CN110382731B - 蒸镀掩模、带框体的蒸镀掩模、蒸镀掩模准备体、蒸镀图案形成方法及有机半导体元件的制造方法 - Google Patents

蒸镀掩模、带框体的蒸镀掩模、蒸镀掩模准备体、蒸镀图案形成方法及有机半导体元件的制造方法 Download PDF

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CN110382731B
CN110382731B CN201880015841.6A CN201880015841A CN110382731B CN 110382731 B CN110382731 B CN 110382731B CN 201880015841 A CN201880015841 A CN 201880015841A CN 110382731 B CN110382731 B CN 110382731B
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mask
vapor deposition
resin
metal
deposition mask
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CN110382731A (zh
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曾根康子
川崎博司
广部吉纪
小幡胜也
成田亚沙子
居城均
初田千秋
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Dai Nippon Printing Co Ltd
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Dai Nippon Printing Co Ltd
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10—Deposition of organic active material
    • H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00—Etching metallic material by chemical means
    • C23F1/02—Local etching
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04—Coating on selected surface areas, e.g. using masks
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04—Coating on selected surface areas, e.g. using masks
    • C23C14/042—Coating on selected surface areas, e.g. using masks using masks
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12—Organic material
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04—Coating on selected surface areas, e.g. using masks
    • C23C16/042—Coating on selected surface areas, e.g. using masks using masks
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00—Etching metallic material by chemical means
    • C23F1/10—Etching compositions
    • C23F1/14—Aqueous compositions
    • C23F1/16—Acidic compositions
    • C23F1/28—Acidic compositions for etching iron group metals
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10—Deposition of organic active material
    • H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0015—Production of aperture devices, microporous systems or stamps
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00—Organic light-emitting devices
    • H10K50/10—OLEDs or polymer light-emitting diodes [PLED]

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)
CN201880015841.6A 2017-03-31 2018-03-30 蒸镀掩模、带框体的蒸镀掩模、蒸镀掩模准备体、蒸镀图案形成方法及有机半导体元件的制造方法 Active CN110382731B (zh)

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JP2017072212 2017-03-31
JP2017072211 2017-03-31
JP2017-072212 2017-03-31
JP2017-072211 2017-03-31
PCT/JP2018/013798 WO2018181969A1 (ja) 2017-03-31 2018-03-30 蒸着マスク、フレーム付き蒸着マスク、蒸着マスク準備体、蒸着パターン形成方法および有機半導体素子の製造方法

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CN110382731B true CN110382731B (zh) 2022-06-17

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US (2) US10895008B2 (enExample)
JP (2) JP6620899B2 (enExample)
KR (1) KR20190132989A (enExample)
CN (1) CN110382731B (enExample)
TW (1) TWI763818B (enExample)
WO (1) WO2018181969A1 (enExample)

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JP6496086B1 (ja) * 2017-12-25 2019-04-03 堺ディスプレイプロダクト株式会社 蒸着マスク、蒸着方法及び有機ｅｌ表示装置の製造方法
WO2020158566A1 (ja) * 2019-01-31 2020-08-06 大日本印刷株式会社 蒸着マスク群、電子デバイスの製造方法及び電子デバイス
JP7645630B2 (ja) * 2020-11-18 2025-03-14 株式会社ジャパンディスプレイ 蒸着マスクの製造方法
TWI772066B (zh) * 2021-06-16 2022-07-21 達運精密工業股份有限公司 金屬遮罩基材的製備方法
KR20230020035A (ko) * 2021-08-02 2023-02-10 삼성디스플레이 주식회사 증착용 마스크
JP3236293U (ja) * 2021-12-10 2022-02-09 日本発條株式会社 メタルマスク
JP2024107763A (ja) * 2023-01-30 2024-08-09 大日本印刷株式会社 フレーム付きマスク、及び、有機デバイスの製造方法
WO2025110102A1 (ja) * 2023-11-22 2025-05-30 大日本印刷株式会社 マスク及びマスクの製造方法
WO2025150503A1 (ja) * 2024-01-10 2025-07-17 大日本印刷株式会社 マスク装置及び有機デバイスの製造方法

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CN1429353A (zh) * 2000-03-14 2003-07-09 西孝 曝光控制光掩模及其形成方法
CN104870682A (zh) * 2012-12-21 2015-08-26 株式会社V技术 成膜掩模的制造方法
CN106350768A (zh) * 2015-07-17 2017-01-25 凸版印刷株式会社 蒸镀用金属掩模以及蒸镀用金属掩模的制造方法
WO2017013903A1 (ja) * 2015-07-17 2017-01-26 凸版印刷株式会社 メタルマスク基材、メタルマスク、および、メタルマスクの製造方法
JP2017020068A (ja) * 2015-07-09 2017-01-26 大日本印刷株式会社 蒸着マスク、蒸着マスク準備体、及び有機半導体素子の製造方法

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JPS5288072A (en) 1976-01-17 1977-07-22 Citizen Watch Co Ltd Electronic watch with leghting
TWI810479B (zh) * 2012-01-12 2023-08-01 日商大日本印刷股份有限公司 蒸鍍遮罩的製造方法、層積體、圖案的製造方法及有機半導體元件的製造方法
TWI479041B (zh) 2012-01-12 2015-04-01 Dainippon Printing Co Ltd A method of manufacturing a vapor deposition mask, a method for producing a vapor deposition mask, and a method of manufacturing the organic semiconductor device
JP5846287B1 (ja) * 2013-12-27 2016-01-20 大日本印刷株式会社 フレーム付き蒸着マスクの製造方法、引張装置、有機半導体素子の製造装置及び有機半導体素子の製造方法
JP6424521B2 (ja) * 2014-09-03 2018-11-21 大日本印刷株式会社 蒸着マスク、フレーム付き蒸着マスク、及び有機半導体素子の製造方法
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CN1429353A (zh) * 2000-03-14 2003-07-09 西孝 曝光控制光掩模及其形成方法
CN104870682A (zh) * 2012-12-21 2015-08-26 株式会社V技术 成膜掩模的制造方法
JP2017020068A (ja) * 2015-07-09 2017-01-26 大日本印刷株式会社 蒸着マスク、蒸着マスク準備体、及び有機半導体素子の製造方法
CN106350768A (zh) * 2015-07-17 2017-01-25 凸版印刷株式会社 蒸镀用金属掩模以及蒸镀用金属掩模的制造方法
WO2017013903A1 (ja) * 2015-07-17 2017-01-26 凸版印刷株式会社 メタルマスク基材、メタルマスク、および、メタルマスクの製造方法

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Publication number Publication date
CN110382731A (zh) 2019-10-25
US10895008B2 (en) 2021-01-19
US20200259090A1 (en) 2020-08-13
JPWO2018181969A1 (ja) 2019-04-04
JP6620899B2 (ja) 2019-12-18
US20210214843A1 (en) 2021-07-15
KR20190132989A (ko) 2019-11-29
TWI763818B (zh) 2022-05-11
WO2018181969A1 (ja) 2018-10-04
JP2020045571A (ja) 2020-03-26
TW201842689A (zh) 2018-12-01

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