CN201576463U - Device for producing and displaying bitmap information during embedded flash memory testing process - Google Patents
Device for producing and displaying bitmap information during embedded flash memory testing process Download PDFInfo
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- CN201576463U CN201576463U CN2009200747546U CN200920074754U CN201576463U CN 201576463 U CN201576463 U CN 201576463U CN 2009200747546 U CN2009200747546 U CN 2009200747546U CN 200920074754 U CN200920074754 U CN 200920074754U CN 201576463 U CN201576463 U CN 201576463U
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- flash memory
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Priority Applications (1)
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CN2009200747546U CN201576463U (en) | 2009-12-03 | 2009-12-03 | Device for producing and displaying bitmap information during embedded flash memory testing process |
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CN2009200747546U CN201576463U (en) | 2009-12-03 | 2009-12-03 | Device for producing and displaying bitmap information during embedded flash memory testing process |
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CN201576463U true CN201576463U (en) | 2010-09-08 |
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CN2009200747546U Expired - Fee Related CN201576463U (en) | 2009-12-03 | 2009-12-03 | Device for producing and displaying bitmap information during embedded flash memory testing process |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102590736A (en) * | 2011-01-05 | 2012-07-18 | 上海华虹Nec电子有限公司 | Rapid test system and rapid test method for stacked chips |
CN102628923A (en) * | 2012-03-19 | 2012-08-08 | 硅谷数模半导体(北京)有限公司 | Test device of analog circuit |
CN104701202A (en) * | 2013-12-09 | 2015-06-10 | 中芯国际集成电路制造(上海)有限公司 | Defect-killing rate analysis method and system |
CN107610738A (en) * | 2017-09-29 | 2018-01-19 | 北京中电华大电子设计有限责任公司 | A kind of efficient out of memory analysis method |
-
2009
- 2009-12-03 CN CN2009200747546U patent/CN201576463U/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102590736A (en) * | 2011-01-05 | 2012-07-18 | 上海华虹Nec电子有限公司 | Rapid test system and rapid test method for stacked chips |
CN102590736B (en) * | 2011-01-05 | 2014-07-09 | 上海华虹宏力半导体制造有限公司 | Rapid test system and rapid test method for stacked chips |
CN102628923A (en) * | 2012-03-19 | 2012-08-08 | 硅谷数模半导体(北京)有限公司 | Test device of analog circuit |
CN104701202A (en) * | 2013-12-09 | 2015-06-10 | 中芯国际集成电路制造(上海)有限公司 | Defect-killing rate analysis method and system |
CN104701202B (en) * | 2013-12-09 | 2017-11-14 | 中芯国际集成电路制造(上海)有限公司 | defect killing rate analysis method and analysis system |
CN107610738A (en) * | 2017-09-29 | 2018-01-19 | 北京中电华大电子设计有限责任公司 | A kind of efficient out of memory analysis method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140109 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
|
TR01 | Transfer of patent right |
Effective date of registration: 20140109 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100908 Termination date: 20151203 |
|
EXPY | Termination of patent right or utility model |