CN108546968A - 一种差异化孔同步电镀填充的方法和电镀装置 - Google Patents
一种差异化孔同步电镀填充的方法和电镀装置 Download PDFInfo
- Publication number
- CN108546968A CN108546968A CN201810339287.9A CN201810339287A CN108546968A CN 108546968 A CN108546968 A CN 108546968A CN 201810339287 A CN201810339287 A CN 201810339287A CN 108546968 A CN108546968 A CN 108546968A
- Authority
- CN
- China
- Prior art keywords
- cavity
- wafer
- hole
- plating
- synchronizes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007747 plating Methods 0.000 title claims abstract description 47
- 238000000034 method Methods 0.000 title claims abstract description 34
- 230000004069 differentiation Effects 0.000 title claims abstract description 24
- 239000007788 liquid Substances 0.000 claims abstract description 34
- 238000009713 electroplating Methods 0.000 claims abstract description 29
- 239000011521 glass Substances 0.000 claims description 13
- 230000007246 mechanism Effects 0.000 claims description 11
- 239000002699 waste material Substances 0.000 claims description 10
- 238000007599 discharging Methods 0.000 claims description 9
- 230000005540 biological transmission Effects 0.000 claims description 8
- 238000006243 chemical reaction Methods 0.000 claims description 5
- 239000003795 chemical substances by application Substances 0.000 claims description 5
- 239000013307 optical fiber Substances 0.000 claims description 5
- 239000003112 inhibitor Substances 0.000 claims description 4
- 230000008021 deposition Effects 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims description 3
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 238000005516 engineering process Methods 0.000 abstract description 10
- 239000010949 copper Substances 0.000 abstract description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract description 8
- 229910052802 copper Inorganic materials 0.000 abstract description 8
- 238000010438 heat treatment Methods 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000009736 wetting Methods 0.000 abstract description 3
- 230000008859 change Effects 0.000 abstract description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 238000002791 soaking Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 241000931526 Acer campestre Species 0.000 description 1
- -1 accelerator Substances 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000000708 deep reactive-ion etching Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 208000002925 dental caries Diseases 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004093 laser heating Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/024—Electroplating of selected surface areas using locally applied electromagnetic radiation, e.g. lasers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/04—Removal of gases or vapours ; Gas or pressure control
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/022—Electroplating of selected surface areas using masking means
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76898—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics formed through a semiconductor substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
- H01L23/53228—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being copper
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Sustainable Development (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Automation & Control Theory (AREA)
- Electroplating Methods And Accessories (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
本发明涉及电子制造技术领域,特别是一种差异化孔同步电镀填充的方法和电镀装置;所述的一种差异化孔同步电镀填充的方法,采用激光照射作为外加能场辅助差异化孔同步电镀填充,采用掩膜板或数字无掩膜技术,精准地对不同位置和不同尺寸的孔进行加温。通过温度差异促使不同区域填充速率发生变化,从而实现差异化孔一次同步电镀填充。在电镀液浸泡预润湿和电镀填充铜的工艺中,使用激光对加工有孔的晶圆进行预热。激光需透过与晶圆微孔位置对应的掩膜板,对晶圆上小孔上表面进行局部精准加温。晶圆上部分小孔表面及附近的电镀液被加热后,使得电镀液黏度和表面张力变小,更加容易进入深宽比较高的微孔,从而加快电镀速度、减少孔洞。
Description
技术领域
本发明涉及电子制造技术领域,特别是一种差异化孔同步电镀填充的方法和电镀装置。
背景技术
硅通孔技术(TSV,Through Silicon Via)是一种三维封装技术,它的发展是为了满足超大规模集成电路(VLSI)发展的需要。硅通孔技术有望取代传统的二维互连,采用三维互连的技术,使芯片在三维方向堆叠的密度最大,外形尺寸最小,并且大大改善芯片速度和降低功耗,因而被业内人士称为继引线键合(WB)、载带自动焊(TAB)和倒装芯片(FC)之后的第四代封装技术。
通常,晶圆TSV结构的制备流程主要有:
(1)通孔制备。采用湿法刻蚀(WCE)、干法刻蚀(DRIE)或激光打孔(LaserDrilling)等方法在晶圆上制备高深宽比的硅通道;
(2)通孔电镀。在通孔侧壁上制备SiO2绝缘层后,通过预先制作的金属种子层电镀金属铜使金属充满整个硅通孔;
(3)化学机械抛光(CMP)。在抛光液和机械力的作用下,使晶圆变薄,露出硅通孔的金属。
其中,(2)通孔电镀金属铜实现电信号互连是TSV技术关键步骤,这一步骤的工艺成本占TSV成本的40%。
目前,其中(2)通孔电镀金属铜Cu常使用由底到顶电镀技术(bottom-upelectroplating),其流程为将加工有TSV结构、溅射种子层后的晶圆浸泡在含有加速剂、抑制剂、整平剂等成分的电镀液中,电镀液从TSV通孔进入,与露出的种子层接触并开始沉积金属。电镀开始后,铜沿着这一路径从底到顶开始沉积,逐渐将通孔完全填充。
但是,根据功能的需求,同一个晶圆上通过加工有孔径大小不同的TSV孔,在电镀过程中,大孔由于尺寸较大,电镀液容易进入,从而填充快;而部分TSV孔的孔径极小(直径2-50μm),电镀液难以进入孔内,导致电镀填充慢、且电镀填充铜存在孔洞、缝隙等缺陷,严重影响芯片的可靠性。
同样,在印制电路板中,同一块电路板上也存在尺寸各异的微孔,其孔的电镀填充也存在着同样的问题。
不论是TSV还是印制电路板上孔的填充,目前还没有可以实现不同尺寸的孔一次同步填充的方法。因此,有必要发明一种可以克服上述问题的方法和装置,实现差异化孔一次同步电镀填充。
发明内容
针对上述缺陷,本发明的目的在于提出一种通过激光加热不同区域促使不同区域填充速率各异,从而实现差异化孔同步电镀填充的方法及电镀装置。
为达此目的,本发明采用以下技术方案:
一种差异化孔同步电镀填充的方法,其包括如下步骤:
步骤a:将加工有孔的晶圆放进腔体内,腔体内填充有电镀液;对腔体抽真空,促使电镀液中的气泡逃逸;掩膜板与密闭反应腔内的晶圆对齐,打开集成光源块发出激光,激光透过掩膜板上透光区域,照射到晶圆上有孔的位置;
步骤b:将步骤a中充分浸泡后的晶圆与电镀电源的负极相连,作为电镀阴极;
步骤c:开启电镀电源,进行阴极铜离子沉积反应;
步骤d:电镀结束后关闭电镀电源、集成光源块和真空系统,取出完成电镀填充的成品。
更优的,所述步骤a中的所述晶圆的孔的直径为2-50μm。
更优的,所述步骤a中所述电镀液含有加速剂、抑制剂和/或整平剂。
所述加速剂可加快电镀填充的速度提高电镀填充效率;所述抑制剂可抑制其他不需要的离子产生,所述整平剂可提高电镀填充后孔的内壁更加平整,使得晶圆上孔的电镀填充的质量更高。
更优的,所述步骤a中所述激光的波长为400nm-1mm,功率为10mW-10W。
经过多次实验结合真空、温度及电镀参数发现,只有激光的波长为400nm-1mm,功率为10mW-10W的情况下,采用上述工艺方法才能对晶圆不同直径的孔达到更好的电镀填充效果。
更优的,所述步骤a中所述腔体内放置的晶圆尺寸为12英寸以下,使用真空泵对腔体抽真空至真空度小于或等于10e-5Pa。经过多次实验结合真空、温度及电镀参数发现,只有真空度小于或等于10e-5Pa的情况下,采用上述工艺方法才能对尺寸在12英寸以下的晶圆不同直径的孔达到更好的电镀填充效果。
一种应用如上所述的一种差异化孔同步电镀填充的方法的电镀装置,其包括:腔体、晶圆支架、盖体、真空系统和锁紧机构;所述腔体上端设有开口;所述盖体设有腔体玻璃板、掩膜板、集成光源块和光纤;所述腔体玻璃板位于所述盖体与所述开口盖合的平面;所述掩膜板加工有对应晶圆上孔的位置的透光区域;所述集成光源块位于所述掩膜板和所述腔体玻璃板上方;所述晶圆支架设置于所述腔体内部的空腔内,所述盖体通过所述锁紧机构与所述开口盖合锁紧;所述真空系统用于将所述腔体内抽成真空。
更优的,所述盖体设有吸附机构,所述掩膜板通过所述吸附机构吸附固定于所述腔体玻璃板。使得掩膜板与腔体玻璃板的贴合度更高,在激光关照下不会出现干扰。
具体的,所述集成光源块可发出波长为400nm-1mm,功率为10mW-10W的激光。
更优的,所述晶圆支架的底部设有废液排放孔,所述废液排放孔连接有废液排放管道;所述腔体内设有的供电电路与外部通过电镀电源线连通。
更优的,所述的一种电镀装置,其还设有控制系统,所述控制系统与所述腔体内设有的集成光源块、供电电路、真空系统、温控系统和时间控制器电联接。所述控制系统可分别控制激光光源的功率和照射时间,可分别控制腔体的真空度、温度、保压时间和保温时间等,可分别控制电镀电源电压大小(恒电位模式)、电流大小(恒电流模式)、电镀时间等,使得所述电镀装置的电镀操作可实现完全自动化。
本发明提出的一种差异化孔同步电镀填充的方法,采用激光照射作为外加能场辅助差异化孔同步电镀填充,采用掩膜板或数字无掩膜技术,精准地对不同位置和不同尺寸的孔进行加温。通过温度差异促使不同区域填充速率发生变化,从而实现差异化孔一次同步电镀填充。在电镀液浸泡预润湿和电镀填充铜的工艺中,使用激光对加工有孔的晶圆进行预热。在这两步工艺中,激光需透过与晶圆微孔位置对应的掩膜板,对晶圆上小孔上表面进行局部精准加温。晶圆上部分小孔表面及附近的电镀液被加热后,使得电镀液黏度和表面张力变小,更加容易进入深宽比较高的微孔,从而加快电镀速度、减少孔洞。
附图说明
图1是本发明的一个实施例的差异化孔同步电镀填充的方法的流程图;
图2是本发明的一个实施例的局部结构示意图。
其中:盖锁紧机构501,真空系统502,晶圆支架503,废液排放孔504,废液排放管道505,电镀电源506,腔体507,腔盖玻璃板508,掩膜板509,集成光源块510,掩膜板吸附机构511,光纤512。
具体实施方式
下面结合附图并通过具体实施方式来进一步说明本发明的技术方案。
如图1和2所示,一种差异化孔同步电镀填充的方法,其特征在于,包括如下步骤:步骤a:将加工有TSV孔的晶圆放进的腔体507的晶圆支架503内,腔体507内填充有电镀液;通过真空系统502对腔体507抽真空,促使电镀液中的气泡逃逸,促进电镀液进入TSV孔中;将掩膜板509放入集成光源块510中,与腔体507内晶圆支架503上的晶圆对齐,激光光源通过光纤512传输到集成光源块510中,激光透过掩膜板509上透光区域,精确照射到晶圆上的TSV孔,精准控制TSV孔区域升温,促进电镀液流动,并进入孔径较小、宽深比较大的TSV孔中,并与孔壁实现良好的润湿。
步骤b:将步骤a充分浸泡的晶圆与电镀电源506的负极相连,作为电镀阴极。
步骤c:开启电镀电源506,进行阴极铜离子沉积反应。
步骤d:电镀结束后关闭电镀电源、集成光源块510和真空系统502,取出完成电镀填充的成品。
具体地,所述步骤a中TSV孔的直径为2-50μm;
具体地,所述步骤a中电镀液含有加速剂、抑制剂、整平剂等成分;
具体地,所述步骤a利用腔盖玻璃板508为透明,允许激光透过并照射进腔体507内;
具体地,所述步骤a中掩膜板509加工有透光区域,透光区域与晶圆上TSV孔一一对应;
具体地,所述步骤a中所述激光波长为1mm,功率为10W。
具体地,所述步骤a腔体内放置的晶圆片尺寸为12英寸,使用真空系统502对腔体507抽真空至真空度等于5Pa;
具体地,所述步骤a、所述步骤b和所述步骤c使用控制系统分别控制激光光源的功率和照射时间,分别控制腔体507的真空度、温度、保压时间和保温时间等,分别控制电镀电源506电压大小(恒电位模式)、电流大小(恒电流模式)、电镀时间等。
如图2所示,一种应用上述的一种差异化孔同步电镀填充的方法的电镀装置,其包括:腔盖锁紧机构、真空系统、晶圆支架、废液排放孔、废液排放管道、电镀电源、腔体、腔盖玻璃板、掩膜板、集成光源块、掩膜板吸附机构、光纤和控制系统。
具体地,所述腔盖玻璃板为透明,并允许激光透过并照射进腔体内;
具体地,所述集成光源块可发出波长为400nm-1mm,功率为10mW-10W的激光;
具体地,所述掩膜板加工有对应晶圆上孔的位置的透光区域;
优选地,所述掩膜板可采用数字无掩膜技术代替,实现同时对大小不同的孔进行激光加温;
具体地,所述腔体可容纳12英寸以下的尺寸的晶圆片,可使用真空泵对密闭腔体抽真空至真空度小于或等于10e-5Pa;
具体地,所述电镀电源包括电镀正极和电镀负极;
具体地,所述控制系统可分别控制激光光源的功率和照射时间,可分别控制腔体的真空度、温度、保压时间和保温时间等,可分别控制电镀电源电压大小(恒电位模式)、电流大小(恒电流模式)、电镀时间等。
所述的差异化孔同步电镀填充的方法和电镀装置,在电镀液浸泡预润湿和电镀填充铜的工艺中,使用激光对加工有孔的晶圆进行预热。在这两步工艺中,激光需透过与晶圆微孔位置对应的掩膜板,对晶圆上小孔上表面进行局部精准加温。晶圆上部分小孔表面及附近的电镀液被加热后,使得电镀液黏度和表面张力变小,更加容易进入深宽比较高的微孔,从而加快电镀速度、减少孔洞。
以上结合具体实施例描述了本发明的技术原理。这些描述只是为了解释本发明的原理,而不能以任何方式解释为对本发明保护范围的限制。基于此处的解释,本领域的技术人员不需要付出创造性的劳动即可联想到本发明的其它具体实施方式,这些方式都将落入本发明的保护范围之内。
Claims (10)
1.一种差异化孔同步电镀填充的方法,其特征在于,包括如下步骤:
步骤a:将加工有孔的晶圆放进腔体内,腔体内填充有电镀液;对腔体抽真空,促使电镀液中的气泡逃逸;掩膜板与密闭反应腔内的晶圆对齐,打开集成光源块发出激光,激光透过掩膜板上透光区域,照射到晶圆上有孔的位置;
步骤b:将步骤a中充分浸泡后的晶圆与电镀电源的负极相连,作为电镀阴极;
步骤c:开启电镀电源,进行阴极铜离子沉积反应;
步骤d:电镀结束后关闭电镀电源、集成光源块和真空系统,取出完成电镀填充的成品。
2.根据权利要求1所述的一种差异化孔同步电镀填充的方法,其特征在于,所述步骤a中的所述晶圆的孔的直径为2-50μm。
3.根据权利要求1所述的一种差异化孔同步电镀填充的方法,其特征在于,所述步骤a中所述电镀液含有加速剂、抑制剂和/或整平剂。
4.根据权利要求1所述的一种差异化孔同步电镀填充的方法,其特征在于,所述步骤a中所述激光的波长为400nm-1mm,功率为10mW~10W。
5.根据权利要求1所述的一种差异化孔同步电镀填充的方法,其特征在于,所述步骤a中所述腔体内放置的晶圆尺寸为12英寸以下,使用真空泵对腔体抽真空至真空度小于或等于10e-5Pa。
6.一种应用如权利要求1-5中任意一项所述的一种差异化孔同步电镀填充的方法的电镀装置,其特征在于,包括:腔体、晶圆支架、盖体、真空系统和锁紧机构;
所述腔体上端设有开口;
所述盖体设有腔体玻璃板、掩膜板、集成光源块和光纤;所述腔体玻璃板位于所述盖体与所述开口盖合的平面;所述掩膜板加工有对应晶圆上孔的位置的透光区域;所述集成光源块位于所述掩膜板和所述腔体玻璃板上方;
所述晶圆支架设置于所述腔体内部的空腔内,所述盖体通过所述锁紧机构与所述开口盖合锁紧;所述真空系统用于将所述腔体内抽成真空。
7.根据权利要求6所述的一种电镀装置,其特征在于,所述盖体设有吸附机构,所述掩膜板通过所述吸附机构吸附固定于所述腔体玻璃板。
8.根据权利要求6所述的一种电镀装置,其特征在于,所述集成光源块可发出波长为400nm-1mm,功率为10mW-10W的激光。
9.根据权利要求6所述的一种电镀装置,其特征在于,所述晶圆支架的底部设有废液排放孔,所述废液排放孔连接有废液排放管道;所述腔体内设有的供电电路与外部通过电镀电源线连通。
10.根据权利要求6所述的一种电镀装置,其特征在于,还设有控制系统,所述控制系统与所述腔体内设有的集成光源块、供电电路、真空系统、温控系统和时间控制器电联接。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810339287.9A CN108546968B (zh) | 2018-04-16 | 2018-04-16 | 一种差异化孔同步电镀填充的方法和电镀装置 |
US16/383,852 US10487411B1 (en) | 2018-04-16 | 2019-04-15 | Method for synchronous electroplating filling of differential vias and electroplating device implementing same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810339287.9A CN108546968B (zh) | 2018-04-16 | 2018-04-16 | 一种差异化孔同步电镀填充的方法和电镀装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108546968A true CN108546968A (zh) | 2018-09-18 |
CN108546968B CN108546968B (zh) | 2019-03-19 |
Family
ID=63515031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810339287.9A Active CN108546968B (zh) | 2018-04-16 | 2018-04-16 | 一种差异化孔同步电镀填充的方法和电镀装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US10487411B1 (zh) |
CN (1) | CN108546968B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111334833A (zh) * | 2020-04-27 | 2020-06-26 | 侯光微 | 一种差异化孔同步电镀填充方法及系统 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1159790A (en) * | 1979-05-08 | 1984-01-03 | Robert L. Melcher | Method for locally enhancing electroplating rates |
CN101501249A (zh) * | 2006-08-07 | 2009-08-05 | 株式会社自动网络技术研究所 | 局部电镀方法、激光电镀设备以及电镀构件 |
CN102286760A (zh) * | 2010-05-19 | 2011-12-21 | 诺发系统有限公司 | 用金属电化学填充高纵横比的大型凹入特征的方法、水溶液电镀槽溶液、电镀设备以及系统 |
CN202090077U (zh) * | 2011-05-13 | 2011-12-28 | 吴燕 | 晶圆处理装置 |
CN103103585A (zh) * | 2012-12-29 | 2013-05-15 | 上海新阳半导体材料股份有限公司 | 一种用于铜互连的高速凸点电镀方法 |
CN103361694A (zh) * | 2013-08-08 | 2013-10-23 | 上海新阳半导体材料股份有限公司 | 一种用于3d铜互连高深宽比硅通孔技术微孔电镀填铜方法 |
CN204550745U (zh) * | 2014-12-31 | 2015-08-12 | 上海新阳半导体材料股份有限公司 | 晶圆电镀前处理装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2465747A (en) * | 1945-04-30 | 1949-03-29 | Rca Corp | Apparatus for electroplating metal |
US5840675A (en) * | 1996-02-28 | 1998-11-24 | The Procter And Gamble Company | Controlled released fabric care article |
TW522455B (en) * | 1998-11-09 | 2003-03-01 | Ebara Corp | Plating method and apparatus therefor |
US6554585B1 (en) * | 2001-02-05 | 2003-04-29 | Giorgio Maracchi | Power generating assembly capable of dual-functionality |
US8404095B2 (en) * | 2009-06-02 | 2013-03-26 | The United States Of America, As Represented By The Secretary Of The Navy | Preparing electrodes for electroplating |
US9455139B2 (en) * | 2009-06-17 | 2016-09-27 | Novellus Systems, Inc. | Methods and apparatus for wetting pretreatment for through resist metal plating |
US9677188B2 (en) * | 2009-06-17 | 2017-06-13 | Novellus Systems, Inc. | Electrofill vacuum plating cell |
KR20130013488A (ko) * | 2011-07-28 | 2013-02-06 | 한국과학기술원 | 진공 도금 장치 및 방법 |
-
2018
- 2018-04-16 CN CN201810339287.9A patent/CN108546968B/zh active Active
-
2019
- 2019-04-15 US US16/383,852 patent/US10487411B1/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1159790A (en) * | 1979-05-08 | 1984-01-03 | Robert L. Melcher | Method for locally enhancing electroplating rates |
CN101501249A (zh) * | 2006-08-07 | 2009-08-05 | 株式会社自动网络技术研究所 | 局部电镀方法、激光电镀设备以及电镀构件 |
CN102286760A (zh) * | 2010-05-19 | 2011-12-21 | 诺发系统有限公司 | 用金属电化学填充高纵横比的大型凹入特征的方法、水溶液电镀槽溶液、电镀设备以及系统 |
CN202090077U (zh) * | 2011-05-13 | 2011-12-28 | 吴燕 | 晶圆处理装置 |
CN103103585A (zh) * | 2012-12-29 | 2013-05-15 | 上海新阳半导体材料股份有限公司 | 一种用于铜互连的高速凸点电镀方法 |
CN103361694A (zh) * | 2013-08-08 | 2013-10-23 | 上海新阳半导体材料股份有限公司 | 一种用于3d铜互连高深宽比硅通孔技术微孔电镀填铜方法 |
CN204550745U (zh) * | 2014-12-31 | 2015-08-12 | 上海新阳半导体材料股份有限公司 | 晶圆电镀前处理装置 |
Non-Patent Citations (1)
Title |
---|
杨越等: "激光强化金属沉积层性质研究", 《电镀与精饰》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111334833A (zh) * | 2020-04-27 | 2020-06-26 | 侯光微 | 一种差异化孔同步电镀填充方法及系统 |
Also Published As
Publication number | Publication date |
---|---|
US10487411B1 (en) | 2019-11-26 |
CN108546968B (zh) | 2019-03-19 |
US20190352789A1 (en) | 2019-11-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20160190007A1 (en) | A method for microvia filling by copper electroplating with tsv technology for 3d copper interconnection at high aspect ratio | |
US8784636B2 (en) | Plating apparatus and plating method | |
CN103305886B (zh) | 用于润湿预处理以进行贯通抗蚀剂金属电镀的方法和装置 | |
JP6900621B2 (ja) | ウェハレベルパッケージにおけるシリカ貫通電極の銅配線材に用いる銅電気めっき液及び電気めっき方法 | |
CN104244613A (zh) | 一种hdi板中金属化孔的制作方法 | |
CN104651893A (zh) | 用于电镀的碱预处理 | |
CN108546968B (zh) | 一种差异化孔同步电镀填充的方法和电镀装置 | |
TW200402483A (en) | Cu ECP planarization by insertion of polymer treatment step between gap fill and bulk fill steps | |
CN105357873A (zh) | 高纵横比的塞填镀hdi板及其制作方法 | |
CN105951137A (zh) | 一种hdi积层板盲埋孔镀铜浴 | |
JP3780302B2 (ja) | ビアホール及びスルーホールを有する基板のめっき方法 | |
CN105357901A (zh) | 一种pcb板埋孔的填孔方法 | |
CN111441071A (zh) | 用于玻璃通孔双面镀铜的电镀液及电镀方法 | |
CN114605080B (zh) | 一种基于交变电场辅助加工玻璃通孔的方法及蚀刻装置 | |
KR20130075765A (ko) | 반도체 장치의 제조 방법 및 반도체 장치 | |
CN116913861A (zh) | 一种tsv/tgv微通孔金属化方法 | |
CN105529299A (zh) | 一种电镀填充硅基tsv转接板的方法 | |
US20050139482A1 (en) | Plating method and plating apparatus | |
Koo et al. | Electrochemical process for 3D TSV without CMP and lithographic processes | |
CN103726085A (zh) | 深孔电镀的预处理方法 | |
US20040182715A1 (en) | Process and apparatus for air bubble removal during electrochemical processing | |
JP7407499B2 (ja) | 凹部又は貫通孔の形成方法、電極の形成方法 | |
CN115297618B (zh) | 一种雷达板pcb制造流程 | |
KR101605811B1 (ko) | Tsv 충전용 전해 구리 도금액 및 이를 이용한 tsv의 충전방법 | |
CN115802645A (zh) | 用于电子线路封装的电镀铜通孔填平方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |