CN101846725A - Experimental method for single event effects (SEE) of pulse width modulator (PWM) - Google Patents
Experimental method for single event effects (SEE) of pulse width modulator (PWM) Download PDFInfo
- Publication number
- CN101846725A CN101846725A CN200910259303A CN200910259303A CN101846725A CN 101846725 A CN101846725 A CN 101846725A CN 200910259303 A CN200910259303 A CN 200910259303A CN 200910259303 A CN200910259303 A CN 200910259303A CN 101846725 A CN101846725 A CN 101846725A
- Authority
- CN
- China
- Prior art keywords
- test
- sample
- pwm
- circuit
- under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/303—Contactless testing of integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31816—Soft error testing; Soft error rate evaluation; Single event testing
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses an experimental method for single event effects (SEE) of a pulse width modulator (PWM) and belongs to the technical field of space radiation effects and hardening. The method comprises the following steps of: numbering test samples; inserting the numbered test samples into a board, wherein a tested circuit board moves in accordance with a movable bracket; performing a power-on test on a test system; starting a radiation source; in a radiating process, monitoring the single event effects of the tested samples in real time by using a monitoring system; monitoring the fluence rate of incident particles in real time by using a beam monitoring system; and recording the number of the single event effects, the electrical parameters of the samples and the radiation time. The method can realize an evaluation test on the anti-SEE performance of a PWM device and obtain a single particle LET threshold or an energy threshold or a sigma-LET or E curve of the PWM device.
Description
Technical field
A kind of experimental method for single event effects (SEE) of pulse width modulator (PWM) of the present invention belongs to Space Radiation Effects and reinforcement technique field.
Background technology
Spacecraft flies in the cosmic space, is in the radiation environment of charged particle formation always.High energy particle in the space radiation environment can cause semiconductor devices in the spacecraft, integrated circuit generation single particle effect (SEE), and becoming influences spacecraft in highly reliable, the long-life principal element of rail, has caused spacecraft designers' attention.
Pulse width modulator (PWM) has advantages such as cost is low, volume is little, noiseproof feature is strong, is widely applied in aerospace measurement, communication and the many fields such as power control and conversion.Because high energy particle easily brings out PWM single particle effect (SEE) phenomenon takes place in the irradiation space environment, can cause the change of the unit for electrical property parameters (as reference voltage, electric current, dutycycle, frequency, phase place and phase sequence etc.) of PWM, cause the Spacecraft Electronic system to break down.For example, extensively adopted PWM in the space of spacecraft in the DC/DC module, the single particle effect of PWM can make DC/DC module output voltage phenomenons such as overvoltage, under-voltage, ripple increase occur, causes the electronic device works in the spacecraft unusual or fault to occur.Therefore, the SEE of PWM device test will be chosen and Design of Reinforcement provides important techniques to support for the spacecraft model, and the SEE test result of PWM device is most important for the application of this device in the space electronic system.
Summary of the invention
The objective of the invention is the problem of unusual and fault to take place, proposed a kind of experimental method for single event effects (SEE) of pulse width modulator (PWM) for thereby the change that solves the PWM electrical property that causes owing to single particle effect causes the Spacecraft Electronic system.
The objective of the invention is by realizing with following technical proposals.
A kind of single event effect of pulse width modulator (PWM) test experimental technique of the present invention, its concrete implementation step is as follows:
1) use special-purpose hood-opening device to the test specimen processing of uncapping before the test; After uncapping, sample is carried out the test of electrical property and functional parameter, carry out follow-up test after qualified, and sample is numbered;
2) test specimen is inserted on the circuit-under-test plate (DUT), the DUT plate is fixed on the breadboard traversing carriage, should prevent the DUT short circuit and rock the mobile consistance of assurance DUT plate and traversing carriage; And guarantee incident ion or laser beam irradiation sensing surface to chip under test;
3) correctly connect test macro, DUT plate, electric power system etc., test macro is added electrical testing, whether test sample and system's operation be normal;
4) guaranteeing on the sample basis working properly, open radiation source and carry out irradiation, in the irradiation process, monitoring system is monitored the SEE phenomenon that sample takes place in real time, the beam monitoring system monitors the fluence rate of incident particle in real time, the electrical quantity and the exposure time of record particle event number, sample;
5) after test finishes, close irradiation dummy source and TT﹠C system;
6) according to number of times, umber of exposures that single event takes place, draw single particle energy threshold value or linear transfer energy (LET) threshold value and cross section with LET or energy (σ～LET or E) change curve, and write test report.Should comprise in test report: date of test, the number of participating in the experiment also provide Analysis of Abnormal Phenomenon and conclusion in the test.
Beneficial effect
The present invention can realize PWM device single-particle LET threshold value or energy threshold and σ～LET or E curve are obtained in the anti-SEE Performance Evaluation test of PWM device.
Description of drawings
Fig. 1 is the PWM single particle effect test macro composition frame chart that the present invention adopts;
Fig. 2 is a californium source simulation single particle effect pilot system used in the embodiment of the invention 1;
Fig. 3 is a pulse laser simulation single particle effect simulation experiment system used in the embodiment of the invention 2;
Wherein, 1-1PWM test circuit, 1-2PWM output, 1-3 comparer, 1-4 shaping circuit, 1-5CPLD metering circuit, 1-6MCU, 1-750MHz, 1-8 observation interface, 1-9 communication interface, 1-10AD conversion, 1-11 signal transformation, 1-12 bipolarity DA output, 1-13 shaping circuit, 1-14 reference voltage, 1-15 clock; 2-1Z is to locating device, 2-2 radioactive source 252Cf isotope, 2-3XY mobile platform, 2-4 vacuum pump, 2-5 vacuum measurement system, 2-6 support, 2-7 vacuum chamber; The 3-1He-Ne laser instrument, 3-2 nanosecond Laser Simulator Radon-5E, the 3-3 focusing unit, the 3-4 colorful CCD camera, 3-5 laser energy instrument, 3-6 control and test cell, 3-7CCD camera PC interface board, 3-8 laser energy instrument PC interface board, 3-9 observing and controlling computing machine and related software, 3-10DUT functional test PC interface board, the 3-11 buffer cell comprises the flexible multi-core cable line, the 3-12X-Y mobile platform, the 3-13DUT plate, 3-14 microscopie unit BiolamM, 3-15 picosecond laser instrument EKSMA PL2143.
Embodiment
Adopt PWM single particle effect test macro among the present invention as shown in Figure 1.The PWM UC1845 device of using below in conjunction with the space is an example, and actual test method of the present invention is described further.
Embodiment 1
The test of californium source simulation PWM UC1845 single particle effect, its experimental system as shown in Figure 2.
1) the UC1845 device of ceramic package is uncapped, the normal UC1845 device in the back of will uncapping places in the vacuum chamber, correctly connects test macro and electric power system;
2) on sample basis working properly, adopt californium source fission fragment to carry out irradiation;
3) in the irradiation process, monitoring system is monitored the SEE phenomenon whether sample takes place in real time, the beam monitoring system monitors the fluence rate of incident particle in real time, test macro can be observed tangible single particle effect phenomenon, the electrical quantity and the exposure time of record particle event number, sample calculate the single-particle cross section.Test findings sees Table 1.
Table 1 UC1845 single-particle inversion and single-particle transient state cross-section data
Embodiment 2
The test of pulse laser simulation PWM UC1845 single particle effect, its experimental system as shown in Figure 3.
1) the UC1845 device of ceramic package is uncapped, the normal UC1845 device in back of uncapping is placed the DUT mobile platform of laser analog single particle effect pilot system, correctly connect test macro and electric power system;
2) the DUT platform sample to laser analog single particle effect pilot system focuses on;
3) focus on finish after, on sample basis working properly, the beginning pulse laser irradiation;
4) in the irradiation process, determine the single-particle sensitizing range of UC1845 device, device single particle effect energy threshold, test findings sees Table 2.
The SEE energy threshold of table 2 UC1845 device
Claims (1)
1. the experimental technique of a single event effect of pulse width modulator (PWM) is characterized in that:
1) use special-purpose hood-opening device to the test specimen processing of uncapping before the test; After uncapping, sample is carried out the test of electrical property and functional parameter, carry out follow-up test after qualified, and sample is numbered;
2) test specimen is inserted on the circuit-under-test plate, the circuit-under-test plate is fixed on the breadboard traversing carriage, should prevent the short circuit of circuit-under-test plate and rock the mobile consistance of assurance circuit-under-test plate and traversing carriage; And guarantee incident ion or laser beam irradiation sensing surface to chip under test;
3) correctly connect test macro, circuit-under-test plate, electric power system etc., test macro is added electrical testing, whether test sample and system's operation be normal;
4) guaranteeing on the sample basis working properly, open radiation source and carry out irradiation, in the irradiation process, monitoring system is monitored the single particle effect that sample takes place in real time, the beam monitoring system monitors the fluence rate of incident particle in real time, the electrical quantity and the exposure time of record particle event number, sample;
5) after test finishes, close irradiation dummy source and TT﹠C system;
6) according to number of times, umber of exposures that single event takes place, draw single particle energy threshold value or linear transfer energy threshold and cross section with energy or linear transfer energy variation curve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910259303A CN101846725A (en) | 2009-12-17 | 2009-12-17 | Experimental method for single event effects (SEE) of pulse width modulator (PWM) |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910259303A CN101846725A (en) | 2009-12-17 | 2009-12-17 | Experimental method for single event effects (SEE) of pulse width modulator (PWM) |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101846725A true CN101846725A (en) | 2010-09-29 |
Family
ID=42771407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200910259303A Pending CN101846725A (en) | 2009-12-17 | 2009-12-17 | Experimental method for single event effects (SEE) of pulse width modulator (PWM) |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101846725A (en) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102169022A (en) * | 2010-12-31 | 2011-08-31 | 中国航天科技集团公司第五研究院第五一○研究所 | Experiment method for pulsed laser single event upset cross section |
| CN102495355A (en) * | 2011-12-31 | 2012-06-13 | 中国科学院微电子研究所 | Laser pulse single event effect simulation system |
| CN103105548A (en) * | 2012-12-27 | 2013-05-15 | 中国空间技术研究院 | Movable single particle test plate debugging platform |
| CN103323627A (en) * | 2013-06-20 | 2013-09-25 | 中国空间技术研究院 | Single-particle test sample cap opening protective device |
| CN104181421A (en) * | 2014-08-22 | 2014-12-03 | 中国科学院空间科学与应用研究中心 | Device and method for field programmable gate array (FPGA) single event effect dynamic fault testing |
| CN104237685A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Space single event effect testing method |
| CN105759198A (en) * | 2016-04-11 | 2016-07-13 | 西北核技术研究所 | Pulse width modulator single event effect time-sensitive characteristic analyzing method |
| WO2019012517A1 (en) * | 2017-07-10 | 2019-01-17 | Hanan Deny | Portable device for soft errors testing |
| CN110083081A (en) * | 2019-03-11 | 2019-08-02 | 北京时代民芯科技有限公司 | A kind of automation single particle radiation test control system and method |
| CN111123062A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Test method for simulating single particle effect test based on femtosecond pulse laser |
| CN112383998A (en) * | 2020-11-24 | 2021-02-19 | 中国科学院上海光学精密机械研究所 | Single event effect testing device based on laser accelerator |
| CN113031053A (en) * | 2021-01-05 | 2021-06-25 | 中国原子能科学研究院 | Experimental device and experimental system for neutron beam irradiation experiment |
-
2009
- 2009-12-17 CN CN200910259303A patent/CN101846725A/en active Pending
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102169022A (en) * | 2010-12-31 | 2011-08-31 | 中国航天科技集团公司第五研究院第五一○研究所 | Experiment method for pulsed laser single event upset cross section |
| CN102495355A (en) * | 2011-12-31 | 2012-06-13 | 中国科学院微电子研究所 | Laser pulse single event effect simulation system |
| CN102495355B (en) * | 2011-12-31 | 2014-01-29 | 中国科学院微电子研究所 | Laser pulse single event effect simulation system |
| CN103105548A (en) * | 2012-12-27 | 2013-05-15 | 中国空间技术研究院 | Movable single particle test plate debugging platform |
| CN103105548B (en) * | 2012-12-27 | 2015-08-19 | 中国空间技术研究院 | Moveable single particle test plate debug platform |
| CN103323627B (en) * | 2013-06-20 | 2015-08-12 | 中国空间技术研究院 | A kind of single-particle test sample drives cap protective device |
| CN103323627A (en) * | 2013-06-20 | 2013-09-25 | 中国空间技术研究院 | Single-particle test sample cap opening protective device |
| CN104181421B (en) * | 2014-08-22 | 2017-03-08 | 中国科学院空间科学与应用研究中心 | FPGA single particle effect dynamic fault test device and method |
| CN104181421A (en) * | 2014-08-22 | 2014-12-03 | 中国科学院空间科学与应用研究中心 | Device and method for field programmable gate array (FPGA) single event effect dynamic fault testing |
| CN104237685A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Space single event effect testing method |
| CN104237685B (en) * | 2014-09-05 | 2017-04-05 | 兰州空间技术物理研究所 | A kind of space single particle effect test method |
| CN105759198A (en) * | 2016-04-11 | 2016-07-13 | 西北核技术研究所 | Pulse width modulator single event effect time-sensitive characteristic analyzing method |
| CN105759198B (en) * | 2016-04-11 | 2018-06-29 | 西北核技术研究所 | A kind of single event effect of pulse width modulator (PWM) time-sensitive characteristic analysis method |
| WO2019012517A1 (en) * | 2017-07-10 | 2019-01-17 | Hanan Deny | Portable device for soft errors testing |
| US10578669B2 (en) | 2017-07-10 | 2020-03-03 | Deny Hanan | Portable device for soft errors testing |
| CN110083081A (en) * | 2019-03-11 | 2019-08-02 | 北京时代民芯科技有限公司 | A kind of automation single particle radiation test control system and method |
| CN111123062A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Test method for simulating single particle effect test based on femtosecond pulse laser |
| CN112383998A (en) * | 2020-11-24 | 2021-02-19 | 中国科学院上海光学精密机械研究所 | Single event effect testing device based on laser accelerator |
| CN113031053A (en) * | 2021-01-05 | 2021-06-25 | 中国原子能科学研究院 | Experimental device and experimental system for neutron beam irradiation experiment |
| CN113031053B (en) * | 2021-01-05 | 2024-05-31 | 中国原子能科学研究院 | Experimental device and experimental system for neutron beam irradiation experiment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101846725A (en) | Experimental method for single event effects (SEE) of pulse width modulator (PWM) | |
| CN102169022A (en) | Experiment method for pulsed laser single event upset cross section | |
| CN108508351B (en) | Single event fault injection simulation method based on double-exponent current source | |
| CN107229824B (en) | Photovoltaic power station power generation unit power curve modeling method and device | |
| CN102332310A (en) | FPGA (Field Programmable Gate Array)-based single event effect test system for NAND FLASH device | |
| CN105759198B (en) | A kind of single event effect of pulse width modulator (PWM) time-sensitive characteristic analysis method | |
| Sun et al. | Reliability assessment of metallized film capacitors using reduced degradation test sample | |
| CN108152705A (en) | A kind of radiation effect Online Transaction Processing and its test method based on transistor | |
| CN101458292A (en) | Remote online automatic test system and method for power VDMOS (vertical double-diffused metal oxide semiconductor) starting voltage | |
| CN105891694A (en) | Method for testing of laser-simulation radiation dose rate effects of silicon-based semiconductor transistor | |
| Chumakov et al. | Single event latchup threshold estimation based on laser dose rate test results | |
| Ashok et al. | Identification and classification of transmission line faults using wavelet analysis | |
| CN114200275B (en) | High-temperature gate bias test method and system for silicon carbide MOSFET device | |
| CN202453479U (en) | Battery protection board testing device based on PCI (Peripheral Component Interconnect) bus structure | |
| Gutierrez et al. | Development of real-time supervision HIL emulator of shaded PV systems | |
| Shvetsov-Shilovskiy et al. | Advanced system for CMOS SOI test structures measurements | |
| CN112329374B (en) | Single event effect rapid simulation method for large-scale circuit | |
| Shichao et al. | Experiment and simulation analysis of BMM electrostatic discharge simulator | |
| Zhang et al. | Development of a three-dimensional pseudo pin-by-pin calculation methodology in ANC | |
| RU2488182C1 (en) | Method of simulating complex radiation effect on investigated object | |
| CN102012275B (en) | Environment simulator for testing NOCT (Nominal Operating Cell Temperature) of component | |
| Phadke et al. | Comtrade; a new standard for common format for transient data exchange | |
| Liu et al. | Testing platform for fault diagnosis and location algorithm in the active distribution network | |
| Reno et al. | Modeling Distribution Connected PV and Interconnection Study Analysis. | |
| CN115856662A (en) | Lithium battery parameter identification method and device, electronic equipment and storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20100929 |