CN108983760A - Function of the MCU and source current test device - Google Patents
Function of the MCU and source current test device Download PDFInfo
- Publication number
- CN108983760A CN108983760A CN201811203163.4A CN201811203163A CN108983760A CN 108983760 A CN108983760 A CN 108983760A CN 201811203163 A CN201811203163 A CN 201811203163A CN 108983760 A CN108983760 A CN 108983760A
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- test
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- 238000012360 testing method Methods 0.000 title claims abstract description 98
- 239000011159 matrix material Substances 0.000 claims abstract description 11
- 230000001105 regulatory effect Effects 0.000 claims abstract description 8
- 238000004891 communication Methods 0.000 claims description 12
- 230000006870 function Effects 0.000 description 21
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000006386 memory function Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A kind of function of the MCU of the present invention and source current test device, including D.C. regulated power supply, testing host, test adaptor plate, the chip test base and control computer of single-chip microcontroller to be measured are installed, chip test base is mounted on test adaptor plate, test adaptor plate is connected on testing host through connector, single-chip microcontroller to be measured is connect with control computer, testing host is equipped with DC-DC digital power, DC-DC analog power, testing current port, matrix keyboard, control switch, spi bus D/A converter, display screen and charactron, DC-DC digital power is connect by testing current port with single-chip microcontroller to be measured, matrix keyboard, control switch, spi bus D/A converter, display screen and charactron are connect with single-chip microcontroller to be measured, D.C. regulated power supply and DC-DC number and DC-DC analog power Connection, DC-DC analog power are connect with spi bus D/A converter.
Description
Technical field
The present invention relates to function of the MCU the field of test technology, more particularly to a kind of single-chip microcontroller PIC16F877 function and
Source current test device.
Background technique
There is portioned product currently on the market using single-chip microcontroller PIC16F877, this chip functions are more, and pin is more and spacing
Small, it is all to take method on probation in the production phase, once chip is defective in quality, the process of coring piece is often that test is difficult
Circuit board can be damaged.
Summary of the invention
The present invention is in view of the problems of the existing technology and insufficient, provides a kind of novel function of the MCU and source current
Test device.
The present invention is to solve above-mentioned technical problem by following technical proposals:
The present invention provides a kind of function of the MCU and source current test device, it is characterized in that comprising D.C. regulated power supply,
Testing host, test adaptor plate, the chip test base for installing single-chip microcontroller to be measured and control computer, the chip test base
It is mounted on test adaptor plate, the test adaptor plate is connected on testing host through switching connector, the single-chip microcontroller to be measured
It is connect with control computer communication, the testing host is equipped with DC-DC digital power, DC-DC analog power, testing current end
Mouth, matrix keyboard, control switch, spi bus D/A converter, display screen and charactron, the DC-DC digital power pass through electric current
Test port and monolithic mechatronics to be measured, the matrix keyboard, control switch, spi bus D/A converter, display screen and number
Guan Junyu monolithic mechatronics to be measured, the D.C. regulated power supply are electrically connected with DC-DC digital power and DC-DC analog power,
The DC-DC analog power is electrically connected with spi bus D/A converter.
Preferably, described device further includes shell, the testing host, DC-DC digital power, DC-DC analog power and
Spi bus D/A converter is encapsulated in shell, the test adaptor plate, chip test base, testing current port, matrix keyboard,
Control switch, display screen and charactron are embedded on shell.
Preferably, the display screen is LCD.
Preferably, the chip test base is removably mounted on test adaptor plate.
Preferably, being additionally provided with serial communication module on the testing host, the single-chip microcontroller to be measured passes through serial communication mould
Block is connect with control computer communication.
Preferably, the output voltage of the spi bus D/A converter is detected using voltmeter.
Preferably, the operating current of the single-chip microcontroller to be measured passes through testing current Port detecting using ammeter.
On the basis of common knowledge of the art, above-mentioned each optimum condition, can any combination to get each preferable reality of the present invention
Example.
The positive effect of the present invention is that:
The present invention is sampled test to the singlechip chip for being prepared to enter into production line, really in order to ensure the quality of production product
The qualification rate of chip is protected, realizes the non-destructive testing before chip is welded, and test device of the invention has versatility.
Detailed description of the invention
Fig. 1 is the function of the MCU of present pre-ferred embodiments and the structure principle chart of source current test device.
Fig. 2 is the function of the MCU of present pre-ferred embodiments and the structural schematic diagram of source current test device.
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached
The embodiment of figure description is exemplary, and for explaining only the invention, and is not considered as limiting the invention.On the contrary, this
The embodiment of invention includes all changes fallen within the scope of the spiritual and intension of attached claims, modification and is equal
Object.
As depicted in figs. 1 and 2, a kind of function of the MCU and source current test device are present embodiments provided comprising
Based on D.C. regulated power supply 1, testing host 2, test adaptor plate 3, the chip test base 5 by installing single-chip microcontroller 4 to be measured and control
Calculation machine 6, the chip test base 5 are mounted on test adaptor plate 3, and the test adaptor plate 3 is connected to survey through switching connector
It tries on mainboard 2.
The testing host 2 is equipped with DC-DC digital power 7, DC-DC analog power 8, testing current port 9, matrix key
Disk 10, control switch 11, spi bus D/A converter 13, display screen 14, charactron 15 and serial communication module 16, the DC-DC
Digital power 7 is electrically connected by testing current port 9 with single-chip microcontroller 4 to be measured, and the matrix keyboard 10, control switch 11, SPI are total
Line D/A converter 13, display screen 14 and charactron 15 are electrically connected with single-chip microcontroller 4 to be measured, the D.C. regulated power supply 1 and DC-DC
Digital power 7 and DC-DC analog power 8 are electrically connected, and the DC-DC analog power 8 is electrically connected with spi bus D/A converter 13,
The single-chip microcontroller to be measured 4 passes through serial communication module 16 and control 6 communication connection of computer.
Moreover, described device further includes shell 18, the testing host 2, DC-DC digital power 7, DC-DC analog power 8
Be encapsulated in shell 18 with spi bus D/A converter 13, the test adaptor plate 3, chip test base 5, testing current port 9,
Matrix keyboard 10, control switch 11, program write-in port 12, display screen 14 and charactron 15 are embedded on shell 18.
Wherein, the display screen 14 is LCD, and the chip test base 5 is removably mounted on test adaptor plate 3.
Single-chip microcontroller 4(PIC16F877 to be measured) is installed on chip test base 5, control computer 6 makes the program write
Port 12 is written by program with program burn writing device 19 to be burned onto PIC16F877 single-chip microcontroller.In PIC16F877 function of the MCU
In test device, control switch 11 is made of 3 self-locking keys.In test, reality is input operation instruction using control switch 11
Existing test function switching, according to the truth table of PIC16F877 single-chip microcontroller, design vector, to the logic function of PIC16F877 single-chip microcontroller
Can be carried out test, after test on display screen 14 and/or charactron 15 display function test result.In source current test,
Using ammeter 17, whether the source current consumed when testing chip operation is normal to assess its work.
This programme is carried out the work for the major function test of thermal imaging system principal series single-chip microcontroller PIC16F877, passes through this
Scheme is implemented, and realizes single-chip microcontroller PIC16F877 following functions verifying: I/O function, double-serial port function, A/D function, MEMORY function
Can, while measuring its operating current.
The test of I/O function can be tested by matrix keyboard 10.Serial port function is by calling in single-chip microcontroller to be measured
The serial ports in portion is communicated with control computer 6 and is tested, and AD analog-to-digital conversion is by analog voltage input 21 and calls monolithic to be measured
10 AD inside machine 4 are tested, and MEMORY function is by calling spi bus unit and outside SPI inside single-chip microcontroller to be measured
The communication of bus D/A converter 13 is tested, and test result is shown by display screen 12 and charactron 13, while outside SPI
The transformation result of bus D/A converter 13 is tested by voltmeter 20.
When source current is tested, using ammeter 17, disappear when testing single-chip microcontroller 4 to be measured work by testing current port 9
Whether the source current of consumption is normal to assess its work.
The replacement of single-chip microcontroller model is realized by different test adaptor plates.In order to realize the versatility of platform, test master
The place that plate is connected with test adaptor plate uses two 64 core connectors, and totally 128 pins, can be compatible with most of single-chip microcontrollers.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with
A variety of variations, modification, replacement can be carried out to these embodiments without departing from the principles and spirit of the present invention by understanding
And modification, the scope of the present invention is by appended claims and its equivalent limits.
Claims (7)
1. a kind of function of the MCU and source current test device, which is characterized in that it includes D.C. regulated power supply, test master
Plate, test adaptor plate, the chip test base for installing single-chip microcontroller to be measured and control computer, the chip test base are mounted on
On test adaptor plate, the test adaptor plate is connected on testing host through switching connector, the single-chip microcontroller to be measured and control
Computer communication connection, the testing host are equipped with DC-DC digital power, DC-DC analog power, testing current port, square
Battle array keyboard, control switch, spi bus D/A converter, display screen and charactron, the DC-DC digital power pass through testing current
Port and monolithic mechatronics to be measured, the matrix keyboard, control switch, spi bus D/A converter, display screen and charactron are equal
With monolithic mechatronics to be measured, the D.C. regulated power supply is electrically connected with DC-DC digital power and DC-DC analog power, described
DC-DC analog power is electrically connected with spi bus D/A converter.
2. function of the MCU according to claim 1 and source current test device, which is characterized in that described device is also wrapped
Shell is included, the testing host, DC-DC digital power, DC-DC analog power and spi bus D/A converter are encapsulated in shell,
The test adaptor plate, chip test base, testing current port, matrix keyboard, control switch, display screen and charactron are embedded at
On shell.
3. function of the MCU according to claim 1 and source current test device, which is characterized in that the display screen is
LCD。
4. function of the MCU according to claim 1 and source current test device, which is characterized in that the chip testing
Seat is removably mounted on test adaptor plate.
5. function of the MCU according to claim 1 and source current test device, which is characterized in that the testing host
On be additionally provided with serial communication module, the single-chip microcontroller to be measured is connect by serial communication module with computer communication is controlled.
6. function of the MCU according to claim 1 and source current test device, which is characterized in that the spi bus
The output voltage of D/A converter is detected using voltmeter.
7. function of the MCU according to claim 1 and source current test device, which is characterized in that the monolithic to be measured
The operating current of machine passes through testing current Port detecting using ammeter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811203163.4A CN108983760A (en) | 2018-10-16 | 2018-10-16 | Function of the MCU and source current test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811203163.4A CN108983760A (en) | 2018-10-16 | 2018-10-16 | Function of the MCU and source current test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108983760A true CN108983760A (en) | 2018-12-11 |
Family
ID=64543660
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811203163.4A Pending CN108983760A (en) | 2018-10-16 | 2018-10-16 | Function of the MCU and source current test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108983760A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111913471A (en) * | 2020-07-21 | 2020-11-10 | 北京京瀚禹电子工程技术有限公司 | Testing device |
| CN115343594A (en) * | 2022-06-24 | 2022-11-15 | 苏州吾爱易达物联网有限公司 | Test device for SIP packaging NB-IoT chip |
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| CN111913471A (en) * | 2020-07-21 | 2020-11-10 | 北京京瀚禹电子工程技术有限公司 | Testing device |
| CN115343594A (en) * | 2022-06-24 | 2022-11-15 | 苏州吾爱易达物联网有限公司 | Test device for SIP packaging NB-IoT chip |
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