CN203773022U - Universal optical coupler chip testing apparatus - Google Patents

Universal optical coupler chip testing apparatus Download PDF

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Publication number
CN203773022U
CN203773022U CN201420153523.5U CN201420153523U CN203773022U CN 203773022 U CN203773022 U CN 203773022U CN 201420153523 U CN201420153523 U CN 201420153523U CN 203773022 U CN203773022 U CN 203773022U
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China
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screen
test
optocoupler
touch
connector
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Expired - Fee Related
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CN201420153523.5U
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Chinese (zh)
Inventor
孙先松
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Yangtze University
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Yangtze University
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Abstract

The utility model relates to a universal optical coupler chip testing apparatus. The apparatus comprises a test circuit board (4), a touch-screen-equipped LCD display screen (1) with a touch screen, a button (8) and a PC (9), and is characterized in that the test circuit board (4) is internally provided with a main control CPI (14), a digital control current source (15), a simulation switch matrix (16), a replaceable packaging test seat (17), an A/D converter (20) and the like; the main control CPU (14) is a central processing unit of the whole testing apparatus, acquisition analysis processing of all control signals, display and data is finished by the main control CPU, and at the time when a result is displayed on the touch-screen-equipped LCD display screen (1), and test result data can also be sent to the PC (9) through an RS232 connector (12). By using the apparatus provided by the utility model, comprehensive testing can be carried out on the performance of various optical couplers, the model of a test chip can be expanded, fault self diagnosis and error self correction can be realized, and the apparatus also has the advantages of simple test method and high automation degree.

Description

A kind of general optocoupler apparatus for testing chip
Technical field:
The utility model relates to a kind of general optocoupler apparatus for testing chip, belongs to ic test technique field.
Background technology:
Optocoupler is the device that carrys out transmission of electric signals taking light as medium, it is the photoelectrical coupler that by " electrical-optical-electricity " conversion, input end signal is coupled to output terminal, the advantages such as the insulation because it has that volume is little, the life-span long, contactless, antijamming capability strong, between output and input, one-way transmission signal and very strong common mode inhibition capacity obtain application widely in digital circuit.Therefore the quality of optocoupler performance also just seems extremely important.At present the index on its databook providing is all just provided the choice and operation of optocoupler, if optocoupler is screened not based on performance index when application, can cause that system failure rate is high and reliability is low.
At present, carrying out optocoupler, to test best equipment be the integrated circuit tester from external import, on the one hand because it is general IC testing tool, is not the testing apparatus for optocoupler specially, therefore the test process that carries out optocoupler test bothers very much, can not robotization; And the content measurement arranging is also very complicated; The price of this equipment is very expensive on the other hand, and up to U.S. dollars up to a million, use cost is higher.The optical coupling tester also having only can only test all-purpose several chips of single channel, binary channels, triple channel, four-way, and also only judge the quality of optocoupler; Some programmable devices also can be tested the quality of optocoupler simply; The most simply test is exactly the quality that judges optocoupler with multimeter; But these several tests all can not test out the quality of optocoupler performance.
Based on the present situation of current optocoupler test, it is high that the utility model has designed a kind of automaticity, and test is simple, and cost performance is high, maintainability, extendibility, good portability, comprehensively new proving installation of test optocoupler performance index.
Summary of the invention:
In order to overcome the deficiencies in the prior art, the purpose of this utility model is to provide a kind of general optocoupler apparatus for testing chip, can comprehensively test the performance of various optocouplers, the model of energy extend testing chip, can carry out fault self-diagnosis and error self-correcting, have the advantages that method of testing is simple, automaticity is high.
The utility model is to realize by following technical solution above-mentioned purpose.
In a kind of structure of general optocoupler apparatus for testing chip, be provided with testing circuit board, the LCD display with touch-screen, button, PC; In testing circuit board, be provided with test bench, communication interface, self-diagnosis unit switches, A/D conversion, power connector, LCD screen connector, button connector, the RS232 connector of power supply unit, master cpu, Numerical Controlled Current Source, analog switch matrix, replaceable encapsulation; LCD screen connector on testing circuit board shields stube cable by LCD and is connected with the LCD display with touch-screen; LCD screen stube cable is the shielding split conductor of 36 cores; Button connector on testing circuit board is connected with button by button stube cable; Button stube cable is shielding multiple twin 4 heart yearns; RS232 connector on testing circuit board is connected with PC serial ports by serial communication cable; Serial communication cable is the shielding line of 3 cores; Power connector on testing circuit board is connected with external power supply;
Described power supply unit provides power supply to LCD display, master cpu, A/D conversion, Numerical Controlled Current Source, the analog switch matrix with touch-screen;
The order that LCD display, button or the PC of described master cpu receiving belt touch-screen sends, sends to control to Numerical Controlled Current Source, analog switch matrix, A/D conversion and self-diagnosis unit switches more after treatment and carries out instruction; Master cpu is according to the corresponding package file configuration data of test chip, the pin of the test bench of control simulation switch matrix to replaceable encapsulation distributes corresponding, then control the measuring current that Numerical Controlled Current Source produces input end LED, with the signal of A/D conversion sampling optocoupler output, by all automatically tests step by step of the input of optocoupler, output performance index, and test result is presented in the LCD display with touch-screen or is transferred to PC by RS232 attachment unit interface show;
Described Numerical Controlled Current Source receives the steering order of master cpu, produces output measuring current after analog switch matrix switches adaptive optocoupler pin, and the test signal of optocoupler input end is provided;
Described analog switch matrix receives the steering order of master cpu, and each pin correspondence of optocoupler is connected in power supply, Numerical Controlled Current Source and A/D conversion;
Described A/D conversion receives the steering order of master cpu, and electric current, voltage to optocoupler input and output are sampled, and also test error are sampled;
Described self-diagnosis unit switches receives the steering order of master cpu, and the duty of Numerical Controlled Current Source and A/D conversion, analog switch matrix is sampled, and judgment means has non-fault;
The test bench of described replaceable encapsulation can be installed the socket of SOP and two kinds of encapsulation of DIP, and the signal that each pin of test bench connects is selected by the configuration of analog switch matrix; Can set up to the optocoupler of various models the library file of pin and encapsulation, user can revise and expand the model of opto-coupler chip to be measured, and when test, system prompt is replaced by corresponding test bench, and maintainability and extendibility are strong;
Described communication interface completes RS232 serial ports level conversion, provides PC to send the passage of order and reception test data;
The described LCD display with touch-screen is that touch-screen and LCD shield integrated screen, and touch-screen is resistance-type, and LCD screen is TFT display screen.
The utility model compared with prior art, its advantage is: be a kind of general optocoupler proving installation, the model of the extendible optocoupler of user, test is simple, energy full automatic working, and the performance index of test optocoupler are comprehensive, can carry out self diagnosis to fault, energy automatic error correction, cost performance is high, maintainability, extendibility, good portability.
Brief description of the drawings:
Fig. 1 is structural representation of the present utility model.
Fig. 2 is the structure control block diagram of the utility model test circuit plate portion.
Fig. 3 is test job process flow diagram of the present utility model.
In the drawings: 1. the LCD display with touch-screen, 2.LCD shields stube cable, 3. power connector, 4. testing circuit board, 5.LCD shields connector, 6. button connector, 7. button stube cable, 8. button, 9.PC machine, 10.PC machine serial ports, 11. serial communication cables, 12.RS232 connector, 13. power supply units, 14. master cpus, 15. Numerical Controlled Current Source, 16. analog switch matrix, 17. the test bench of replaceable encapsulation, 18. communication interfaces, 19. self-diagnosis unit switches, 20.A/D conversion.
Embodiment:
Below in conjunction with drawings and Examples, the utility model is further described.
A kind of general optocoupler apparatus for testing chip of the utility model, comprises testing circuit board 4, LCD display 1, button 8 and PC 9 with touch-screen; In testing circuit board 4, be provided with test bench 17, communication interface 18, self-diagnosis unit switches 19, A/D conversion 20, power connector 3, LCD screen connector 5, button connector 6, the RS232 connector 12 of power supply unit 13, master cpu 14, Numerical Controlled Current Source 15, analog switch matrix 16, replaceable encapsulation; LCD screen connector 5 on testing circuit board 4 shields stube cable 2 by LCD and is connected with the LCD display 1 with touch-screen; LCD screen stube cable 2 is the shielding split conductor of 36 cores; Button connector 6 on testing circuit board 4 is connected with button 8 by button stube cable 7; Button stube cable 7 is shielding multiple twin 4 heart yearns; Use test circuit board 4 carries out the test of optocoupler separately, must connect LCD display 1 and button 8 with touch-screen, and test function is selected or order can be passed through button 8 or touch screen operation; Master cpu 14 is CPU (central processing unit) of whole proving installation, all control signals, demonstration and data collection and analysis are processed and are all completed by it, also can by RS232 connector 12 test result data be delivered to PC 9 in showing result in the LCD display 1 with touch-screen; RS232 connector 12 on testing circuit board 4 is connected with PC 9 by the serial communication cable 11 of three cores; On PC 9, testing software is installed, has coordinated the test of quality and the performance index of opto-coupler chip with testing circuit board 4; In the time using PC 9 to test, proving installation also can mounting strap touch-screen LCD display 1 and button 8, directly control optocoupler proving installation at PC 9, comprise the transmission of the selection of chip model, self-inspection, error correction order, proving installation sends the test result of returning and shows on the screen of PC 9; Power connector 3 on testing circuit board 4 is connected with external power supply; Power connector 3 is power input interfaces of supplying with whole proving installation, input power requirement+5V, the above electric current of 2A;
Described power supply unit 13 provides power supply to LCD display 1, master cpu 14, A/D conversion 20, Numerical Controlled Current Source 15, the analog switch matrix 16 with touch-screen;
The order that LCD display 1, button 8 or the PC 9 of described master cpu 14 receiving belt touch-screens sends, sends and controls the instruction of carrying out test to Numerical Controlled Current Source 15, analog switch matrix 16, A/D conversion 20 and self-diagnosis unit switches 19 more after treatment; Master cpu 14 is according to the corresponding package file configuration data of test chip, the pin of the test bench 17 of control simulation switch matrix 16 to replaceable encapsulation distributes corresponding, then control the measuring current that Numerical Controlled Current Source 15 produces input end LED, with the signal of A/D conversion 20 sampling optocoupler outputs, by all automatically tests step by step of the input of optocoupler, output performance index, and test result is presented in the LCD display 1 with touch-screen or is transferred to PC 9 by RS232 connector 12 interfaces show;
Described Numerical Controlled Current Source 15 receives the steering order of master cpu 14, produces output measuring current after analog switch matrix 16 switches adaptive optocoupler pin, and the test signal of optocoupler input end is provided;
Described A/D conversion 20 receives the steering order of master cpu 14, and electric current, voltage to optocoupler input and output are sampled, and also test error are sampled;
Described analog switch matrix 16 receives the steering order of master cpu 14, and each pin correspondence of optocoupler is connected in power supply, Numerical Controlled Current Source 15 and A/D conversion 20;
Described self-diagnosis unit switches 19 receives the steering order of master cpu 14, and the duty of Numerical Controlled Current Source 15 and A/D conversion 20, analog switch matrix 16 is sampled, and carries out fault self-diagnosis, and judgment means has non-fault; Can also carry out error self-correcting;
The test bench 17 of described replaceable encapsulation can be installed the socket of SOP and two kinds of encapsulation of DIP, and the signal that each pin of test bench connects is selected by the configuration of analog switch matrix 16; Can set up to the optocoupler of various models the library file of pin and encapsulation, user can revise and expand the model of opto-coupler chip to be measured, and when test, system prompt is replaced by corresponding test bench, and maintainability and extendibility are strong; For the opto-coupler chip of difference encapsulation, in software, can configure by calling the data file of different encapsulation the test bench 17 of replaceable encapsulation, and which kind of test bench (mainly containing DIP, SOP test bench etc.) is installed and used in prompting;
Described communication interface 18 completes RS232 serial ports level conversion, provides PC to send the passage of order and reception test data;
The described LCD display with touch-screen 1 is for touch-screen and LCD shield integrated screen, and touch-screen is resistance-type, and LCD screen is TFT display screen.
As shown in Figure 3, be a kind of test job schematic flow sheet of general optocoupler apparatus for testing chip.
Whole test operation flow process is: select opto-coupler chip model to be tested, call chip corresponding pin and encapsulation library file, analog switch matrix be set, automatically carry out optocoupler test, LCD shows test results, result is sent by communication interface simultaneously.Automatically carrying out in optocoupler test process, device to test the following the key technical indexes of optocoupler: forward working current I f, forward operating voltage V f, direct impulse working current I fp, the test of input current thresholding, the test of forward input voltage range, input/output function test, current transfer ratio CTR, propagation delay time t pHL, t pLH(V tHHL, V tHLHcan arrange), rise time, fall time, output voltage test Vo, output collector current Ic test, power consumption test.

Claims (6)

1. a general optocoupler apparatus for testing chip, comprises testing circuit board (4), the LCD display (1) with touch-screen, button (8), PC (9); It is characterized in that being provided with test bench (17), communication interface (18), self-diagnosis unit switches (19), A/D conversion (20), power connector (3), LCD screen connector (5), button connector (6), the RS232 connector (12) of power supply unit (13), master cpu (14), Numerical Controlled Current Source (15), analog switch matrix (16), replaceable encapsulation in testing circuit board (4); LCD screen connector (5) on testing circuit board (4) shields stube cable (2) by LCD and is connected with the LCD display (1) with touch-screen; Button connector (6) on testing circuit board (4) is connected with button (8) by button stube cable (7); RS232 connector (12) on testing circuit board (4) is connected with PC serial ports (10) by serial communication cable (11); Power connector (3) on testing circuit board (4) is connected with external power supply;
Described power supply unit (13) provides power supply to LCD display (1), master cpu (14), A/D conversion (20), Numerical Controlled Current Source (15), the analog switch matrix (16) with touch-screen;
The order that LCD display (1), button (8) or the PC (9) of described master cpu (14) receiving belt touch-screen sends, sends to control to Numerical Controlled Current Source (15), analog switch matrix (16), A/D conversion (20) and self-diagnosis unit switches (19) more after treatment and carries out instruction;
Described Numerical Controlled Current Source (15) receives the steering order of master cpu (14), produces output measuring current after analog switch matrix (16) switches adaptive optocoupler pin, and the test signal of optocoupler input end is provided;
Described analog switch matrix (16) receives the steering order of master cpu (14), and each pin correspondence of optocoupler is connected in power supply, Numerical Controlled Current Source (15) and A/D conversion (20);
Described A/D conversion (20) receives the steering order of master cpu (14), and electric current, voltage to optocoupler input and output are sampled, and also test error are sampled;
Described self-diagnosis unit switches (19) receives the steering order of master cpu (14), Numerical Controlled Current Source (15) and A/D is changed to the duty of (20), analog switch matrix (16) and samples;
Described communication interface (18) completes RS232 serial ports level conversion, provides PC to send the passage of order and reception test data.
2. the general optocoupler apparatus for testing chip of one according to claim 1, is characterized in that LCD screen stube cable (2) is the shielding split conductor of 36 cores.
3. the general optocoupler apparatus for testing chip of one according to claim 1, is characterized in that button stube cable (7) is for shielding multiple twin 4 heart yearns.
4. the general optocoupler apparatus for testing chip of one according to claim 1, is characterized in that serial communication cable (11) is the shielding of 3 cores.
5. according to the general optocoupler apparatus for testing chip of the one described in claim 2,3,4, the test bench (17) that it is characterized in that described replaceable encapsulation can be installed the socket of SOP and two kinds of encapsulation of DIP, and the signal that each pin of test bench connects selects by the configuration of analog switch matrix (16).
6. the general optocoupler apparatus for testing chip of one according to claim 5, is characterized in that the described LCD display with touch-screen (1) is for touch-screen and LCD shield integrated screen, and touch-screen is resistance-type, and LCD screen is TFT display screen.
CN201420153523.5U 2014-03-31 2014-03-31 Universal optical coupler chip testing apparatus Expired - Fee Related CN203773022U (en)

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Application Number Priority Date Filing Date Title
CN201420153523.5U CN203773022U (en) 2014-03-31 2014-03-31 Universal optical coupler chip testing apparatus

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Application Number Priority Date Filing Date Title
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106873436A (en) * 2015-12-10 2017-06-20 北京铁路信号有限公司 Optocoupler transfer ratio automatic testing equipment and system
CN108983760A (en) * 2018-10-16 2018-12-11 昆明北方红外技术股份有限公司 Function of the MCU and source current test device
CN111913471A (en) * 2020-07-21 2020-11-10 北京京瀚禹电子工程技术有限公司 Testing device
CN114325312A (en) * 2021-12-20 2022-04-12 锐石创芯(深圳)科技股份有限公司 Chip testing device, chip testing system and data acquisition method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106873436A (en) * 2015-12-10 2017-06-20 北京铁路信号有限公司 Optocoupler transfer ratio automatic testing equipment and system
CN108983760A (en) * 2018-10-16 2018-12-11 昆明北方红外技术股份有限公司 Function of the MCU and source current test device
CN111913471A (en) * 2020-07-21 2020-11-10 北京京瀚禹电子工程技术有限公司 Testing device
CN114325312A (en) * 2021-12-20 2022-04-12 锐石创芯(深圳)科技股份有限公司 Chip testing device, chip testing system and data acquisition method

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140813

Termination date: 20150331

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