CN103019177A - Single event effect monitoring system of space general-purpose memory - Google Patents
Single event effect monitoring system of space general-purpose memory Download PDFInfo
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Abstract
The invention aims to the problem that the single event effect of different types of memories for spaces, and designs a single event effect monitoring system of a space general-purpose memory. The single event effect monitoring system of the space general-purpose memory comprises an upper computer, an embedded controller, a programmable direct-current power source, a data collection module, a high-speed digital waveform generator/analyzer, a temperature collection module, a decoder A, a decoder B, 16 relays, a pin interface and a test board; the upper computer is connected with the embedded controller; the embedded controller is respectively connected with the high-speed digital waveform generator/analyzer, the data collection module, the programmable direct-current power source and the temperature collection module; the data collection module is respectively connected with the decoder A and the decoder B; the pin interface is respectively connected with the high-speed digital waveform generator/analyzer, the decoder A and the test board; the 16 relays are respectively connected with the decoder B, the programmable direct-current power source and the test board; and the output end of the temperature collection module is connected with the test board.
Description
Technical field
A kind of space of the present invention general-purpose storage single particle effect monitoring system belongs to Space Radiation Effects and reinforcement technique field.
Background technology
Well known, the single particle effect that space radiation environment brings out is one of key factor that affects the spacecraft performance of storage system, directly affects spacecraft in the performance of rail usefulness and security performance.
Along with the development of spationautics, the memory application of large quantity high performance, low-power consumption is stored, is played an important role at aspects such as rail management in the data of spacecraft in spacecraft.While, it was more and more extensive in the application demand in space to memory device owing to spacecraft long-life, high reliability and low-cost demand constantly manifests.But along with the development of semiconductor process techniques, the storer that can be used on the one hand the space is of a great variety; The integrated level of device is more and more higher on the other hand, and its characteristic dimension constantly reduces, and these change all so that device is more responsive to single particle effect, therefore, need to estimate the single particle effect of electron device, to satisfy the demand of spacecraft engineering development.Simultaneously, because the working temperature of device can affect the single particle effect susceptibility of device, also can bring certain impact to the performance of memory performance, this single particle effect evaluation to electron device has proposed higher demand.
At present, when estimating on the ground of carrying out the storer single particle effect, all according to the different monitoring system of type development of storer, repeat like this to develop monitoring system and waste on the one hand resource, increased development cost; Also affected on the other hand the Development Schedule of model task.Therefore, in order effectively to economize on resources, reduce cost, improve ground utilization factor and the testing efficiency of memory device, convenient, carry out the single particle effect evaluation of different kinds of memory efficiently, a kind of general single particle effect monitoring system based on virtual instrument technique has been proposed, can be implemented in the single particle effect characteristic parameter that obtains the space general-purpose storage under the radiation parameter of laboratory simulation source, using for the space of measured device provides important technical support.
Summary of the invention
The present invention is directed to the space single particle effect problem of different kinds of memory, designed a kind of space general-purpose storage single particle effect monitoring system, can be for the different software monitoring modular of different types of reservoir designs, utilize the passage of virtual instrument to redefine the versatility of Function Extension different kinds of memory, can realize easily the evaluation to the test of different kinds of memory single particle effect, to satisfy the demand of spacecraft model task development.
The objective of the invention is to be achieved through the following technical solutions.
A kind of space of the present invention general-purpose storage single particle effect monitoring system comprises host computer, embedded controller, programmable DC power supply, data acquisition module, high speed digital waveform generator and analyser, temperature collect module, code translator A and code translator B, 16 relays, needle interface and test boards; Host computer links to each other with embedded controller, embedded controller links to each other respectively at high speed digital waveform generator and analyser, data acquisition module, programmable DC power supply, temperature collect module, data acquisition module links to each other with code translator B with code translator A respectively, needle interface links to each other with test board with high speed digital waveform generator and analyser, code translator A respectively, 16 relays link to each other with code translator B, programmable DC power supply and test board respectively, and the output terminal of temperature collect module links to each other with test board;
Its working method is as follows: system powers on, and measured device enters normal operating conditions, and host computer is set the test initiation parameter, and under the instruction control of embedded controller, system carries out initialization operation; Host computer redefines passage in high speed digital waveform generator and the analyser by embedded controller, chooses energy or linear energy transfer LET value and the input rate of testing program regulation, and definite test position point; Test chip on the test board is carried out irradiation test, the first via is the on off state of code translator B pilot relay under the steering order of embedded controller, and utilize 16 relays to finish monitoring to the test chip power supply on the test board, and monitored results passed to data acquisition module by code translator B, data acquisition module is passed to host computer by embedded controller with related data, the second the tunnel is after utilizing code translator A to obtain the chip selection signal of 16 test board sockets, pass to data acquisition module, again by embedded controller to host computer, Third Road is the working temperature in test chip when operation on the temperature collect module Real-time Collection test board, and with its collection result by embedded controller to host computer, by the acquisition device working temperature with on the impact of device single particle effect, to characterize temperature to the mutual relationship of single particle effect characteristic parameter; The signal that host computer transmits according to the threshold value of setting and the first via, judge whether static current of lcd surpasses judgment value, judge whether to have occured locking single particle (SEL), if so, record data then are again in conjunction with the second tunnel chip selection signal that transmits, if do not receive any chip selection signal, illustrative system crashes, and expendable inefficacy, off-test have occured chip under test; If received the second tunnel chip selection signal that transmits, illustrative system does not crash, then system reset; If locking single particle (SEL) does not occur, then further judge whether to occur single-particle inversion (SEU), read the data of chip under test by high speed digital waveform generator and analyser, and compare with the initial value in the host computer, if comparison result is inconsistent, then think the single-particle inversion phenomenon has occured, follow the mistake of statistics number, misaddress, and whether the wrong number of judging record reaches setting, if reach setting, then off-test, and host computer as a result shown with character style, if do not reach setting, check then whether the required injection rate IR of device reaches requirement, if do not reach requirement, then redefine the test position point, if reach requirement, then observe the energy requirement that whether satisfies test determination, if so, then off-test, organize data point if not then choosing next, and redefine the test position point.
Wherein said system reset adopts following method: when SEL occured, system selected to adopt step-down mode or time-delay mode to read the data in the chip one time according to the testing requirements of initial setting up and the anti-radiation performance of chip again; In the process that detects locking single particle, if adopt the mode of power-off restarting to carry out system reset, in order to reduce the statistical error to single-particle inversion, to record current sampled point for nonvolatile memory, after recovering, system carries out again retaking of a year or grade; And for volatile memory the outage before first retaking of a year or grade once, with the skip of minimizing system to roll-over unit.
Wherein said two code translators and data acquisition module share an earth terminal and a power supply, the output terminal of data acquisition module has 5 passages, each code translator has 4 input ends, 4 passages of 8 input end shared data acquisition modules of two code translators, and the 5th passage of data acquisition module links to each other with the chip selection signal of code translator A, realizes the common choice of two code translators is controlled with this.
Wherein said two code translators all are 4/16 code translators, wherein code translator A produces 16 chip selection signals, be connected respectively to by needle interface on the chip selection signal of 16 test board sockets, 16 chip selection signals that code translator B produces and 16 corresponding connections of relay, with the break-make of realization memory device power supply whether.
Beneficial effect of the present invention:
A kind of space general-purpose storage single particle effect monitoring system that the present invention proposes, can under the radiation parameter of laboratory simulation source, carry out quickly and efficiently the single particle effect evaluation of different kinds of memory, obtain space common memory device single particle effect characteristic parameter.This monitoring system has been expanded the versatility of space with the monitoring of storer single particle effect on the one hand, can effectively reduce cost, saves human and material resources; But on the other hand ground utilization factor and the testing efficiency of Effective Raise memory device shorten the test evaluation cycle, can realize convenient, efficiently to the estimating of tested device anti event of single particle ability, to satisfy the demand of spacecraft model task development.
Description of drawings
Fig. 1 is space general-purpose storage single particle effect monitoring function synoptic diagram;
Fig. 2 is the structure principle chart of space general-purpose storage single particle effect monitoring system;
Fig. 3 is the corresponding annexation of virtual instrument passage and pin.
Embodiment
The below is further described in detail technical scheme of the present invention.
As shown in Figure 1, in the single particle effect process of the test of the present invention, the course of work of monitoring system is as follows:
Step 1: system powers on, and measured device enters normal operating conditions, and host computer is set the test initiation parameter, and under the instruction control of embedded controller, system carries out initialization operation; Host computer redefines 32 passages in high speed digital waveform generator/analyser by embedded controller, and provides signal for test chip; The measured device initialization.Under write command, storage 00H or FFH in the storage unit of general-purpose storage, then the numerical value of reading cells and comparing, if consistent with initial value, not bad piece of storer (chip under test) then is described, carry out step 2, otherwise there is bad piece in proof, mark these bad pieces, and its memory address is uploaded to host computer marks, carry out step 2.
Step 2: choose energy or LET value (linear energy transfer value) and the input rate of testing program regulation, and definite test position point.
Step 3: the test chip on the test board (storer) is carried out irradiation test with dummy source, with this monitoring system it is monitored simultaneously, the first via under the steering order of embedded controller code translator B in order to the on off state of pilot relay, and utilize 16 relays to finish automatic monitoring to the test chip power supply on the test board, and then with monitored results, B passes to data acquisition module by code translator, data acquisition module is passed to host computer by embedded controller with related data, the second the tunnel is after utilizing code translator A to obtain the chip selection signal of 16 test board sockets, pass to data acquisition module, again by embedded controller to host computer; Working temperature when Third Road is the tested test chip operation of temperature collect module Real-time Collection, and with its collection result by embedded controller to host computer, by the acquisition device working temperature with on the impact of device single particle effect, to characterize temperature to the mutual relationship of single particle effect characteristic parameter.
Step 4: the signal that host computer transmits according to the threshold value of setting and the first via, judge whether static current of lcd surpasses judgment value, judge whether to have occured locking single particle (SEL), if so, record data then are again in conjunction with the second tunnel chip selection signal that transmits, if do not receive any chip selection signal, illustrative system crashes, and expendable inefficacy, off-test have occured chip under test; If received the second tunnel chip selection signal that transmits, illustrative system does not crash, and then system reset re-starts step 3.Concrete system reset is as follows: when SEL occured, system can select to adopt step-down mode or time-delay mode to read the data in the chip one time according to the testing requirements of initial setting up and the anti-radiation performance of chip again.But in the process that detects locking single particle, if adopt the mode of power-off restarting to carry out system reset, in order to reduce the statistical error to single-particle inversion, to record current sampled point for nonvolatile memory, after system is recovered, carry out again retaking of a year or grade; And for volatile memory the outage before first retaking of a year or grade once, with the skip of minimizing system to roll-over unit.
Step 5: if in the step 4 kind (SEL) (locking single particle) do not occur, then further judge whether to occur the SEU(single-particle inversion), read the data of chip under test by high speed digital waveform generator/analyser, and compare with the initial value in the host computer, if comparison result is inconsistent, then think the SEU(single-particle inversion occured) phenomenon, follow again mistake of statistics number, misaddress, and whether the wrong number of judging record reaches setting, if reach setting, then off-test, and host computer as a result shown with character style.If do not reach setting, need then to check whether the required injection rate IR of device reaches requirement, if do not reach requirement, then return step 2, if reach requirement, then observe the energy requirement that whether satisfies test determination, if, then off-test is organized data point if not then choosing next, and is returned step 2.
As shown in Figure 2, monitoring system of the present invention comprises host computer, embedded controller, programmable DC power supply, data acquisition module, high speed digital waveform generator and analyser, temperature collect module, code translator A and code translator B, 16 relays, needle interface and test boards; Host computer links to each other with embedded controller, embedded controller links to each other respectively at high speed digital waveform generator and analyser, data acquisition module, programmable DC power supply, temperature collect module, data acquisition module links to each other with code translator B with code translator A respectively, needle interface links to each other with test board with high speed digital waveform generator and analyser, code translator A respectively, 16 relays link to each other with code translator B, programmable DC power supply and test board respectively, and the output terminal of temperature collect module links to each other with test board.
As shown in Figure 3, in order further to improve the versatility of described monitoring system, existing RAM, Flash, eeprom memory (chip under test) pin distribution corresponding logical relationship are analyzed as follows:
1) for RAM, if the pin of various storeies adopts the mode of end alignment, the pin positions of different capabilities storer can be unified correspondence, and namely the control signal in the pin so just can align to realize the end of by the normalization of control signal all at same position.When pin package occurring not simultaneously, can utilize the pin jack card extender to realize the switching of alignment pins function.
2) for Flash, if number of pins is consistent, then address wire pin, data line pin, power lead pin, chip selection signal pin, write and allow pin and output to allow pin all on same position.If number of pins is inconsistent, can utilize the function that redefines of waveform generator to solve.
3) for EEPROM, the pin except data line and control line, great majority all are empty, and the pin positions of control line also great majority all be identical; For the pin of minority wherein, can utilize the compatibility support that function realizes hardware that redefines of waveform generator.
Above-mentioned corresponding relation is so that when compatible Software for Design, if adopt the mode of aliging at the bottom of the storer pin just can realize reshuffling of pin, improve the compatibility of system hardware and software.When the passage that utilizes waveform generator redefines function, with the corresponding relation design of 32 passages of the pin of storer and waveform generator as shown in Figure 3.
Based on above design philosophy, we are when the design test plate, on same plate, design respectively the different pin jack of number, in order to realize the versatility of storer single-particle inversion monitoring, reduce simultaneously in the plug process the damage of test chip and the serviceable life of improving socket, adopt wide tight-lipped miniature DIP socket, the storer that encapsulates for non-DIP can adopt multi-tap, card extender to convert the DIP encapsulation to.On Software for Design, because dissimilar storeies, its read-write operation is slightly variant, such as the Flash storer, take " page or leaf " as the unit data writing, take " piece " as the unit obliterated data.Therefore, for dissimilar reservoir designs different software monitoring modulars, at first judge type of memory during software operation, then call corresponding software monitoring modular and carry out data monitoring.Be described as follows:
1) for RAM, the initialization of RAM adopts the form of section, piece character lists to provide initialization segments, thereby so that test cell arranges more flexibly, can realize like this carrying out initialization for several continuous or discrete address fields in the page or leaf, the data segment that reads simultaneously also provides with the form of character lists.
2) for Flash, therefore the whole page data of write-once, and carrying out take " piece " as unit when wiping, provides for the initialization of the Flash form with the page or leaf character lists, and the data that read simultaneously also show with the form of page or leaf.
3) for EEPROM, the data of eeprom memory write with read comparatively flexible, can section, the mode data writing of page or leaf, piece, but when reading, carry out with whole page or leaf, but the such speed that reads of Effective Raise data.
Claims (4)
1. a space general-purpose storage single particle effect monitoring system is characterized in that: comprise host computer, embedded controller, programmable DC power supply, data acquisition module, high speed digital waveform generator and analyser, temperature collect module, code translator A and code translator B, 16 relays, needle interface and test boards; Host computer links to each other with embedded controller, embedded controller links to each other respectively at high speed digital waveform generator and analyser, data acquisition module, programmable DC power supply, temperature collect module, data acquisition module links to each other with code translator B with code translator A respectively, needle interface links to each other with test board with high speed digital waveform generator and analyser, code translator A respectively, 16 relays link to each other with code translator B, programmable DC power supply and test board respectively, and the output terminal of temperature collect module links to each other with test board;
Its working method is as follows: system powers on, and measured device enters normal operating conditions, and host computer is set the test initiation parameter, and under the instruction control of embedded controller, system carries out initialization operation; Host computer redefines passage in high speed digital waveform generator and the analyser by embedded controller, chooses energy or linear energy transfer LET value and the input rate of testing program regulation, and definite test position point; Test chip on the test board is carried out irradiation test, the first via is the on off state of code translator B pilot relay under the steering order of embedded controller, and utilize 16 relays to finish monitoring to the test chip power supply on the test board, and monitored results passed to data acquisition module by code translator B, data acquisition module is passed to host computer by embedded controller with related data, the second the tunnel is after utilizing code translator A to obtain the chip selection signal of 16 test board sockets, pass to data acquisition module, again by embedded controller to host computer, Third Road is the working temperature in test chip when operation on the temperature collect module Real-time Collection test board, and with its collection result by embedded controller to host computer, by the acquisition device working temperature with on the impact of device single particle effect, to characterize temperature to the mutual relationship of single particle effect characteristic parameter; The signal that host computer transmits according to the threshold value of setting and the first via, judge whether static current of lcd surpasses judgment value, judge whether to have occured locking single particle (SEL), if so, record data then are again in conjunction with the second tunnel chip selection signal that transmits, if do not receive any chip selection signal, illustrative system crashes, and expendable inefficacy, off-test have occured chip under test; If received the second tunnel chip selection signal that transmits, illustrative system does not crash, then system reset; If locking single particle (SEL) does not occur, then further judge whether to occur single-particle inversion (SEU), read the data of chip under test by high speed digital waveform generator and analyser, and compare with the initial value in the host computer, if comparison result is inconsistent, then think the single-particle inversion phenomenon has occured, follow the mistake of statistics number, misaddress, and whether the wrong number of judging record reaches setting, if reach setting, then off-test, and host computer as a result shown with character style, if do not reach setting, check then whether the required injection rate IR of device reaches requirement, if do not reach requirement, then redefine the test position point, if reach requirement, then observe the energy requirement that whether satisfies test determination, if so, then off-test, organize data point if not then choosing next, and redefine the test position point.
2. a kind of space as claimed in claim 1 general-purpose storage single particle effect monitoring system, it is characterized in that: wherein said system reset adopts following method: when SEL occured, system selected to adopt step-down mode or time-delay mode to read the data in the chip one time according to the testing requirements of initial setting up and the anti-radiation performance of chip again; In the process that detects locking single particle, if adopt the mode of power-off restarting to carry out system reset, in order to reduce the statistical error to single-particle inversion, to record current sampled point for nonvolatile memory, after recovering, system carries out again retaking of a year or grade; And for volatile memory the outage before first retaking of a year or grade once, with the skip of minimizing system to roll-over unit.
3. a kind of space as claimed in claim 1 general-purpose storage single particle effect monitoring system, it is characterized in that: wherein said two code translators and data acquisition module share an earth terminal and a power supply, the output terminal of data acquisition module has 5 passages, each code translator has 4 input ends, 4 passages of 8 input end shared data acquisition modules of two code translators, and the 5th passage of data acquisition module links to each other with the chip selection signal of code translator A, realizes the common choice of two code translators is controlled with this.
4. such as claim 1 or 2 or 3 described a kind of space general-purpose storage single particle effect monitoring systems, it is characterized in that: wherein said two code translators all are 4/16 code translators, wherein code translator A produces 16 chip selection signals, be connected respectively to by needle interface on the chip selection signal of 16 test board sockets, 16 chip selection signals that code translator B produces and 16 corresponding connections of relay, with the break-make of realization memory device power supply whether.
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| CN103165192A (en) * | 2013-04-16 | 2013-06-19 | 西北核技术研究所 | SRAM (Static Random Access Memory) single event latch-up effect testing system and method |
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| CN104483574A (en) * | 2014-12-19 | 2015-04-01 | 中国电子科技集团公司第四十七研究所 | Space effect test board, test system and method for testing device space effect |
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| CN107134758B (en) * | 2017-05-08 | 2019-02-22 | 哈尔滨工业大学 | Cmos device single event latch-up effect protective device under a kind of space environment |
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| CN108287302A (en) * | 2018-01-29 | 2018-07-17 | 北京卫星环境工程研究所 | The single particle effect detection circuit structure of space-oriented radiation environment |
| CN108630286A (en) * | 2018-04-26 | 2018-10-09 | 兰州空间技术物理研究所 | The single particle effect test method of 3D volumetric stacked memories |
| CN108974388A (en) * | 2018-04-28 | 2018-12-11 | 北京机械设备研究所 | A kind of emitter body function test macro based on embedded controller |
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| CN111123062A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Test method for simulating single particle effect test based on femtosecond pulse laser |
| CN112557885A (en) * | 2020-12-09 | 2021-03-26 | 北京时代民芯科技有限公司 | FPGA single event latch-up test system and method based on built-in temperature monitor |
| CN112557885B (en) * | 2020-12-09 | 2023-08-08 | 北京时代民芯科技有限公司 | FPGA single particle latch-up test system and method based on built-in temperature monitor |
| CN114665977A (en) * | 2022-03-10 | 2022-06-24 | 航天恒星科技有限公司 | Method for resisting single event effect of high-speed optical interface module in space environment |
| CN114665977B (en) * | 2022-03-10 | 2024-03-01 | 航天恒星科技有限公司 | Method for resisting single event effect of high-speed optical interface module in space environment |
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