CN109115816A - X射线Talbot干涉仪和X射线Talbot干涉仪系统 - Google Patents

X射线Talbot干涉仪和X射线Talbot干涉仪系统 Download PDF

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Publication number
CN109115816A
CN109115816A CN201811127026.7A CN201811127026A CN109115816A CN 109115816 A CN109115816 A CN 109115816A CN 201811127026 A CN201811127026 A CN 201811127026A CN 109115816 A CN109115816 A CN 109115816A
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China
Prior art keywords
ray
talbot interferometer
grating
interference
source
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CN201811127026.7A
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English (en)
Chinese (zh)
Inventor
半田宗郎
半田宗一郎
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Publication of CN109115816A publication Critical patent/CN109115816A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Molecular Biology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biomedical Technology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Optics & Photonics (AREA)
  • Biophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201811127026.7A 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统 Pending CN109115816A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014-026677 2014-02-14
JP2014026677 2014-02-14
CN201580008324.2A CN105992557B (zh) 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统

Related Parent Applications (1)

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CN201580008324.2A Division CN105992557B (zh) 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统

Publications (1)

Publication Number Publication Date
CN109115816A true CN109115816A (zh) 2019-01-01

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
CN201811127026.7A Pending CN109115816A (zh) 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统
CN201580008324.2A Active CN105992557B (zh) 2014-02-14 2015-02-12 X射线Talbot干涉仪和X射线Talbot干涉仪系统

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Country Status (5)

Country Link
US (1) US10393681B2 (https=)
EP (1) EP3105763B1 (https=)
JP (1) JP6537293B2 (https=)
CN (2) CN109115816A (https=)
WO (1) WO2015122542A1 (https=)

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CN109561864B (zh) * 2016-07-28 2022-05-17 株式会社岛津制作所 X射线相位差摄像装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
EP3391821B1 (en) * 2017-04-20 2024-05-08 Shimadzu Corporation X-ray phase contrast imaging system
US11013482B2 (en) * 2017-10-31 2021-05-25 Shimadzu Corporation Phase contrast X-ray imaging system
JP6987345B2 (ja) * 2018-01-18 2021-12-22 富士フイルムヘルスケア株式会社 放射線撮像装置
JP7006784B2 (ja) * 2018-06-15 2022-02-10 株式会社島津製作所 Ｘ線イメージング装置
EP3922180A1 (en) * 2020-06-09 2021-12-15 Koninklijke Philips N.V. Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system

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Also Published As

Publication number Publication date
EP3105763A1 (en) 2016-12-21
JP2015166735A (ja) 2015-09-24
US20160356730A1 (en) 2016-12-08
EP3105763B1 (en) 2019-09-11
WO2015122542A1 (en) 2015-08-20
CN105992557B (zh) 2020-01-14
US10393681B2 (en) 2019-08-27
CN105992557A (zh) 2016-10-05
JP6537293B2 (ja) 2019-07-03

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