CN101286126A - Spatial processor single particle experiment automatized test system and method - Google Patents

Spatial processor single particle experiment automatized test system and method Download PDF

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Publication number
CN101286126A
CN101286126A CNA2008101148763A CN200810114876A CN101286126A CN 101286126 A CN101286126 A CN 101286126A CN A2008101148763 A CNA2008101148763 A CN A2008101148763A CN 200810114876 A CN200810114876 A CN 200810114876A CN 101286126 A CN101286126 A CN 101286126A
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test
processor
tested
module
main control
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CN100559349C (en
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兰利东
祝长民
颜洁
于立新
范隆
刘立全
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China Aerospace Modern Electronic Co 772nd Institute
Mxtronics Corp
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China Aerospace Modern Electronic Co 772nd Institute
Mxtronics Corp
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Abstract

The invention provides a space processor single particle test automation testing system and a method, comprising a main control processor, a tested processor and a monitoring host machine; communication between the main control processor and the tested processor is carried out by a PCI bus; the main control process can be provided with a multi-scene testing module, a data analysis module and a self-adaptive negative feedback sensing module; a processing display module is arranged in the monitoring host machine; the system and the method of the invention can realize that each test aims at a plurality of testing vectors, can automatically adjust the testing vector according to the testing results, determine the most effective testing vector and has high reliability.

Description

Spatial processor single particle experiment automatized test system and method
Technical field
The present invention relates to a kind of automatization test system and method thereof of single particle experiment test.
Background technology
Single particle experiment both domestic and external, usually adopt outside the monitoring or manual operations, promptly under radiation environment in test macro the mode of external logic analyser, oscillograph and reometer observe, the shortcoming of this method is that observation window is young, can't the real time record observed result, require more high to the electric property of testing ground, whole test system.The employing classic method is utilized oscillograph observation, can only observe the logic of peripheral interface, and is limited to the observing capacity of interior overturn, can't effectively assess out the number of times of single-particle inversion.
Existing at hiperspace processor test method, the pattern of ipc monitor, tested computer run test, the test of every round can only need the personnel control at a test vector, the manually behavior of the tested platform of control, and can't the on-the site analysis data obtain data report.Single test vector, can't obtain in the test of a round than more comprehensive error pattern, the personnel control, manually the normal flow process is then disturbed in participation, and data can't on-the site analysis, can't obtain the direction of next step test, the test blindness below making is bigger.
Number of patent application: 200710176529.9, main employing is to adopt dual port RAM to carry out data storage between main control processor and the tested processor in " SPARC processor single particle effect detection device and detection method ", and its method can only single test be carried out at a class testing vector.
Summary of the invention
Technology of the present invention is dealt with problems and is: overcome the deficiencies in the prior art, a kind of spatial processor single particle experiment automatized test system and method are provided, this system and method can realize that the test of every round carries out at a plurality of test vectors, and can regulate test vector automatically according to test result, determine the most effective test vector, the reliability height.
The technical solution of system of the present invention is: spatial processor single particle experiment automatized test system, comprise main control processor, tested processor, monitoring host computer, and communicate by pci bus between main control processor and the tested processor; The configurable many scrnario testings module of configuration, data analysis module, self-adaptation negative feedback induction module in the main control processor; The processes and displays block configuration is in monitoring host computer; Configurable many scrnario testings module according to test vector configuration testing scene, sends to tested processor with this test scene by pci bus, and the notice monitoring host computer is configured according to described test scene; Tested processor is configured and works according to the test scene that receives, and working result is stored in the shared drive in the main control processor by pci bus; Data analysis module is analyzed and is added up the result in the shared drive, and its result is sent to self-adaptation negative feedback induction module and processes and displays module; Self-adaptation negative feedback induction module, the data processed result that receives is analyzed, judged whether to reconfigure test scene, if need be configured again test scene, then determine new test vector, and this vector is sent to configurable many scrnario testings module according to result; If do not need to reconfigure, then keep original test scene, continue operation; The processes and displays module, the result that the data analysis module that receives is sent handles, shows and generate automatically test report.
Go back the configuration monitoring module in the main control processor, the running status, the tested processor that are mainly used in the tested processor of monitoring are unusual; When tested processor crashed, monitoring module sent reset signal, and tested processor resets; When tested processor takes place when unusual, monitoring module is handled unusual, and result is sent to tested processor.
Also comprise the remote monitoring main frame, the remote monitoring main frame is connected with monitoring host computer by network, realizes remote monitoring.
The technical solution of the inventive method is: spatial processor single particle experiment automatized method of testing comprises the following steps:
(1) initialization test system, the configuration testing scene;
(2) main control processor sends commencing signal to tested processor, and tested processor is started working at official hour, and working result is sent to main control processor;
(3) main control processor is handled described result, judges whether that according to the result after handling needs reconfigure test scene, if need be configured again test scene, then determines new test vector according to result, carries out the test of a new round; If do not need to reconfigure, then keep original test scene, continue operation; And test result sent to monitoring host computer;
(4) monitoring host computer carries out standardization processing, shows and generates automatically test report to test result.
The present invention compared with prior art beneficial effect is:
(1) the present invention can realize testing at a plurality of test vectors by self-adaptation negative feedback induction module and configurable many scrnario testings module, and can regulate test vector automatically according to test result, determine the most effective test vector, the dirigibility and the configurable ability of test scene have been improved, in the face of complicated experimental enviroment, can the current test scene of more effective configuration, obtain reliable, effective test figure, improve the reliability and the degree of confidence of test figure.
(2) self-adaptation negative feedback induction module of the present invention, by analysis to test figure, the distribution of homogenizing test figure when testing minimizes test figure test is produced tendentious result, can effectively receive data and analysis result provides correct FEEDBACK CONTROL.
(3) the present invention can adopt network mode that monitoring host computer is carried out telnet, realization is to the control of primary processor, state to test macro carries out real-time monitoring, handle in real time test macro send data, and provide graphical and normalized test report, carrying out error correction unusually or reset to test macro; And can effectively ensure the safety of testing crew.
(4) the present invention adopts the method for testing of robotization, the error that maximized eliminating artificial interference causes, and can instruct next step test at the data result of duration of test at the scene.
(5) monitoring host computer of the present invention can generate graphical and normalized test report automatically, is convenient to the direction that testing crew obtains next step test, reduces the blindness of test.
(6) bi-processor architecture is adopted in this test, and principal and subordinate processor is realized seamless communication by the pci bus bridge joint, the high reliability of host-guest architecture warranty test and dirigibility, from all states of processor all under the monitoring of primary processor.The high reliability of pci bus has guaranteed that the principal and subordinate processor communication port provides reliable communication capacity.
Description of drawings
Fig. 1 is a test system structure block diagram of the present invention;
Fig. 2 is the inventive method process flow diagram.
Embodiment
As shown in Figure 1, system of the present invention comprises main control processor, tested processor, monitoring host computer, communicates by pci bus between main control processor and the tested processor; The configurable many scrnario testings module of configuration, data analysis module, self-adaptation negative feedback induction module in the main control processor; The processes and displays block configuration is in monitoring host computer;
Configurable many scrnario testings module according to test vector configuration testing scene, sends to tested processor with this test scene by pci bus, and the notice monitoring host computer is configured according to described test scene; The tested object of configurable many scrnario testings module comprises cache, regfile, pci bus, IU and FPU; Each tested object disposes a plurality of test cases, at different test vectors, at least one test case of selecting at least one tested object and tested object to contain, and according to object and the use-case PCI allocation bus selected, at the different test case independence statistical test time, finish the test scene configuration in the course of work.
Tested processor is configured and works according to the test scene that receives, and working result is stored in the shared drive in the main control processor by pci bus;
Data analysis module is analyzed and is added up the result in the shared drive, and its result is sent to self-adaptation negative feedback induction module and processes and displays module;
Self-adaptation negative feedback induction module, the data processed result that receives is analyzed, judged whether to reconfigure test scene, if need be configured again test scene, then determine new test vector, and this vector is sent to configurable many scrnario testings module according to result; If do not need to reconfigure, then keep original test scene, continue operation; Its course of work is:
(1) the data processed result analysis that receives is obtained the coverage rate of single-particle inversion or breech lock;
(2) threshold value with described coverage rate and regulation compares, if be higher than threshold value, then test case is effective, carries out fluence accumulation test; Otherwise, the test case that more renews, the test back begins to carry out from step (1) again, satisfies the threshold value requirement until coverage rate.
The processes and displays module, the result that the data analysis module that receives is sent handles, shows and generate automatically test report.
Go back the configuration monitoring module in the main control processor, the running status, the tested processor that are mainly used in the tested processor of monitoring are unusual; Main control processor is by the WATCHDOG signal of the tested processor of monitoring, judge the running status of tested processor, when the WATCHDOG signal is put when high, show tested processor operation exception, main control processor adopts overtime retransmission technique, when three no responses of tested processor, shows that tested processor crashes, monitoring module sends reset signal, and tested processor resets.
The present invention can adopt network mode that monitoring host computer is carried out telnet, the remote monitoring main frame is connected with monitoring host computer by network, realization is to the control of primary processor, state to test macro carries out real-time monitoring, handle in real time test macro send data, and provide graphical and normalized test report, carrying out error correction unusually or reset to test macro; And can effectively ensure the safety of testing crew.
Fig. 2 is the inventive method process flow diagram, and the specific implementation process is as follows:
(1) initialization test system, the configuration testing scene;
(2) main control processor sends commencing signal to tested processor, and tested processor is started working at official hour, and working result is sent to main control processor;
(3) main control processor is handled described result, judges whether that according to the result after handling needs reconfigure test scene, if need be configured again test scene, then determines new test vector according to result, carries out the test of a new round; If do not need to reconfigure, then keep original test scene, continue operation; And test result sent to monitoring host computer;
(4) monitoring host computer carries out standardization processing, shows and generates automatically test report to test result.
Main control processor can also be monitored tested processor real-time in whole test process, mainly monitors the running status of tested processor, tested processor is unusual; When tested processor crashed, main control processor sent reset signal, and tested processor resets; When tested processor takes place when unusual, main control processor is handled unusual, and result is sent to tested processor.
Following mask body is introduced the basic test method of above-mentioned tested object.
Embodiment 1
Test vector: (record comprises once inside out and the wrong number that repeatedly overturns to the number of searching cache generation single-particle inversion under radiation environment, the wrong address that takes place, location), this test module is used to monitor the upset of cache module, belongs to function block test and SEU test.
Tested object: command cache (16K*8), data cache (32K*8), check bit (8K*8), instruction tag (4K*8), data tag (4K*8), check bit (8K*8)
Command cache is 16K, and data cache is 32K, and data tag is that 4K, instruction tag are 4K, and check bit is respectively 8K, 8K, and wherein low four of tag is significance bit, and the 5th to the 15th invalid, and the 16th to the 32nd is the data bits certificate of tag.
Test environment: heavy particle environment
Testing scheme: read the data of tested processor cache and analyze data correctness by main control processor, observe the running status of tested processor cache with this.
The testing scheme flow process:
(1) the total system initialization comprises IU initialization of register, peripheral hardware initialization, cache initialization.The Cache initialization is exactly that command cache, data cache, all unit of instruction tag, data tag are closed, and all writes 0xffffffff then.
(2) beginning radiation, main control processor is sent out an interruption and is given tested processor, waits for that then tested processor replys, and tested processor begins to gather a pass certificate, is written in the PCI communal space;
More whether (3) main control computer is taken data from the PCI communal space the data upset, if the data upset is arranged, the log-on data analysis module, combining adaptive negative feedback induction module, information such as the bit quantity of analysis upset, position, self-adaptation negative feedback induction module provides FEEDBACK CONTROL, and configurable many scrnario testings module of main control processor reconfigures test scene, and then notify by controlling processor and generate test data according to new test scene, refresh cache.To note the influence of radiation during program run to interrupt control register.
Embodiment 2
Regfile comprises:
A) 136 internal registers (%g0--%g7, %o0--%o7, %l0--%l7)
B) flating point register
C) floating-point general-purpose register (%f0--%f31)
Totally 168 registers.
Error definition:
Two kinds of mistakes of Regfile test procedure monitoring
1. wrong for can revise mistake (promptly mistake one, edac can stop flowing water, rights a wrong and writes back register),
2. wrong for revising mistake (promptly wrong two, as to enter trap) thereby edac can produce trap.
Trial vector: under radiation environment, seek the number (comprising once inside out and repeatedly upset, the once wrong number of once inside out meter, the repeatedly repeatedly wrong number of upset meter) that single-particle inversion takes place Regfile.
Test environment: heavy particle environment
Testing scheme:
(1) program initialization is all registers initialization all, and idle register all is made as 0xffffffff;
(2) beginning radiation, main control processor is sent out an interruption and is given tested processor, wait for that then tested processor replys, tested processor certain hour is all read all registers in the interval, to add up an error count after reading one group of register at every turn, the error count value is written in the PCI communal space;
More whether (3) main control computer is taken data from the PCI communal space the data upset, if the data upset is arranged, the log-on data analysis module, combining adaptive negative feedback induction module, information such as the bit quantity of analysis upset, position, self-adaptation negative feedback induction module provides FEEDBACK CONTROL, and configurable many scrnario testings module of main control processor reconfigures test scene, and then notify by controlling processor and generate test data according to new test scene, refresh Regfile.
If multi-bit error then enters abnormality processing, main control processor is preserved and sent to the error count value, preserve " not correctable error number occurring " then, and send not correctable error number to main control processor, re-execute the regfile test; Otherwise, continue operation.
Embodiment 3
ALLTEST (IU_FPU) test
Test vector: under radiation environment, seek the sensitivity of IU_FPU, the upset of this test module monitoring IU_FPU module, function interruption, abnormality processing, timeout treatment, WATCHDOG monitoring etc. to single-particle.
Tested object: comprise IU, FPU functional module
Test environment: heavy-particle radiation environment
Testing scheme:
(1) program initialization, and set-up register initial value; According to test scene, tested processor moves one group of integer arithmetic test case, as factorization, and fft conversion, matrix multiplication etc.
(2) tested processor operational data pass to the storage of main control processor and main control processor data result compare.
(3) main control processor is wanted the data that constantly relatively transmit, when data not to the time carry out record.By adding up contingent unusual, in the IU flowing water, register, all single event upset rate might take place in the register file, log-on data analysis module, combining adaptive negative feedback induction module, analyzing unusual type is also distinguished, self-adaptation negative feedback induction module provides FEEDBACK CONTROL, and configurable many scrnario testings module of main control processor reconfigures test scene, carries out the test of a new round; If do not need to reconfigure, then keep original test scene, continue operation; And test result sent to monitoring host computer.
If regfile edac multi-bit error, then enter abnormality processing, main control processor is preserved and sent to the error count value, preserve " not correctable error number occurring " then, and send not correctable error number to main control processor, re-execute ALLTEST (IU_FPU) test; Otherwise, continue operation.
The unspecified part of the present invention belongs to general knowledge as well known to those skilled in the art.

Claims (9)

1, spatial processor single particle experiment automatized test system is characterized in that: comprise main control processor, tested processor, monitoring host computer, communicate by pci bus between main control processor and the tested processor; The configurable many scrnario testings module of configuration, data analysis module, self-adaptation negative feedback induction module in the main control processor; The processes and displays block configuration is in monitoring host computer;
Configurable many scrnario testings module according to test vector configuration testing scene, sends to tested processor with this test scene by pci bus, and the notice monitoring host computer is configured according to described test scene;
Tested processor is configured and works according to the test scene that receives, and stores into working result in the shared drive of main control processor by pci bus;
Data analysis module is analyzed and is added up the result in the shared drive, and its result is sent to self-adaptation negative feedback induction module and processes and displays module;
Self-adaptation negative feedback induction module, the data processed result that receives is analyzed, judged whether to reconfigure test scene, if need be configured again test scene, then determine new test vector, and this vector is sent to configurable many scrnario testings module according to result; If do not need to reconfigure, then keep original test scene, continue operation;
The processes and displays module, the result that the data analysis module that receives is sent handles, shows and generate automatically test report.
2, spatial processor single particle experiment automatized test system according to claim 1 is characterized in that: go back the configuration monitoring module in the main control processor, the running status, the tested processor that are mainly used in the tested processor of monitoring are unusual; When tested processor crashed, monitoring module sent reset signal, and tested processor resets; When tested processor takes place when unusual, monitoring module is handled unusual, and result is sent to tested processor.
3, spatial processor single particle experiment automatized test system according to claim 1 and 2 is characterized in that: also comprise the remote monitoring main frame, the remote monitoring main frame is connected with monitoring host computer by network, realizes remote monitoring.
4, spatial processor single particle experiment automatized test system according to claim 1 and 2 is characterized in that: the tested object of described configurable many scrnario testings module comprises cache, regfile, pci bus, IU and FPU; Each tested object disposes a plurality of test cases, at different test vectors, at least one test case of selecting at least one tested object and tested object to contain, and according to object and the use-case PCI allocation bus selected, at the different test case independence statistical test time, finish the test scene configuration in the course of work.
5, spatial processor single particle experiment automatized test system according to claim 3 is characterized in that: the tested object of described configurable many scrnario testings module comprises cache, regfile, pci bus, IU and FPU; Each tested object disposes a plurality of test cases, at different test vectors, at least one test case of selecting at least one tested object and tested object to contain, and according to object and the use-case PCI allocation bus selected, at the different test case independence statistical test time, finish the test scene configuration in the course of work.
6, spatial processor single particle experiment automatized test system according to claim 1 and 2 is characterized in that: the described self-adaptation negative feedback induction module course of work is:
(1) the data processed result analysis that receives is obtained the coverage rate of single-particle inversion or breech lock;
(2) threshold value with described coverage rate and regulation compares, if be higher than threshold value, then test case is effective, carries out fluence accumulation test; Otherwise, the test case that more renews, the test back begins to carry out from step (1) again, satisfies the threshold value requirement until coverage rate.
7, spatial processor single particle experiment automatized test system according to claim 3 is characterized in that: the described self-adaptation negative feedback induction module course of work is:
(1) the data processed result analysis that receives is obtained the coverage rate of single-particle inversion or breech lock;
(2) threshold value with described coverage rate and regulation compares, if be higher than threshold value, then test case is effective, carries out fluence accumulation test; Otherwise, the test case that more renews, the test back begins to carry out from step (1) again, satisfies the threshold value requirement until coverage rate.
8, spatial processor single particle experiment automatized method of testing is characterized in that comprising the following steps:
(1) initialization test system, the configuration testing scene;
(2) main control processor sends commencing signal to tested processor, and tested processor is started working at official hour, and working result is sent to main control processor;
(3) main control processor is handled described result, judges whether that according to the result after handling needs reconfigure test scene, if need be configured again test scene, then determines new test vector according to result, carries out the test of a new round; If do not need to reconfigure, then keep original test scene, continue operation; And test result sent to monitoring host computer;
(4) monitoring host computer carries out standardization processing, shows and generates automatically test report to test result.
9, spatial processor single particle experiment automatized method of testing according to claim 8, it is characterized in that: main control processor can also be monitored tested processor real-time in whole test process, mainly monitors the running status of tested processor, tested processor is unusual; When tested processor crashed, main control processor sent reset signal, and tested processor resets; When tested processor takes place when unusual, main control processor is handled unusual, and result is sent to tested processor.
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CN108535626B (en) * 2017-12-29 2021-06-08 北京时代民芯科技有限公司 Full-automatic test device and method for SOC single particle test
CN110058104A (en) * 2019-05-31 2019-07-26 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Long-distance intelligent single particle effect test macro, method and device
CN113377646A (en) * 2021-05-20 2021-09-10 山东科技大学 Particle swarm algorithm-based automatic data stream test case generation method
CN113377646B (en) * 2021-05-20 2023-11-14 山东科技大学 Automatic data flow test case generation method based on particle swarm optimization

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