CN109900962B - Keyboard matrix impedance testing device - Google Patents
Keyboard matrix impedance testing device Download PDFInfo
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- CN109900962B CN109900962B CN201711293131.3A CN201711293131A CN109900962B CN 109900962 B CN109900962 B CN 109900962B CN 201711293131 A CN201711293131 A CN 201711293131A CN 109900962 B CN109900962 B CN 109900962B
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Abstract
The invention discloses a keyboard matrix impedance testing device, comprising: the connector for testing is provided with an interface for inserting a carbon ribbon of a keyboard at one end, and a plurality of first pin holes which are sequentially arranged at the other end, wherein each first pin hole is correspondingly connected with a carbon ribbon pin of the carbon ribbon one by one, and the plurality of first pin holes are divided into a first area corresponding to an X axis of a keyboard matrix and a second area corresponding to a Y axis of the keyboard matrix; one end of the test adapter plate is connected with each first pin hole of the test connector in the second area, the other end of the test adapter plate is provided with a plurality of second pin holes which are sequentially arranged, and each second pin hole is correspondingly connected with the first pin hole of the second area one by one; and the micro-ohm meter is provided with two probes, and each probe is respectively inserted into the first pin hole and the second pin hole. Therefore, the insertion is more convenient, the operation is simple, the insertion is accurate, and the contact is good; the operator can conveniently and correctly select the corresponding first pin hole and the second pin hole.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to a testing device, in particular to a keyboard matrix impedance testing device.
[ background of the invention ]
When the keyboard is accepted by a part sample, a micro-ohm meter is used for measuring the contact resistance of each keycap (keycap) in the matrix, so that whether the contact condition is good or not and whether the function is normal or not are known. The contact impedance reflects whether the trigger point where each key cap of the keyboard is located is in good contact in the loop or not and the loop is smooth, so that the conditions of poor function, partial key effectiveness and the like cannot be caused, and the later use reliability deviation cannot be caused. The measurement of the keyboard impedance is mainly in the detection of a contact loop after the single body is started or the contact loop is subjected to high temperature, low temperature, humidity, rain, dust and vibration falling.
The impedance specification of a typical keyboard matrix is below 250 milli-ohms for normal keys and below 300 milli-ohms for functional keys before and after environmental and reliability testing experiments.
Referring to fig. 1, fig. 1 is a schematic diagram illustrating a keyboard matrix impedance testing apparatus in the prior art. As shown in the figure, the keyboard 100 includes a plurality of key caps 101, the plurality of key caps 101 correspond to a keyboard matrix, each key cap 101 has a two-dimensional coordinate, an output of each key cap 101 of the keyboard 100 is connected to the outside through a carbon ribbon 102, and the carbon ribbon 102 has carbon ribbon pins 103 corresponding to the two-dimensional coordinates, for example, the carbon ribbon pins 103 include 16 carbon ribbon pins 103 with an X abscissa and 8 carbon ribbon pins 103 with a Y ordinate. In the prior art, when a certain key cap 101 is tested, a probe 104 of a micro-ohm meter is used for contacting two carbon ribbon pins 103 of the key cap 101 corresponding to two-dimensional coordinates, the key cap 101 is pressed, the test is carried out, a numerical value is obtained through the micro-ohm meter, and the numerical value is compared with a test standard to determine whether the test is passed or not.
However, when the above method is used for testing, because the carbon ribbon pins 103 are usually dense and numb and have no numerical value marks, two carbon ribbon pins 103 corresponding to the coordinates of the keycap 101 cannot be found quickly during measurement, and the operation is troublesome; and because the ribbon pins 103 are very dense and have very small pitch (about 0.5 mm), the test probes 104 used in the micro-ohm meter are not easily in good contact with the ribbon pins 103, often requiring multiple click attempts.
In view of the above, it is desirable to provide a keyboard matrix impedance testing apparatus to solve the above problems.
[ summary of the invention ]
Therefore, an object of the present invention is to provide a keyboard matrix impedance testing apparatus, which solves the problems of troublesome operation and incapability of achieving the testing purpose quickly during testing.
In order to achieve the above object, the keyboard matrix impedance testing apparatus of the present invention comprises:
the connector for testing is provided with an interface for inserting a carbon ribbon of a keyboard at one end, and a plurality of first pin holes which are sequentially arranged at the other end, wherein each first pin hole is correspondingly connected with a carbon ribbon pin of the carbon ribbon one by one, and the plurality of first pin holes are divided into a first area corresponding to an X axis of a keyboard matrix and a second area corresponding to a Y axis of the keyboard matrix;
one end of the test adapter plate is connected with each first pin hole of the test connector in the second area, the other end of the test adapter plate is provided with a plurality of second pin holes which are sequentially arranged, and each second pin hole is correspondingly connected with the first pin hole of the second area one by one;
and the micro-ohm meter is provided with two probes, and each probe is respectively inserted into the first pin hole and the second pin hole.
Optionally, each first pin hole in the first area has a coordinate mark.
Optionally, each first pin hole on the second area has a coordinate mark.
Optionally, the first pin hole is a copper foil hole.
Optionally, the second pin hole is a copper foil hole.
Optionally, the second pin hole has a coordinate mark.
Optionally, the test connector and the test adapter plate are vertically arranged.
Optionally, the test connector and the test adapter plate are placed side by side.
Optionally, the number of the first pin holes of the first area is 16, and the number of the first pin holes of the second area is 8.
Optionally, the first pin hole and the second pin hole both have a hole diameter larger than 1 mm.
Compared with the prior art, the keyboard matrix impedance testing device disclosed by the invention has the advantages that during testing, the probes of the ohmmeter are inserted into the corresponding first pin holes and the second pin holes only by contrasting the coordinates of the keyboard matrix, and a certain keycap of the keyboard is pressed to obtain the contact impedance of the keycap so as to judge whether the test is passed or not. Because the probe is inserted into the first pin hole and the second pin hole, the insertion is more convenient, the operation is simple, the insertion is accurate, and the contact is good; the identifiers corresponding to the two-dimensional coordinates of the keyboard matrix are respectively observed on the connector for testing and the adapter plate for testing, so that an operator can conveniently and correctly select the corresponding first pin hole and the corresponding second pin hole.
[ description of the drawings ]
Fig. 1 is a schematic diagram illustrating a keyboard matrix impedance testing apparatus in the prior art.
FIG. 2 is a schematic structural diagram of a keyboard matrix impedance testing apparatus according to a first embodiment of the invention.
FIG. 3 is an exploded view of the keyboard matrix impedance testing apparatus according to the first embodiment of the present invention.
FIG. 4 is a schematic structural diagram of a keyboard matrix impedance testing apparatus according to a second embodiment of the present invention.
[ detailed description ] embodiments
Referring to fig. 2, fig. 3 and fig. 3 in combination, fig. 2 is a schematic structural diagram of a keyboard matrix impedance testing device according to a first embodiment of the invention, and fig. 3 is a schematic exploded structural diagram of the keyboard matrix impedance testing device according to the first embodiment of the invention.
In order to achieve the above object, the keyboard matrix impedance testing apparatus of the present invention comprises:
the connector 200 for testing, one end of which has an interface 203 for inserting the carbon ribbon 202 of the keyboard 201, the other end of which has a plurality of first pin holes 204 arranged in sequence, each of the first pin holes 204 is connected with the carbon ribbon pins 205 of the carbon ribbon 202 in a one-to-one correspondence manner, and the plurality of first pin holes 204 are divided into a first area 206 corresponding to the X axis of the keyboard matrix and a second area 207 corresponding to the Y axis of the keyboard matrix;
a test interposer 208, one end of which is connected to each of the first pin holes 204 of the second region 207 of the test connector 200, and the other end of which has a plurality of second pin holes 209 arranged in sequence, wherein each of the second pin holes 209 is connected to the first pin hole 204 of the second region 207 in a one-to-one correspondence;
the micro-ohm meter 210 has two probes 211, and each probe 211 is inserted into the first pin hole 204 and the second pin hole 209.
In the first embodiment, the test connector 200 and the test interposer 208 are vertically disposed, so that an operator can conveniently observe and operate the test connector according to coordinate habits.
Each of the first pin holes 204 in the first area 206 may have a coordinate mark, each of the first pin holes 204 in the second area 207 may have a coordinate mark, and the second pin holes 209 may have a coordinate mark.
The first pin holes 204 may be copper foil holes, and the second pin holes 209 may be copper foil holes; the copper foil has a good conductive effect.
The first pin hole 204 and the second pin hole 209 have a diameter larger than 1 mm, so that an operator can insert the probe 211 conveniently.
The number of the first pin holes 204 of the first region 206 may be 16, and the number of the first pin holes 204 of the second region 207 may be 8; the ordering corresponding to the X axis and the Y axis is 16 and 8 respectively. Of course, the above numbers are only examples, and other numbers may be used, depending on the actual situation of the keyboard matrix.
Compared with the prior art, in the keyboard matrix impedance testing device of the invention, during testing, only by comparing the coordinates of the keyboard matrix, the probe 211 of the ohmmeter 210 is inserted into the corresponding first pin hole 204 and the second pin hole 209, and a certain key cap 212 of the keyboard 201 is pressed to obtain the contact impedance of the key cap 212, so as to determine whether the test is passed. The probe 211 is inserted into the first pin hole 204 and the second pin hole 209, so that the insertion is more convenient, the operation is simple, the insertion is accurate, and the contact is good; the identifiers corresponding to the two-dimensional coordinates of the keyboard matrix are respectively observed on the test connector 200 and the test interposer 208, so that an operator can conveniently and correctly select the corresponding first pin hole 204 and the corresponding second pin hole 209.
Referring to fig. 4, fig. 4 is a schematic structural diagram illustrating a keyboard matrix impedance testing apparatus according to a second embodiment of the present invention.
In the second embodiment, the test connector 200 and the test interposer 208 are disposed side by side, so that the test interposer 208 and the test connector 200 can be conveniently connected to each other.
It should be noted that the present invention is not limited to the above embodiments, and any simple modification, equivalent change and modification made to the above embodiments by those skilled in the art based on the technical solution of the present invention fall within the protection scope of the present invention.
Claims (10)
1. A keyboard matrix impedance testing device, comprising:
the connector for testing is provided with an interface for inserting a carbon ribbon of a keyboard at one end, and a plurality of first pin holes which are sequentially arranged at the other end, wherein each first pin hole is correspondingly connected with a carbon ribbon pin of the carbon ribbon one by one, and the plurality of first pin holes are divided into a first area corresponding to an X axis of a keyboard matrix and a second area corresponding to a Y axis of the keyboard matrix;
one end of the test adapter plate is connected with each first pin hole of the test connector in the second area, the other end of the test adapter plate is provided with a plurality of second pin holes which are sequentially arranged, and each second pin hole is correspondingly connected with the first pin hole of the second area one by one;
and the micro-ohm meter is provided with two probes, and each probe is respectively inserted into the first pin hole and the second pin hole corresponding to the two-dimensional coordinate of the keycap to be measured.
2. The keyboard matrix impedance testing device of claim 1, wherein each of the first pin holes in the first area has a coordinate mark.
3. The keyboard matrix impedance testing device of claim 1, wherein each of the first pin holes on the second area has a coordinate mark.
4. The keyboard matrix impedance testing device of claim 1, wherein the first pin holes are copper foil holes.
5. The keyboard matrix impedance testing device of claim 1, wherein the second pin holes are copper foil holes.
6. The keyboard matrix impedance testing device of claim 1, wherein the second pin hole has a coordinate designation.
7. The keyboard matrix impedance test apparatus of claim 1, wherein the test connector is positioned perpendicular to the test interposer.
8. The keyboard matrix impedance testing device of claim 1, wherein the test connector is positioned side-by-side with the test interposer.
9. The keyboard matrix impedance testing device of claim 1, wherein the number of the first pin holes of the first area is 16, and the number of the first pin holes of the second area is 8.
10. The keyboard matrix impedance testing device of claim 1, wherein the first pin hole and the second pin hole both have an aperture diameter greater than 1 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711293131.3A CN109900962B (en) | 2017-12-08 | 2017-12-08 | Keyboard matrix impedance testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711293131.3A CN109900962B (en) | 2017-12-08 | 2017-12-08 | Keyboard matrix impedance testing device |
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| Publication Number | Publication Date |
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| CN109900962A CN109900962A (en) | 2019-06-18 |
| CN109900962B true CN109900962B (en) | 2021-08-10 |
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| CN201711293131.3A Active CN109900962B (en) | 2017-12-08 | 2017-12-08 | Keyboard matrix impedance testing device |
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| CN113532757A (en) * | 2020-04-17 | 2021-10-22 | 神讯电脑(昆山)有限公司 | Keyboard waterproof function test system and method thereof |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0847342B1 (en) * | 1995-09-01 | 1999-03-24 | Robert Bosch Gmbh | Device for the contactless transfer of signals between two vehicle parts mounted to rotate with respect to each other |
| CN102412486A (en) * | 2010-09-23 | 2012-04-11 | 鸿富锦精密工业（深圳）有限公司 | Adapter and transferring method of the same |
| CN203630224U (en) * | 2013-09-12 | 2014-06-04 | 陕西航天导航设备有限公司 | Conductive device dynamic contact resistance test apparatus |
| CN203950531U (en) * | 2014-07-18 | 2014-11-19 | 昆山龙腾光电有限公司 | Card extender |
| CN205301433U (en) * | 2015-12-01 | 2016-06-08 | 中国科学院西安光学精密机械研究所 | Matrix automatic impedance tester |
| CN105785079A (en) * | 2016-03-01 | 2016-07-20 | 廖小健 | Channel rapid conversion device for signals to be detected based on PCI |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7098670B2 (en) * | 2004-03-02 | 2006-08-29 | Cole J Bradford | Method and system of characterizing a device under test |
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- 2017-12-08 CN CN201711293131.3A patent/CN109900962B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0847342B1 (en) * | 1995-09-01 | 1999-03-24 | Robert Bosch Gmbh | Device for the contactless transfer of signals between two vehicle parts mounted to rotate with respect to each other |
| CN102412486A (en) * | 2010-09-23 | 2012-04-11 | 鸿富锦精密工业（深圳）有限公司 | Adapter and transferring method of the same |
| CN203630224U (en) * | 2013-09-12 | 2014-06-04 | 陕西航天导航设备有限公司 | Conductive device dynamic contact resistance test apparatus |
| CN203950531U (en) * | 2014-07-18 | 2014-11-19 | 昆山龙腾光电有限公司 | Card extender |
| CN205301433U (en) * | 2015-12-01 | 2016-06-08 | 中国科学院西安光学精密机械研究所 | Matrix automatic impedance tester |
| CN105785079A (en) * | 2016-03-01 | 2016-07-20 | 廖小健 | Channel rapid conversion device for signals to be detected based on PCI |
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