CN214703944U - Voltage sampling detection device - Google Patents
Voltage sampling detection device Download PDFInfo
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- CN214703944U CN214703944U CN202023002381.7U CN202023002381U CN214703944U CN 214703944 U CN214703944 U CN 214703944U CN 202023002381 U CN202023002381 U CN 202023002381U CN 214703944 U CN214703944 U CN 214703944U
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Abstract
The utility model discloses a voltage sampling detection device, include: the test system comprises a motherboard, a control unit, a motherboard connector, a test interface group and an error reporting assembly. The control unit is arranged on the motherboard; the motherboard connector is arranged on the motherboard and is electrically connected with the control unit; the number of the test interface groups is at least one, and at least one test interface group is electrically connected with the motherboard connector; the error reporting component is electrically connected with the control unit. The utility model discloses a voltage sampling detection device will await measuring the cable and insert corresponding test interface group, and the control unit sends test signal, and test signal is through the cable that awaits measuring, and the cable that then awaits measuring is intact through the cable that awaits measuring and gets back to the control unit when test signal, otherwise, reports wrong subassembly and sends and reports wrong signal, and the suggestion cable damages. Through with the cable that awaits measuring of difference, insert corresponding test interface group, realize testing the cable of multiple model to through inserting the cable that awaits measuring test interface group and realize the test, efficiency is higher.
Description
Technical Field
The utility model relates to a cable detects technical field, in particular to voltage sampling detection device.
Background
With the development of technology, various complex integrated devices appear in succession, and the complex integrated devices are connected by cables to work together. Therefore, the quality of the cable is very important. The cable is used as a medium for signal transmission and power transmission, and the quality of the cable determines whether the whole equipment can work normally. In the actual detection, only a few special cables are detected in detail, and the rest cables cannot be checked by a specific machine due to the various types of connectors on the cables and the various specifications of the cables, and only manual sampling inspection can be adopted, so that the inspection is insufficient and the efficiency is low.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides a voltage sampling detection device can detect the cable of multiple model to efficiency is higher.
According to the utility model discloses voltage sampling detection device, include: a motherboard; a control unit mounted on the motherboard; the motherboard connector is mounted on the motherboard and is electrically connected with the control unit; at least one test interface group, wherein the at least one test interface group is electrically connected with the motherboard connector; and the error reporting assembly is electrically connected with the control unit.
According to the utility model discloses voltage sampling detection device has following beneficial effect at least: the cable to be tested is connected into the corresponding test interface group, the control unit sends out a test signal, the test signal passes through the cable to be tested, when the test signal passes through the cable to be tested and returns to the control unit, the cable to be tested is intact, otherwise, the error reporting assembly sends out an error reporting signal to prompt that the cable is damaged. Through with the cable that awaits measuring of difference, insert corresponding test interface group, realize testing the cable of multiple model to through inserting the cable that awaits measuring test interface group and realize the test, efficiency is higher.
According to the utility model discloses a some embodiments, test interface group includes first test interface, second test interface, daughterboard connector and daughterboard, first test interface with daughterboard connector electric connection, second test interface with daughterboard connector electric connection, daughterboard connector with daughterboard connector electric connection, first test interface second test interface with daughterboard connector all installs on the daughterboard, portable.
According to some embodiments of the utility model, the test interface group includes first test interface, second test interface, first connector and second connector, first test interface with first connector electric connection, first connector with motherboard connector electric connection, second test interface with second connector electric connection, the second connector with motherboard connector connects, the change of the test interface group of being convenient for.
According to the utility model discloses a some embodiments still include IO and extend the unit, IO extends the unit and installs on the motherboard, IO extend the unit with the control unit electric connection, IO extend the unit still with motherboard connector electric connection is convenient for practice thrift the port resource of the control unit to and be convenient for test the more cable of wire.
According to the utility model discloses a some embodiments still include analog switch, analog switch installs on the motherboard, analog switch with motherboard connector electric connection, analog switch still with the control unit electric connection, be convenient for practice thrift the control unit's port resource to and be convenient for test the more cable of wire.
According to some embodiments of the utility model, still include power module, power module installs on the motherboard, power module with the control unit electric connection to convenient to use.
According to some embodiments of the utility model, still include the memory, the memory is installed on the motherboard, the memory with the control unit electric connection to in save test result.
According to some embodiments of the utility model, still include input module, input module with the control unit electric connection to in the selection test item.
According to some embodiments of the utility model, report wrong subassembly includes the LCD display module, the LCD display module with the control unit electric connection to report the mistake.
According to some embodiments of the utility model, the voltage sampling detection device still includes input module and shell, input module with the control unit electric connection, the motherboard is installed the inside of shell, input module with the LCD display module is installed the surface of shell to in protection.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic circuit block diagram of a voltage sampling detection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic block diagram of a specific circuit of the voltage sampling detection apparatus shown in FIG. 1;
fig. 3 is another specific circuit schematic block diagram of the voltage sampling detection apparatus shown in fig. 1.
The reference numbers are as follows:
the system comprises a control unit 110, a motherboard connector 120, an IO expansion unit 130, an analog switch 140, a power supply module 150, a memory 160, an input module 170 and a debugging interface 180;
the test interface group 200, the first test interface 210, the second test interface 220, the daughter board connector 230, the first connector 240, the second connector 250, the error reporting component 300, the LCD display module 310, and the sound generating module 320.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.
In the description of the present invention, a plurality of means are one or more, a plurality of means are two or more, and the terms greater than, less than, exceeding, etc. are understood as not including the present number, and the terms greater than, less than, within, etc. are understood as including the present number. If there is a description of the first, second, third and fourth only for the purpose of distinguishing between technical features, this is not to be understood as indicating or implying a relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.
Referring to fig. 1, a voltage sampling detection apparatus includes: a motherboard, a control unit 110, a motherboard connector 120, a test interface set 200, and an error reporting assembly 300. The control unit 110 is mounted on the motherboard; the motherboard connector 120 is mounted on the motherboard, and the motherboard connector 120 is electrically connected with the control unit 110; the number of the test interface sets 200 is at least one, and at least one test interface set 200 is electrically connected with the motherboard connector 120; the error reporting component 300 is electrically connected to the control unit 110.
Specifically, the first output end of the control unit 110 is electrically connected to the first end of the motherboard connector 120, the second end of the motherboard connector 120 is electrically connected to the first input end of the control unit 110, the first end of the test interface set 200 is electrically connected to the third end of the motherboard connector 120, the second end of the test interface set 200 is electrically connected to the fourth end of the motherboard connector 120, and the input end of the error reporting component 300 is electrically connected to the second output end of the control unit 110.
The cable to be tested is connected to the test interface set 200, the control unit 110 sends out a test signal, the test signal enters the cable to be tested through the motherboard connector 120, when the test signal passes through the cable to be tested and returns to the control unit 110, the cable to be tested is indicated to be intact, when the test signal cannot return to the control unit 110, the cable to be tested is indicated to be damaged, and the control unit 110 controls the error reporting component 300 to send out an error reporting signal.
The number of the test interface groups 200 is at least one, and different test interface groups 200 can test different cables to be tested. For example, the plurality of test interface groups 200 may be fixedly mounted on the motherboard, and simultaneously test a plurality of cables to be tested with different or the same models, or respectively test a plurality of cables to be tested with different or the same models; or, the plurality of test interface groups 200 may be detachably mounted on the motherboard, and the corresponding test interface groups 200 are mounted according to different types of cables to be tested, so as to test the cables to be tested with different types. The test interface group 200 can test cables of various types and improve the test efficiency.
It should be noted that the first end of the motherboard connector 120 is electrically connected to the third end corresponding to itself, and the second end of the motherboard connector 120 is electrically connected to the fourth end corresponding to itself.
It should be noted that the control unit 110 may select a 51-chip microcomputer, an ARM processor, a DSP processor, or an FPGA.
Referring to fig. 2, in some embodiments of the present invention, the test interface set 200 includes a first test interface 210, a second test interface 220, a first connector 240 and a second connector 250, the first test interface 210 is electrically connected to the first connector 240, the first connector 240 is electrically connected to the motherboard connector 120, the second test interface 220 is electrically connected to the second connector 250, and the second connector 250 is connected to the motherboard connector 120.
Specifically, a first end of the first test interface 210 is electrically connected to a first end of the first connector 240, a second end of the first connector 240 is electrically connected to a third end of the motherboard connector 120, a first end of the second test interface 220 is electrically connected to a first end of the second connector 250, and a second end of the second connector 250 is electrically connected to a fourth end of the motherboard connector 120. When testing is required, the first end of the cable to be tested is connected to the second end of the first testing interface 210, the second end of the cable to be tested is connected to the second end of the second testing interface 220, and then the control unit 110 tests the cable to be tested.
It should be noted that the first test interface 210 is fixedly mounted on the first connector 240, the second test interface 220 is fixedly mounted on the second connector 250, and both the first connector 240 and the second connector 250 may be fixedly mounted on the motherboard or both may be detachably mounted on the motherboard. For example, the first connector 240 and the second connector 250 can be electrically connected to the motherboard connector 120 by plugging, specifically, the second end of the first connector 240 is inserted into the first end of the motherboard connector 120, and the second end of the second connector 250 is inserted into the second end of the motherboard connector 120.
When the first connector 240 and the second connector 250 are electrically connected to the motherboard connector 120 in a plugging manner, the portability of the test interface set 200 is increased, and a plurality of different test interface sets 200 are conveniently carried, so as to test cables of different types.
It should be noted that, the female board connector 120 may be a female pin, and the first connector 240 and the second connector 250 may be a pin; alternatively, the motherboard connector 120, the first connector 240, and the second connector 250 all use pins, and the motherboard connector 120 and the first connector 240 and the motherboard connector 120 and the second connector 250 are electrically connected by cables.
Referring to fig. 3, the test interface set 200 includes a first test interface 210, a second test interface 220, a daughter board connector 230, and a daughter board, wherein the first test interface 210 is electrically connected to the daughter board connector 230, the second test interface 220 is electrically connected to the daughter board connector 230, the daughter board connector 230 is electrically connected to the motherboard connector 120, and the first test interface 210, the second test interface 220, and the daughter board connector 230 are all mounted on the daughter board.
Specifically, the first end of the first test interface 210 is electrically connected to the first end of the daughter board connector 230, the first end of the second test interface 220 is electrically connected to the second end of the daughter board connector 230, the third end of the daughter board connector 230 is electrically connected to the third end of the motherboard connector 120, and the fourth end of the daughter board connector 230 is electrically connected to the fourth end of the motherboard connector 120.
The daughter board and the motherboard are connected by the connection between the motherboard connector 120 and the daughter board connector 230, that is, the daughter board is detachably mounted on the motherboard, for example, the daughter board connector 230 is electrically connected to the motherboard connector 120 by a plug-in connection manner, or the daughter board connector 230 is electrically connected to the motherboard connector 120 by a snap-in connection manner. And then, according to the difference of the model of the cable that awaits measuring, choose for use corresponding test interface group 200 to be connected with the motherboard through the connected mode of plug or the connected mode of buckle, realize testing the cable of different models. In addition, the test interface set 200 can be quickly replaced by a plug connection mode or a buckle connection mode, and the test efficiency is improved.
It should be noted that the first end of the daughter board connector 230 is electrically connected to the corresponding third end thereof, and the second end of the daughter board connector 230 is electrically connected to the corresponding fourth end thereof. In the plugging connection mode, the motherboard connector 120 can be selected as a female connector, and the daughter board connector 230 can be selected as a pin header; alternatively, the female board connector 120 and the male board connector 230 both use pins, and the female board connector 120 and the male board connector 230 are electrically connected by a flat cable. In the snap-fit connection, snap-fit connectors may be used for both the motherboard connector 120 and the daughter board connector 230.
It should be noted that, the daughter board connector 230, the first test interface 210, and the second test interface 220 mounted on the daughter board as a whole are more favorable for accessing cables to be tested with different interfaces at two ends, and compared with the first connector 240 and the second connector 250 of the above embodiment, the case of wrong connection can be reduced by using the daughter board connector 230 in this embodiment.
Referring to fig. 2, the voltage sampling detection apparatus further includes an IO extension unit 130, the IO extension unit 130 is mounted on the motherboard, the IO extension unit 130 is electrically connected to the control unit 110, and the IO extension unit 130 is further electrically connected to the motherboard connector 120. Specifically, an input end of the IO expansion unit 130 is electrically connected to a first output end of the control unit 110, and an output end of the IO expansion unit 130 is electrically connected to a first end of the motherboard connector 120. Through the IO expansion unit 130, fewer IO port resources of the control unit 110 can be expanded into more IO port resources, so as to detect cables with more wires.
It should be noted that the IO extension unit 130 may select an IO extension chip such as a 74HC595 chip or a CH423 chip.
Referring to fig. 2, the voltage sampling and detecting apparatus further includes an analog switch 140, the analog switch 140 is mounted on the motherboard, the analog switch 140 is electrically connected to the motherboard connector 120, and the analog switch 140 is further electrically connected to the control unit 110. Specifically, an input terminal of the analog switch 140 is electrically connected to the second terminal of the motherboard connector 120, and an output terminal of the analog switch 140 is electrically connected to the first input terminal of the control unit 110. Through analog switch 140, can gather the digital signal of cable and send for control unit 110 to the control unit 110 handles, simultaneously, can also detect more cables of wire, according to the different routes of control unit 110 gating analog switch 140, realize detecting the different wires of cable, and then realize detecting more cables of wire, realize detecting more kinds of cable promptly.
It should be noted that the analog switch 140 may be a single 8-way analog switch, a multi-way analog switch such as a 16-way analog switch, and in this embodiment, 2 single 8-way analog switches are used.
Referring to fig. 2, the voltage sampling and detecting device further includes a power supply module 150, the power supply module 150 is mounted on the motherboard, and the power supply module 150 is electrically connected to the control unit 110. Specifically, the power supply terminal of the power supply module 150 is electrically connected to the power supply terminal of the control unit 110. The power supply module 150 can be a USB interface, and is electrically connected to the mobile power supply through the USB interface to supply power, so as to reduce the weight of the voltage sampling detection device and facilitate carrying; alternatively, the power module 150 may be powered by a battery, and the power supply may be supplemented by replacing the battery, so as to detect the cable anytime and anywhere.
Referring to fig. 2, the voltage sampling detecting device further includes a memory 160, the memory 160 is mounted on the motherboard, and the memory 160 is electrically connected to the control unit 110. Specifically, the input terminal of the memory 160 is electrically connected to the third output terminal of the control unit 110. The memory 160 is configured to store test data for easy test report generation on the PC side. The memory 160 may be a mechanical hard disk, a solid state hard disk, a removable hard disk, an optical disk, or a flash memory.
Referring to fig. 2, the voltage sampling and detecting apparatus further includes an input module 170, and the input module 170 is electrically connected to the control unit 110. Specifically, the output end of the input module 170 is electrically connected to the second input end of the control unit 110. The input module 170 is used for selecting a test item of the cable to be tested and controlling the test to be turned on and off. For example, test items for testing only one of the wires of the cable, or test items for testing the same cable under test multiple times. The input module 170 may be a key module or a touch screen module, so as to implement a function of selecting a test item.
Referring to fig. 2, the error reporting assembly 300 includes an LCD display module 310, and the LCD display module 310 is electrically connected to the control unit 110. Specifically, the input terminal of the LCD display module 310 is electrically connected to the second output terminal of the control unit 110. The LCD display module 310 is used for displaying the test information of the cable to be tested, so that an operator can know the quality of the cable to be tested.
It should be noted that the LCD display module 310 may be replaced with a sound module 320, and the information about the quality of the cable may be provided to the operator through a sound signal. Or, referring to fig. 3, the error reporting component 300 may include an LCD display module 310 and a sound generating module 320, an input end of the LCD display module 310 is electrically connected to the second output end of the control unit 110, an input end of the sound generating module 320 is electrically connected to an output end of the LCD display module 310, the LCD display module 310 provides data information of the cable to be tested, and the sound generating module 320 generates sound to report an error, so that an operator can know the quality of the cable to be tested in time.
It should be noted that the sound module 320 may adopt a speaker or a buzzer.
It should be noted that, referring to fig. 3, the voltage sampling detection apparatus further includes a debug interface 180, the debug interface 180 is mounted on the motherboard, and the debug interface 180 is electrically connected to the third input terminal of the control unit 110. Through the debug interface 180, the control unit 110 can be debugged to exclude errors of the control unit 110. The debug interface 180 may be an SWD interface or a JTAG interface.
It should be noted that the voltage sampling detection device further includes a housing, and the motherboard is mounted inside the housing, so as to protect the devices on the motherboard; the input module 170 and the LCD display module 310 are mounted on a surface of the housing for convenient use by an operator.
It should be noted that the motherboard may be one circuit board or a plurality of circuit boards. When the motherboard is a circuit board, the control unit 110, the motherboard connector 120, the IO expansion unit 130, the analog switch 140, the power supply module 150, the memory 160, and the debug interface 180 may all be mounted on the same circuit board; when the motherboard is a plurality of circuit boards, the control unit 110, the motherboard connector 120, the IO expansion unit 130, the analog switch 140, the power supply module 150, the memory 160, and the debug interface 180 may be respectively mounted on different circuit boards, so as to adjust the placement positions of the devices according to actual requirements.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.
Claims (10)
1. Voltage sampling detection device, its characterized in that includes:
a motherboard;
a control unit mounted on the motherboard;
the motherboard connector is mounted on the motherboard and is electrically connected with the control unit;
at least one test interface group, wherein the at least one test interface group is electrically connected with the motherboard connector;
and the error reporting assembly is electrically connected with the control unit.
2. The voltage sampling test device of claim 1, wherein the test interface set comprises a first test interface, a second test interface, a daughterboard connector, and a daughterboard, the first test interface being electrically connected to the daughterboard connector, the second test interface being electrically connected to the daughterboard connector, the daughterboard connector being electrically connected to the daughterboard connector, the first test interface, the second test interface, and the daughterboard connector all being mounted on the daughterboard.
3. The voltage sampling test device of claim 1, wherein the test interface set comprises a first test interface, a second test interface, a first connector and a second connector, the first test interface is electrically connected to the first connector, the first connector is electrically connected to the motherboard connector, the second test interface is electrically connected to the second connector, and the second connector is connected to the motherboard connector.
4. The voltage sampling detection device according to claim 1, further comprising an IO extension unit, wherein the IO extension unit is mounted on the motherboard, and is electrically connected to the control unit, and is also electrically connected to the motherboard connector.
5. The voltage sampling detection device of claim 1, further comprising an analog switch mounted on the motherboard, the analog switch being electrically connected to the motherboard connector, the analog switch being further electrically connected to the control unit.
6. The voltage sampling detection device of claim 1, further comprising a power supply module, wherein the power supply module is mounted on the motherboard, and the power supply module is electrically connected to the control unit.
7. The voltage sampling detection device of claim 1, further comprising a memory mounted on the motherboard, the memory being electrically connected to the control unit.
8. The voltage sampling detection device of any one of claims 1 to 7, further comprising an input module electrically connected to the control unit.
9. The voltage sampling detection device of any one of claims 1 to 7, wherein the error reporting component comprises an LCD display module, and the LCD display module is electrically connected with the control unit.
10. The voltage sampling detection device of claim 9, further comprising an input module and a housing, wherein the input module is electrically connected to the control unit, the motherboard is mounted inside the housing, and the input module and the LCD display module are mounted on a surface of the housing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023002381.7U CN214703944U (en) | 2020-12-14 | 2020-12-14 | Voltage sampling detection device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023002381.7U CN214703944U (en) | 2020-12-14 | 2020-12-14 | Voltage sampling detection device |
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| CN214703944U true CN214703944U (en) | 2021-11-12 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116908751A (en) * | 2023-09-13 | 2023-10-20 | 合肥安迅精密技术有限公司 | Test board for detecting peripheral interfaces of industrial system, detection system and method |
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2020
- 2020-12-14 CN CN202023002381.7U patent/CN214703944U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116908751A (en) * | 2023-09-13 | 2023-10-20 | 合肥安迅精密技术有限公司 | Test board for detecting peripheral interfaces of industrial system, detection system and method |
| CN116908751B (en) * | 2023-09-13 | 2024-04-19 | 合肥安迅精密技术有限公司 | Test board for detecting peripheral interfaces of industrial system, detection system and method |
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