CN109900962A - Keyboard matrix impedance test device - Google Patents
Keyboard matrix impedance test device Download PDFInfo
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- CN109900962A CN109900962A CN201711293131.3A CN201711293131A CN109900962A CN 109900962 A CN109900962 A CN 109900962A CN 201711293131 A CN201711293131 A CN 201711293131A CN 109900962 A CN109900962 A CN 109900962A
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- pin
- keyboard matrix
- pin bores
- area
- test device
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Abstract
The present invention discloses a kind of keyboard matrix impedance test device, it include: test connector, one end has the interface for the carbon ribbon for plugging keyboard, the other end has several first pin bores of sequential, respectively first pin bores and the carbon ribbon pin of the carbon ribbon connect one to one, which is divided into the first area of corresponding keyboard matrix X-axis and the second area of corresponding keyboard matrix Y-axis；Test pinboard, one end are connect with respectively first pin bores that the test connector is in second area, and the other end has the second pin hole of several sequentials, and respectively the second pin hole and first pin bores of the second area connect one to one；Microhmmeter, there are two probe, each probes to be inserted into first pin bores and second pin hole respectively for tool.Therefore it is inserted into more convenient, easy to operate, and be inserted into accurate, contact is good；Operator is facilitated correctly to select corresponding first pin bores and second pin hole.
Description
[technical field]
The present invention relates to test devices, and in particular to a kind of keyboard matrix impedance test device.
[background technique]
When keyboard is in part sample and recognizes, need to measure each keycap (keycap) using microhmmeter in a matrix
Contact impedance size, to know whether its contact condition good, whether function normal.Contact impedance reflects that keyboard is every
It is unimpeded whether trigger point locating for a keycap contacts intact and circuit in its circuit, will not generate dysfunction, and part key is real
Effect etc., will not lead to the situation of later period use reliability deviation.The measurement of keyboard impedance is mostly in monomer and just arrives, Huo Zhegao
Warm, low epidemic disaster drenches with rain, is dust-proof, vibrating the detection for falling the contact loop after falling.
The impedance specification of usual keyboard matrix, before and after environment and reliability testing experiment, conventional key can be lower than 250 millis
Europe, function key can be lower than 300 milliohms.
Referring to Fig. 1, Fig. 1 is schematically shown as a kind of keyboard matrix impedance test device schematic diagram of the prior art.As shown,
The keyboard 100 includes several keycaps 101, and the corresponding keyboard matrix of several keycaps 101, each keycap 101 is with one
The output of two-dimensional coordinate, each keycap 101 of the keyboard 100 is connect by a carbon ribbon 102 with the external world, is had on the carbon ribbon 102
The carbon ribbon pin 103 of corresponding above-mentioned two-dimensional coordinate, carbon ribbon pin 103 and 8 ordinate Y for example including 16 abscissa X
Carbon ribbon pin 103.The prior art is to go the probe 104 of microhmmeter to contact the keycap when testing some keycap 101
Two carbon ribbon pins 103 of 101 corresponding two-dimensional coordinates, press the keycap 101, test and obtain number by microhmmeter
Value, is compared with testing standard, tests whether to pass through with determination.
However, when being tested using aforesaid way, since carbon ribbon pin 103 is usually thickly dotted, without numerical value
Label, therefore two carbon ribbon pins 103 of corresponding 101 coordinate of keycap can not be comparatively fast found when measurement, it is troublesome in poeration；And due to
Carbon ribbon pin 103 is very close, spacing very little (about 0.5 millimeter), so microhmmeter used test probe 104 is not easy and carbon ribbon pin
103 contacts are good, it is often necessary to repeatedly click and attempt.
In view of this, it is really necessary to provide a kind of keyboard matrix impedance test device, to solve the above problems.
[summary of the invention]
Therefore, the purpose of the present invention is to provide a kind of keyboard matrix impedance test devices, solve troublesome in poeration, nothing when test
Method is rapidly achieved the problem of test purpose.
In order to achieve the above object, keyboard matrix impedance test device of the invention, comprising:
Test connector, one end have the interface for the carbon ribbon for plugging keyboard, and the other end has the several of sequential
A first pin bores, respectively first pin bores and the carbon ribbon pin of the carbon ribbon connect one to one, several first pins
Hole is divided into the first area of corresponding keyboard matrix X-axis and the second area of corresponding keyboard matrix Y-axis；
Respectively first pin bores that test pinboard, one end and the test connector are in second area connect
It connects, the other end has the second pin hole of several sequentials, and this of respectively the second pin hole and the second area first draw
Foot hole connects one to one；
Microhmmeter, there are two probe, each probes to be inserted into first pin bores and second pin hole respectively for tool.
Optionally, respectively first pin bores in the first area have coordinates logo.
Optionally, respectively first pin bores on the second area have coordinates logo.
Optionally, first pin bores are copper foil hole.
Optionally, the second pin hole is copper foil hole.
Optionally, which has coordinates logo.
Optionally, the test connector is disposed vertically with the test with pinboard.
Optionally, the test connector and the test are placed side by side with pinboard.
Optionally, the number of first pin bores of the first area is 16, and described the first of the second area is drawn
The number in foot hole is 8.
Optionally, the aperture in first pin bores and second pin hole is all greater than 1 millimeter.
Compared to the prior art, keyboard matrix impedance test device of the invention, when test, it is only necessary to compare keyboard matrix
Coordinate, the probe of ohmmeter is inserted into corresponding first pin bores and second pin hole, some keycap of keyboard is pressed, obtains
The contact impedance of the keycap tests whether to pass through with judgement.Due to being to insert a probe into the first pin bores and second pin hole, because
This insertion is more convenient, easy to operate, and is inserted into accurately, and contact is good；Divide on test connector and test pinboard
The mark that keyboard matrix two-dimensional coordinate Guan Cha not corresponded to, facilitates operator correctly to select corresponding first pin bores and second pin
Hole.
[Detailed description of the invention]
Fig. 1 is schematically shown as a kind of keyboard matrix impedance test device schematic diagram of the prior art.
Fig. 2 is schematically shown as the structural schematic diagram of keyboard matrix impedance test device first embodiment of the invention.
Fig. 3 is schematically shown as the decomposition texture schematic diagram of keyboard matrix impedance test device first embodiment of the invention.
Fig. 4 is schematically shown as the structural schematic diagram of keyboard matrix impedance test device second embodiment of the invention.
[specific embodiment]
Fig. 2, Fig. 3, Fig. 3 are please referred to, Fig. 2 is schematically shown as keyboard matrix impedance test device first embodiment of the invention
Structural schematic diagram, Fig. 3 be schematically shown as the decomposition texture schematic diagram of keyboard matrix impedance test device first embodiment of the invention.
In order to achieve the above object, keyboard matrix impedance test device of the invention, comprising:
Test connector 200, one end have plug keyboard 201 carbon ribbon 202 interface 203, the other end have according to
Several first pin bores 204 of sequence arrangement, respectively the carbon ribbon pin 205 1 of first pin bores 204 and the carbon ribbon 202 is a pair of
It should connect, which divides first area 206 and corresponding keyboard matrix Y-axis for corresponding keyboard matrix X-axis
Second area 207；
Test pinboard 208, one end and the test connector 200 be in second area 207 respectively this first
Pin bores 204 connect, and the other end has the second pin hole 209 of several sequentials, respectively the second pin hole 209 and this
First pin bores 204 in two regions 207 connect one to one；
Microhmmeter 210, there are two probe 211, each probes 211 to be inserted into first pin bores 204 and second respectively for tool
Pin bores 209.
In the first embodiment, the test connector 200 is disposed vertically with the test pinboard 208, convenient
Operator operates after observing according to coordinate habit.
Wherein, respectively first pin bores 204 in the first area 206 can have coordinates logo, the second area 207
On respectively first pin bores 204 can have coordinates logo, which can have coordinates logo.
Wherein, first pin bores 204 can be copper foil hole, and the second pin hole 209 can be copper foil hole；Copper foil
With preferable conductive effect.
Wherein, the aperture in first pin bores 204 and second pin hole 209 is all greater than 1 millimeter, facilitates operator that will visit
Needle 211 is inserted into.
Wherein, the number of first pin bores 204 of the first area 206 can be 16, the second area 207
The number of first pin bores 204 can be 8；The sequence of corresponding X-axis and Y-axis is respectively 16 and 8.Certainly, above-mentioned
Number is only illustrated, and can be actually other numbers, depending on the actual conditions of keyboard matrix.
Compared to the prior art, keyboard matrix impedance test device of the invention, when test, it is only necessary to compare keyboard matrix
Coordinate, the probe 211 of ohmmeter 210 is inserted into corresponding first pin bores 204 and second pin hole 209, presses keyboard 201
Some keycap 212, obtain the contact impedance of the keycap 212, with judgement test whether to pass through.Due to being to be inserted into probe 211
First pin bores 204 and second pin hole 209, therefore insertion is more convenient, it is easy to operate, and be inserted into accurately, contact is good；?
The mark for observing corresponding keyboard matrix two-dimensional coordinate on test connector 200 and test pinboard 208 respectively, facilitates operation
Person correctly selects corresponding first pin bores 204 and second pin hole 209.
Fig. 4 is please referred to, the structure that Fig. 4 is schematically shown as keyboard matrix impedance test device second embodiment of the invention is shown
It is intended to.
Wherein, in the second embodiment, the test connector 200 is placed side by side with pinboard 208 with the test,
It so can be convenient the connection between the test pinboard 208 and test connector 200.
It is noted that the present invention is not limited to the above embodiments, any person skilled in the art is based on this hair
Bright technical solution both falls within protection model of the invention to any simple modification, equivalent change and modification made by above-described embodiment
In enclosing.
Claims (10)
1. a kind of keyboard matrix impedance test device, characterized in that it comprises:
Test connector, one end have an interface for the carbon ribbon for plugging keyboard, the other end have sequential several the
One pin bores, respectively first pin bores and the carbon ribbon pin of the carbon ribbon connect one to one, several first pin bores point
For the first area of corresponding keyboard matrix X-axis and the second area of corresponding keyboard matrix Y-axis；
Test pinboard, one end are connect with respectively first pin bores that the test connector is in second area, separately
One end has the second pin hole of several sequentials, respectively first pin bores one in the second pin hole and the second area
One is correspondingly connected with；
Microhmmeter, there are two probe, each probes to be inserted into first pin bores and second pin hole respectively for tool.
2. keyboard matrix impedance test device as described in claim 1, which is characterized in that in the first area respectively this first
Pin bores have coordinates logo.
3. keyboard matrix impedance test device as described in claim 1, which is characterized in that on the second area respectively this first
Pin bores have coordinates logo.
4. keyboard matrix impedance test device as described in claim 1, which is characterized in that first pin bores are copper foil
Hole.
5. keyboard matrix impedance test device as described in claim 1, which is characterized in that the second pin hole is copper foil
Hole.
6. keyboard matrix impedance test device as described in claim 1, which is characterized in that the second pin hole has coordinate mark
Know.
7. keyboard matrix impedance test device as described in claim 1, which is characterized in that the test connector with it is described
Test is disposed vertically with pinboard.
8. keyboard matrix impedance test device as described in claim 1, which is characterized in that the test connector with it is described
Test is placed side by side with pinboard.
9. keyboard matrix impedance test device as described in claim 1, which is characterized in that described the first of the first area is drawn
The number in foot hole is 16, and the number of first pin bores of the second area is 8.
10. keyboard matrix impedance test device as described in claim 1, which is characterized in that first pin bores and second
The aperture of pin bores is all greater than 1 millimeter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711293131.3A CN109900962B (en) | 2017-12-08 | 2017-12-08 | Keyboard matrix impedance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711293131.3A CN109900962B (en) | 2017-12-08 | 2017-12-08 | Keyboard matrix impedance testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109900962A true CN109900962A (en) | 2019-06-18 |
| CN109900962B CN109900962B (en) | 2021-08-10 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711293131.3A Active CN109900962B (en) | 2017-12-08 | 2017-12-08 | Keyboard matrix impedance testing device |
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| CN (1) | CN109900962B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113532757A (en) * | 2020-04-17 | 2021-10-22 | 神讯电脑(昆山)有限公司 | Keyboard waterproof function test system and method thereof |
Citations (7)
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| EP0847342B1 (en) * | 1995-09-01 | 1999-03-24 | Robert Bosch Gmbh | Device for the contactless transfer of signals between two vehicle parts mounted to rotate with respect to each other |
| US20050194981A1 (en) * | 2004-03-02 | 2005-09-08 | Cole J. B. | Method and system of characterizing a device under test |
| CN102412486A (en) * | 2010-09-23 | 2012-04-11 | 鸿富锦精密工业（深圳）有限公司 | Adapter and transferring method of the same |
| CN203630224U (en) * | 2013-09-12 | 2014-06-04 | 陕西航天导航设备有限公司 | Conductive device dynamic contact resistance test apparatus |
| CN203950531U (en) * | 2014-07-18 | 2014-11-19 | 昆山龙腾光电有限公司 | Card extender |
| CN205301433U (en) * | 2015-12-01 | 2016-06-08 | 中国科学院西安光学精密机械研究所 | Matrix automatic impedance tester |
| CN105785079A (en) * | 2016-03-01 | 2016-07-20 | 廖小健 | Channel rapid conversion device for signals to be detected based on PCI |
-
2017
- 2017-12-08 CN CN201711293131.3A patent/CN109900962B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0847342B1 (en) * | 1995-09-01 | 1999-03-24 | Robert Bosch Gmbh | Device for the contactless transfer of signals between two vehicle parts mounted to rotate with respect to each other |
| US20050194981A1 (en) * | 2004-03-02 | 2005-09-08 | Cole J. B. | Method and system of characterizing a device under test |
| CN102412486A (en) * | 2010-09-23 | 2012-04-11 | 鸿富锦精密工业（深圳）有限公司 | Adapter and transferring method of the same |
| CN203630224U (en) * | 2013-09-12 | 2014-06-04 | 陕西航天导航设备有限公司 | Conductive device dynamic contact resistance test apparatus |
| CN203950531U (en) * | 2014-07-18 | 2014-11-19 | 昆山龙腾光电有限公司 | Card extender |
| CN205301433U (en) * | 2015-12-01 | 2016-06-08 | 中国科学院西安光学精密机械研究所 | Matrix automatic impedance tester |
| CN105785079A (en) * | 2016-03-01 | 2016-07-20 | 廖小健 | Channel rapid conversion device for signals to be detected based on PCI |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113532757A (en) * | 2020-04-17 | 2021-10-22 | 神讯电脑(昆山)有限公司 | Keyboard waterproof function test system and method thereof |
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| CN109900962B (en) | 2021-08-10 |
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