CN102393504A - Plotting device of schematic diagram of circuit board - Google Patents

Plotting device of schematic diagram of circuit board Download PDF

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Publication number
CN102393504A
CN102393504A CN2010102983678A CN201010298367A CN102393504A CN 102393504 A CN102393504 A CN 102393504A CN 2010102983678 A CN2010102983678 A CN 2010102983678A CN 201010298367 A CN201010298367 A CN 201010298367A CN 102393504 A CN102393504 A CN 102393504A
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China
Prior art keywords
circuit
pin
adg732
backboard
test
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CN2010102983678A
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Chinese (zh)
Inventor
刘耀周
王振生
赵昉
宋祥君
方兴桥
张永鹏
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Ordnance Technology Research Institute of General Armament Department of Chinese PLA
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Ordnance Technology Research Institute of General Armament Department of Chinese PLA
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Priority to CN2010102983678A priority Critical patent/CN102393504A/en
Publication of CN102393504A publication Critical patent/CN102393504A/en
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Abstract

The invention discloses a plotting device of a schematic diagram of a circuit board. The device comprises a numerical controlled host, a tester, and a flexible needle bed. Key points of the design of the device are as follows: the tester is connected with the flexible needle bed through a cable; the tester is composed of a backboard, a channel board, a power supply module, and a cabinet; a socket is arranged on the backboard; the channel board is vertically plugged on the backboard through the socket; the backboard is connected with numerical controlled host through a USB cable; and the channel board is connected with the flexible needle bed through the socket. According to the invention, the device has advantages of fast testing speed, high accuracy, good university, and strong anti-interference property and the like.

Description

A kind of circuit board schematic diagram plotting board
Technical field
The present invention relates to electronic test equipment, specifically a kind of circuit board schematic diagram plotting board.
Background technology
At present, electronic equipment is widely used in many industries and department, is bringing into play crucial effects.Electronic equipment generally is made up of various circuit boards, and the content height that possesses skills, the characteristics that failure rate is high in case break down, will produce significant impact to the normal operation of equipment, place under repair in time.But owing to many equipment especially import equipment often lack the principle drawing, cause and can't repair equipment, equipment can't move, and causes very big loss, so acquisition cuicuit plate schematic diagram is used for instructing repair work very urgent and necessary.
At present, acquisition cuicuit plate schematic diagram mainly contains polishing method, observation, manual test method and fixing needle-bar method of testing.The polishing method is that circuit board element is pulled down; Then circuit board is polished, every polishing one deck is just taken a picture, until all board layers of having polished; Come the protracting circuit schematic diagram according to every layer imaging; This method need be damaged the circuit kit plate fully, and is with high costs, is difficult to carry out generally speaking; Observation is the cabling on the visual inspection circuit board, manual then the drafting, and this method often is applicable to not too complicated single sided board and doubling plate, can't be suitable for for present increasing multilayer board; The manual test method is to use the ohms range of multimeter that the resistance between all components and parts pins on the circuit-under-test plate is tested in twos; If resistance is less than a specific value between two pins; Can think conducting between 2, otherwise be not conducting that this method is to not damage of circuit board; Also be applicable to multilayer board, but workload is big, error rate is high; Fixedly the needle-bar method of testing is to use needle-bar that circuit board is fixed, and utilizes the optical imagery means to draw electronic devices and components pin distribution plan on the circuit-under-test plate then, and then makes corresponding channel plate according to distribution plan; Be used for the assignment test probe; Last under the control of testing software, send test instruction by Test Host and test, this method of testing test speed is fast; Accuracy rate is high; But this method requires to make special channel plate and testing software for every tested electronics spare part, and system is huge, cost is high, fabrication cycle is long, versatility is poor, can't apply on a large scale.CN200820227738.1 discloses a kind of circuit board schematic diagram mapping system, and this design especially highly has harsh requirement, system's poor anti jamming capability, job insecurity to the volume of used all kinds of EBI components and parts and analog switch device.
Summary of the invention
It is fast that the object of the invention just provides a kind of test speed, and accuracy rate is high, and versatility is good, the circuit board schematic diagram plotting board that antijamming capability is strong.
The objective of the invention is to realize like this:
Circuit board schematic diagram plotting board provided by the present invention, it includes numerical control main frame, tester, flexible needle-bar, and its key points in design is that tester is connected through cable with flexible needle-bar; Tester is made up of backboard, channel plate, power module, cabinet, and backboard is provided with socket, and channel plate vertically is plugged on the backboard through this socket; Backboard is connected with the numerical control main frame through USB cable; Channel plate is connected with flexible needle-bar through socket.
In use, the numerical control main frame be used for sending controling instruction, receive image data and handle, finally draw circuit-under-test plate circuit theory diagrams according to result.Flexible needle-bar 2 is used for fixing, connects circuit-under-test plate 16, is connected with tester 1 through flat cable 9.Tester 1 is used for receiving the steering order that the numerical control main frame sends; To test little electric current through its inner passage switching and be loaded into circuit-under-test plate 16 corresponding pins; Thereby realize the test in twos between circuit-under-test plate 16 all components and parts pins, and the test data that collects is sent to the numerical control main frame through USB interface.
The beneficial effect that the present invention had is:
1, when test, need not the circuit-under-test plate is disassembled, and be applicable to the test of any specification circuit board schematic diagram.It is simple in structure, antijamming capability is strong, reliable operation, cost is low, versatility good, test speed is fast, and accuracy rate is high, can communicate with computing machine easily.
2, the present invention is designed to two relatively independent mechanisms with tester and flexible needle-bar; Connect through cable again; Can make the various circuit board plates in the tester have enough spaces can install and use various filtering commonly used, rectification, isolation, protector on the one hand thus, thereby guarantee that whole device can stable operation.On the flexible on the other hand needle-bar channel plate is not set, thereby greatly facilitates installation, the debugging of circuit-under-test plate, saved the test duration.
3, it is more scientific and reasonable that the present invention makes the design of whole test circuit, thereby not only dwindled the volume of proving installation greatly, also improved test speed and accuracy rating of tests simultaneously.
Description of drawings
Fig. 1 one-piece construction synoptic diagram of the present invention.
The longitudinal sectional drawing of press strip among Fig. 2 the present invention.
Fig. 3 back plane circuitry structured flowchart of the present invention.
Fig. 4 channel plate circuit structure of the present invention block diagram.
Fig. 5 back plane circuitry schematic diagram of the present invention.
Fig. 6 channel plate circuit theory diagrams of the present invention.
Fig. 7 is a four-wire system test resistance method schematic diagram.
Embodiment
The present invention is as shown in Figure 1, includes numerical control main frame, tester 1, flexible needle-bar 2.Tester 1 is connected through cable 9 with flexible needle-bar 2; Tester 1 is made up of backboard 3, channel plate 4, power module 5, cabinet 6, and backboard 3 is provided with socket 8, and channel plate 4 vertically is plugged on the backboard 3 through this socket 8; Backboard 3 is connected with the numerical control main frame through USB cable; Channel plate 4 is connected with flexible needle-bar 2 through socket 7.Wherein power module 5 is connected with backboard 3, and toward back plate 3 provides working power and to channel plate 4 working power is provided through backboard socket 8, and output voltage is monitored in real time, and the assurance system normally moves.Backboard 3, channel plate 4, power module 5 all place a cabinet 6.Backboard socket 8 optional usefulness have the standard connector of five jacks.Channel plate socket 7 optional usefulness have the two rows standard connector of totally 64 jacks.
In order further to strengthen job stability of the present invention, the circuit (as shown in Figure 3) of the backboard 3 that is designed is by usb circuit 3a, backboard I 2 C repeat circuit 3b, constant-current source circuit 3c, voltage comparator circuit 3d, core bus circuit 3e form; Usb circuit 3a receives the steering order that the numerical control main frame sends, and after resolving, passes through backboard I 2 C repeat circuit 3b delivers to core bus circuit 3e; Constant-current source circuit 3c provides test circuit-under-test plate 16 required little electric current through core bus circuit 3e; Voltage comparator circuit 3d is sent to usb circuit 3a with comparative result with constant-current source circuit 3c output voltage and reference voltage after relatively, is transferred to the numerical control main frame again and carries out data processing;
What it was more concrete is, the instruction of numerical control main frame sends to the usb circuit 3a of coupled backboard 3 through USB cable, and this interface circuit is resolved steering order and converted I to 2C bus data form is also delivered to I with it 2C repeat circuit 3b, this repeat circuit has been broken through I 2In the C agreement defined be connected on the bus can be from parts input capacitance sum greater than the limitation of 400pF, to connecting not restriction of number of components above that, for system provides good extensibility; Core bus circuit 3e is the bus circuit that comprises five leads that are parallel to each other, and evenly is provided with several backboard sockets 8 on it, I 2Steering order after C repeat circuit 3b will resolve is seen off through two leads of backboard socket 8; Constant-current source circuit 3c is connected with another root lead of core bus circuit 3e, is used for producing little electric current of test usefulness, and from security consideration, this electric current is 1mA, under the situation of test fast, can not cause damage to circuit-under-test plate 16; Voltage comparator circuit 3d is sent to usb circuit 3a with comparative result with constant-current source circuit 3c output voltage and reference voltage after relatively, by the numerical control main frame test data is handled.Its circuit theory is as shown in Figure 5, by internal USB interface and I 2The single-chip microcomputer U1 of C interface and peripheral circuit thereof are formed usb circuit 3a, by P82B96 type I 2C repeater U2 forms I 2C repeat circuit 3b forms constant-current source circuit 3c by standard of precision voltage U5, operational amplifier U6 and precision resistance R1, forms voltage comparator circuit 3d by voltage comparator U3 and voltage reference U4; The D+ of U1, D-pin are connected with USB interface of computer, and SCL, SDA pin are connected with Sx, the Sy pin of U2 respectively, the pin Tx of U2 is connected with Rx, Ty with after Ry is connected respectively with core bus circuit 3e on SCL, sda line link to each other; R1 one end links to each other with the output terminal pin OUT of U5; The other end links to each other with the out-phase input end of U6 and constitutes the output terminal of constant-current source circuit 3c; U6 is connected into voltage follower, links to each other with the ground end pin GND of U5 after promptly its in-phase input end is connected with output terminal, and be the reference voltage that the R1 voltage just equals U5 between U6 in-phase input end and the U5 output terminal; Thereby export constant electric current, this current value i=U5 reference voltage u Out / R1, and be connected with Iout line on the core bus circuit 3e through resistance R 2; The U4 output terminal links to each other with the negative input pin IN-of U3, for U3 provides reference data voltage u Ref , the electrode input end pin IN+ of U3 and the output terminal of constant-current source circuit 3c are that the out-phase input end of U6 is connected, U3 output terminal pin OUT is connected with the I/O mouth pin PA0 of U1; Core bus circuit 3e is the five-wire system bus circuit, comprises I 2C clock line SCL and data line SDA, power lead VCC and GND, constant current source electric current line Iout all are connected with backboard socket 8; If the resistance between the tested pin is Rx, the internal resistance of analog switch is Ri, is Rx+2Ri from the last constant current source electric current line Iout of core bus circuit 3e to the resistance between the ground wire GND then, so the voltage on the U3 electrode input end pin IN+ u i = i(Rx+2Ri+R2), if u i > u Ref , U3 output terminal pin OUT goes up the output high level, otherwise output low level.In the present invention, the reference gate that whether conducting is set between two the tested pins resistance of rationing the power supply is 10 ohm, then u Ref = i(10+2Ri+R2), wherein i, Ri, R2 be known, can calculate thus u Ref Numerical value, thereby can select suitable voltage reference U4.
The circuit (as shown in Figure 4) of the channel plate 4 among the present invention is by channel plate I 2 C repeat circuit 4a, control circuit 4b, analog switch matrix circuit 4c) channel interface 4d composition; Channel plate I wherein 2 C repeat circuit 4a receives the steering order that core bus circuit 3e sends here, and this instruction is sent to control circuit 4b, and control circuit 4b carries out the address and relatively the success back resolved by instruction, the folding of control analog switch matrix circuit 4c respective switch; Analog switch matrix circuit 4c receives little electric current of sending here on the core bus circuit 3e; Switch through closed is delivered to the components and parts pin that is connected with this switch on the circuit-under-test plate 16 with this little electric current; After testing the circuit on little electric current process circuit-under-test plate 16, go up another closed switch to ground through analog switch matrix circuit 4c.
Can calculate the voltage at circuit-under-test two ends through the output voltage of test constant-current source circuit 3c; Size of current according to constant-current source circuit 3c output; The resistance at circuit-under-test two ends can be calculated, and then the resistance between two electronic devices and components pins can be calculated on the circuit-under-test plate 16.Each passage on the channel interface 4d is that each connection terminal all is assigned a unique address, and tester is realized being connected the sign of electronic devices and components pin on the circuit-under-test plate 16 on this passage through this address.
Channel plate 4 more detailed structures among the present invention are: channel plate I 2Two I on C repeat circuit 4a and the core bus circuit 3e 2The C lead links to each other, and is used for and I 2C repeat circuit 3b pairing is used with expansion I 2The capacity of C bus, and support hot plug, channel plate I 2C repeat circuit 4a passes to control circuit 4b with the steering order that receives; Because all channel plates 4 all are connected on the same bus circuit; So all channel plates 4 all can receive steering order; Therefore the inner computer software programs that use of control circuit 4b are provided with a unique address for each channel plate 4; Adopt the mode of software setting address to have the advantage that is provided with flexibly, does not receive interface device address pin restricted number with respect to hardware mode; Control circuit 4b on each channel plate 4 at first compares target address information in the steering order and built-in address date, if two addresses are identical, control circuit 4b continues to carry out next step action; To steering order resolve and with its output so that analog switch matrix circuit 4c is controlled, otherwise be failure to actuate; The control pin of analog switch matrix circuit 4c is connected with control circuit 4b; Under the control of control circuit 4b, realize opening of respective channel with closed; Each switch terminal of analog switch matrix circuit 4c all with channel plate socket 7 on each connection terminal link to each other, the input end of analog switch matrix circuit 4c receives little electric current that constant-current source circuit 3c sends here, delivers on the tested components and parts pin through the switch of a closure; This electric current is flowed through on the circuit-under-test plate 16 behind the corresponding circuit to another tested pin; Through the ground wire on another closed switch to the core bus circuit 3e that links to each other with this pin, this ground wire is connected with the ground end of constant current source, has just formed a close access thus between constant current source and the circuit-under-test again; This moment, the output voltage of constant-current source circuit 3c was exactly the voltage at circuit-under-test two ends; Size of current according to constant-current source circuit 3c output can calculate the resistance at circuit-under-test two ends, and then can calculate on the circuit-under-test plate 16 resistance between two electronic devices and components pins.
The circuit theory of the channel plate among the present invention, as shown in Figure 6, by P82B96 type I 2C repeater U7 forms channel plate I 2 C repeat circuit 4a forms control circuit 4b by CPLD U8 and active crystal oscillator X1, constitutes the analog switch matrix circuit by analog switch device ADG732; The pin Tx of U7 and Rx link to each other, Ty be connected with SCL, the sda line of core bus circuit 3e respectively after Ry links to each other, the Sx of U7, Sy pin link to each other with two I/O pins of U8 respectively; Two I/O pins of this of U8 are modeled to I 2C interface and U7 communicate, and the clock pin GCLK of X1 output terminal and U3 is connected to it provides clock signal.
Voltage comparator circuit 3d among the present invention provides a reference voltage; Be equivalent to provide the reference resistance of a conducting and disconnection; Voltage comparator circuit 3d is with circuit-under-test voltage and reference voltage process relatively; Between two electronic devices and components pins that in fact just will calculate resistance with reference to resistance value ratio process, if the test resistance greater than with reference to resistance, can be thought between two pins for breaking off; Otherwise be conducting, promptly directly connecting between two pins on the circuit board with lead.
Flexible needle-bar 2 among the present invention comprises crossbeam 12, press strip 14 and flexibility test pin 15; Be distributed with equally spaced row's screw 13 on the crossbeam 12, press strip 14 is fixed on relevant position on the crossbeam 12 through securing member; That press strip 14 (as shown in Figure 2) is provided with is coaxial, top is divided into the solid metal body, the bottom is the connection terminal 17 of hollow structure; Flexibility test pin 15 upper ends place in the connection terminal 17 on the press strip 14, and the pin of electronic devices and components is connected on lower end and the circuit-under-test plate 16.
Flexible needle-bar 2 more detailed structures are that flexible needle-bar is made up of rectangular shaped rim 10, supporting leg 11, crossbeam 12, press strip 14 and flexibility test pin 15, is laterally zygomorphic tower structure; Rectangular shaped rim 10 is fixed on the middle part of its four supporting legs 11 of four jiaos; Upper and lower surface in rectangular shaped rim 10 is provided with two crossbeams that are parallel to each other 12; Crossbeam 12 is provided with equally spaced screw 13, the spacing between two through holes 18 at press strip 14 two ends with equate with the distance of two rows between the screws 13 on two crossbeams 12 of one side; Circuit-under-test plate 16 is fixed on the middle part of rectangular shaped rim 10 vertical direction; Press strip 14 is placed tested electronic devices and components pin top; Use screw that press strip 14 is fixed on two crossbeams 12, then the press strip 14 of rectangular shaped rim 10 upper and lower surfaces equates with the spacing of circuit-under-test plate 16; Use flat cable 9 to connect tester 1 and flexible needle-bar 2; Flat cable 9 one ends for the connector with 64 contact pins of channel plate socket 7 same specifications; Can be inserted in the channel plate socket 7, every contact pin all is connected with a lead of flat cable 9, and flat cable 9 other ends are connected with press strip 14; Every lead all with press strip 14 on the welded top of connection terminal 17, thereby realize being connected of each connection terminal 17 on tester 1 each passage and the press strip 14; Flexibility test pin 15 tops are inserted the bottom of press strip 14 upper connecting terminals 17; The probe of bottom is pricked on the pin of tested components and parts; Because connection terminal 17 has certain degree of depth, flexibility test pin 15 also can keep under the situation at certain angle of inclination being connected with the reliable of tested components and parts pin having; Use a press strip 14 and connected flexibility test pin 15; Can cover the tested components and parts pin of a row of press strip 14 belows; Through abundant press strip 14 and flexibility test pin 15 are set; Can cover whole pins of circuit-under-test plate 16 all components and parts of upper and lower surface, thereby realize being connected between circuit-under-test plate 16 all pins and tester 1 passage.
Flat cable 9 is connected tester 1 with flexible needle-bar 2; The one of which end uses the standard connector to insert on the channel plate socket 7; The other end is connected with press strip 14, in the flat cable 9 every lead two ends respectively with press strip 14 on contact pin welding on corresponding each connection terminal 17 and the standard connector.
Press strip 14 is as shown in Figure 2; Press strip upper connecting terminal 17 is divided into coaxial two parts up and down, and the bottom is divided into hollow structure, and top is divided into the solid metal body; Be connected with the conductive metallic material of lower part inwall; A wire bonds in top, top and the flat cable 9, flexibility test pin 15 tops place the inside of its underpart, guarantee that flexibility test pin 15 still can reliably be connected with circuit-under-test plate 16 under the situation of inclination certain angle; Every press strip 14 can cover its next row's components and parts pin; Through upper and lower surface abundant press strip 14 is set at flexible needle-bar 2; Then can cover all electronic devices and components pins on the circuit-under-test plate 16, thereby realize being connected of all pins and tester 1 respective channel; Because each pin of linking to each other with the tester passage all is assigned a unique address, whole pins are with after tester is connected, and tester can be realized the test between any two pins.
Analog switch matrix circuit 4c according to the invention is made up of analog switch device ADG732; Specifically as shown in Figure 6; The enable of ADG732-1, ADG732-2, ADG732-3, ADG732-4 device
Figure 2010102983678100002DEST_PATH_IMAGE002
, sheet select pin
Figure 2010102983678100002DEST_PATH_IMAGE004
to link to each other with eight I/O pins of U3 respectively; Read-write pin
Figure 2010102983678100002DEST_PATH_IMAGE006
all is connected with the same I/O pin of U3; Switch is connected with five I/O pins of U3 respectively after selecting pin A0 ~ A4 to connect by identical sequence number; Realized that control circuit 4b is to control function such as the enabling of each analog switch device, sheet choosing, read-write, switch selections; ADG732-1 and the common port pin D of ADG732-3 are connected with Iout line on the core bus circuit 3e; ADG732-2 and the common port pin D of ADG732-4 are connected with GND line on the core bus circuit 3e; ADG732-1 is connected to by identical order with switch terminals pin S1 ~ S32 of ADG732-2 and constitutes output channel K1 ~ K32 together; ADG732-3 is connected to by identical order with switch terminals pin S1 ~ S32 of ADG732-4 and constitutes output channel K33 ~ K64 together, each passage respectively with channel interface 4d that channel plate socket 7 is formed on each terminal link to each other.
In the method for the four-wire system measuring resistance of routine, (as shown in Figure 7) Rx is two resistance between the tested pin, and Rx one end is connected with analog switch K1, and the other end is connected with analog switch K2, and constant current source A is anodal to be connected with K1, and negative pole is connected with K2, and output current does i, then flow through K1, Rx, K2 of electric current forms a close access, and this moment, constant current source A voltage did u o , just equaling K1, Rx, K2 voltage, the internal resistance of analog switch K1, K2 is R i, then the resistance at K1, Rx, K2 two ends is 2R i+ Rx= u o / i, then can calculate Rx= u o / i-2R iBut common analog switch device internal resistance is often bigger, is generally hundreds of ohm, and bigger with the temperature variation drift; The Rx result who calculates like this has very large deviation, does not conform to the actual conditions, so in the method for four-wire system test resistance, be provided with K switch 3 at the end of Rx again; The other end is provided with K4; Because K3, K4 is last does not have electric current to flow through, so do not have pressure drop on these two switches, the therefore voltage between two switches u' just equal the magnitude of voltage at Rx two ends so Rx= u'/ i, this moment, the internal resistance of analog switch device just no longer exerted an influence to the result of calculation of Rx, thereby obtained result accurately; But this method has increased by one times with the quantity of analog switch device, and system scale enlarges greatly, and cost significantly improves.Therefore invention has selected for use analog switch device ADG732 to constitute analog switch matrix circuit 4c; This device internal resistance has only several ohm and very little with temperature drift; To the influence of Rx result of calculation within the acceptable scope; To not influence of final testing result, therefore can K3, K4 be cast out, then the Rx value is Rx= u o / i-2R i
The concrete circuit of analog switch matrix circuit 4c connects as follows (with reference to shown in Figure 6): the enable of ADG732-1, ADG732-2, ADG732-3, ADG732-4 device
Figure 613125DEST_PATH_IMAGE002
, sheet select pin to link to each other with eight I/O pins of U3 respectively; Read-write pin
Figure 372320DEST_PATH_IMAGE006
all is connected with the same I/O pin of U3; Switch is connected with five I/O pins of U3 respectively after selecting pin A0 ~ A4 to connect by identical sequence number; Realized that control circuit 4b is to control function such as the enabling of each analog switch device, sheet choosing, read-write, switch selections; ADG732-1 and the common port pin D of ADG732-3 are connected with Iout line on the core bus circuit 3e; ADG732-2 and the common port pin D of ADG732-4 are connected with GND line on the core bus circuit 3e; ADG732-1 is connected to by identical order with switch terminals pin S1 ~ S32 of ADG732-2 and constitutes output channel K1 ~ K32 together; ADG732-3 is connected to by identical order with switch terminals pin S1 ~ S32 of ADG732-4 and constitutes output channel K33 ~ K64 together, each passage respectively with channel interface 4d that channel plate socket 7 is formed on each terminal link to each other.
Comprehensive above analysis result, the voltage on the backboard 1 on the voltage comparator U3 electrode input end pin IN+ u i = i(Rx+2Ri+R2)= i( u o / i+ R2)= u O+ i* R2, iWith R2 be known, so through test constant current source voltage u o , again through calculating the reference voltage of back and voltage reference U4 u Ref Compare and to judge between two tested pins whether conducting.The output terminal pin OUT of U3 sends to U1 through the PA0 pin of single-chip microcomputer U1 with comparative result, and send to computing machine by U1 through USB interface again and handle, and then the protracting circuit schematic diagram.

Claims (7)

1. circuit board schematic diagram plotting board, it includes numerical control main frame, tester (1), flexible needle-bar (2), it is characterized in that tester (1) is connected through cable (9) with flexible needle-bar (2); Tester (1) is made up of backboard (3), channel plate (4), power module (5), cabinet (6), and backboard (3) is provided with socket (8), and channel plate (4) vertically is plugged on the backboard (3) through this socket (8); Backboard (3) is connected with the numerical control main frame through USB cable; Channel plate (4) is connected with flexible needle-bar (2) through socket (7).
2. circuit board schematic diagram plotting board according to claim 1 is characterized in that described backboard (3) is by usb circuit (3a), backboard I 2C repeat circuit (3b), constant-current source circuit (3c), voltage comparator circuit (3d), core bus circuit (3e) are formed; Usb circuit (3a) receives the steering order that the numerical control main frame sends, and after resolving, passes through backboard I 2C repeat circuit (3b) is delivered to core bus circuit (3e); Constant-current source circuit (3c) provides test required little electric current through core bus circuit (3e); Voltage comparator circuit (3d) is sent to usb circuit (3a) with comparative result with constant-current source circuit (3c) output voltage and reference voltage after relatively, is transferred to the numerical control main frame again.
3. circuit board schematic diagram plotting board according to claim 1 and 2 is characterized in that said channel plate (4) is by channel plate I 2C repeat circuit (4a), control circuit (4b), analog switch matrix circuit (4c), channel interface (4d) are formed; Channel plate I wherein 2C repeat circuit (4a) receives the steering order that core bus circuit (3e) is sent here; And this instruction sent to control circuit (4b); Control circuit (4b) carries out the address relatively resolves instruction the success back, the folding of control analog switch matrix circuit (4c) respective switch; Analog switch matrix circuit (4c) receives little electric current of sending here on the core bus circuit (3e); Through closed switch this little electric current is delivered to the components and parts pin that circuit-under-test plate (16) upward is connected with this switch; After testing the circuit on little electric current process circuit-under-test plate (16), go up another closed switch to ground through analog switch matrix circuit (4c).
4. circuit board schematic diagram plotting board according to claim 1 and 2 is characterized in that described constant-current source circuit (3c) is made up of standard of precision voltage U5, operational amplifier U6 and precision resistance R1.
5. circuit board schematic diagram plotting board according to claim 1 and 2 is characterized in that described flexible needle-bar 2 comprises crossbeam 12, press strip 14 and flexibility test pin 15; Be distributed with equally spaced row's screw 13 on the crossbeam 12, press strip 14 is fixed on relevant position on the crossbeam 12 through securing member; That press strip 14 is provided with is coaxial, top is divided into the solid metal body, the bottom is the connection terminal 17 of hollow structure; Flexibility test pin 15 upper ends place in the connection terminal 17 on the press strip 14, and the pin of the electronic devices and components on lower end and the circuit-under-test plate 16 is connected.
6. circuit board schematic diagram plotting board according to claim 3; It is characterized in that said analog switch matrix circuit 4c is made up of four ADG732 analog switch devices; Wherein the enable of ADG732-1, ADG732-2, ADG732-3, ADG732-4 device
Figure DEST_PATH_IMAGE002
, sheet select pin
Figure DEST_PATH_IMAGE004
to link to each other with eight I/O pins of voltage comparator U3 respectively; Read-write pin
Figure DEST_PATH_IMAGE006
all is connected with the same I/O pin of U3; Switch is connected with five I/O pins of U3 respectively after selecting pin A0 ~ A4 to connect by identical sequence number; ADG732-1 and the common port pin D of ADG732-3 are connected with Iout line on the core bus circuit 3e; ADG732-2 and the common port pin D of ADG732-4 are connected with GND line on the core bus circuit 3e; ADG732-1 is connected to by identical order with switch terminals pin S1 ~ S32 of ADG732-2 and constitutes output channel K1 ~ K32 together; ADG732-3 is connected to by identical order with switch terminals pin S1 ~ S32 of ADG732-4 and constitutes output channel K33 ~ K64 together, each passage respectively with channel interface 4d that channel plate socket 7 is formed on each terminal link to each other.
7. circuit board schematic diagram plotting board according to claim 3 is characterized in that the inner computer software programs that use of said control circuit 4b are provided with a unique address for each channel plate 4.
CN2010102983678A 2010-09-30 2010-09-30 Plotting device of schematic diagram of circuit board Pending CN102393504A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105510763A (en) * 2016-02-25 2016-04-20 珠海全志科技股份有限公司 Integrated circuit pin testing device
CN110737299A (en) * 2019-10-10 2020-01-31 华东光电集成器件研究所 low-voltage variable constant current source device
CN111967115A (en) * 2020-08-17 2020-11-20 深圳市安冠科技有限公司 Drawing method of power supply schematic diagram and computer equipment

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080252318A1 (en) * 2007-04-12 2008-10-16 Semiconductor Testing Advanced Research Lab Inc. Method for testing micro sd devices using each test circuits
CN201307146Y (en) * 2008-12-08 2009-09-09 中国人民解放军63908部队 Mapping device of circuit board schematic diagram
CN201876523U (en) * 2010-09-30 2011-06-22 中国人民解放军总装备部军械技术研究所 Circuit board schematic diagram plotting device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080252318A1 (en) * 2007-04-12 2008-10-16 Semiconductor Testing Advanced Research Lab Inc. Method for testing micro sd devices using each test circuits
CN201307146Y (en) * 2008-12-08 2009-09-09 中国人民解放军63908部队 Mapping device of circuit board schematic diagram
CN201876523U (en) * 2010-09-30 2011-06-22 中国人民解放军总装备部军械技术研究所 Circuit board schematic diagram plotting device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘耀周等: "未知电路板原理图测绘系统的设计与实现", 《电子技术应用》, no. 11, 30 November 2005 (2005-11-30) *
王振生等: "基于I2C 总线的大型开关矩阵设计与实现", 《国外电子元器件》, no. 11, 30 November 2006 (2006-11-30) *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105510763A (en) * 2016-02-25 2016-04-20 珠海全志科技股份有限公司 Integrated circuit pin testing device
CN105510763B (en) * 2016-02-25 2018-08-10 珠海全志科技股份有限公司 Ic pin test device
CN110737299A (en) * 2019-10-10 2020-01-31 华东光电集成器件研究所 low-voltage variable constant current source device
CN111967115A (en) * 2020-08-17 2020-11-20 深圳市安冠科技有限公司 Drawing method of power supply schematic diagram and computer equipment
CN111967115B (en) * 2020-08-17 2024-02-02 深圳市安冠科技有限公司 Drawing method of power supply schematic diagram and computer equipment

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Application publication date: 20120328