CN110428763A - Array substrate test device - Google Patents
Array substrate test device Download PDFInfo
- Publication number
- CN110428763A CN110428763A CN201910633806.7A CN201910633806A CN110428763A CN 110428763 A CN110428763 A CN 110428763A CN 201910633806 A CN201910633806 A CN 201910633806A CN 110428763 A CN110428763 A CN 110428763A
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- Prior art keywords
- array substrate
- detection means
- component
- test device
- detection
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The present invention provides a kind of array substrate test device, the array substrate test device includes carrying platform, supporting member, the first detection means and the second detection means, for carrying array substrate on the carrying platform, first detection means are used to detect the first part of array substrate viewing area, and second detection means are used to detect the second part and non-display area of array substrate viewing area；By the way that the second detection means are arranged, make the second part and non-display area of the second detection means detection array substrate viewing area, so that the first detection means and the second detection means collective effect, array substrate can be completely detected, solving existing short-circuit open test equipment there is technical issues that edge of display area circuit in array substrate and gate driving circuit can not be carried out.
Description
Technical field
The present invention relates to field of display technology, more particularly, to a kind of array substrate test device.
Background technique
In the preparation process of array substrate, needs to test array substrate using short-circuit open test equipment, keep away
The array substrate for exempting from circuit existing defects flows into next processing procedure, but existing short-circuit open test equipment can not be to GOA (Gate On
Array, gate driving circuit) and the circuit of array substrate edge of display area detected so that there is the board of existing defects
Next processing procedure is flowed into, the yield of array substrate is influenced.
So existing short circuit open test equipment presence can not be to edge of display area circuit and gate driving in array substrate
The technical issues of circuit is detected.
Summary of the invention
The present invention provides a kind of array substrate test device, can not be right for solving existing short-circuit open test equipment presence
The technical issues of edge of display area circuit and gate driving circuit are detected in array substrate.
To solve the above problems, technical solution provided by the invention is as follows:
The present invention provides a kind of array substrate test device, which includes:
Carrying platform, the carrying platform is for carrying array substrate；
Supporting member；
First detection means, for detecting the first part of array substrate viewing area；
Second detection means, for detecting the second part and non-display area of array substrate viewing area.
In array substrate test device provided by the invention, second detection means include optical detection mould group, institute
Optical detection mould group is stated to connect with the supporting member.
In array substrate test device provided by the invention, the optical detection mould group includes detection components and mark group
Part, the detection components are used to detect the second part and non-display area of the array substrate viewing area, and the label component is used
In after detection components detect the defect of array substrate, the defect area of array substrate is marked.
In array substrate test device provided by the invention, the detection components include at image acquisition unit and information
Unit is managed, described image acquiring unit is used to obtain the second part of array substrate viewing area and the image of non-display area, and will
Described image passes to information process unit, and the information process unit is used to receive the figure of described image acquiring unit transmitting
Picture, and described image is handled.
In array substrate test device provided by the invention, which further includes drive member, institute
Drive member is stated for driving the first detection means and the second detection means to work.
In array substrate test device provided by the invention, the drive member includes that the first drive member and second drive
Dynamic component, first drive member is for driving the work of the first detection means, and second drive member is for driving second
Detection means work.
In array substrate test device provided by the invention, which further includes repairing component, institute
It states after repairing component at least one to detect that defect occurs in array substrate in the first detection means and the second detection means,
Repair array substrate.
In array substrate test device provided by the invention, which further includes after-treatment component,
The after-treatment component is used for after the reparation component can not repair the array substrate, handles array substrate.
In array substrate test device provided by the invention, which further includes control member, institute
Control member is stated to repair for receiving the information of the first detection means and the second detection means, and according to the information control received
Component and after-treatment component work.
In array substrate test device provided by the invention, the control member includes the first control member and the second control
Component processed, first control member are connect with the reparation component, and first control member is for needing to repair array
When substrate, the reparation component work is controlled；Second control member is connect with the after-treatment component, second control
Component is used for when needing to handle array substrate, controls the after-treatment component work.
The utility model has the advantages that the present invention provides a kind of array substrate test device, which includes that carrying is flat
Platform, supporting member, the first detection means and the second detection means, for carrying array substrate on the carrying platform, described the
One detection means are used to detect the first part of array substrate viewing area, and second detection means are aobvious for detecting array substrate
Show the second part and non-display area in area；By the way that the second detection means are arranged, show the second detection means detection array substrate
The second part and non-display area in area, so that the first detection means and the second detection means collective effect, can completely examine
Array substrate is surveyed, solving existing short-circuit open test equipment presence can not be to edge of display area circuit and grid in array substrate
The technical issues of driving circuit is detected.
Detailed description of the invention
It, below will be to embodiment or the prior art in order to illustrate more clearly of embodiment or technical solution in the prior art
Attached drawing needed in description is briefly described, it should be apparent that, the accompanying drawings in the following description is only some of invention
Embodiment for those of ordinary skill in the art without creative efforts, can also be attached according to these
Figure obtains other attached drawings.
Fig. 1 is the first schematic diagram of array substrate test device provided in an embodiment of the present invention；
Fig. 2 is the second schematic diagram of array substrate test device provided in an embodiment of the present invention；
Fig. 3 is the third schematic diagram of array substrate test device provided in an embodiment of the present invention；
Fig. 4 is the schematic diagram of the first detection means provided in an embodiment of the present invention；
Fig. 5 is the schematic diagram of the second detection means provided in an embodiment of the present invention.
Specific embodiment
The explanation of following embodiment is referred to the additional illustration, the particular implementation that can be used to implement to illustrate the present invention
Example.The direction term that the present invention is previously mentioned, such as [on], [under], [preceding], [rear], [left side], [right side], [interior], [outer], [side]
Deng being only the direction with reference to annexed drawings.Therefore, the direction term used be to illustrate and understand the present invention, rather than to
The limitation present invention.The similar unit of structure is with being given the same reference numerals in the figure.
The present invention exists for existing short-circuit open test equipment can not be to edge of display area circuit and grid in array substrate
The technical issues of pole driving circuit is detected, the embodiment of the present invention is to solve the problems, such as this.
Existing short circuit open test equipment emits signal by emission sensor, then using the signal in array substrate
Line transmits signal, the signal of the signal wire transmitting on receiving sensor receiving array substrate, so that array substrate is detected,
When the abnormal signal that receiving sensor receives, then it represents that the signal wire is abnormal, which can only be directed to one
The signal wire for arranging arrangement is tested, and in the circuit at the edge of viewing area and GOA circuit, the arrangement side of signal wire
Formula is not one to arrange arrangement, causes short-circuit open test equipment can not be to array substrate edge of display area circuit and GOA circuit
It is tested, the array substrate of existing defects is caused to flow into next processing procedure, i.e., existing short-circuit open test equipment exists can not be right
The technical issues of edge of display area circuit and gate driving circuit are detected in array substrate.
As shown in Figure 1, the embodiment of the present invention provides a kind of array substrate test device, the array substrate test device packet
It includes:
Carrying platform 11, the carrying platform 11 is for carrying array substrate 12；
Supporting member 15；
First detection means 13, for detecting the first part 121 of 12 viewing area of array substrate；
Second detection means 14, for detecting the second part 122 and non-display area 123 of 12 viewing area of array substrate.
The embodiment of the present invention provides a kind of array substrate test device, the array substrate test device include carrying platform,
Supporting member, the first detection means and the second detection means, for carrying array substrate, first inspection on the carrying platform
The first part that component is used to detect array substrate viewing area is surveyed, second detection means are for detecting array substrate viewing area
Second part and non-display area；By the way that the second detection means are arranged, make the second detection means detection array substrate viewing area
Second part and non-display area, so that the first detection means and the second detection means collective effect, can completely detect battle array
Column substrate, solving existing short-circuit open test equipment presence can not be to edge of display area circuit and gate driving in array substrate
The technical issues of circuit is detected.
It should be noted that the first part of array substrate viewing area and the second part composition array substrate of viewing area are aobvious
Show area, for example, viewing area second part include array substrate viewing area fringe region, width 1.5mm, the of viewing area
A part is other regions of viewing area.
It should be noted that illustrating first of the second part and non-display area of viewing area about viewing area in Fig. 1
Divide symmetrically arranged two parts, only indicates the second part of viewing area and a part of non-display area in Fig. 1；Meanwhile in Fig. 1
The second detection means are only indicated about a part in the symmetrical two parts of supporting member.
In one embodiment, second detection means include optical detection mould group, the optical detection mould group and institute
Supporting member connection is stated, the second part and non-display area of array substrate viewing area are detected using optical detection mould group, thus
Existing short-circuit open test equipment is avoided to have the defects that can not to detect array substrate edge of display area circuit and GOA circuit
Problem makes it possible to detect array substrate whole face, and then makes a response according to testing result, avoids that there are circuit defects
Array substrate flow into next processing procedure.
In one embodiment, the optical detection mould group includes detection components and label component, and the detection components are used
In the second part and non-display area that detect the array substrate viewing area, the label component in detection components for detecting
After the defect of array substrate, the defect area of array substrate is marked；Array substrate is examined in optical detection mould group
When survey, array substrate is detected using detection components, in the defect of array substrate panel detection to array substrate, can be made
The flaw labeling of first array substrate gone out with label component, then it is subsequent can according to the region of label to array substrate at
Reason.
In one embodiment, the detection components include image acquisition unit and information process unit, and described image obtains
It takes unit for obtaining the second part of array substrate viewing area and the image of non-display area, and described image is passed into information
Processing unit, the information process unit is used to receive the image of described image acquiring unit transmitting, and carries out to described image
Processing；When second part and non-display area of the detection components to array substrate viewing area detect, image can be used to obtain
Unit obtains the second part of array substrate viewing area and the image of non-display area, and the image is then passed to information processing list
Member is stored with the parameter and image of qualified array substrate in information process unit, passes through what is obtained to image acquisition unit
The image and parameter of image and qualified array substrate are compared, and can determine whether array substrate defect and defect occurs
The region of appearance, and then the array substrate for occurring or not occurring defect can be handled.
In one embodiment, the label component region of defect can directly occur in array substrate, such as occur
The part of signal thread breakage is marked, can also be after the image of acquisition array substrate, to there is defect on the image of acquisition
Region be marked, to facilitate subsequent handled.
In one embodiment, second detection means can be independently arranged, as shown in Figure 1, in the two sides of array substrate
Two the second detection means are set and may also set up one so that the second detection means respectively detect the two sides of array substrate
A second detection means carry out the mobile second part and non-display area to array substrate viewing area of the second detection means
Detection, can also second part and the further subregion of non-display area to viewing area so that multiple second detection means of setting, to not
Same region is detected, and the accuracy of detection is improved.
In one embodiment, which further includes drive member, and the drive member is for driving
First detection means and the work of the second detection means use drive member driving the when needing to detect array substrate
One detection means and the work of the second detection means, work at the same time the first detection means and the second detection means, to array substrate
Whole face detected.
In one embodiment, the drive member includes the first drive member and the second drive member, and described first drives
Dynamic component is for driving the work of the first detection means, and second drive member is for driving the work of the second detection means；Right
When array substrate is detected, it can make the first drive member that the first detection means first be driven to detect array substrate, then
Make the second drive member that the second detection means be driven to detect array substrate；The first drive member and second can also be made to drive
Component drives the first detection means and the second detection means simultaneously, so that the first detection means are poised for battle simultaneously with the second detection means
Column substrate is detected.
In one embodiment, which further includes sensing member, the sensing member and the drive
Dynamic component connection, the sensing member is for sensing array substrate, when sensing member senses array substrate, the sensing structure
Part passes information to drive member, and drive member drives the first detection means and the work of the second detection means.
In one embodiment, as shown in Fig. 2, the array substrate test device further includes repairing component 26, the reparation
After component is at least one to detect that defect occurs in array substrate in the first detection means and the second detection means, battle array is repaired
Column substrate；In array substrate test device, component is repaired in setting can when defect occurs in any region in array substrate
Array substrate is repaired, array substrate is worked normally；Such as when the first detection means detect first of viewing area
Reparation component can be used to repair the cabling for occurring being broken for the problem of occurring thread breakage in point, such as repairs component and be
Welding gun, carrying out welding to cabling connects cabling, so that the circuit of array substrate works normally, shows that array substrate normally
Show；Or when circuit is opened a way, the insulating layer in array substrate is punched by using laser, so that repairing in array substrate
Multiple line is connect with the signal wire of open circuit two sides, to repair the circuit of array substrate, when short circuit occurs in circuit, it is short to interrupt appearance
The signal wire of the position on road.
In one embodiment, the reparation component is connect with the supporting member, and the reparation component can be along the branch
It is mobile to support component, so that the arbitrary region for occurring defect in array substrate can be repaired by repairing component.
In one embodiment, the reparation component is movable part, and the reparation component is detachable, so that repairing component
The work of detection means is not influenced, meanwhile, when needing using component is repaired, component will be repaired and connect with supporting member, so that
Component is repaired to repair array substrate.
In one embodiment, when the second detection means include label component, to the area for occurring defect in array substrate
Domain is marked using label component column substrate poised for battle or the image of array substrate is marked, may make subsequent reparation
Component work is more convenient, repairs component without relocating, need to only be repaired according to the position of label.
In one embodiment, as shown in Fig. 2, the array substrate test device further includes after-treatment component 27, after described
It handles component to be used for after the reparation component can not repair the array substrate, handles array substrate；In the first detection means
Perhaps the second detection means detect after there is defect in array substrate repair component array substrate can not be carried out repairing or
When repairing unsuccessful, array substrate is handled using after-treatment component, array substrate is avoided to enter next processing procedure.
In one embodiment, the after-treatment component is connect with the supporting member, and the after-treatment component includes stretching
Contracting arm and gripper assembly drive gripper assembly using telescopic arm, gripper assembly are made to clamp array when needing to handle array substrate
Substrate handles array substrate.
In one embodiment, handling the array substrate includes carrying out array substrate to scrap processing, or to array
Substrate is utilized again, can be will be unable to the array substrate repaired storage, then be carried out part available in array substrate
It utilizes again, avoids wasting.
In one embodiment, as shown in figure 3, the array substrate test device further includes control member 38, the control
Component processed is used to receive the information of the first detection means and the second detection means, and repairs component according to the information control received
It works with after-treatment component, by the way that control member is arranged, so that the first detection means or the second detection means detect array
After defect occurs in substrate, pass it to control member, control member controlled according to the information repair component work or
After-treatment component work, to handle the array substrate for defect occur, defect can occurs receiving array substrate
After information, directly control after-treatment component processing array substrate, can also first control repair component work, then repair component without
After method is repaired, control after-treatment component handles array substrate.
In one embodiment, as shown in figure 3, the control member 38 includes the first control member 381 and the second control
Component 382, first control member 381 are connect with the reparation component 26, and first control member 381 is for needing
When repairing array substrate, controls the reparation component 26 and work；Second control member 382 connects with the after-treatment component 27
It connects, second control member 382 is used for when needing to handle array substrate, is controlled the after-treatment component 27 and is worked；Pass through
By the first control member and the second control member respectively with repair component and after-treatment component connect so that the first control member with
Second control member controls respectively repairs component and after-treatment component work, so that needing to repair array substrate
When, so that the control of the first control member is repaired component to array substrate reparation, when needing to array processing substrate, uses the second control
Component control after-treatment component work processed, repairs component and is independently controlled with after-treatment component, and repair component and post-processing structure
Part does not interfere.
In one embodiment, the second detection means are fixed on the supporting member, can be poised for battle in the second detection means
When the second part and non-display area of column substrate viewing area are detected, the second detection means can be made to be fixed on supporting member,
Such as second detection means include video camera, the camera shooting function shoot array substrate viewing area second part and non-display area,
With to array substrate viewing area second part and non-display area detect, then without mobile second detection means, avoid the
Two detection means have an impact the first detection means and reparation component.
In one embodiment, second detection means are movable part, and second detection means can be along the branch
It is mobile to support component, moves the second detection means along supporting member, so that the second detection means can show array substrate
The second part and non-display area in area are preferably detected, and undetectable region is avoided the occurrence of, and are carried out to array substrate whole
The detection in face.
In one embodiment, the supporting member includes guide rail, and the guide rail is mobile for movable part, such as second
It when detection means are movable part, connect the second detection means with supporting member, while leads the second detection means described in
Rail is mobile, so that the second part and non-display area to viewing area in array substrate detect；Meanwhile structure can be repaired in setting
Guide rail is arranged in the region of part, moves so that repairing component along the guide rail, to repair to array substrate, and repairs component
It can be same guide rail or different guide rails from the second detection means corresponding rails.
In one embodiment, first detection means, the second detection means are connect with the supporting member, the branch
Support component is connect with the carrying platform, and the carrying platform is equipped with guide rail, and the supporting member is moved along the guide rail, with
Drive the first detection means and the second detection means mobile, while the first detection means and the second detection means can be in supporting members
Whether upper movement or not, realizes and detects to the whole face of array substrate.
In one embodiment, the carrying platform includes positioning component, and the positioning component is determined for array substrate
Position, array substrate setting on the carrying platform when, can according to positioning component position place so that the first detection means with
Second detection means can carry out entire detection to array substrate.
In one embodiment, as shown in Figure 1, first detection means 13 include signal emission sensor 131 and letter
Number receiving sensor 132, the signal emission sensor 131 are used to test letter to the circuit transmission of the first part of viewing area
Number, the signal receiving sensor 132 is used to receive the test signal of the circuit transmitting of the first part of viewing area, by using
Signal emission sensor and signal receiving sensor test the circuit of the first part of viewing area, so that the first detection structure
Part tests the circuit of the first part of viewing area line by line, to judge that the circuit of the first part of viewing area whether there is
Defect.
As shown in figure 4, the embodiment of the present invention provides a kind of first detection means, the first detection means 13 emit including signal
Sensor 131 and signal receiving sensor 132, the signal emission sensor 131 are located at signal receiving sensor 132
The both ends of the signal wire 1211 of the first part 121 of the viewing area of array substrate 42, signal emission sensor 131 is to signal wire
1211 send test signal, and signal receiving sensor 132 receives the test signal transmitted by signal wire 1211, and to different length
The signal wire of degree, can be by transverse shifting signal emission sensor and signal receiving sensor to the signal wire to different length
It is tested, and by longitudinal movement signal emission sensor and signal receiving sensor, to be surveyed to each row signal line
The detection of the circuit to the first part of array substrate viewing area is realized in examination.
As shown in figure 5, the embodiment of the present invention provides a kind of second detection means, the second detection means include optical detection mould
Group 54, the optical detection mould group 54 include detection components 541 and label component 542, and the detection components 541 are obtained including image
Take unit 5411 and information process unit 5412.
In one embodiment, described image acquiring unit includes photographic device, can by the surface to array substrate into
Row camera shooting obtains image.
In one embodiment, second detection means include contraposition component, and the contraposition component is used for bit array
Substrate aligns the second detection means and array substrate by aligning component, so that the first detection means are according to second
The contraposition of detection means and array substrate, realize the first detection means and array substrate contraposition so that the first detection means with
Array substrate contraposition is accurate, to realize the detection to the first part of array substrate viewing area.
In one embodiment, first detection means include contraposition component, by being arranged in the first detection means
Component is aligned, so that the first detection means are directly aligned with array substrate, to detect to array substrate, contraposition component includes
Sensor, such as by the way that groove is arranged in array substrate, groove is aligned using range sensor, to realize the first detection structure
The contraposition of part and array substrate.
In one embodiment, second detection means include charge-coupled device.
In one embodiment, first detection means include any second detection structure in above-described embodiment
Part, first detection means detect the first part of array substrate viewing area.
According to above embodiments:
The present invention provides a kind of array substrate test device, which includes carrying platform, support structure
Part, the first detection means and the second detection means, for carrying array substrate, first detection means on the carrying platform
For detecting the first part of array substrate viewing area, second detection means are for detecting the second of array substrate viewing area
Part and non-display area；By the way that the second detection means are arranged, make second of the second detection means detection array substrate viewing area
Point and non-display area so that the first detection means and the second detection means collective effect, can completely detect array substrate,
Solve existing short-circuit open test equipment exist can not to edge of display area circuit in array substrate and gate driving circuit into
The technical issues of row detection.
In conclusion although the present invention has been disclosed above in the preferred embodiment, but above preferred embodiment is not to limit
The system present invention, those skilled in the art can make various changes and profit without departing from the spirit and scope of the present invention
Decorations, therefore protection scope of the present invention subjects to the scope of the claims.
Claims (10)
1. a kind of array substrate test device characterized by comprising
Carrying platform, the carrying platform is for carrying array substrate；
Supporting member；
First detection means, for detecting the first part of array substrate viewing area；
Second detection means, for detecting the second part and non-display area of array substrate viewing area.
2. array substrate test device as described in claim 1, which is characterized in that second detection means include optics inspection
Mould group is surveyed, the optical detection mould group is connect with the supporting member.
3. array substrate test device as claimed in claim 2, which is characterized in that the optical detection mould group includes detection group
Part and label component, the detection components are used to detect the second part and non-display area of the array substrate viewing area, described
It marks component to be used for after detection components detect the defect of array substrate, the defect area of array substrate is marked.
4. array substrate test device as claimed in claim 3, which is characterized in that the detection components include that image obtains list
Member and information process unit, described image acquiring unit are used to obtain the second part and non-display area of array substrate viewing area
Image, and described image is passed into information process unit, the information process unit is for receiving described image acquiring unit
The image of transmitting, and described image is handled.
5. array substrate test device as described in claim 1, which is characterized in that it further include drive member, the driving structure
Part is for driving the first detection means and the work of the second detection means.
6. array substrate test device as claimed in claim 5, which is characterized in that the drive member includes the first driving structure
Part and the second drive member, first drive member for driving the work of the first detection means, use by second drive member
In driving the second detection means work.
7. array substrate test device as described in claim 1, which is characterized in that further include repairing component, the reparation structure
After part is at least one to detect that defect occurs in array substrate in the first detection means and the second detection means, array is repaired
Substrate.
8. array substrate test device as claimed in claim 7, which is characterized in that further include after-treatment component, locate after described
It manages component to be used for after the reparation component can not repair the array substrate, handles array substrate.
9. array substrate test device as claimed in claim 8, which is characterized in that it further include control member, the control structure
Part is used to receive the information of the first detection means and the second detection means, and repairs component with after according to the information control received
Handle component work.
10. array substrate test device as claimed in claim 9, which is characterized in that the control member includes the first control
Component and the second control member, first control member are connect with the reparation component, and first control member is used for
When needing to repair array substrate, the reparation component work is controlled；Second control member is connect with the after-treatment component,
Second control member is used for when needing to handle array substrate, controls the after-treatment component work.
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Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5504438A (en) * | 1991-09-10 | 1996-04-02 | Photon Dynamics, Inc. | Testing method for imaging defects in a liquid crystal display substrate |
| US6075245A (en) * | 1998-01-12 | 2000-06-13 | Toro-Lira; Guillermo L. | High speed electron beam based system for testing large area flat panel displays |
| JP2001024042A (en) * | 1999-07-07 | 2001-01-26 | Hitachi Ltd | Semiconductor inspecting apparatus |
| US20020085198A1 (en) * | 2000-12-30 | 2002-07-04 | Lg.Philips Lcd Co., Ltd. | Inspection apparatus for liquid crystal display device |
| US20040174182A1 (en) * | 2003-03-04 | 2004-09-09 | Shimadzu Corporation | Apparatus and method for testing pixels arranged in a matrix array |
| US20080180592A1 (en) * | 2007-01-30 | 2008-07-31 | Au Optronics Corp. | Liquid crystal display panel and testing system and method thereof |
| JP2012078127A (en) * | 2010-09-30 | 2012-04-19 | Shimadzu Corp | Tft array inspection device and tft array inspection method |
| CN104280904A (en) * | 2014-09-26 | 2015-01-14 | 京东方科技集团股份有限公司 | Array substrate detecting head and device and array substrate detecting method |
| CN205318809U (en) * | 2016-01-19 | 2016-06-15 | 上海天马微电子有限公司 | Display device and display system |
| CN106125357A (en) * | 2016-06-27 | 2016-11-16 | 京东方科技集团股份有限公司 | A kind of array base palte detection method and detecting system |
| CN109119356A (en) * | 2018-08-22 | 2019-01-01 | 京东方科技集团股份有限公司 | The detection device and detection method of array substrate |
-
2019
- 2019-07-15 CN CN201910633806.7A patent/CN110428763A/en active Pending
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5504438A (en) * | 1991-09-10 | 1996-04-02 | Photon Dynamics, Inc. | Testing method for imaging defects in a liquid crystal display substrate |
| US6075245A (en) * | 1998-01-12 | 2000-06-13 | Toro-Lira; Guillermo L. | High speed electron beam based system for testing large area flat panel displays |
| JP2004309488A (en) * | 1998-01-12 | 2004-11-04 | Shimadzu Corp | Tftfpd substrate inspection device and inspection method |
| JP2001024042A (en) * | 1999-07-07 | 2001-01-26 | Hitachi Ltd | Semiconductor inspecting apparatus |
| US20020085198A1 (en) * | 2000-12-30 | 2002-07-04 | Lg.Philips Lcd Co., Ltd. | Inspection apparatus for liquid crystal display device |
| US20040174182A1 (en) * | 2003-03-04 | 2004-09-09 | Shimadzu Corporation | Apparatus and method for testing pixels arranged in a matrix array |
| US20080180592A1 (en) * | 2007-01-30 | 2008-07-31 | Au Optronics Corp. | Liquid crystal display panel and testing system and method thereof |
| JP2012078127A (en) * | 2010-09-30 | 2012-04-19 | Shimadzu Corp | Tft array inspection device and tft array inspection method |
| CN104280904A (en) * | 2014-09-26 | 2015-01-14 | 京东方科技集团股份有限公司 | Array substrate detecting head and device and array substrate detecting method |
| CN205318809U (en) * | 2016-01-19 | 2016-06-15 | 上海天马微电子有限公司 | Display device and display system |
| CN106125357A (en) * | 2016-06-27 | 2016-11-16 | 京东方科技集团股份有限公司 | A kind of array base palte detection method and detecting system |
| CN109119356A (en) * | 2018-08-22 | 2019-01-01 | 京东方科技集团股份有限公司 | The detection device and detection method of array substrate |
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