CN108508030A - 玻璃基板检查装置及使用其检查玻璃基板的方法 - Google Patents
玻璃基板检查装置及使用其检查玻璃基板的方法 Download PDFInfo
- Publication number
- CN108508030A CN108508030A CN201810473265.1A CN201810473265A CN108508030A CN 108508030 A CN108508030 A CN 108508030A CN 201810473265 A CN201810473265 A CN 201810473265A CN 108508030 A CN108508030 A CN 108508030A
- Authority
- CN
- China
- Prior art keywords
- glass substrate
- back light
- light system
- glass
- horizontal direction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011521 glass Substances 0.000 title claims abstract description 196
- 239000000758 substrate Substances 0.000 title claims abstract description 130
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000007689 inspection Methods 0.000 claims abstract description 49
- 230000007246 mechanism Effects 0.000 claims abstract description 39
- 230000005540 biological transmission Effects 0.000 claims abstract description 25
- 230000008859 change Effects 0.000 claims abstract description 13
- 238000005286 illumination Methods 0.000 claims abstract description 10
- 230000033001 locomotion Effects 0.000 claims description 18
- 239000003638 chemical reducing agent Substances 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 8
- 238000010521 absorption reaction Methods 0.000 claims description 6
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 5
- 238000013459 approach Methods 0.000 claims description 3
- 230000007547 defect Effects 0.000 description 14
- 238000001514 detection method Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000005265 energy consumption Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000003599 detergent Substances 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 238000011017 operating method Methods 0.000 description 1
- 239000013618 particulate matter Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
- G01N2021/945—Liquid or solid deposits of macroscopic size on surfaces, e.g. drops, films, or clustered contaminants
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810473265.1A CN108508030A (zh) | 2018-05-17 | 2018-05-17 | 玻璃基板检查装置及使用其检查玻璃基板的方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810473265.1A CN108508030A (zh) | 2018-05-17 | 2018-05-17 | 玻璃基板检查装置及使用其检查玻璃基板的方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN108508030A true CN108508030A (zh) | 2018-09-07 |
Family
ID=63400635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810473265.1A Pending CN108508030A (zh) | 2018-05-17 | 2018-05-17 | 玻璃基板检查装置及使用其检查玻璃基板的方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108508030A (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110672629A (zh) * | 2019-11-07 | 2020-01-10 | 江苏上达电子有限公司 | 一种避免外观检查时cof产品产生背面划伤的方法 |
WO2020062571A1 (zh) * | 2018-09-29 | 2020-04-02 | 苏州精濑光电有限公司 | 基板检测设备 |
CN112764266A (zh) * | 2020-12-31 | 2021-05-07 | 惠州视维新技术有限公司 | 背光模组、显示装置以及显示装置的检测方法 |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1940541A (zh) * | 2005-09-29 | 2007-04-04 | 奥林巴斯株式会社 | 基板检查装置 |
CN1991446A (zh) * | 2005-12-29 | 2007-07-04 | Lg.菲利浦Lcd株式会社 | 用于检查平板显示器件的装置及其检查方法 |
JP2008170254A (ja) * | 2007-01-11 | 2008-07-24 | Olympus Corp | 基板検査装置 |
CN203909468U (zh) * | 2014-01-09 | 2014-10-29 | 深圳市度信科技有限公司 | 一种摄像头模组及其半自动调焦测试装置 |
CN104280400A (zh) * | 2013-07-11 | 2015-01-14 | 北京兆维电子(集团)有限责任公司 | 一种打光装置及纸张质量检测设备 |
CN106680289A (zh) * | 2017-01-25 | 2017-05-17 | 江苏东旭亿泰智能装备有限公司 | 玻璃基板宏观检查系统 |
CN106990567A (zh) * | 2017-05-12 | 2017-07-28 | 深圳市华星光电技术有限公司 | 一种宏观检查装置及宏观检查方法 |
CN107831172A (zh) * | 2017-08-02 | 2018-03-23 | 深圳市迪姆自动化有限公司 | 全自动玻璃表面瑕疵检测机 |
CN207163930U (zh) * | 2017-09-28 | 2018-03-30 | 芜湖东旭光电科技有限公司 | 液晶基板玻璃条纹辅助检查装置和检查系统 |
CN107907549A (zh) * | 2017-11-13 | 2018-04-13 | 武汉华星光电半导体显示技术有限公司 | 基板检查设备及基板检查方法 |
CN208520779U (zh) * | 2018-05-17 | 2019-02-19 | 江苏东旭亿泰智能装备有限公司 | 玻璃基板检查装置 |
-
2018
- 2018-05-17 CN CN201810473265.1A patent/CN108508030A/zh active Pending
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1940541A (zh) * | 2005-09-29 | 2007-04-04 | 奥林巴斯株式会社 | 基板检查装置 |
CN1991446A (zh) * | 2005-12-29 | 2007-07-04 | Lg.菲利浦Lcd株式会社 | 用于检查平板显示器件的装置及其检查方法 |
JP2008170254A (ja) * | 2007-01-11 | 2008-07-24 | Olympus Corp | 基板検査装置 |
CN104280400A (zh) * | 2013-07-11 | 2015-01-14 | 北京兆维电子(集团)有限责任公司 | 一种打光装置及纸张质量检测设备 |
CN203909468U (zh) * | 2014-01-09 | 2014-10-29 | 深圳市度信科技有限公司 | 一种摄像头模组及其半自动调焦测试装置 |
CN106680289A (zh) * | 2017-01-25 | 2017-05-17 | 江苏东旭亿泰智能装备有限公司 | 玻璃基板宏观检查系统 |
CN106990567A (zh) * | 2017-05-12 | 2017-07-28 | 深圳市华星光电技术有限公司 | 一种宏观检查装置及宏观检查方法 |
CN107831172A (zh) * | 2017-08-02 | 2018-03-23 | 深圳市迪姆自动化有限公司 | 全自动玻璃表面瑕疵检测机 |
CN207163930U (zh) * | 2017-09-28 | 2018-03-30 | 芜湖东旭光电科技有限公司 | 液晶基板玻璃条纹辅助检查装置和检查系统 |
CN107907549A (zh) * | 2017-11-13 | 2018-04-13 | 武汉华星光电半导体显示技术有限公司 | 基板检查设备及基板检查方法 |
CN208520779U (zh) * | 2018-05-17 | 2019-02-19 | 江苏东旭亿泰智能装备有限公司 | 玻璃基板检查装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020062571A1 (zh) * | 2018-09-29 | 2020-04-02 | 苏州精濑光电有限公司 | 基板检测设备 |
CN110672629A (zh) * | 2019-11-07 | 2020-01-10 | 江苏上达电子有限公司 | 一种避免外观检查时cof产品产生背面划伤的方法 |
CN112764266A (zh) * | 2020-12-31 | 2021-05-07 | 惠州视维新技术有限公司 | 背光模组、显示装置以及显示装置的检测方法 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN108508030A (zh) | 玻璃基板检查装置及使用其检查玻璃基板的方法 | |
CN104375293B (zh) | 基于机器视觉的lcd屏自动检测机台 | |
CN208520779U (zh) | 玻璃基板检查装置 | |
CN105301009A (zh) | 刹车片外观缺陷多工位在线检测装置及方法 | |
CN205356603U (zh) | 多工位手机摄像头模组检测机 | |
KR20070094471A (ko) | 외관 검사 장치 | |
CN104019331A (zh) | 一种aoi可升降工作台 | |
CN206531573U (zh) | 导光板辉度检测装置 | |
CN104923921B (zh) | 一种紫外激光加工设备 | |
CN209311359U (zh) | 一种屏幕外观质量检测装置 | |
CN219201397U (zh) | 一种芯片光学检测装置 | |
CN209486011U (zh) | 一种x-ray检测平台 | |
CN207528645U (zh) | 一种基板边缘检查机 | |
CN204064971U (zh) | 背光模组质量检测装置 | |
CN109540939A (zh) | 一种x-ray检测平台 | |
CN205537628U (zh) | 视觉立体检测模组 | |
CN207366077U (zh) | 五轴测量机台 | |
CN107884417A (zh) | 一种基板边缘检查机及边缘检查方法 | |
KR100776732B1 (ko) | 평판 디스플레이용 매크로 검사장치 | |
KR100856727B1 (ko) | 평판 디스플레이용 글라스 육안 검사장치 | |
KR100596334B1 (ko) | 기판 외관 검사 장치 | |
CN208902625U (zh) | 陶瓷基板外观检测装置 | |
CN209325306U (zh) | Led支架检测装置 | |
CN201569781U (zh) | 显微镜用可程控平移标本放置平台 | |
WO2006080760A1 (en) | An apparatus for macro inspection for flat panel display |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information |
Address after: No. 223800, Suhu Economic Development Zone, Jiangsu Province Applicant after: Jiangsu Hongxin Yitai Intelligent Equipment Co.,Ltd. Applicant after: DONGXU OPTOELECTRONIC TECHNOLOGY Co.,Ltd. Address before: No. 223800, Suhu Economic Development Zone, Jiangsu Province Applicant before: JIANGSU DONGXU YITAI INTELLIGENT EQUIPMENT Co.,Ltd. Applicant before: DONGXU OPTOELECTRONIC TECHNOLOGY Co.,Ltd. |
|
CB02 | Change of applicant information | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20201221 Address after: No. 223800, Suhu Economic Development Zone, Jiangsu Province Applicant after: Jiangsu Hongxin Yitai Intelligent Equipment Co.,Ltd. Address before: No. 223800, Suhu Economic Development Zone, Jiangsu Province Applicant before: Jiangsu Hongxin Yitai Intelligent Equipment Co.,Ltd. Applicant before: DONGXU OPTOELECTRONIC TECHNOLOGY Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180907 |