CN108499906A - 电子部件输送装置及电子部件检查装置 - Google Patents

电子部件输送装置及电子部件检查装置 Download PDF

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Publication number
CN108499906A
CN108499906A CN201810144864.9A CN201810144864A CN108499906A CN 108499906 A CN108499906 A CN 108499906A CN 201810144864 A CN201810144864 A CN 201810144864A CN 108499906 A CN108499906 A CN 108499906A
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CN
China
Prior art keywords
inspection
electronic component
electronic unit
checks
fingerprint
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810144864.9A
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English (en)
Chinese (zh)
Inventor
荻原武彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN108499906A publication Critical patent/CN108499906A/zh
Pending legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN201810144864.9A 2017-02-23 2018-02-12 电子部件输送装置及电子部件检查装置 Pending CN108499906A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-031827 2017-02-23
JP2017031827A JP2018136239A (ja) 2017-02-23 2017-02-23 電子部品搬送装置及び電子部品検査装置

Publications (1)

Publication Number Publication Date
CN108499906A true CN108499906A (zh) 2018-09-07

Family

ID=63365484

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810144864.9A Pending CN108499906A (zh) 2017-02-23 2018-02-12 电子部件输送装置及电子部件检查装置

Country Status (3)

Country Link
JP (1) JP2018136239A (https=)
CN (1) CN108499906A (https=)
TW (1) TWI668455B (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110954801A (zh) * 2018-09-27 2020-04-03 精工爱普生株式会社 电子部件输送装置及电子部件检查装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8381896B2 (en) * 2009-04-13 2013-02-26 Ackley Machine Corporation Ejection system
CN103569624A (zh) * 2012-07-20 2014-02-12 精工爱普生株式会社 电子部件搬运装置以及电子部件检查装置
CN103687467A (zh) * 2012-09-19 2014-03-26 雅马哈发动机株式会社 电子元件安装装置
CN105738793A (zh) * 2010-05-14 2016-07-06 精工爱普生株式会社 电子部件检查装置及电子部件搬送方法
CN106180004A (zh) * 2016-08-08 2016-12-07 深圳市华宇半导体有限公司 指纹分选机的控制系统及控制方法
CN106269581A (zh) * 2015-06-10 2017-01-04 鸿劲科技股份有限公司 指纹辨识电子元件作业装置及其应用的测试分类设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0514951U (ja) * 1991-08-14 1993-02-26 横河電機株式会社 半導体テスト装置
TW369692B (en) * 1997-12-26 1999-09-11 Samsung Electronics Co Ltd Test and burn-in apparatus, in-line system using the apparatus, and test method using the system
KR100898821B1 (ko) * 2007-11-29 2009-05-22 주식회사 실트론 웨이퍼 캐리어의 제조방법
KR101304275B1 (ko) * 2008-09-30 2013-09-11 (주)테크윙 전자부품 테스트 시스템
TWI425230B (zh) * 2011-10-25 2014-02-01 Chroma Ate Inc Touchpad detection machine
CN105938169A (zh) * 2016-03-25 2016-09-14 江苏凯尔生物识别科技有限公司 指纹模组金属环组装吸附冶具

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8381896B2 (en) * 2009-04-13 2013-02-26 Ackley Machine Corporation Ejection system
CN105738793A (zh) * 2010-05-14 2016-07-06 精工爱普生株式会社 电子部件检查装置及电子部件搬送方法
CN103569624A (zh) * 2012-07-20 2014-02-12 精工爱普生株式会社 电子部件搬运装置以及电子部件检查装置
CN103687467A (zh) * 2012-09-19 2014-03-26 雅马哈发动机株式会社 电子元件安装装置
CN106269581A (zh) * 2015-06-10 2017-01-04 鸿劲科技股份有限公司 指纹辨识电子元件作业装置及其应用的测试分类设备
CN106180004A (zh) * 2016-08-08 2016-12-07 深圳市华宇半导体有限公司 指纹分选机的控制系统及控制方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110954801A (zh) * 2018-09-27 2020-04-03 精工爱普生株式会社 电子部件输送装置及电子部件检查装置
CN110954801B (zh) * 2018-09-27 2021-11-05 北星科技股份有限公司 电子部件输送装置及电子部件检查装置

Also Published As

Publication number Publication date
TWI668455B (zh) 2019-08-11
JP2018136239A (ja) 2018-08-30
TW201831913A (zh) 2018-09-01

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Application publication date: 20180907