材料M被除去。
接下来,如图2的(c)所示,在除去周边电路区域30的埋入膜9的同时,调整像素区域20的埋入膜9的厚度(显影工序)。显影工序例如通过将埋入膜9浸泡在添加了添加剂的显影液中来进行。在显影工序中,通过从周边电路区域30除去埋入膜9,在微透镜13的形成后实施的、电焊线用的焊垫开口变得容易。此外,周边电路区域30的埋入膜9(感光材料M)可以以不妨碍焊垫开口的作业的程度残留,没有必要完全除去。
另外,在显影工序中,减少像素区域20的埋入膜9的厚度来调整希望的膜厚T1。在感光材料M为正型的情况下,通过将在曝光工序中没有曝光的像素区域20的埋入膜9在显影工序中浸泡在上述显影液中,能够降低像素区域20的埋入膜9的厚度。另一方面,在感光材料M为负型的情况下,通过将在曝光工序中曝光了的埋入膜9在显影工序中浸泡在上述显影液中,能够降低像素区域20的埋入膜9的厚度。
例如,像素区域20的埋入膜9的厚度与显影液浸泡时间大致呈比例地减少。另外,通过适当控制显影工序的显影液浸泡时间,能够调整像素区域20的埋入膜9的膜厚T1。另外,为了调整埋入膜9的厚度,也可以适当选择显影液浓度、添加剂、显影方法等。例如,作为显影液能够列举TMAH(四甲基氢氧化铵),作为添加剂能够列举表面活性剂。作为表面活性剂,可以添加例如非离子表面活性剂、阳离子表面活性剂、阴离子表面活性剂、两性表面活性剂的任意一种,也可以组合它们中的两种以上添加。进一步,为了选择与适当的埋入膜9的厚度对应的显影条件,可以变更显影液浸泡时间、显影液的浓度,添加剂的有无、浓度的各要素的任意一个,也可以变更多个要素。
作为显影条件的具体例,例如,将TMAH1.8质量%浓度的水溶液作为显影液,向其加入表面活性剂作为添加剂,将搅练法的显影液浸泡时间作为80秒。根据该显影条件,能够将像素区域20的埋入膜9的厚度从显影工序前的大约1200nm(膜厚T2)减少至大约300nm(膜厚T1)。由此,能够将像素区域20的埋入膜9的厚度调整至四分之一以下。
此外,作为显影工序后的像素领域20的埋入膜9的膜厚T1,优选将显影工序前的埋入膜9的膜厚T2调整至三分之一以下,更优选为调整至十分之一以下。由此,能够适当提高固体摄像元件100的聚光效率。
接下来,如图2的(d)所示,在埋入膜9上依次形成彩色滤光片11、微透镜13。它们是由感光性的彩色滤光片材料、微透镜材料利用光刻工序等形成。此外,可以在埋入膜9、彩色滤光片11上形成平坦化膜,也可以在微透镜13上形成防反射膜。
进一步,虽然未图示,接下来利用光刻工序、干法刻蚀工序等来形成配置于周边电路区域30的电焊线用的焊垫开口。在周边电路区域30中,由于没有残存埋入膜9、彩色滤光片11、微透镜13,能够容易实施所述焊垫开口。
(效果)
这样一来,本实施方式的固体摄像元件100的制造方法中,固体摄像元件100包括像素区域20、以及配置有处理来自该像素区域20的信号的电路的周边电路区域30,在像素区域20形成有光学波导7,固体摄像元件100的制造方法包括:涂布工序,对横跨像素区域20以及周边电路区域30形成的、具有用于形成光学波导7的开口部的多层配线层5,涂布感光材料M;曝光工序,对感光材料M的一部分进行曝光;和显影工序,在除去周边电路区域30的感光材料M的同时,减少像素区域20的感光材料M中的、多层配线层5上的感光材料M的厚度从而调整为希望的膜厚T1。
在固体摄像元件100的制造方法中,在显影工序中,在除去周边电路区域30的感光材料M的同时,减少像素区域20的多层配线层5上的感光材料M(埋入膜9)的厚度从而调整为希望的膜厚T1。因此,没有必要如现有技术那样,另外增加使像素区域的埋入膜薄膜化的工序,能够改善制造成本、良率。
即,根据固体摄像元件100的制造方法,通过适当设定显影条件,在显影工序中,能够将像素区域20的埋入膜9调整为希望的膜厚T1。参照图1以及图3说明本实施方式的效果。
图3为表示在显影工序中,作为比较对照的固体摄像元件101的截面图。如图3所示,在采用现有的显影工序的情况下,像素区域20的埋入膜9几乎直接残留了涂布工序时的膜厚T2。因此,在固体摄像元件101中,存在彩色滤光片11以及微透镜13远离光学波导7,向相邻像素的光泄露增加的不良。另一方面,在采用本实施方式的显影工序的情况下,如图1所示,埋入膜9形成为厚度比膜厚T2小的膜厚T1。因此,在固体摄像元件100中,上述那样的光泄露被抑制,聚光效果提高。
(变形例)
本实施方式的固体摄像元件100的制造方法,在涂布工序与显影工序之间,还可以包括对埋入膜9(感光材料M)进行亲水化处理的亲水化处理工序。
由于显影工序的不均匀的薄膜化的进行,像素区域20的埋入膜9的厚度会产生偏差。有时由于该偏差引发元件之间的聚光差,成为图像模糊的原因。通过在显影工序之前增加对埋入膜9进行亲水化处理的亲水化处理工序,能够形成厚度均匀的埋入膜9。
作为亲水化处理工序,例如,通过在等离子装置中,对埋入膜9的表面照射10秒氧等离子,实施良好的亲水化处理。通过继续实施显影工序,均匀进行埋入膜9的薄膜化,形成厚度偏差小的埋入膜9。此外,亲水化处理工序可以在曝光工序之前实施,也可以在显影工序之前实施。
另外,本实施方式的固体摄像元件100的制造方法,在亲水化处理工序与显影工序之间,还可以包括对埋入膜9(感光材料M)进行水洗的水洗处理工序。通过实施水洗处理工序,进一步均匀进行埋入膜9的薄膜化,形成厚度偏差小的埋入膜9。在水洗处理工序中,例如,通过在显影装置中,进行5秒水洗,在埋入膜9表面还残存水分的状态下实施显影工序,在埋入膜9表面中,抑制显影液滴下环境差带来的薄膜化的不均匀的进行。其结果,形成厚度偏差小的埋入膜9。
此外,所谓水洗处理工序与亲水化处理工序可以仅实施其中一个,也可以两个均实施。
总结
本发明的方式1的固体摄像元件的制造方法中,所述固体摄像元件100包括像素区域以及配置有处理来自该像素区域的信号的电路的周边电路区域,在所述像素区域形成有光学波导,其特征在于,所述固体摄像元件的制造方法包括:涂布工序,对横跨所述像素区域以及所述周边电路区域形成的、具有用于形成所述光学波导的开口部的多层配线层,涂布感光材料;曝光工序,对所述感光材料的一部分进行曝光;和显影工序,在除去所述周边电路区域的所述感光材料的同时,减少所述像素区域的所述感光材料中的所述多层配线层上的所述感光材料的厚度从而调整为希望的膜厚。
上述方法中,在显影工序中,除去周边电路区域的感光材料的同时,减少像素区域的多层配线层上的感光材料(埋入膜)的厚度从而调整为希望的膜厚。因此,没有必要如现有技术那样,另外增加使像素区域的埋入膜薄膜化的工序,能够改善制造成本、良率。
因此,根据上述方式,能够制造不增加工序就能够调整像素区域的埋入膜的厚度的固体摄像元件。
本发明的方式2的固体摄像元件的制造方法,在上述方式1中,在所述显影工序中,可以将所述像素区域的所述多层配线层上的所述感光材料的厚度减少至三分之一以下。
根据上述方式,能够制造不增加工序而调整像素区域的埋入膜的厚度,聚光效率优秀的固体摄像元件。
本发明的方式3的固体摄像元件100的制造方法,在上述方式1以及2中,所述涂布工序与所述显影工序之间,还可以包括对所述感光材料进行亲水化处理的亲水化处理工序。
在像素区域的多层配线层上的感光材料(埋入膜)的厚度中产生偏差的情况下,聚光差产生从而成为图像模糊的原因。在上述方法中,通过涂布工序与显影工序之间的感光材料的亲水化处理,能够通过显影工序,在像素区域形成厚度的偏差小的埋入膜。因此,根据上述方法,能够制造抑制图像模糊的固体摄像元件。
本发明的方式4的固体摄像元件100的制造方法,在上述方式3中,在所述亲水化处理工序与所述显影工序之间,还可以包括对所述感光材料进行水洗的水洗处理工序。
根据上述方法,通过在亲水化处理工序与显影工序之间,对感光材料实施水洗处理工序,能够在像素区域形成厚度的偏差更小的埋入膜。因此,根据上述方式,能够制造进一步抑制图像模糊的固体摄像元件。
本发明的方式5的固体摄像元件100的制造方法,在上述方式1以及2中,在所述曝光工序与所述显影工序之间,还可以包括对涂布在所述多层配线层的所述感光材料进行水洗处理的水洗处理工序。
在像素区域的多层配线层上的感光材料(埋入膜)的厚度中产生偏差的情况下,聚光差产生从而成为图像模糊的原因。在上述方法中,通过在曝光工序与显影工序之间对感光材料进行水洗处理,能够在像素区域形成厚度的偏差小的埋入膜。因此,根据上述方式,能够制造抑制图像模糊的固体摄像元件。
本发明的方式6的固体摄像元件的制造方法,在上述方式1至5中,所述显影工序将所述感光材料浸泡在显影液中的工序,在所述显影工序中,通过控制所述感光材料的所述显影液的浸泡时间,可以减少所述多层配线层上的所述感光材料的厚度从而调整为希望的膜厚。
在上述方式中,通过控制显影工序的显影液浸泡时间,能够将像素区域的多层配线层上的感光材料(埋入膜)调整为希望的膜厚。因此,根据上述方法,通过变更显影工序的显影液浸泡时间,能够将埋入膜的膜厚调整为希望的膜厚。
本发明不限于上述各实施方式,能在权利要求所示的范围中进行各种变更,将不同的实施方式中分别公开的技术手段适当组合得到的实施方式也包含于本发明的技术范围。而且,能通过将各实施方式分别公开的技术手段组合而形成新的技术特征。
附图标记说明
1 半导体基板
3 光电转换部
5 多层配线层
5a 上表面
7 光学波导
9 埋入膜
11 彩色滤光片
13 微透镜
20 像素区域
30 周边电路区域
51 层间绝缘膜
52 配线
53 开口部
100 固体摄像元件
M 感光材料
T1 膜厚
T2 膜厚

Claims (6)

1.一种固体摄像元件的制造方法,所述固体摄像元件包括像素区域、以及配置有处理来自该像素区域的信号的电路的周边电路区域,在所述像素区域形成有光学波导的固体摄像元件,其特征在于,所述固体摄像元件的制造方法包括:
涂布工序,对横跨所述像素区域以及所述周边电路区域形成的、具有用于形成所述光学波导的开口部的多层配线层,涂布感光材料;
曝光工序,对所述感光材料的一部分进行曝光;和
显影工序,在除去所述周边电路区域的所述感光材料的同时,减少所述像素区域的所述感光材料中的所述多层配线层上的所述感光材料的厚度从而调整为希望的膜厚。
2.如权利要求1所述的固体摄像元件的制造方法,其特征在于,在所述显影工序中,能够将所述像素区域的所述多层配线层上的所述感光材料的厚度减少至三分之一以下。
3.如权利要求1或2所述的固体摄像元件的制造方法,其特征在于,在所述涂布工序与所述显影工序之间,还包括对所述感光材料进行亲水化处理的亲水化处理工序。
4.如权利要求3所述的固体摄像元件的制造方法,其特征在于,在所述亲水化处理工序与所述显影工序之间,还包括对所述感光材料进行水洗的水洗处理工序。
5.如权利要求1或2所述的固体摄像元件的制造方法,其特征在于,在所述曝光工序与所述显影工序之间,还包括对涂布在所述多层配线层的所述感光材料进行水洗处理的水洗处理工序。
6.如权利要求1或2所述的固体摄像元件的制造方法,其特征在于,所述显影工序是将所述感光材料浸泡在显影液中的工序,
在所述显影工序中,通过控制所述感光材料的所述显影液的浸泡时间,能够减少所述多层配线层上的所述感光材料的厚度从而调整为希望的膜厚。
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