CN104569594A - Automatic missile resistance testing system - Google Patents
Automatic missile resistance testing system Download PDFInfo
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- CN104569594A CN104569594A CN201310502712.9A CN201310502712A CN104569594A CN 104569594 A CN104569594 A CN 104569594A CN 201310502712 A CN201310502712 A CN 201310502712A CN 104569594 A CN104569594 A CN 104569594A
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Abstract
The invention provides an automatic missile resistance testing system. The system comprises first matrix switches, second matrix switches, a multimeter pen clip, a computer and a standard resistor, wherein the first matrix switches, the second matrix switches and the multimeter pen clip are connected with the computer; the standard resistor is connected with the second matrix switches, and to-be-tested missile resistance is connected with the first matrix switches; the multimeter pen clip is selectively connected with the first matrix switch or the second matrix switch; during self-test, the standard resistor and the multimeter pen clip form a test loop through the second matrix switches, and when resistance is measured, the to-be-tested missile resistance and the multimeter pen clip form a test loop through the first matrix switches. The automatic missile resistance testing system realizes automation of a missile resistance test, reduces errors of a traditional manual test, greatly improves the test efficiency, shortens the test time, reduces the complication of missile resistance and greatly improves the flexibility.
Description
Technical field
The present invention relates to resistance test macro, be specifically related to a kind of guided missile robotization resistance test macro.
Background technology
In guided missile development process, each cabin section is by interface and other module composition organic whole, the characteristic of these interfaces reflects the internal state of each cabin section, guided missile resistance is interface node resistance between any two, it is one of important indicator describing interface features, measured by resistance, each cabin intersegmental part can be analyzed and whether there is hidden danger, the short circuit that such as internal circuit is caused by a variety of causes, open circuit, components and parts exception etc.
Resistance test develops whole process through guided missile, the consequently important indicator of evaluation apparatus electronics property.Resistance method of testing traditional is at present that efficiency is very low, expends the time and efforts that scientific research personnel is a large amount of with multimeter manual point-to-point measurement, and manual testing is easy to because operation reason brings error; Resistance measuring system needs to carry out comprehensive detection to measurand simultaneously, signal is more, this data volume sharp increase also making test macro produce, in the face of a large amount of data messages, be the close ties that manual data management or file system management mode all correctly cannot reflect between Various types of data, also all can not effectively manage and organising data.
Summary of the invention
The object of the present invention is to provide a kind of guided missile robotization resistance test macro, to improve efficiency, accuracy and automaticity that guided missile resistance is tested.
To achieve the above object, the invention provides a kind of guided missile robotization resistance test macro, comprise the first matrix switch, the second matrix switch, multitester probe card, computing machine and measuring resistance; Described first matrix switch, the second matrix switch are all connected with described computing machine with multitester probe card; Described measuring resistance is connected with described second matrix switch, and guided missile resistance to be measured is connected with described first matrix switch; Described multitester probe card is selectively connected with described first matrix switch or the second matrix switch; During self-inspection, described measuring resistance and multitester probe cartoon are crossed the second matrix switch and are formed test loop, and when resistance is measured, described guided missile resistance to be measured and multitester probe cartoon are crossed the first matrix switch and formed test loop.
Above-mentioned guided missile robotization resistance test macro, wherein, the switch of described first matrix switch is divided into two groups, one end of one end of first group of switch and second group of switch connects one to one, the other end of first group of all switch is connected in parallel, and the other end of second group of all switch is connected in parallel; The switch of described second matrix switch board is divided into two groups, and one end of one end of first group of switch and second group of switch connects one to one, and the other end of first group of all switch is connected in parallel, and the other end of second group of all switch is connected in parallel; The two ends of described measuring resistance are connected with the end be not connected in parallel of any two switches in described second matrix switch respectively; The positive test pencil of described multitester probe card and negative test pencil are selectively connected with the end be not connected in parallel of any two switches in described first matrix switch or in the second matrix switch respectively.
Above-mentioned guided missile robotization resistance test macro, wherein, the end be not connected in parallel of described first matrix switch first group of switch and the end be not connected in parallel of described second matrix switch first group of switch connect one to one, the end be not connected in parallel of described first matrix switch second group of switch and the end be not connected in parallel of described second matrix switch second group of switch connect one to one, and the positive test pencil of described multitester probe card and negative test pencil are connected with the end be not connected in parallel of any two switches in described first matrix switch respectively.
Above-mentioned guided missile robotization resistance test macro, wherein, the two ends of described measuring resistance are connected with the end be not connected in parallel organizing any two switches in switch with described second matrix switch respectively.
Above-mentioned guided missile robotization resistance test macro, wherein, described measuring resistance is two or more.
Above-mentioned guided missile robotization resistance test macro, wherein, the positive test pencil of described multitester probe card and negative test pencil are connected with the end be not connected in parallel organizing any two switches in switch with described first matrix switch respectively.
Guided missile robotization resistance test macro of the present invention achieves the robotization of guided missile resistance test, reduces the error of Traditional Man test, drastically increases testing efficiency, and shorten the test duration of guided missile resistance and loaded down with trivial details degree.
Guided missile robotization resistance test macro of the present invention can selector channel arbitrarily, greatly strengthen the dirigibility of this resistance test macro.
Accompanying drawing explanation
Guided missile robotization resistance test macro of the present invention is provided by following embodiment and accompanying drawing.
Fig. 1 is the topology diagram of matrix switch board in the embodiment of the present invention.
Fig. 2 is the schematic diagram of measuring missile resistance in the embodiment of the present invention.
Embodiment
Below with reference to Fig. 1, guided missile robotization resistance test macro of the present invention is described in further detail.
Guided missile robotization resistance test macro of the present invention comprises the first matrix switch, the second matrix switch, multitester probe card, computing machine and measuring resistance;
Described first matrix switch, the second matrix switch are all connected with described computing machine with multitester probe card;
Described measuring resistance is connected with described second matrix switch, and guided missile resistance to be measured is connected with described first matrix switch;
Described multitester probe card is selectively connected with described first matrix switch or the second matrix switch;
During self-inspection, described measuring resistance and multitester probe cartoon are crossed the second matrix switch and are formed test loop, and when resistance is measured, described guided missile resistance to be measured and multitester probe cartoon are crossed the first matrix switch and formed test loop.
The switch of described first matrix switch is divided into two groups, and one end of one end of first group of switch and second group of switch connects one to one, and the other end of first group of all switch is connected in parallel, and the other end of second group of all switch is connected in parallel; The switch of described second matrix switch board is divided into two groups, and one end of one end of first group of switch and second group of switch connects one to one, and the other end of first group of all switch is connected in parallel, and the other end of second group of all switch is connected in parallel; The two ends of described measuring resistance are connected with the end be not connected in parallel of any two switches in described second matrix switch respectively; The positive test pencil of described multitester probe card and negative test pencil are selectively connected with the end be not connected in parallel of any two switches in described first matrix switch or in the second matrix switch respectively.
In a preferred embodiment of the present invention, described first matrix switch and the second matrix switch all adopt 1130 boards of NI, and this board comprises 0 ~ 255 way switch.
256 switches are divided into two groups, and often organize 128 switches, as shown in Figure 1, the K switch b1 ~ Kb128 of the second matrix switch is first group, and K switch b129 ~ Kb256 is second group; One end of K switch b1 is connected with one end of K switch b129, and one end of K switch b2 is connected with one end of K switch b130, and one end of K switch b3 is connected with one end of K switch b131 ..., the like, one end of K switch b128 is connected with one end of K switch b256; The other end of K switch b1, the other end of K switch b2, K switch b3 the other end ..., K switch b128 the other end be connected in parallel; The other end of K switch b129, the other end of K switch b130, K switch b131 the other end ..., K switch b256 the other end be connected in parallel; The two ends of measuring resistance are connected with the end be not connected in parallel of any two switches in this second matrix switch respectively, and such as, the two ends of measuring resistance R are held with the Lb127 of K switch b127 respectively and the Lb128 of K switch b128 holds and is connected.
K switch a1 ~ the Ka128 of the first matrix switch is first group, and K switch a129 ~ Ka256 is second group; One end of K switch a1 is connected with one end of K switch a129, and one end of K switch a2 is connected with one end of K switch a130, and one end of K switch a3 is connected with one end of K switch a131 ..., the like, one end of K switch a128 is connected with one end of K switch a256; The other end of K switch a1, the other end of K switch a2, K switch a3 the other end ..., K switch a128 the other end be connected in parallel; The other end of K switch a129, the other end of K switch a130, K switch a131 the other end ..., K switch a256 the other end be connected in parallel; The positive test pencil of multitester probe card is connected with the end be not connected in parallel of any two switches in this first matrix switch respectively with negative test pencil, such as, in the present embodiment, the positive test pencil of multitester probe card is held with the La127 of K switch a127 respectively with negative test pencil and the La128 of K switch a128 holds and is connected.
The end be not connected in parallel of described first matrix switch first group of switch and the end be not connected in parallel of described second matrix switch first group of switch connect one to one, namely the La1 end of K switch a1 is held with the Lb1 of K switch b1 and is connected, the La2 end of K switch a2 is held with the Lb2 of K switch b2 and is connected, the La3 end of K switch a3 is held with the Lb3 of K switch b3 and is connected,, the La128 end of K switch a128 is held with the Lb128 of K switch b128 and is connected; The end be not connected in parallel of described first matrix switch second group of switch and the end be not connected in parallel of described second matrix switch second group of switch connect one to one, namely the La129 end of K switch a129 is held with the Lb129 of K switch b129 and is connected, the La130 end of K switch a130 is held with the Lb130 of K switch b130 and is connected, the La131 end of K switch a131 is held with the Lb131 of K switch b131 and is connected,, the La256 end of K switch a256 is held with the Lb256 of K switch b256 and is connected.
Preferably, connection between first matrix switch and the second matrix switch, connection between measuring resistance and the second matrix switch, and the interface between guided missile resistance to be measured and this resistance test macro all realizes by adapter, because adapter is universal electronic device, the use of adapter is general knowledge known in this field, does not launch to describe in detail at this to how utilizing adapter to realize connecting.
In the present embodiment, described first matrix switch is connected with computing machine by bus, and described second matrix switch is connected with described computing machine by bus, and described multitester probe cartoon is crossed bus and is connected with described computing machine.
The guided missile robotization resistance test macro course of work of the present embodiment is as follows:
(1) this resistance test macro self-inspection: adopt measuring resistance to carry out self-inspection, the two ends of tentative standard resistance are held with the Lb127 of the second matrix switch K switch b127 respectively and the Lb128 of K switch b128 holds and is connected, computing machine is by software program gauge tap Kb1, Kb127, Kb256, Kb130 closes, such measuring resistance and multimeter form test loop by the second matrix switch, computing machine drives the resistance of multimeter to measuring resistance to take multiple measurements by software program, average, because the resistance of measuring resistance is known, whether the serviceability that can be detected this resistance test macro by self-inspection is normal, measuring resistance can be multiple.
(2) measuring missile resistance: make passage for the K switch a1 of the first matrix switch, Ka2, the two ends of guided missile resistance to be measured are held with the La1 of K switch a1 respectively, the La2 of Ka2 holds and is connected, computing machine is closed by software program gauge tap Ka1, Ka127, Ka256, Ka130, guided missile resistance to be measured and multimeter form test loop by the first matrix switch, computing machine drives multimeter to take multiple measurements guided missile resistance to be measured by software program, averages.
During measuring missile resistance, the selection of passage can be arbitrary, such as, can be Ka1 and Ka2, Ka1 and Ka3 or Ka2 and Ka10 etc., greatly strengthen the dirigibility of this resistance test macro.The parameter of instructs computer action is kept in the database of computing machine, for different measurement occasions, without the need to modifying to the hardware device of this resistance test macro, only needs the parameter in Update Table storehouse.
Described multitester probe card completes the measurement to current channel signal, and signal data is sent to computing machine, the initialization of the guided missile resistance testing software realization matrix switch board of computing machine, data processing and storage etc., the interface of resistance test can be shown with display (as computer screen), described guided missile resistance testing system software is one and both can independently uses, and can be embedded into again the system of other test procedures.
Guided missile robotization resistance test macro of the present invention achieves the robotization of guided missile resistance test, reduces the error of Traditional Man test, drastically increases testing efficiency, and shorten the test duration of guided missile resistance and loaded down with trivial details degree.
Claims (6)
1. guided missile robotization resistance test macro, is characterized in that, comprises the first matrix switch, the second matrix switch, multitester probe card, computing machine and measuring resistance;
Described first matrix switch, the second matrix switch are all connected with described computing machine with multitester probe card;
Described measuring resistance is connected with described second matrix switch, and guided missile resistance to be measured is connected with described first matrix switch;
Described multitester probe card is selectively connected with described first matrix switch or the second matrix switch;
During self-inspection, described measuring resistance and multitester probe cartoon are crossed the second matrix switch and are formed test loop, and when resistance is measured, described guided missile resistance to be measured and multitester probe cartoon are crossed the first matrix switch and formed test loop.
2. the guided missile robotization resistance test macro as described in right 1, it is characterized in that, the switch of described first matrix switch is divided into two groups, one end of one end of first group of switch and second group of switch connects one to one, the other end of first group of all switch is connected in parallel, and the other end of second group of all switch is connected in parallel; The switch of described second matrix switch board is divided into two groups, and one end of one end of first group of switch and second group of switch connects one to one, and the other end of first group of all switch is connected in parallel, and the other end of second group of all switch is connected in parallel; The two ends of described measuring resistance are connected with the end be not connected in parallel of any two switches in described second matrix switch respectively; The positive test pencil of described multitester probe card and negative test pencil are selectively connected with the end be not connected in parallel of any two switches in described first matrix switch or in the second matrix switch respectively.
3. the guided missile robotization resistance test macro as described in right 3, it is characterized in that, the end be not connected in parallel of described first matrix switch first group of switch and the end be not connected in parallel of described second matrix switch first group of switch connect one to one, the end be not connected in parallel of described first matrix switch second group of switch and the end be not connected in parallel of described second matrix switch second group of switch connect one to one, and the positive test pencil of described multitester probe card and negative test pencil are connected with the end be not connected in parallel of any two switches in described first matrix switch respectively.
4. the guided missile robotization resistance test macro as described in right 2 or 3, is characterized in that, the two ends of described measuring resistance are connected with the end be not connected in parallel organizing any two switches in switch with described second matrix switch respectively.
5. the guided missile robotization resistance test macro as described in right 4, it is characterized in that, described measuring resistance is two or more.
6. the guided missile robotization resistance test macro as described in right 2 or 3, is characterized in that, the positive test pencil of described multitester probe card and negative test pencil are connected with the end be not connected in parallel organizing any two switches in switch with described first matrix switch respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310502712.9A CN104569594A (en) | 2013-10-23 | 2013-10-23 | Automatic missile resistance testing system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310502712.9A CN104569594A (en) | 2013-10-23 | 2013-10-23 | Automatic missile resistance testing system |
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| CN104569594A true CN104569594A (en) | 2015-04-29 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105277081A (en) * | 2015-11-13 | 2016-01-27 | 北京电子工程总体研究所 | I/O testing monitoring device and method for automatic missile testing |
| CN105425044A (en) * | 2015-12-01 | 2016-03-23 | 中国科学院西安光学精密机械研究所 | Automatic matrix impedance tester and testing method |
| CN106370962A (en) * | 2016-08-18 | 2017-02-01 | 上海机电工程研究所 | Cased bomb initiating explosive device's conduction test and its test method |
| CN110146750A (en) * | 2019-06-10 | 2019-08-20 | 西安现代控制技术研究所 | Play the static electrical detecting tool of arrow |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105277081A (en) * | 2015-11-13 | 2016-01-27 | 北京电子工程总体研究所 | I/O testing monitoring device and method for automatic missile testing |
| CN105425044A (en) * | 2015-12-01 | 2016-03-23 | 中国科学院西安光学精密机械研究所 | Automatic matrix impedance tester and testing method |
| CN106370962A (en) * | 2016-08-18 | 2017-02-01 | 上海机电工程研究所 | Cased bomb initiating explosive device's conduction test and its test method |
| CN106370962B (en) * | 2016-08-18 | 2019-06-04 | 上海机电工程研究所 | Case bullet priming system continuity test equipment and its test method |
| CN110146750A (en) * | 2019-06-10 | 2019-08-20 | 西安现代控制技术研究所 | Play the static electrical detecting tool of arrow |
| CN110146750B (en) * | 2019-06-10 | 2021-07-02 | 西安现代控制技术研究所 | Static electric detection tool for rocket |
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