CN109211953B - X射线探测器和控制x射线探测器的技术 - Google Patents

X射线探测器和控制x射线探测器的技术 Download PDF

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Publication number
CN109211953B
CN109211953B CN201810676716.1A CN201810676716A CN109211953B CN 109211953 B CN109211953 B CN 109211953B CN 201810676716 A CN201810676716 A CN 201810676716A CN 109211953 B CN109211953 B CN 109211953B
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ray detector
ray
detector
sample
modules
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Chinese (zh)
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CN109211953A (zh
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达米安·库哈尔奇克
马赛厄斯·梅耶
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Rigaku Corp
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Rigaku Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2907—Angle determination; Directional detectors; Telescopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201810676716.1A 2017-07-05 2018-06-27 X射线探测器和控制x射线探测器的技术 Active CN109211953B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP17179774.9 2017-07-05
EP17179774.9A EP3425377B1 (en) 2017-07-05 2017-07-05 X-ray detector and technique of controlling the x-ray detector

Publications (2)

Publication Number Publication Date
CN109211953A CN109211953A (zh) 2019-01-15
CN109211953B true CN109211953B (zh) 2023-10-17

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Country Status (5)

Country Link
US (1) US10684378B2 (https=)
EP (1) EP3425377B1 (https=)
JP (1) JP7129624B2 (https=)
CN (1) CN109211953B (https=)
PL (1) PL3425377T3 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3579664A1 (en) * 2018-06-08 2019-12-11 Excillum AB Method for controlling an x-ray source
US11375963B2 (en) 2019-04-10 2022-07-05 Argospect Technologies Inc. Medical imaging systems and methods of using the same
DE102019209188B4 (de) * 2019-06-25 2021-01-28 Bruker Axs Gmbh Messanordnung für Röntgenstrahlung mit verminderten Parallax-Effekten
CN113558648B (zh) * 2021-07-22 2025-03-11 湖北锐世数字医学影像科技有限公司 正电子发射计算机断层成像装置及方法
WO2025209135A1 (zh) * 2024-04-01 2025-10-09 深圳帧观德芯科技有限公司 一种x射线衍射仪

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014228474A (ja) * 2013-05-24 2014-12-08 株式会社島津製作所 Ｘ線分析装置
CN104335031A (zh) * 2012-05-22 2015-02-04 波音公司 可重新配置的检测器系统
CN105223216A (zh) * 2015-09-23 2016-01-06 北京科技大学 一种基于x射线衍射的材料微结构在线检测系统

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CA628280A (en) * 1961-10-03 Khol Frantisek X-ray type stress analyzer
JPH0868771A (ja) * 1994-08-29 1996-03-12 Nippon Steel Corp 放射線画像読取装置
JP3027361B2 (ja) 1998-07-17 2000-04-04 科学技術振興事業団 イメージングプレートｘ線回折装置
JP2001095789A (ja) * 1999-09-30 2001-04-10 Shimadzu Corp Ｘ線透視撮影装置
JP2002228758A (ja) 2001-01-31 2002-08-14 National Institute Of Advanced Industrial & Technology 高速ｘ線ｃｔ用多角形型半導体検出器とその製造方法
JP3931161B2 (ja) * 2003-08-05 2007-06-13 株式会社リガク Ｘ線構造解析における回折斑点の強度算出方法
US7190762B2 (en) * 2004-10-29 2007-03-13 Broker Axs, Inc Scanning line detector for two-dimensional x-ray diffractometer
DE102006037256B4 (de) * 2006-02-01 2017-03-30 Paul Scherer Institut Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System
US7796726B1 (en) * 2006-02-14 2010-09-14 University Of Maryland, Baltimore County Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation
DE102012208305B4 (de) * 2012-05-16 2022-10-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgendetektor und Röntgensystem
US20180017684A1 (en) * 2015-02-06 2018-01-18 Teledyne Dalsa, Inc. Articulated segmented x-ray detector system and method
US9835571B2 (en) * 2015-10-06 2017-12-05 Shimadzu Corporation X-ray analyzer

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104335031A (zh) * 2012-05-22 2015-02-04 波音公司 可重新配置的检测器系统
JP2014228474A (ja) * 2013-05-24 2014-12-08 株式会社島津製作所 Ｘ線分析装置
CN105223216A (zh) * 2015-09-23 2016-01-06 北京科技大学 一种基于x射线衍射的材料微结构在线检测系统

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
傅强.现代药物分离与分析技术.西安交通大学出版社,2011,第161-164页. *
毛卫民，杨平，陈冷.材料织构分析原理与检测技术.冶金工业出版社,2008,第21-22页. *

Also Published As

Publication number Publication date
US20190011579A1 (en) 2019-01-10
JP2019015725A (ja) 2019-01-31
US10684378B2 (en) 2020-06-16
CN109211953A (zh) 2019-01-15
EP3425377B1 (en) 2022-06-01
EP3425377A1 (en) 2019-01-09
JP7129624B2 (ja) 2022-09-02
PL3425377T3 (pl) 2022-09-19

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