CN108535626A - A kind of full-automatic testing device and method of the test of SOC single-particles - Google Patents
A kind of full-automatic testing device and method of the test of SOC single-particles Download PDFInfo
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- CN108535626A CN108535626A CN201711477725.XA CN201711477725A CN108535626A CN 108535626 A CN108535626 A CN 108535626A CN 201711477725 A CN201711477725 A CN 201711477725A CN 108535626 A CN108535626 A CN 108535626A
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- soc chip
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
A kind of full-automatic testing device of SOC single-particles test, including host, SOC test boards and programmable power supply；The SOC test boards include flash, tested SOC chip and electrification reset circuit；The host is tested SOC chip by designated command and traverses the storage region or module that are tested in SOC chip successively, is tested after SOC chip acquisition traversing result and is sent to host with the fixed cycle；Host receives and stores the traversing result that tested SOC chip is sent；Host supervision and storage are tested the electric current that SOC chip sends the state and programmable power supply of traversing result simultaneously, and host is additionally operable to the powering down and up of control programmable power supply；Host computer is tested the traversing result that SOC chip is sent and tested SOC chip sends the state of traversing result, and statistical method is then used to complete the test for being tested SOC chip.The invention also includes a kind of full-automatic testing methods of SOC single-particles test simultaneously.
Description
Technical field
The present invention relates to the full-automatic testing devices and method of a kind of test of SOC single-particles, belong to field of computer technology.
Background technology
Spatial processor may be caused storage content in memory bank to be mutated between " 0 ", " 1 " by radiation effect, to
Cause semiconductor circuit the logic state of mistake occur, influences the function of semiconductor devices, normally referred to as single-particle inversion
(SEU), it is also possible to cause cmos device the intrinsic silicon-controlled conducting that is triggered of parasitism, Low ESR is formed between power supply and ground
The latch phenomenon of high current access.For operating status of the test space processor under space environment, irradiated on ground
Experiment is necessary approach.The particle that irradiation particle accelerator can send a large amount of different-energies within a very short time (is set in advance
It is fixed) it is radiated required test space processor, and then imitate the processor in space environment in a short time and pass through for a long time
The suffered influence of irradiation.It needs to preengage in advance when the machine of particle accelerator, it is most valuable.And traditional approach tests SOC, is all
Manually control test board and reload program, it is on the one hand time-consuming, if on the other hand in downloading program process, irradiate continue into
It will cause statistical errors for row.
Invention content
The technical problem to be solved by the present invention is to：A kind of test of SOC single-particles is overcome the deficiencies of the prior art and provide
Full-automatic testing device and method, by building SOC test boards, the automation that tested SOC chip can be completed in conjunction with host is surveyed
Examination, improves measuring accuracy, shortens test period, testing reliability is promoted, while substantially saving human and material resources and time
Cost.
The object of the invention is achieved by the following technical programs：
A kind of full-automatic testing device of SOC single-particles test, including host, SOC test boards and programmable power supply；It is described
SOC test boards include flash, tested SOC chip and electrification reset circuit；
The host is tested SOC chip by designated command and traverses the storage region being tested in SOC chip or mould successively
Block is tested after SOC chip acquisition traversing result and is sent to host with the fixed cycle；Host receives and stores tested SOC chip hair
The traversing result sent；Host supervision and storage are tested the electric current that SOC chip sends the state and programmable power supply of traversing result simultaneously,
Host is additionally operable to the powering down and up of control programmable power supply；Host computer is tested the traversing result and tested SOC that SOC chip is sent
Chip sends the state of traversing result, and statistical method is then used to complete the test for being tested SOC chip；
When host does not receive the traversing result that above-mentioned tested SOC chip is sent within the fixed cycle, host judgement is tested SOC
Deadlock pattern occurs for chip；Then Host Command programmable power supply is powered back up, when tested SOC chip is powered back up, on
Reset circuit control is tested the reset routine in SOC chip reading flash, makes the storage region in tested SOC chip or mould
Block normal initialization.
The full-automatic testing device of above-mentioned SOC single-particles test, the host is by automatically controlling instruction or manually controlling
Designated command is tested SOC chip and traverses the storage region or module being tested in SOC chip successively.
The full-automatic testing device of above-mentioned SOC single-particles test, stating the traversing result that tested SOC chip is sent includes
The overturning error pattern that tested SOC chip occurs.
The full-automatic testing device of above-mentioned SOC single-particles test, the electric current of the host supervision programmable power supply work as program-controlled electric
When the electric current in source is more than 2 times of tested SOC chip rated current, the power-off of host computer control programmable power supply.
The full-automatic testing device of above-mentioned SOC single-particles test, the tested SOC chip is with the fixed cycle of 0.1s~3s
Traversing result is sent to host.
The full-automatic testing device of above-mentioned SOC single-particles test, it is described to be tested SOC chip transmission traversal knot in host supervision
The state of fruit and the electric current of programmable power supply, the current anomaly priority of programmable power supply are higher than tested SOC chip and send traversing result
Status fault pattern, i.e., it is preferential to control when host is tested the current anomaly of SOC chip by monitoring the electric current judgement of programmable power supply
Processing procedure control power cut-off.
The full-automatic testing device of above-mentioned SOC single-particles test, the SOC test boards further include power supply, and programmable power supply is logical
It crosses power supply to power to the other assemblies of SOC test boards, power supply is used to complete the voltage transformation of programmable power supply output.
The full-automatic testing device of above-mentioned SOC single-particles test, the SOC test boards further include Max3232 modules,
Max3232 modules are for the serial ports controller for testing tested SOC chip；Max3232 modules are for being tested SOC chip simultaneously
Serial communication between host.
A kind of full-automatic testing method of SOC single-particles test, includes the following steps：
Step 1: automatic mode or manual mode is selected to carry out the test of SOC single-particles on host；
Step 2: host by designated command be tested SOC chip traverse successively storage region in tested SOC chip or
Module, while host supervision and the electric current for storing the state and programmable power supply that are tested SOC chip transmission traversing result；
Step 3: host judges the electric current of programmable power supply；If above-mentioned current anomaly, test terminates, and is otherwise transferred to step
Rapid four；
Step 4: host judges to be tested the state that SOC chip sends traversing result；If above-mentioned state is normal, it is transferred to
Step 2 continues to traverse storage region or module in tested SOC chip, terminates until testing, is otherwise transferred to step 5；
Step 5: Host Command programmable power supply is powered back up, the storage region being tested in SOC chip or module initialization,
Then it is transferred to step 2, until test terminates.
The present invention has the advantages that compared with the prior art：
(1) test process compared with the prior art of apparatus of the present invention is easy to operate, in the case where human intervention is few
To test result, testing efficiency is high, and test period is short；
(2) host of apparatus of the present invention provides automatic protection to SOC test boards, if electric current is more than twice of rated limits from
Dynamic circuit breaker electric alarm can just power on after to be confirmed, the tested SOC chip of effective protection；
(3) apparatus of the present invention can substantially save the testing time, and prior art manual measurement pattern whole experiment process is extremely
Need two people that could complete to test less, after apparatus of the present invention and method, it is only necessary to which a personal monitoring and control apparatus of the present invention are just
It can complete entirely to test；And automatic decision SOC test chips crash and carry out power on operation automatically later, and which at least saves
About 10 time；
(4) apparatus of the present invention can promote measurement reaction precision, and automatic measurement can be with the cycle detection data of 0.1s, far
Much smaller than artificial most fast 1s in the prior art, while saving test period, faster Data Detection further improves survey
Accuracy of measurement.
Description of the drawings
Fig. 1 is a kind of full-automatic testing device composition schematic diagram of SOC single-particles test of the present invention；
Fig. 2 is a kind of flow chart of the full-automatic testing method of SOC single-particles test of the present invention.
Specific implementation mode
To make the object, technical solutions and advantages of the present invention clearer, the implementation below in conjunction with attached drawing to the present invention
Mode is described in further detail.
A kind of full-automatic testing device of SOC single-particles test, including remote monitor, host, SOC test boards and program-controlled
Power supply.SOC test boards include MAC module, sram modules, flash module, Max3232 modules, DDR modules, tested SOC chip,
Power module, electrification reset circuit, as shown in Figure 1.
Include multiple storage regions or module in tested SOC chip；Tested SOC chip according to the instruction of host successively time
The program of the storage region gone through in tested SOC chip storage region or module that either module traversal is tested in SOC chip is deposited
Storage is in flash module；After i.e. tested SOC chip receives the traversal instruction of host transmission, SOC chip is tested from flash module
Then middle reading traversal program is tested SOC chip and traverses the storage region or module being tested in SOC chip successively.
Tested SOC chip obtains above-mentioned traversing result, is tested SOC chip and is sent out with the fixed cycle of 0.1s~3s by serial ports
Give host；It is tested SOC chip in the present embodiment, above-mentioned traversing result is sent to by host with the fixed cycle of 0.5s, wherein on
State the overturning error pattern that traversing result includes the storage region or module generation in tested SOC chip.
Host is used to control tested SOC chip and traverses the storage region or module being tested in SOC chip successively, and host can
To traverse the memory block being tested in SOC chip successively by automatically controlling instruction or manually controlling the tested SOC chip of designated command
Domain or module, then host receive and store the traversing result that tested SOC chip is sent；It host supervision and stores tested simultaneously
SOC chip sends the electric current of the state and programmable power supply of traversing result, and host also controls the powering down and up of programmable power supply.Host
State by being tested traversing result and tested SOC chip transmission traversing result that SOC chip is sent is completed using statistical method
The test of tested SOC chip.
Specifically, host obtains the overturning mistake that tested SOC chip occurs from the traversing result that tested SOC chip is sent
Pattern；Host judges whether the state for being tested SOC chip transmission traversing result is normal, when tested SOC chip is logical with the fixed cycle
When crossing serial ports traversing result being sent to host, host judges that being tested SOC chip, deadlock pattern does not occur, when host is solid
Judge that being tested SOC chip occurs deadlock pattern, this reality when not receiving the traversing result that tested SOC chip is sent in fixed cycle
It applies in example and not to receive the traversing result that tested SOC chip is sent in 1s when host and then judge that event of crashing occurs for tested SOC chip
Barrier pattern.
The purpose of the electric current of host supervision programmable power supply is to judge to be tested whether SOC chip current anomaly occurs, when program-controlled
When the electric current of power supply is more than 2 times of tested SOC chip rated current, host judgement is tested the current anomaly of SOC chip, host control
Processing procedure control power cut-off avoids current anomaly from causing the physical damnification of tested SOC chip.It is tested SOC chip hair in host supervision
It send in the state of traversing result and the current course of programmable power supply, the priority of the electric current of programmable power supply is higher than tested SOC chip
The state of traversing result is sent, i.e., when host is tested the current anomaly of SOC chip by monitoring the electric current judgement of programmable power supply, directly
Connect control programmable power supply power-off.
When host judges that being tested SOC chip occurs deadlock pattern, host sends designated command journey to programmable power supply
Power cut-off is controlled, then host sends the power-up of designated command programmable power supply to programmable power supply, and programmable power supply is used for SOC test boards
Power supply.When tested SOC chip is powered back up, electrification reset circuit sends electrification reset pulse to tested SOC chip, is tested
After SOC chip receives electrification reset pulse, the reset routine being tested in SOC chip reading flash, to ensure tested SOC chip
Interior storage region or module normal initialization.
To host after remote monitor is used to monitor that host to send to tested SOC chip and instructs, tested SOC chip traverses
The traversing result of transmission, the electric current of the programmable power supply of host supervision, the power-off of host computer control programmable power supply, while remote monitor energy
The cut-offing instruction for the instruction and host computer control programmable power supply that enough control host is sent to tested SOC chip.Remote monitor can be with
Far from host, it is advantageously implemented remotely monitor and control, while convenient for the equipment arrangement in test process, it is attached to reduce test environment
Close equipment is placed.
Power supply is used to complete the voltage transformation of programmable power supply output, other are tested in the SOC test boards such as SOC chip to meet
The voltage of component normal work needs.Programmable power supply has the multiple output functions such as V1, V2, V3, V4, can expire with power supply cooperation
The voltage of other assemblies normal work needs in the multiple and different tested SOC chips of foot, SOC test boards.
MAC module is used to test the Ethernet transmission control unit (TCU) examination of tested SOC chip, and MAC module can measure Ethernet
Each operating mode of controlling transmission controller.
On the one hand serial port module of the Max3232 modules as SOC test boards is used to test the serial ports control of tested SOC chip
Whether device processed is normal；The serial communication that another aspect Max3232 modules are used to be tested between SOC chip and host, i.e. host are logical
It crosses Max3232 modules and sends instruction to tested SOC chip, be tested SOC chip and pass through Max3232 module hosts transmission traversal knot
Fruit.
Whether the DDR control modules function that DDR modules are used to test tested SOC chip is normal.
Whether the sram storage controls that sram modules are used to test tested SOC chip are normal.
A kind of full-automatic testing method of SOC single-particles test, as shown in Fig. 2, using the full-automatic of SOC single-particles test
Test is realized, is included the following steps：
Step 1: automatic mode or manual mode is selected to carry out the test of SOC single-particles on host；
Step 2: host by designated command be tested SOC chip traverse successively storage region in tested SOC chip or
Module, while host supervision and the electric current for storing the state and programmable power supply that are tested SOC chip transmission traversing result；
Step 3: host judges the electric current of programmable power supply；If above-mentioned current anomaly, test terminates, and is otherwise transferred to step
Rapid four；
Step 4: host judges to be tested the state that SOC chip sends traversing result；If above-mentioned state is normal, it is transferred to
Step 2 continues to traverse storage region or module in tested SOC chip, terminates until testing, is otherwise transferred to step 5；
Step 5: Host Command programmable power supply is powered back up, the storage region being tested in SOC chip or module initialization,
Then it is transferred to step 2, until test terminates.
In the present apparatus and invention operating process, SOC test boards are integrally fixed inside particle emitter, by adjusting SOC
The position of test board and distance, adjustment irradiation particle is beaten to tested SOC test chips, while irradiation particle being avoided to influence other electricity
Road, programmable power supply and host are connected by data line with SOC test boards all other than experimental situation.
The content that description in the present invention is not described in detail belongs to the known technology of those skilled in the art.
Claims (9)
1. a kind of full-automatic testing device of SOC single-particles test, it is characterised in that：Including host, SOC test boards and program-controlled electric
Source；The SOC test boards include flash, tested SOC chip and electrification reset circuit；
The host is tested SOC chip by designated command and traverses the storage region or module that are tested in SOC chip, quilt successively
It surveys after SOC chip acquisition traversing result and host is sent to the fixed cycle；Host receives and stores time that tested SOC chip is sent
Go through result；Host supervision and storage are tested the electric current that SOC chip sends the state and programmable power supply of traversing result simultaneously, and host is also
Powering down and up for controlling programmable power supply；Host computer is tested the traversing result that SOC chip is sent and tested SOC chip hair
The state of traversing result is sent, statistical method is then used to complete the test for being tested SOC chip；
When host does not receive the traversing result that above-mentioned tested SOC chip is sent within the fixed cycle, host judgement is tested SOC chip
Deadlock pattern occurs；Then Host Command programmable power supply is powered back up, and when tested SOC chip is powered back up, is above replied by cable
Position circuit control is tested the reset routine in SOC chip reading flash, makes the storage region being tested in SOC chip or module just
Often initialization.
2. a kind of full-automatic testing device of SOC single-particles test according to claim 1, it is characterised in that：The master
Machine traverses the memory block being tested in SOC chip successively by automatically controlling instruction or manually controlling the tested SOC chip of designated command
Domain or module.
3. a kind of full-automatic testing device of SOC single-particles test according to claim 1, it is characterised in that：It is stated
The traversing result that tested SOC chip is sent includes the overturning error pattern that tested SOC chip occurs.
4. a kind of full-automatic testing device of SOC single-particles test according to claim 1, it is characterised in that：The master
Machine monitors the electric current of programmable power supply, when the electric current of programmable power supply is more than 2 times of tested SOC chip rated current, host computer control
Programmable power supply powers off.
5. a kind of full-automatic testing device of SOC single-particles test according to claim 1, it is characterised in that：The quilt
It surveys SOC chip and traversing result is sent to by host with the fixed cycle of 0.1s~3s.
6. a kind of full-automatic testing device of SOC single-particles test according to claim 1, it is characterised in that：It is described
Host supervision is tested the electric current that SOC chip sends the state and programmable power supply of traversing result, and the current anomaly of programmable power supply is preferential
Grade sends the status fault pattern of traversing result higher than tested SOC chip, i.e. host is judged by monitoring the electric current of programmable power supply
When the current anomaly of tested SOC chip, the power-off of priority acccess control programmable power supply.
7. a kind of full-automatic testing device of SOC single-particles test according to one of claim 1~6, it is characterised in that：
The SOC test boards further include power supply, and programmable power supply is powered by power supply to the other assemblies of SOC test boards, and power supply has been used for
The voltage transformation exported at programmable power supply.
8. a kind of full-automatic testing device of SOC single-particles test according to one of claim 1~6, it is characterised in that：
The SOC test boards further include Max3232 modules, and Max3232 modules are used for the serial ports for testing tested SOC chip and control
Device；The serial communication that Max3232 modules are used to be tested between SOC chip and host simultaneously.
9. a kind of full-automatic testing method of SOC single-particles test, it is characterised in that：Include the following steps：
Step 1: automatic mode or manual mode is selected to carry out the test of SOC single-particles on host；
Step 2: host is tested SOC chip by designated command traverses the storage region being tested in SOC chip or mould successively
Block, while host supervision and the electric current for storing the state and programmable power supply that are tested SOC chip transmission traversing result；
Step 3: host judges the electric current of programmable power supply；If above-mentioned current anomaly, test terminates, and is otherwise transferred to step 4；
Step 4: host judges to be tested the state that SOC chip sends traversing result；If above-mentioned state is normal, it is transferred to step
Two, continue to traverse the storage region or module in tested SOC chip, terminates until testing, be otherwise transferred to step 5；
Step 5: Host Command programmable power supply is powered back up, the storage region being tested in SOC chip or module initialization, then
It is transferred to step 2, until test terminates.
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Cited By (1)
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| CN108535626B (en) | 2021-06-08 |
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