CN217112603U - Test circuit board and test mechanism - Google Patents
Test circuit board and test mechanism Download PDFInfo
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- CN217112603U CN217112603U CN202123273217.4U CN202123273217U CN217112603U CN 217112603 U CN217112603 U CN 217112603U CN 202123273217 U CN202123273217 U CN 202123273217U CN 217112603 U CN217112603 U CN 217112603U
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Abstract
The application discloses test circuit board and accredited testing organization. The test circuit board includes: the substrate is provided with a preset functional circuit and is used for bearing the functional circuit of the electronic element to be tested, and the electronic element to be tested borne by the substrate is electrically connected with the functional circuit; a connector mounted on the substrate and electrically connected to the functional circuit; the identification circuit is arranged on the substrate and electrically connected with the connector, and the identification circuit is provided with an identification mark corresponding to the connector and is used for identifying the connector by detecting the identification mark. Can confirm the information of connector through above-mentioned scheme, when having a plurality of connectors, can avoid appearing the connector and connect the problem of mistake to can play the foolproof effect.
Description
Technical Field
The application belongs to the technical field of testing devices of electronic elements, and particularly relates to a testing circuit board and a testing mechanism.
Background
After the chip is packaged, an electrical property test is required to ensure that the chip is good for use; this test after packaging is called final test. The final test is carried out by mounting a test socket on a test board, and mounting the electronic components to be tested through the test socket, the test board being mounted on the tester and connected to the tester through the relevant interface device or pogo pins. When testing, the chip is placed in the test seat, and the pin of the test seat is electrically connected with the corresponding interface device of the testing machine through the internal circuit of the test board, so that the test seat is communicated with the testing machine to test the chip.
The connector can be arranged on the test board for final test in the prior art, and the test board is electrically connected with the test machine through the connector switching.
SUMMERY OF THE UTILITY MODEL
The application provides a test circuit board and a test mechanism, which are used for solving the technical problem.
In order to solve the technical problem, the application adopts a technical scheme that: there is provided a test circuit board including:
the substrate is provided with a preset functional circuit and is used for bearing an electronic element to be tested, and the electronic element to be tested borne by the substrate is electrically connected with the functional circuit;
a connector mounted on the substrate and electrically connected to the functional circuit;
the identification circuit is arranged on the substrate and electrically connected with the connector, the identification circuit is provided with an identification mark corresponding to the connector, and the connector is identified by detecting the identification mark.
Optionally, the identification circuit includes an identification resistor, a first end of the identification resistor is grounded, and a second end of the identification resistor is electrically connected to a preset pin of the connector;
the identification resistor is provided with a preset resistance value, and the identification mark is the preset resistance value.
Optionally, the identification circuit further includes a switch circuit, the second end of the identification resistor is connected to one end of the switch circuit, and the other end of the switch is electrically connected to a preset pin of the connector.
Optionally, the switching circuit comprises a relay.
Optionally, the number of the connectors is multiple, and the number of the identification circuits is multiple; each connector is connected with one identification circuit.
Optionally, the connectors include a first connector and a second connector of the same type, the identification circuit includes a first identification circuit and a second identification circuit, the first identification circuit has a first identification resistor therein, and the second identification circuit has a second identification resistor therein;
the first identification resistor and the second identification resistor are electrically connected with the same pins of the first connector and the second connector respectively, and the resistance values of the first identification resistor and the second identification resistor are different; or
The first identification resistor and the second identification resistor are electrically connected with different pins of the first connector and the second connector respectively.
Optionally, still be equipped with the test installation department on the base plate, the test installation department is used for installing the electronic component that awaits measuring, the test installation department with the function circuit electricity is connected.
Optionally, the test mounting part is a mounting seat, and the electronic element to be tested is detachably mounted on the mounting seat.
In order to solve the technical problem, the application adopts a technical scheme that: there is provided a test mechanism comprising a motherboard, a patch panel and a test circuit board as described above, wherein one end of the patch panel is electrically connected to the motherboard and the other end is electrically connected to the connector.
Optionally, the test mechanism comprises a plurality of different models of the test circuit board;
the identification mark in each test circuit board corresponds to the model of the test circuit board.
The beneficial effect of this application is: according to the scheme, the information of the connector can be confirmed through the identification mark in the identification circuit, and when a plurality of connectors are arranged, the problem of wrong connection of the connectors can be avoided, so that a foolproof effect can be achieved; in addition, the test device sends out an identification signal to detect the identification mark in the identification circuit, so that the connector can be automatically identified, and the connector connection errors on the mother board and the daughter board can be avoided.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without inventive efforts, wherein:
FIG. 1 is a schematic structural diagram of an embodiment of a test circuit board provided in the present application;
FIG. 2 is a schematic structural diagram of another embodiment of a test circuit board provided by the present application;
FIG. 3 is a schematic structural diagram of another embodiment of the test circuit board of FIG. 2;
FIG. 4 is a schematic structural diagram of an embodiment of a testing mechanism provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort belong to the protection scope of the present application.
It should be noted that if directional indications (such as up, down, left, right, front, and back … …) are referred to in the embodiments of the present application, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in the embodiments of the present application, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
Please refer to fig. 1. Fig. 1 is a schematic structural diagram of an embodiment of a test circuit board provided in the present application.
The test circuit board 10 includes a substrate 110, a connector 120, and an identification circuit 130.
A substrate 110, provided with a predetermined functional circuit (not shown), wherein the substrate 110 is used for carrying an electronic component to be tested, and the electronic component to be tested carried by the substrate 110 can be electrically connected with the functional circuit; therefore, by disposing the electronic component to be tested on the substrate 110 and then electrically connecting the electronic component to be tested with the functional circuit on the substrate 110, a test signal of an external test device can be transmitted to the electronic component to be tested through the functional circuit on the substrate 110 to test the electronic component to be tested.
The connector 120 is disposed on the substrate 110, wherein the connector 120 can be soldered to the substrate 110, and the connector 120 is electrically connected to the functional circuit on the substrate 110.
The recognition circuit 130 is provided on the substrate 110, the recognition circuit 130 is electrically connected to the connector 120, the recognition circuit 130 has a recognition mark corresponding to the connector 120, and the connector 120 is recognized by detecting the recognition mark.
Therefore, in the solution of this embodiment, through the identification mark in the identification circuit 130, the information of the connector 120 can be confirmed, and when there are a plurality of connectors 120, the problem of connector misconnection can be avoided, so that the fool-proof effect can be achieved.
In this embodiment, the identification circuit 130 includes an identification resistor 131 and a switch circuit 132.
The first end of the identifying resistor 131 may be grounded, and the second end of the identifying resistor 131 is electrically connected to the preset pin of the connector 120 through the switch circuit 132; the identification resistor 131 has a predetermined resistance value, and the identification mark has a predetermined resistance value.
Therefore, in the present embodiment, the corresponding connector 120 can be identified by detecting the resistance value of the identifying resistor 131.
The resistance value of the identification resistor 131 can be marked on the surface of the identification resistor 131, and the identification can be directly performed manually; alternatively, the resistance value of the identifying resistor 131 may be identified by an external device such as a multimeter.
In some embodiments, the automatic identification may also be performed by an external testing device.
In this embodiment, the external testing device may be electrically connected to the functional circuit on the substrate 110 through the connector 120, so as to electrically connect to the electronic component to be tested carried by the substrate 110, and the testing device may send out a testing signal, and the testing signal may pass through the connector 120 and the functional circuit on the substrate 110, so as to be transmitted to the electronic component to be tested, so as to test the electronic component to be tested.
Wherein, the testing device can also be provided with an identification unit.
The identification unit of the testing device can send out an identification signal, and the identification signal can be transmitted to the identification resistor 131 through the connector 120 and the switch circuit 132, so that the resistance value of the identification resistor 131 can be detected and identified.
For example, the identification unit may send out an identification signal with a preset voltage or current, the identification signal is transmitted to the identification resistor 131, and then the current or voltage of the identification resistor corresponding to the identification signal may be acquired, so that the resistance value of the identification resistor 131 may be calculated.
The switch circuit 132 can control the connection and disconnection between the identification resistor 131 and the connector 120.
Specifically, when the external testing device sends a testing signal to test the electronic device, the switch circuit 132 can disconnect the electrical connection between the identification resistor 131 and the connector 120, so as to prevent the identification circuit 130 from interfering with the testing signal.
When an external testing device sends out an identification signal, the switch circuit 132 may enable the identification resistor 131 to be electrically connected with the connector 120, so that the identification signal may be transmitted to the identification resistor 131 to detect and identify the resistance value of the identification resistor 131.
In practical applications, different types of test circuit boards are generally required to be used for different electronic components to be tested. That is, the same type of test circuit board can be used for a certain electronic component to be tested.
The connectors with the same signal can be arranged on different test circuit boards so as to realize the electrical connection with an external test device.
At this time, the connectors 120 of the same type on different types of test circuit boards 10 may be respectively connected with the identification resistors 131 having different resistance values, so as to perform corresponding differentiation. At this time, the connectors 120 on the same type of test circuit board may use the identification resistors 131 having the same resistance value.
In addition, if there are at least two connectors 120 with the same model on the same test circuit board 10, at least two identification circuits 130 may also be disposed on the test circuit board 10, and each connector 120 may be correspondingly connected to one identification circuit 130, and the resistance values of the identification resistors in the identification circuits 130 connected to different connectors 120 on the test circuit board 10 may be set to be different, so as to identify and distinguish each connector.
For example, please refer to fig. 2, fig. 2 is a schematic structural diagram of another embodiment of a test circuit board according to the present application.
A plurality of connectors 120 may be provided on the test circuit board 10, and the plurality of connectors 120 have a first connector 121 and a second connector 122 of the same model. The number of the identification circuits 130 may also be multiple, and the multiple identification circuits 130 include a first identification circuit 1301 and a second identification circuit 1302.
The first identification circuit 1301 may be connected to the first connector 121, and the second identification circuit 1302 may be connected to the second connector 122.
In this embodiment, the first identification circuit 1301 has a first identification resistor 1303, and the second identification circuit 1302 has a second identification resistor 1304.
In one embodiment, the resistance values of the first identification resistor 1303 and the second identification resistor 1304 may be set to be different, for example, the resistance value of the first identification resistor 1303 may be set to 1K ohm, and the resistance value of the second identification resistor 1304 may be set to 2K ohm, so that the first connector 121 and the second connector 122 are distinguished by making the resistance values of the first identification resistor 1303 and the second identification resistor 1304 different.
At this time, the first recognition circuit 1301 and the second recognition circuit 1302 may be electrically connected to the same pins in the first connector 121 and the second connector 122, respectively. Specifically, the connector 120 generally includes a plurality of pins 1201, and the plurality of pins 1201 may be numbered according to a preset numbering sequence, and the first identification circuit 1301 and the second identification circuit 1302 may be electrically connected to the same-numbered pins 1201 in the first connector 121 and the second connector 122, respectively.
In another embodiment, the resistance values of the first identifying resistor 1303 and the second identifying resistor 1304 may be set to be the same. At this time, the first identification circuit 1301 and the second identification circuit 1302 need to be configured to be electrically connected to the pins 1201 of the first connector 121 and the second connector 122 with different numbers, respectively, so as to distinguish the first connector 121 from the second connector 122.
Further, in the present embodiment, the switch circuit 132 may include a relay.
There may be one relay in each identification circuit 130, or at least two adjacent identification circuits 130 may share one relay.
Referring to fig. 3, fig. 3 is a schematic structural diagram of another embodiment of the test circuit board shown in fig. 2.
The first identification circuit 1301 and the second identification circuit 1302 may share one relay 1305.
In this embodiment, when the testing device sends an identification signal (a specific voltage or current signal) to the relay 1305 through the connector, the relay 1305 may electrically connect the first identification resistor 1303 and the first connector 121 or the second identification resistor 1304 and the second connector 122.
When the test device emits an electrical signal other than the identification signal (e.g., a test signal for testing the electronic element to be tested), the relay 1305 may electrically disconnect the first identification resistor 1303 from the first connector 121 or the second identification resistor 1304 from the second connector 122.
Further, the substrate 110 is further provided with a test mounting portion (not shown in the figure) for mounting an electronic component to be tested, and the test mounting portion is electrically connected to the functional circuit. The test installation part is a mounting seat, the electronic element to be tested is detachably installed on the mounting seat, and the electronic element to be tested is detachably installed on the mounting seat to be tested, so that the electronic element to be tested can be welded on the substrate 110 in different modes, and the electronic element to be tested can be conveniently detached and packaged.
Based on the same inventive concept, the application also provides a testing mechanism. Referring to fig. 4, fig. 4 is a schematic structural diagram of an embodiment of a testing mechanism provided in the present application.
The testing mechanism 20 includes a motherboard 210, a patch circuit board 220, and the testing circuit board 10 as described above, wherein one end of the patch circuit board 220 is electrically connected to the motherboard 210, and the other end of the patch circuit board 220 is electrically connected to the connector 120 in the testing circuit board 10.
The adapting circuit board 220 may be an FPC (or a flat cable) for testing, one end of the adapting circuit board 220 has a connector matching with the connector 120 in the testing circuit board 10, and the connector on the adapting circuit board 220 and the connector 120 in the testing circuit board 10 may form a male-female socket. The motherboard 210 is electrically connected with the test circuit board 10 through the adapter circuit board 220, so that the position of the test circuit board 10 can be conveniently regulated and transferred.
Further, the motherboard 210 may be fixedly connected to the other end of the adapting circuit board 220, or similarly, the motherboard 210 and the other end of the adapting circuit board 220 may be connected by a male-female connector.
The testing mechanism 20 may further include a testing device 240, the testing device 240 may be electrically connected to the motherboard 210, and the testing device 240 may emit the testing signal and the identification signal as described above. The test signal sent by the test device 240 may pass through the motherboard 210 and the adapter circuit board 220 and then be transmitted to the test circuit board 10 to test the electronic component to be tested on the test circuit board 10; the identification signal sent by the testing device 240 passes through the motherboard 210 and the adapting circuit board 220 and then is transmitted to the connector 120 and the identification circuit 130 on the testing circuit board 10, so as to detect the identification mark in the identification circuit 130.
Here, the connectors on the motherboard 210 and the patch panel 220 may also be provided with the identification circuit 130 as described above.
Further, in the present embodiment, the test mechanism 20 may include a plurality of different models of test circuit boards 10; the identification mark in each test circuit board 10 corresponds to the model of the test circuit board 10.
In summary, those skilled in the art can easily understand that the beneficial effects of the present application are: according to the scheme, the information of the connector can be confirmed through the identification mark in the identification circuit, and when a plurality of connectors are arranged, the problem of wrong connection of the connectors can be avoided, so that a foolproof effect can be achieved; in addition, the test device sends out the identification signal to detect the identification mark in the identification circuit, so that the connector can be automatically identified, and the connector connection error on the mother board and the daughter board can be avoided.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings, or which are directly or indirectly applied to other related technical fields, are intended to be included within the scope of the present application.
Claims (10)
1. A test circuit board, comprising:
the substrate is provided with a preset functional circuit and is used for bearing an electronic element to be tested, and the electronic element to be tested borne by the substrate is electrically connected with the functional circuit;
a connector mounted on the substrate and electrically connected to the functional circuit;
the identification circuit is arranged on the substrate and electrically connected with the connector, the identification circuit is provided with an identification mark corresponding to the connector, and the connector is identified by detecting the identification mark.
2. The test circuit board of claim 1,
the identification circuit comprises an identification resistor, wherein the first end of the identification resistor is grounded, and the second end of the identification resistor is electrically connected with a preset pin of the connector;
the identification resistor is provided with a preset resistance value, and the identification mark is the preset resistance value.
3. The test circuit board of claim 2,
the identification circuit further comprises a switch circuit, the second end of the identification resistor is connected with one end of the switch circuit, and the other end of the switch circuit is electrically connected with a preset pin of the connector.
4. The test circuit board of claim 3,
the switching circuit includes a relay.
5. The test circuit board of claim 2,
the number of the connectors is multiple, and the number of the identification circuits is multiple; each connector is connected with one identification circuit.
6. The test circuit board of claim 5,
the connectors comprise a first connector and a second connector which have the same model, the identification circuit comprises a first identification circuit and a second identification circuit, the first identification circuit is provided with a first identification resistor, and the second identification circuit is provided with a second identification resistor;
the first identification resistor and the second identification resistor are electrically connected with the same pins of the first connector and the second connector respectively, and the resistance values of the first identification resistor and the second identification resistor are different; or alternatively
The first identification resistor and the second identification resistor are electrically connected with different pins of the first connector and the second connector respectively.
7. Test circuit board according to any one of claims 1 to 6,
still be equipped with the test installation department on the base plate, the test installation department is used for installing the examination electronic component that awaits measuring, the test installation department with the function circuit electricity is connected.
8. The test circuit board of claim 7,
the test installation part is a mounting seat, and the electronic element to be tested is detachably installed on the mounting seat.
9. A test mechanism comprising a motherboard, a patch panel electrically connected to the motherboard at one end and to the connector at the other end, and a test circuit board according to any of claims 1 to 8.
10. The test mechanism of claim 9, wherein the test mechanism includes a plurality of different models of the test circuit board;
the identification mark in each test circuit board corresponds to the model of the test circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123273217.4U CN217112603U (en) | 2021-12-23 | 2021-12-23 | Test circuit board and test mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123273217.4U CN217112603U (en) | 2021-12-23 | 2021-12-23 | Test circuit board and test mechanism |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217112603U true CN217112603U (en) | 2022-08-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123273217.4U Active CN217112603U (en) | 2021-12-23 | 2021-12-23 | Test circuit board and test mechanism |
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| Country | Link |
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| CN (1) | CN217112603U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116541895A (en) * | 2023-06-20 | 2023-08-04 | 荣耀终端有限公司 | Circuit board detection method, electronic device and chip system |
-
2021
- 2021-12-23 CN CN202123273217.4U patent/CN217112603U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116541895A (en) * | 2023-06-20 | 2023-08-04 | 荣耀终端有限公司 | Circuit board detection method, electronic device and chip system |
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