CN109959806A - Contact probe with compressibility spring assembly - Google Patents

Contact probe with compressibility spring assembly Download PDF

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Publication number
CN109959806A
CN109959806A CN201811046239.7A CN201811046239A CN109959806A CN 109959806 A CN109959806 A CN 109959806A CN 201811046239 A CN201811046239 A CN 201811046239A CN 109959806 A CN109959806 A CN 109959806A
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CN
China
Prior art keywords
spring
compressibility
contact probe
plunger
external compression
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811046239.7A
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Chinese (zh)
Inventor
吉田卓斗
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yu Teng Precision Probe Group (malaysia)
Original Assignee
Yu Teng Precision Probe Group (malaysia)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yu Teng Precision Probe Group (malaysia) filed Critical Yu Teng Precision Probe Group (malaysia)
Publication of CN109959806A publication Critical patent/CN109959806A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to the contact probe with compressibility spring assembly (300), which can realize high spring force in the case where not influencing spring service life.The contact probe includes pipe (200), the first plunger, the second plunger (450) and compressibility spring assembly (300), and wherein compressibility spring assembly (300) includes at least one interior compressibility spring (301) and at least one external compression spring (303).The interior compressibility spring (301) has the first coiling direction, and the external compression spring (303) has the second coiling direction, wherein the first coiling direction is different from the second coiling direction.

Description

Contact probe with compressibility spring assembly
Technical field
The present invention relates to the contact probe with compressibility spring assembly, which can not influence spring life In the case where realize high spring force.The contact probe includes pipe, the first plunger, the second plunger and compressibility spring assembly, Middle compressibility spring assembly includes at least one interior compressibility spring and at least one external compression spring.The interior compressibility bullet Spring has the first coiling direction, and the external compression spring has the second coiling direction, wherein the first coiling direction and volume Two Around direction difference.
Background technique
Contact probe is used in testing in socket or test contactor, with (all in test circuit board and measured device (DUT) Such as Electronic Packaging) between electrical interconnection is provided.Spring contact probe is in the prior art as providing the electrical interface being electrically interconnected It is well-known.In general, spring contact probe includes cylindrical tube, plunger and spring, wherein spring and plunger are accommodated in In cylindrical tube.Then spring contact probe is assembled into test jack or test contactor.
During the electrical testing of DUT, plunger is axially slided along pipe, spring by compression to push plunger with it is corresponding Contact element contacts.One end of contact probe and the contact point of DUT are in electrical contact, and the opposite end of contact probe and test equipment Circuit board contacts.It is measured according to predetermined parameter and specification.
In large-scale production test environment, high spring force is that low and stable contact resistance is desired.However, traditional Single spring design in spring performance have limitation.Increasing spring force will cause spring life desired value to shorten.For example, in the phase Under the impulse stroke state of prestige, the single spring of ram compression is until desired impulse stroke is to obtain desired spring force.When pre- Spring loaded is about in 50% of desired spring force in impulse stroke, and spring life is about 100,000 circulation.Judgement The spring life of 100,000 circulations is inadequate for contact probe.If it would be possible, about 1,000 is required, The projected life of the spring of 000 circulation.Alternatively, the length of spring can be increased with longer spring life, but High bandwidth during electrical testing requires to be affected.Therefore, the length of contact probe must keep minimum, to avoid high frequency letter Number decaying.However, in the presence of challenge of the short contact probe without influencing spring force and service life is designed.On the other hand, by In using short pin, the thickness of test jack is also thinning.For this reason, when socket is attached to load board (PCB), occur By preloading the problem of making socket warpage.Reduce an important factor for preloading and using short pin.
Therefore, it is very favorable that the contact probe of disadvantages mentioned above can be overcome by, which having,.The present invention is provided to short pins, tool There is the contact probe of compressibility spring assembly, which is configured to realize desired high spring force and high bandwidth requirement.
Summary of the invention
Therefore, the main object of the present invention is to provide for electrical testing, the contact probe with compressibility spring assembly.
The further object of the present invention is to provide the contact probe with dual spring design.
The further object of the present invention is to provide the contact probe that can satisfy high pin power.
The further object of the present invention is to provide the contact probe with short length, which may be implemented high bandwidth It is required that.
The further object of the present invention is to provide the contact probe with improved spring service life.
The further object of the present invention is to provide the contact probe for being suitable for that test environment is mass produced.
The further object of the present invention is that the contact probe with desired spring force is provided according to expected application.
It is of the invention described in detail below or in actual practice using the present invention, other objects of the present invention by understanding It will become obvious.
Preferred embodiment in accordance with the present invention provides the following contents:
Contact probe, the contact probe include:
Pipe, the pipe have first end, second end and the through-hole that the second end is extended to from the first end;
First plunger, first plunger are arranged in the first end;
Second plunger, second plunger are arranged in the second end;
Compressibility spring assembly, the compressibility spring assembly are arranged in the tube;
It is characterized in that,
The compressibility spring assembly include at least two springs, two of them spring include at least one interior compressibility spring and At least one external compression spring.
Detailed description of the invention
Other aspects of the present invention and its advantage in conjunction with attached drawing studying after detailed description it will be appreciated that, in which:
Fig. 1-A shows the side view of contact probe of the invention.
Fig. 1-B shows the cross-sectional view of contact probe.
Fig. 2-A and Fig. 2-B(are referred to as Fig. 2) be pipe side view and perspective view.
Fig. 3-A to Fig. 3-D(is referred to as Fig. 3) be compressibility spring assembly side view and perspective view.
Fig. 4-A to Fig. 4-D(is referred to as Fig. 4) be plunger side view and perspective view.
Fig. 5 shows the partial sectional view of contact probe.
Fig. 6-A shows the partial sectional view of the contact probe in first embodiment to Fig. 6-C, wherein compressibility groups of springs Part is in three kinds of different states.
Fig. 7 shows the spring force song opposite with compression travel of the compressibility spring assembly in first embodiment of the invention Line.
Fig. 8-A shows the partial sectional view of the contact probe in second embodiment to Fig. 8-C, wherein compressibility groups of springs Part is in three kinds of different states.
Fig. 9 shows the spring force song opposite with compression travel of the compressibility spring assembly in second embodiment of the invention Line.
Specific embodiment
In the following detailed description, many details are set forth fully understands in order to provide to of the invention.However, this Field the skilled person will understand that, the present invention can be practiced without these specific details.In other cases, do not have Well known method, process and/or component is described in detail, in order to avoid make the present invention unclear.
The present invention will be more clearly understood from being described below of embodiment, these embodiments only pass through exemplary side Formula is provided referring to attached drawing, and the drawings are not drawn to scale.
The present invention relates to the contact probe 100 for test jack and contactor, which is used in electronic test equipment Electrical contact is provided between the electronic component of such as tested Electronic Packaging.More particularly it relates to have compressibility spring The contact probe 100 of component 300, the contact probe can realize high spring force in the case where not influencing spring service life.
- A referring now to fig. 1, Fig. 1-A show the side view of contact probe 100, and are further embodied by Fig. 1-B, figure 1-B shows the cross-sectional view of contact probe 100 according to the present invention.The contact probe 100 includes pipe 200, the first column Fill in the 400, second plunger 450 and compressibility spring assembly 300.Fig. 2 to Fig. 4 shows the pipe 200, the compressibility groups of springs The side view and perspective view of part 300, first plunger 400 and second plunger 450.The contact probe 100 is constructed At the length of about 1mm to 4mm.In the exemplary embodiment, 0.4mm spacing BGA Package (BGA) is applied, it is described Contact probe can have the length of about 2mm.Without departing from the present invention, the size of contact probe can be from One embodiment of the present of invention variation is another embodiment.
As shown in Fig. 2-A and Fig. 2-B, the pipe 200 is cylindrical shell 201, and cylindrical shell 201 includes first End 203, second end 205 and the through-hole 207 that the second end 205 is extended to from the first end 203.The first of the pipe 200 End 203 is set as receiving first plunger 400, and the second end 205 of the pipe 200 is set as receiving second plunger 450, And the through-hole 207 of the pipe 200 accommodates the compressibility spring assembly 300.
Such as being shown in Fig. 3-A into Fig. 3-D, the compressibility spring assembly 300 includes at least two compressibility springs, In two springs include that at least one interior compressibility spring 301(is shown in Fig. 3-A and Fig. 3-B) and at least one external compression Spring 303(is shown in Fig. 3-C and Fig. 3-D).The interior compressibility spring 301 and the external compression spring 303 are all arranged In the pipe 200.In an embodiment of the present invention, the line footpath of the external compression spring 303 and spring force are greater than in described The line footpath and spring force of compressibility spring 301.The diameter of interior compressibility spring 301 is less than the diameter of external compression spring 303, makes Compressibility spring 301 can be assemblied in external compression spring 303 in obtaining.Spring can be made of an electrically conducting material, such as qin is used Steel wire or stainless steel wire.Design of compressibility spring, such as sum, length, the shape of coil etc. can change, to be different Test application provides different compression and spring force.
It is such as shown in Fig. 4-A and Fig. 4-B, first plunger 400 includes the first contact portion 401, elongated portion 403, shoulder segments 405 and conical section 407.First plunger 400 is slidably disposed on the first end of the pipe 200 In 203, so that the first plunger 400 moves in a longitudinal direction relative to the pipe 200.The tapered portion of first plunger 400 407 are divided to be used to engage with one end of the compressibility spring, and the first contact portion 401 is used for during electrical testing and such as electricity The external circuit elements of road plate pad engage.The diameter of the conical section 407 must be substantially equal to or less than external compression bullet The internal diameter of spring 303.The diameter of the shoulder segments 405 is slightly less than the internal diameter of the pipe 200.
Second plunger 450 is shown in Fig. 4-C and Fig. 4-D.Second plunger 450 includes the second contact portion 451 and coupling part 453.Second plunger 450 is arranged at the second end 205 of the pipe 200, wherein coupling part 453 It is engaged with the other end of the compressibility spring, and the second contact portion 451 is for the contact element with Electronic Packaging during test Part engagement.As shown in Fig. 4-C and Fig. 4-D, the second contact portion 451 of second plunger 450 is for testing ball bar The encapsulation of four points of array package (BGA) and Quad Flat No-leads (QFN).The example of other kinds of contact portion includes nine A point encapsulation, aciculiform etc..It can be depended on the circumstances according to specific application and select the shape of contact portion.On it should be understood that The type for the contact portion that text is listed is for illustration purposes only rather than limits.First plunger 400 was configured in the operation phase Between be retracted back in pipe 200 and extend from pipe 200, it is mobile relative to outer member to allow contact probe, while still ensuring that institute State the electric continuity between the first plunger 400 and the second plunger 450.Even if the first plunger 400 and the second plunger 450 are all removable Dynamic, it also can establish the present invention.
The partial sectional view of the contact probe of the invention is shown referring now to Fig. 5, Fig. 5.The interior compressibility bullet Spring 301 and the external compression spring 303 are all disposed in the pipe 200.The external compression spring 303 is concentrically positioned in Around the interior compressibility spring 301.The interior compressibility spring 301 has the first coiling direction, the external compression spring 303 have the second coiling direction.First coiling direction is different from the second coiling direction, to prevent the interior compressibility spring 301 It tangles with the external compression spring 303.In an embodiment of the present invention, the interior compressibility spring 301 is up time needle spring, The external compression spring 303 be inverse time needle spring, or both in turn.
Fig. 6-A to Fig. 6 C shows the partial sectional view of the contact probe in first embodiment, wherein the compression Property spring assembly 300 is in three kinds of different states.As shown in Fig. 6-A, the compressibility spring assembly 300 is in assembling shape State, medium and small power are applied to the compressibility spring assembly 300.The conical section 407 of first plunger 400 with it is described Interior compressibility spring 301 contacts.The shoulder segments 405 of first plunger 400 are contacted with the external compression spring 303.Figure 6-B is shown in the contact probe for preloading stroke state.Interior compressibility spring 301 and external compression spring 303 are all described First plunger 400 compression, until preloading impulse stroke predetermined.Preload spring force is obtained from two springs.Figure 6-C shows the contact probe in desired impulse stroke state.From the interior compressibility spring 301 and the external compression bullet Desired spring force is obtained in spring 303.Two springs are all compressed by first plunger 400 until desired impulse stroke.Fig. 7 Show the spring force of the compressibility spring assembly 300 in the first embodiment of the invention curve opposite with compression travel.From song Line is it is found that realize desired high spring force by using compressibility spring assembly 300 of the invention.Due in desired working line Spring force in journey is less than traditional Single spring and designs, therefore the life cycle of the external compression spring 303 is than traditional list Spring design length.Compared with traditional Single spring design, the life cycle of the interior compressibility spring 301 has increased.Pre-add It carries spring force and is about in 50% of desired spring force under impulse stroke state.However, more than 1, the bullet of 000,000 circulation The spring service life can be implemented.
Fig. 8-A to Fig. 8-C shows the partial sectional view of the contact probe in second embodiment, wherein the compression Property spring assembly 300 is in three kinds of different states.It is real second compared with the external compression spring 303 in first embodiment The length for applying external compression spring 303 used in example is shorter.As shown in Fig. 8-A, the compressibility spring assembly 300 is being assembled It under state, is applied on the external compression spring 303 without load, and sets load and be applied to the interior compressibility bullet On spring 301.The conical section 407 of first plunger 400 is contacted with the interior compressibility spring 301.And the external compression Spring 303 and first plunger 400 have certain distance.Fig. 8-B is shown in the contact probe for preloading stroke state.It is interior Compressibility spring 301 is compressed by first plunger 400, until preloading impulse stroke predetermined.For example, in 0.15mm Preloading impulse stroke in, preload spring force is about 3.75gf.Preloading bullet is obtained from the interior compressibility spring 301 Spring force, and the external compression spring 303 is just contacted with first plunger 400.Fig. 8-C is shown in desired working line The contact probe of journey state.Desired spring is obtained from the interior compressibility spring 301 and the external compression spring 303 Power.Two springs are all compressed by first plunger 400 until desired impulse stroke.In the exemplary embodiment, such as fruiting period The impulse stroke of prestige is 0.3mm, then desired spring force is about 30gf.Fig. 9 shows compressibility spring assembly 300 of the invention The spring force curve opposite with compression travel.From curve it is found that being realized by using compressibility spring assembly 300 of the invention Desired high spring force.The life cycle of the external compression spring 303 is almost the same with traditional Single spring design, but with biography The Single spring design of system is compared, and the life cycle of the interior compressibility spring 301 has increased.Total spring life and traditional list Spring design is almost the same.Preload spring force with traditional Single spring is about desired spring force under impulse stroke state 55% compare, under impulse stroke state, preload spring force is about the 13% of desired spring force.This has than traditional list Spring designs the benefit for reducing 77% preloading stroke force.
It therefore, can be in the durability for not damaging spring force performance and compressibility spring using contact probe of the invention In the case where realize high bandwidth requirement.In addition, can reduce the warpage of test jack by reducing preload spring force.
Although disclosing the preferred embodiment of the present invention and its advantage in detailed description above, the present invention is unlimited In this, but it is limited only by the scope of the following claims.

Claims (7)

1. contact probe, the contact probe include:
It manages (200), which has first end (203), second end (205) and extend to from the first end (203) described The through-hole (207) of second end (205);
First plunger (400), first plunger (400) are arranged in the first end (203);
Second plunger (450), second plunger (450) are arranged in the second end (205);
Compressibility spring assembly (300), the compressibility spring assembly (300) are arranged in the pipe (200);
It is characterized in that,
The compressibility spring assembly (300) includes at least two springs, and two of them spring includes at least one interior compressibility Spring (301) and at least one external compression spring (303).
2. contact probe as described in claim 1, wherein the external compression spring (303) is concentrically positioned in the internal pressure Around contracting spring (301).
3. contact probe as described in claim 1, wherein the internal pressure contracting spring (301) has the first coiling direction, institute External compression spring (303) are stated with the second coiling direction, the first coiling direction is different from the second coiling direction.
4. contact probe as described in claim 1, wherein the line footpath of the external compression spring (303) is greater than the interior compression The line footpath of property spring (301).
5. contact probe as described in claim 1, wherein in compressibility spring (301) and external compression spring (303) all by First plunger (400) compression, until desired impulse stroke.
6. contact probe as described in claim 1, wherein in preloading in stroke state, from the interior compressibility spring (301) reloading spring is obtained in or from the interior compressibility spring (301) and the external compression spring (303) the two Power.
7. contact probe as described in claim 1, wherein in desired impulse stroke state, from the interior compressibility bullet Desired spring force is obtained in spring (301) and the external compression spring (303) the two.
CN201811046239.7A 2017-12-22 2018-09-07 Contact probe with compressibility spring assembly Pending CN109959806A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
MYPI2017704995 2017-12-22
MYPI2017704995 2017-12-22

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CN109959806A true CN109959806A (en) 2019-07-02

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TW (1) TWI671529B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102456469B1 (en) * 2020-08-11 2022-10-21 리노공업주식회사 Method and Device for fabricating the test probe
KR102456449B1 (en) * 2020-08-11 2022-10-20 리노공업주식회사 Test Probe

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1436306A (en) * 2000-06-16 2003-08-13 日本发条株式会社 Microcontactor probe and electric probe unit
CN102369447A (en) * 2009-04-03 2012-03-07 日本发条株式会社 Spring wire, contact probe, and probe unit
CN102971842A (en) * 2010-06-30 2013-03-13 李诺工业有限公司 Probe
CN203224534U (en) * 2013-03-18 2013-10-02 矽品科技(苏州)有限公司 A double-crown testing probe
CN204333358U (en) * 2014-12-26 2015-05-13 廖芳 A kind of novel spring probe
JP2017142080A (en) * 2016-02-08 2017-08-17 日本電産リード株式会社 Contact terminal, inspection tool, and inspection device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202205932U (en) * 2011-09-01 2012-04-25 东莞中探探针有限公司 Coaxial type spring connector
KR101841107B1 (en) * 2016-04-27 2018-03-22 주식회사 아이에스시 Bifurcated probe apparatus

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1436306A (en) * 2000-06-16 2003-08-13 日本发条株式会社 Microcontactor probe and electric probe unit
CN102369447A (en) * 2009-04-03 2012-03-07 日本发条株式会社 Spring wire, contact probe, and probe unit
CN102971842A (en) * 2010-06-30 2013-03-13 李诺工业有限公司 Probe
CN203224534U (en) * 2013-03-18 2013-10-02 矽品科技(苏州)有限公司 A double-crown testing probe
CN204333358U (en) * 2014-12-26 2015-05-13 廖芳 A kind of novel spring probe
JP2017142080A (en) * 2016-02-08 2017-08-17 日本電産リード株式会社 Contact terminal, inspection tool, and inspection device

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TW201928356A (en) 2019-07-16
TWI671529B (en) 2019-09-11

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Application publication date: 20190702