CN104237685B - A kind of space single particle effect test method - Google Patents
A kind of space single particle effect test method Download PDFInfo
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- CN104237685B CN104237685B CN201410451782.0A CN201410451782A CN104237685B CN 104237685 B CN104237685 B CN 104237685B CN 201410451782 A CN201410451782 A CN 201410451782A CN 104237685 B CN104237685 B CN 104237685B
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Abstract
The invention discloses a kind of space single particle effect test method, can realize single-particle inversion, locking single particle, the real-time testing of single event burnout and storage；Single particle effect can be characterized comprehensively, provide comprehensive reliable basis for spacecraft anti-single particle effect Design of Reinforcement；The integrated space single particle effect test system set up in the present invention, three kinds of single particle effects can be tested using two single particle effect sensors, simultaneously, two sensors share a set of test system, the integrated of test system is realized, while being also that the miniaturization for realizing test system is laid a good foundation.
Description
Technical field
The invention belongs to Space Radiation Effects and reinforcement technique field, a kind of space single particle effect test side of specific design
Method.
Background technology
Single Energetic particle clashes into Spacecraft Electronic system, interacts with electronic device and can induce single-particle effect
Should.Memory element such as single energetic particle hits memory device causes logic state to change, and causes single-particle inversion to imitate
Should；The locking single particle effect that single high energy particle causes in cmos device, can cause forever to hardware within the extremely short time
The destruction of property long；Single high energy particle penetrates power MOSFET device, produces high current in device inside sensitive nodes, so as to lure
Bill burnt particle effect, and so on, these single particle effects can affect the in-orbit safety of spacecraft, serious meeting to cause boat
Its device is thoroughly damaged, therefore, the common concern of which enjoys Spacecraft guidance and control person.Recently as the continuous of semiconductor feature sizes
Reduce so that node capacitor constantly reduces, and the running voltage of electronic device is also constantly being reduced, and causes electronic device to occur
Single particle effect is more sensitive.
As ultra-large integrated chip and ultra-large special circuit are in the extensive application of space electronic system, simple grain
The radiation hazradial bundle that sub- effect causes becomes affects one of key factor of reliability under integrated circuit radiation environment.Operate in sky
Between spacecraft in environment, the combined influence of various single particle effects, the in-orbit safety of serious harm spacecraft can be subjected to.It is existing
Single particle effect monitoring be both for a certain effect and be separately monitored, all devise not for different single particle effects
Same test system, such as single-particle inversion test system or locking single particle test system etc., the test of this discrete design
System can realize the test of different type single particle effect, but the design of repeatability, development cost is not only increased, and
Versatility is low.But, with the continuous development of space technology, development and design miniaturization, integrated new payload into
For main development trend.Under the development trend of spacecraft miniaturization load, due to spacecraft own wt, volume and grind
The restriction of the factor such as this is made, this discrete load design can not fully meet the engineering demand of space mission.
The content of the invention
In view of this, the invention provides a kind of space single particle effect test method, by setting up integrated space
Single particle effect test system, can test single-particle inversion, locking single particle and single event burnout effect simultaneously, be spacecraft
Single particle effect is monitored and radiation protection design provides comprehensive technical data.
In order to solve above-mentioned technical problem, what the present invention was realized in：
A kind of space single particle effect test method, comprises the steps：
Step 1, set up integrated space single particle effect test system：
The system includes single-particle soft error sensor, single hard error sensor, analog signal processing, logic
Status monitoring circuit, current monitoring circuit, locking judge and protection circuit, data processing and control module and host computer；Institute
State single-particle soft error sensor to be connected with logic state observation circuit and current monitoring circuit respectively；The single hard error
Sensor is connected with analog signal processing；The analog signal processing and current monitoring circuit and data processing and control
Molding block is respectively connected with；The current monitoring circuit, logic state observation circuit and locking judge and protection circuit respectively with
Data processing and control module are connected；The locking judges and protection circuit is connected with the current monitoring circuit；The data
Process and control module is connected with host computer again；
The single-particle soft error sensor is storage cake core, receives the irradiation of irradiation bomb；
The single hard error sensor is power MOSFET type chip, receives the irradiation of irradiation bomb；
Step 2, selection single particle effect test to be performed：
When needing to test single event burnout effect：
(1), to electricity in the space single particle effect test system, and initiation parameter；
(2), the radiation environment according to space, select irradiation bomb, and determine irradiation bomb transmitting particle energy after to described
Single hard error sensor carries out irradiation；
(3), the operating current signal of the analog signal processing reception single hard error sensor is gone forward side by side
The process of row early stage, including：Operating current is compared with threshold value is burnt, when there is operating current more than burning the situation of threshold value
When, judge to produce single event burnout effect, what accumulative single particle effect hard error sensor occurred burns number of times and records now
Operating current, the number of times that burns is issued into the data processing and control module, and smothing filtering is carried out to operating current
Process with blood pressure lowering, then operating current after blood pressure lowering is sent to into the current monitoring circuit, execution step (4)；
If single hard error working sensor electric current is not above burning threshold current, execution step (5)；
(4), the operating current of single hard error sensor is delivered to data processing and control by the current monitoring circuit
Module；The data processing and control module are digitized process to the operating current of single hard error sensor, then
By the operating current and burn number of times and be uploaded to host computer；The host computer is to single hard error working sensor electricity
Flow and burn number of times and stored and shown；Then to space single particle effect test system power-off and change single particle effect
Hard error sensor, returns execution step (3)；
(5), judge obtain burn number of times and whether the operating current of record meets test requirements document, if being unsatisfactory for, adjustment
After the particle energy of irradiation bomb transmitting, execution step (3) is returned；If meeting, terminate test；
When needing to test locking single particle effect and Single event upset effecf：
1., to electricity in the space single particle effect test system, and initiation parameter：
2., the radiation environment according to space, select irradiation bomb, and determine irradiation bomb transmitting particle energy after to the list
Particle soft error sensor carries out irradiation；
3., the operating current of the current monitoring circuit real-time monitoring single-particle soft error sensor, and the work is electric
Streaming is judged and protection circuit to data processing and control module and locking；
4. line number is entered to which after the operating current of the data processing and control module reception single-particle soft error sensor,
Wordization process, and it is uploaded to host computer；
The locking judges and protection circuit carries out real-time judgment to the operating current of single-particle soft error sensor：
When the operating current exceedes lock threshold, then judge locking single particle effect, add up single particle effect soft
The locking number of times of faulty sensors, and locking number of times and lock command are issued into the data processing and control module；The number
According to processing and control module is received after lock command, data processing and control module control electric current observation circuit are released single-particle
The operating current of soft error sensor, carries out blood pressure lowering to single-particle soft error sensor；Meanwhile, the locking number of times is uploaded to
Host computer；The host computer is stored and is shown to the operating current and locking number of times of single-particle soft error sensor；It is right
Space single particle effect test system power-off is simultaneously restarted, and 3. return to step, proceeds test；
If single particle effect soft error working sensor electric current is not above lock threshold, execution step is 5.；
5., the logic state of the logic state observation circuit real-time monitoring single-particle soft error sensor, if occurring single
Particle overturns, and records the memory unit address that logic state occurs upset, afterwards by logic state changing value and logic state
The memory unit address that upset occurs delivers to data processing and control module；Logic state is changed by data processing and control module
The memory unit address of value and logic state generation upset is delivered to and is uploaded to host computer；If not overturning single-particle inversion,
Execution step is 6.；The host computer is to the operating current of single-particle soft error sensor that receives and logic state changing value
The memory unit address that upset occurs with logic state is stored and is shown；
6. judge whether the operating current of the locking number of times and record for obtaining meets test requirements document：If being unsatisfactory for, spoke is adjusted
According to the particle energy of source transmitting, execution step is then back to 3.；If meeting, terminate test.
The present invention has the advantages that：
The present invention proposes a kind of space single particle effect test method, can realize single-particle inversion, locking single particle,
The real-time testing of single event burnout and storage；Single particle effect can be characterized comprehensively, be that the reinforcing of spacecraft anti-single particle effect sets
Meter provides comprehensive reliable basis.
The integrated space single particle effect test system set up in the present invention, using two single particle effect sensors
Three kinds of single particle effects can be tested, meanwhile, two sensors share a set of test system, realize the integrated of test system
Change, while being also that the miniaturization for realizing test system is laid a good foundation.
Description of the drawings
Fig. 1 is the schematic diagram of the test system of the present invention；
Fig. 2 is the single event burnout effect test flow chart of the present invention.
Fig. 3 is the single-particle inversion and locking single particle effect test flow chart of the present invention.
Specific embodiment
Develop simultaneously embodiment below in conjunction with the accompanying drawings, describes the present invention.
A kind of space single particle effect test method of the present invention, comprises the steps：
Step 1, integrated space single particle effect test system is set up, as shown in Figure 1：
The system includes single-particle soft error sensor, single hard error sensor, analog signal processing, logic
Status monitoring circuit, current monitoring circuit, locking judge and protection circuit, data processing and control module and host computer；Institute
State single-particle soft error sensor to be connected with logic state observation circuit and current monitoring circuit respectively；The single hard error
Sensor is connected with analog signal processing；The analog signal processing and current monitoring circuit and data processing and control
Molding block is respectively connected with；The current monitoring circuit, logic state observation circuit and locking judge and protection circuit respectively with
Data processing and control module are connected；The locking judges and protection circuit is connected with the current monitoring circuit；The data
Process and control module is connected with host computer again；
The single-particle soft error sensor is storage cake core, receives the irradiation of irradiation bomb；
The single hard error sensor is power MOSFET type chip, receives the irradiation of irradiation bomb；
Step 2, selection single particle effect test to be performed：
When needing to test single event burnout effect, as shown in Figure 2：
(1), to electricity in the space single particle effect test system, and initiation parameter；
(2), the radiation environment according to space, select irradiation bomb, and determine irradiation bomb transmitting particle energy after to described
Single hard error sensor carries out irradiation；
(3), the operating current signal of the analog signal processing reception single hard error sensor is gone forward side by side
The process of row early stage, including：Operating current is compared with threshold value is burnt, when there is operating current more than burning the situation of threshold value
When, judge to produce single event burnout effect, what accumulative single particle effect hard error sensor occurred burns number of times and records now
Operating current, the number of times that burns is issued into the data processing and control module, and smothing filtering is carried out to operating current
Process with blood pressure lowering, then operating current after blood pressure lowering is sent to into the current monitoring circuit, execution step (4)；
If single hard error working sensor electric current is not above burning threshold current, execution step (5)；
(4), the operating current of single hard error sensor is delivered to data processing and control by the current monitoring circuit
Module；The data processing and control module are digitized process to the operating current of single hard error sensor, then
By the operating current and burn number of times and be uploaded to host computer；The host computer is to single hard error working sensor electricity
Flow and burn number of times and stored and shown；Then to space single particle effect test system power-off and change single particle effect
Hard error sensor, returns execution step (3)；
(5), judge obtain burn number of times and whether the operating current of record meets test requirements document, if being unsatisfactory for, adjustment
After the particle energy of irradiation bomb transmitting, execution step (3) is returned；If meeting, terminate test；
When needing to test locking single particle effect and Single event upset effecf, as shown in Figure 3：
1., to electricity in the space single particle effect test system, and initiation parameter：
2., the radiation environment according to space, select irradiation bomb, and determine irradiation bomb transmitting particle energy after to the list
Particle soft error sensor carries out irradiation；
3., the operating current of the current monitoring circuit real-time monitoring single-particle soft error sensor, and the work is electric
Streaming is judged and protection circuit to data processing and control module and locking；
4. line number is entered to which after the operating current of the data processing and control module reception single-particle soft error sensor,
Wordization process, and it is uploaded to host computer；
The locking judges and protection circuit carries out real-time judgment to the operating current of single-particle soft error sensor：
When the operating current exceedes lock threshold, then judge locking single particle effect, add up single particle effect soft
The locking number of times of faulty sensors, and locking number of times and lock command are issued into the data processing and control module；The number
According to processing and control module is received after lock command, data processing and control module control electric current observation circuit are released single-particle
The operating current of soft error sensor, carries out blood pressure lowering to single-particle soft error sensor；Meanwhile, the locking number of times is uploaded to
Host computer；The host computer is stored and is shown to the operating current and locking number of times of single-particle soft error sensor；It is right
Space single particle effect test system power-off is simultaneously restarted, and 3. return to step, proceeds test；
If single particle effect soft error working sensor electric current is not above lock threshold, execution step is 5.；
5., the logic state of the logic state observation circuit real-time monitoring single-particle soft error sensor, if occurring single
Particle overturns, and records the memory unit address that logic state occurs upset, afterwards by logic state changing value and logic state
The memory unit address that upset occurs delivers to data processing and control module；Logic state is changed by data processing and control module
The memory unit address of value and logic state generation upset is delivered to and is uploaded to host computer；If not overturning single-particle inversion,
Execution step is 6.；The host computer is to the operating current of single-particle soft error sensor that receives and logic state changing value
The memory unit address that upset occurs with logic state is stored and is shown；
6. judge whether the operating current of the locking number of times and record for obtaining meets test requirements document：If being unsatisfactory for, spoke is adjusted
According to the particle energy of source transmitting, execution step is then back to 3.；If meeting, terminate test.
In sum, presently preferred embodiments of the present invention is these are only, is not intended to limit protection scope of the present invention.
All any modification, equivalent substitution and improvements within the spirit and principles in the present invention, made etc., should be included in the present invention's
Within protection domain.
Claims (1)
1. a kind of space single particle effect test method, it is characterised in that comprise the steps：
Step 1, set up integrated space single particle effect test system：
The system includes single-particle soft error sensor, single hard error sensor, analog signal processing, logic state
Observation circuit, current monitoring circuit, locking judge and protection circuit, data processing and control module and host computer；The list
Particle soft error sensor is connected with logic state observation circuit and current monitoring circuit respectively；The single hard error sensing
Device is connected with analog signal processing；The analog signal processing and current monitoring circuit and data processing and control mould
Block is respectively connected with；The current monitoring circuit, logic state observation circuit and locking judge and protection circuit respectively with data
Process and control module is connected；The locking judges and protection circuit is connected with the current monitoring circuit；The data processing
And control module is connected with host computer again；
The single-particle soft error sensor is storage cake core, receives the irradiation of irradiation bomb；
The single hard error sensor is power MOSFET type chip, receives the irradiation of irradiation bomb；
Step 2, selection single particle effect test to be performed：
When needing to test single event burnout effect：
(1), to electricity in the space single particle effect test system, and initiation parameter；
(2), the radiation environment according to space, select irradiation bomb, and determine irradiation bomb transmitting particle energy after to the simple grain
Sub- hard error sensor carries out irradiation；
(3) before, the analog signal processing receives the operating current signal of the single hard error sensor and carries out
Phase is processed, including：Operating current is compared with threshold value is burnt, when there is operating current more than the situation of threshold value is burnt,
Judge to produce single event burnout effect, what accumulative single hard error sensor occurred burns number of times record work electricity now
The number of times that burns is issued the data processing and control module, and operating current is carried out at smothing filtering and blood pressure lowering by stream
Reason, then operating current after blood pressure lowering is sent to into the current monitoring circuit, execution step (4)；
If single hard error working sensor electric current is not above burning threshold current, execution step (5)；
(4), the operating current of single hard error sensor is delivered to data processing and control module by the current monitoring circuit；
The data processing and control module are digitized process to the operating current of single hard error sensor, then by the work
Make electric current and burn number of times to be uploaded to host computer；The host computer to the single hard error working sensor electric current and
Burn number of times to be stored and shown；Then to space single particle effect test system power-off and change single particle effect hard error
Sensor, returns execution step (3)；
(5), judge obtain burn number of times and whether the operating current of record meets test requirements document, if being unsatisfactory for, adjust irradiation
After the particle energy of source transmitting, execution step (3) is returned；If meeting, terminate test；
When needing to test locking single particle effect and Single event upset effecf：
1., to electricity in the space single particle effect test system, and initiation parameter：
2., the radiation environment according to space, select irradiation bomb, and determine irradiation bomb transmitting particle energy after to the single-particle
Soft error sensor carries out irradiation；
3., the operating current of the current monitoring circuit real-time monitoring single-particle soft error sensor, and the operating current is given
Judge and protection circuit to data processing and control module and locking；
4., which is digitized after the operating current of the data processing and control module reception single-particle soft error sensor
Process, and be uploaded to host computer；
The locking judges and protection circuit carries out real-time judgment to the operating current of single-particle soft error sensor：
When the operating current exceedes lock threshold, then judge locking single particle effect, add up single-particle soft error sensing
The locking number of times of device, and locking number of times and lock command are issued into the data processing and control module；The data processing and
After control module receives lock command, data processing and control module control electric current observation circuit are released the misinformation of single-particle soft error
The operating current of sensor, carries out blood pressure lowering to single-particle soft error sensor；Meanwhile, the locking number of times is uploaded to into host computer；
The host computer is stored and is shown to the operating current and locking number of times of single-particle soft error sensor；To the space
The power-off of single particle effect test system is simultaneously restarted, and 3. return to step, proceeds test；
If single particle effect soft error working sensor electric current is not above lock threshold, execution step is 5.；
5., the logic state of the logic state observation circuit real-time monitoring single-particle soft error sensor, if there is single-particle
Upset, records the memory unit address that logic state occurs upset, and afterwards logic state changing value and logic state occur
The memory unit address of upset delivers to data processing and control module；Data processing and control module by logic state changing value with
And the memory unit address that logic state occurs upset is uploaded to host computer；If there is no single-particle inversion, execution step
⑥；The host computer is to the operating current of single-particle soft error sensor that receives and logic state changing value and logic shape
The memory unit address that state occurs upset is stored and is shown；
6. judge whether the operating current of the locking number of times and record for obtaining meets test requirements document：If being unsatisfactory for, irradiation bomb is adjusted
3. the particle energy of transmitting, be then back to execution step；If meeting, terminate test.
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| CN104793080A (en) * | 2015-04-16 | 2015-07-22 | 西安交通大学 | Method for testing single event effect of on-chip system |
| CN105223494B (en) * | 2015-09-25 | 2016-09-28 | 中国人民解放军国防科学技术大学 | A kind of system single particle effect detection method based on parallel testing and system |
| CN106405385B (en) * | 2016-08-31 | 2019-03-05 | 西北核技术研究所 | Logic circuit single particle effect test method based on chain of flip-flops |
| CN106908672A (en) * | 2017-01-24 | 2017-06-30 | 王洋 | A kind of single particle radiation experiment test device, system and method |
| CN108334707A (en) * | 2018-02-09 | 2018-07-27 | 哈尔滨工业大学 | A kind of analysis method of single particle radiation silicon carbide power MOSFETs security boundary performance degradations |
| CN109214049B (en) * | 2018-07-27 | 2023-06-30 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and device for acquiring neutron single event effect section of device |
| CN109917263B (en) * | 2019-03-28 | 2021-12-24 | 西北核技术研究所 | Unattended semiconductor device single event effect measuring method |
| CN110045204B (en) * | 2019-04-26 | 2021-09-07 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Single event latch-up holding current test method, device and system |
| CN110879623B (en) * | 2019-11-06 | 2021-04-13 | 中国空间技术研究院 | Single-particle test temperature control device with correction function and temperature control method |
| CN111781446B (en) * | 2020-06-23 | 2022-11-08 | 中国科学院国家空间科学中心 | Overall monitoring system and monitoring method for single event effect of multiple types of devices |
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