CN109166786A - 一种柔性tft基板的镀膜工艺 - Google Patents

一种柔性tft基板的镀膜工艺 Download PDF

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CN109166786A
CN109166786A CN201810833954.9A CN201810833954A CN109166786A CN 109166786 A CN109166786 A CN 109166786A CN 201810833954 A CN201810833954 A CN 201810833954A CN 109166786 A CN109166786 A CN 109166786A
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base board
flexible base
coated
molybdenum layer
substrate
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高迪
万志龙
丁文涛
谭晓彬
李林
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Truly Semiconductors Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/02631Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1259Multistep manufacturing methods

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Thin Film Transistor (AREA)

Abstract

本发明公开了一种柔性TFT基板的镀膜工艺,包括如下步骤:S1.提供承载基板;S2.在所述承载基板形成柔性基板;S3.将柔性基板置于镀膜腔室中,在40℃下采用PVD镀膜的方式在所述柔性基板上镀制第一钼层,将柔性基板从镀膜腔室中取出,冷却至室温后再放入镀膜腔室中,在40‑60℃下在所述第一钼层上采用采用PVD镀膜的方式分别镀制铝层和第二钼层。本发明中降低采用PVD镀膜的镀制温度,同时将第一钼层、以及铝层和第二钼层分次镀制,采用这种镀膜工艺,不仅可以保证钼铝钼层与柔性基板的粘附力,而且有效避免了TFT制备过程中因工艺温度过高柔性基板发生的形变、翘曲等问题。

Description

一种柔性TFT基板的镀膜工艺
技术领域
本发明涉及显示技术领域,特别是涉及了一种柔性TFT基板的镀膜工艺。
背景技术
在显示技术领域,柔性显示器是基于柔性有机材料作为基板的显示器,其具有薄而轻、高对比度、快速响应、宽视角、高亮度、全彩色等优点,可以被弯曲、折叠、甚至作为可穿戴计算机的一部分,因此在显示效果好的便携产品和军事等特殊领域有非常广泛的应用,因此柔性显示技术已然成为下一代主流显示技术。
薄膜晶体管(Thin Film Transistor,简称TFT)是目前液晶显示装置(LiquidCrystal Display,简称LCD)和有源矩阵驱动式有机电致发光显示装置(Active MatrixOrganic Light-Emitting Diode,简称AMOLED)中的主要驱动元件,直接关系到高性能显示装置的发展方向。
一般将磁控溅射简称为PVD,基本原理是在于,先将溅镀靶材 (SputteringTarget)及基板设置在真空环境中,并且将靶材设于具有高电压的阴极侧,基板设于具有高电压的阳极侧,接着利用阴极与阳极间的辉光放电所形成的电浆,使靶材与基板之间所通入的溅镀气体产生出正离子,正离子受到阴极吸引而轰击靶材,使靶材的原子或分子被轰击出并沉积至基板表面,以达到使基板沉积出薄膜的目的。由于磁控溅射沉积的膜层均匀、致密、针孔少,纯度高,附着力强,可以 在低温、低损伤的条件下实现高速沉积各种材料薄膜,已经成为当今真空镀膜 中的一种成熟技术与工业化的生产方式。
现有技术在柔性TFT基板的制作中,通常在承载基板上涂布有机材料并固化,以制作出柔性基板,然后在柔性基板上通过磁控溅射的工艺镀制钼铝钼层。发明人在实践中发现,采用现有的镀膜工艺,柔性基板在高温工艺条件下会发生形变、翘曲等问题。
发明内容
为了弥补已有技术的缺陷,本发明提供一种柔性TFT基板的镀膜工艺。
本发明所要解决的技术问题通过以下技术方案予以实现:
一种柔性TFT基板的镀膜工艺,包括如下步骤:
S1.提供承载基板;
S2.在所述承载基板形成柔性基板;
S3.将柔性基板置于镀膜腔室中,在40℃下采用PVD镀膜的方式在所述柔性基板上镀制第一钼层,将柔性基板从镀膜腔室中取出,冷却至室温后再放入镀膜腔室中,在40-60℃下在所述第一钼层上采用采用PVD镀膜的方式分别镀制铝层和第二钼层。
现有技术中为了增强钼铝钼层与柔性基板的粘附力,提高钼铝钼层的致密性,往往在高温下采用采用PVD镀膜的方式在柔性基板上连续镀制第一钼层、铝层和第二钼层,但是发明人在实践中发现,采用这种镀膜工艺,柔性基板在高温下收缩会引起柔性基板的形变、翘曲等问题,若形变、翘曲过大则不能进行后续的曝光制程,产品的良率低。针对上述问题,发明人经过大量研究发现,将柔性基板置于镀膜腔室中,在40℃下采用采用PVD镀膜的方式在所述柔性基板上镀制第一钼层,将柔性基板从镀膜腔室中取出,冷却至室温后再放入镀膜腔室中,在40-60℃下在所述第一钼层上采用采用PVD镀膜的方式分别镀制铝层和第二钼层;本发明中降低采用PVD镀膜的镀制温度,同时将第一钼层、以及铝层和第二钼层分次镀制,采用这种镀膜工艺,不仅可以保证钼铝钼层与柔性基板的粘附力,而且有效避免了TFT制备过程中因工艺温度过高柔性基板发生的形变、翘曲等问题。
进一步地,所述承载基板为玻璃基板。
进一步地,步骤S2中,所述柔性基板通过有机粘结剂形成在所述承载基板上。
进一步地,步骤S2的具体操作为:(1)在所述承载基板上涂覆有机粘结剂;(2)在涂覆有粘结剂的承载基板上涂布有机材料并固化,以形成柔性基板。
进一步地,所述有机材料为PI、PET、PES、PEN、PC中的一种或多种。
本发明具有如下有益效果:
本发明中降低采用PVD镀膜的镀制温度,同时将第一钼层、以及铝层和第二钼层分次镀制,采用这种镀膜工艺,不仅可以保证钼铝钼层与柔性基板的粘附力,而且有效避免了TFT制备过程中因工艺温度过高柔性基板发生的形变、翘曲等问题。
具体实施方式
下面结合实施例对本发明进行详细的说明,实施例仅是本发明的优选实施方式,不是对本发明的限定。
一种柔性TFT基板的镀膜工艺,包括如下步骤:
S1.提供承载基板;
S2.在所述承载基板形成柔性基板;
S3.将柔性基板置于镀膜腔室中,在40℃下采用PVD镀膜的方式在所述柔性基板上镀制第一钼层,将柔性基板从镀膜腔室中取出,冷却至室温后再放入镀膜腔室中,在40-60℃下在所述第一钼层上采用采用PVD镀膜的方式分别镀制铝层和第二钼层。
现有技术中为了增强钼铝钼层与柔性基板的粘附力,提高钼铝钼层的致密性,往往在高温下采用采用PVD镀膜的方式在柔性基板上连续镀制第一钼层、铝层和第二钼层,但是发明人在实践中发现,采用这种镀膜工艺,柔性基板在高温下收缩会引起柔性基板的形变、翘曲等问题,若形变、翘曲过大则不能进行后续的曝光制程,产品的良率低。针对上述问题,发明人经过大量研究发现,将柔性基板置于镀膜腔室中,在40℃下采用采用PVD镀膜的方式在所述柔性基板上镀制第一钼层,将柔性基板从镀膜腔室中取出,冷却至室温后再放入镀膜腔室中,在40-60℃下在所述第一钼层上采用采用PVD镀膜的方式分别镀制铝层和第二钼层;本发明中降低采用PVD镀膜的镀制温度,同时将第一钼层、以及铝层和第二钼层分次镀制,采用这种镀膜工艺,不仅可以保证钼铝钼层与柔性基板的粘附力,而且有效避免了TFT制备过程中因工艺温度过高柔性基板发生的形变、翘曲等问题。
本发明中,所述承载基板包括玻璃基板、硅片、金属或硬质薄膜,优选地,所述承载基板为玻璃基板。
本发明中,步骤S2中,所述柔性基板通过有机粘结剂形成在所述承载基板上;具体地,步骤S2的具体操作为:(1)在所述承载基板上涂覆有机粘结剂;(2)在涂覆有粘结剂的承载基板上涂布有机材料并固化,以形成柔性基板。
本发明中,承载基板和柔性基板之间采用有机粘结剂粘接,有机粘结剂的厚度约为100-200μm。后续制作中有机粘结剂会被分离留在承载基板上。具体地,后续从承载基板上剥离出柔性基板,可采用在0-10℃环境有机粘结剂自动失去粘性实现剥离,还可采用UV光照模式失去粘性实现剥离。
本发明中并不具体限定有机粘结剂的种类,其可以采用现有技术中的常规种类,其对本领域技术人员为公知。
本发明中,有机材料采用涂布的方式成膜,薄膜特性容易控制。有机材料也可直接固化成膜通过粘结剂连接在基板上
本发明实施方式中,并不具体限定柔性基板的厚度,具体厚度可根据实际需要而选择,作为举例所述柔性基板的厚度可以为10-50μm,进一步可以是20-30μm。
所述有机材料为PI、PET、PES、PEN、PC中的一种或多种,但不局限于此。优选地,所述有机材料为PI(聚酰亚胺),PI树脂的粘度系数能保证柔性基板与承载基板的粘接力度,使在制备工艺中不会出现脱落的情形。
本发明中,对PVD镀膜的具体工艺参数不作特别限定,本领域技术人员可以根据实际需要进行选择。
可以理解,本发明中,还包括在柔性基板上制备TFT的其他步骤,其可按照本领域内的常规工艺进行,本发明不做特殊限定。
以上所述实施例仅表达了本发明的实施方式,其描述较为具体和详细,但并不能因此而理解为对本发明专利范围的限制,但凡采用等同替换或等效变换的形式所获得的技术方案,均应落在本发明的保护范围之内。

Claims (5)

1.一种柔性TFT基板的镀膜工艺,包括如下步骤:
S1.提供承载基板;
S2.在所述承载基板形成柔性基板;
S3.将柔性基板置于镀膜腔室中,在40℃下采用PVD镀膜的方式在所述柔性基板上镀制第一钼层,将柔性基板从镀膜腔室中取出,冷却至室温后再放入镀膜腔室中,在40-60℃下在所述第一钼层上采用采用PVD镀膜的方式分别镀制铝层和第二钼层。
2.如权利要求1所述的镀膜工艺,其特征在于,所述承载基板为玻璃基板。
3.如权利要求1所述的镀膜工艺,其特征在于,步骤S2中,所述柔性基板通过有机粘结剂形成在所述承载基板上。
4.如权利要求1所述的镀膜工艺,其特征在于,步骤S2的具体操作为:(1)在所述承载基板上涂覆有机粘结剂;(2)在涂覆有粘结剂的承载基板上涂布有机材料并固化,以形成柔性基板。
5.如权利要求4所述的镀膜工艺,其特征在于,所述有机材料为PI、PET、PES、PEN、PC中的一种或多种。
CN201810833954.9A 2018-07-26 2018-07-26 一种柔性tft基板的镀膜工艺 Pending CN109166786A (zh)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113198663A (zh) * 2021-04-22 2021-08-03 京东方科技集团股份有限公司 弯折屏的镀膜修复设备以及修复方法

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US20050274947A1 (en) * 2004-06-15 2005-12-15 Cheng-Chung Chen Structure of TFT electrode for preventing metal layer diffusion and manufacturing method therefor
CN106222619A (zh) * 2016-08-16 2016-12-14 京东方科技集团股份有限公司 一种基底、基板及其制作方法、电子器件
CN107462350A (zh) * 2017-08-17 2017-12-12 京东方科技集团股份有限公司 一种压电传感器、压力检测装置、制作方法及检测方法

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Publication number Priority date Publication date Assignee Title
US20050274947A1 (en) * 2004-06-15 2005-12-15 Cheng-Chung Chen Structure of TFT electrode for preventing metal layer diffusion and manufacturing method therefor
CN106222619A (zh) * 2016-08-16 2016-12-14 京东方科技集团股份有限公司 一种基底、基板及其制作方法、电子器件
CN107462350A (zh) * 2017-08-17 2017-12-12 京东方科技集团股份有限公司 一种压电传感器、压力检测装置、制作方法及检测方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113198663A (zh) * 2021-04-22 2021-08-03 京东方科技集团股份有限公司 弯折屏的镀膜修复设备以及修复方法
CN113198663B (zh) * 2021-04-22 2022-10-18 京东方科技集团股份有限公司 弯折屏的镀膜修复设备以及修复方法

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