CN108242252B - 一种nand闪存芯片的测试样本 - Google Patents
一种nand闪存芯片的测试样本 Download PDFInfo
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- CN108242252B CN108242252B CN201611224670.7A CN201611224670A CN108242252B CN 108242252 B CN108242252 B CN 108242252B CN 201611224670 A CN201611224670 A CN 201611224670A CN 108242252 B CN108242252 B CN 108242252B
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- adjacent
- flash memory
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
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Priority Applications (1)
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CN201611224670.7A CN108242252B (zh) | 2016-12-27 | 2016-12-27 | 一种nand闪存芯片的测试样本 |
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CN201611224670.7A CN108242252B (zh) | 2016-12-27 | 2016-12-27 | 一种nand闪存芯片的测试样本 |
Publications (2)
Publication Number | Publication Date |
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CN108242252A CN108242252A (zh) | 2018-07-03 |
CN108242252B true CN108242252B (zh) | 2023-10-10 |
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CN201611224670.7A Active CN108242252B (zh) | 2016-12-27 | 2016-12-27 | 一种nand闪存芯片的测试样本 |
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Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111833948A (zh) * | 2020-07-16 | 2020-10-27 | 浪潮(北京)电子信息产业有限公司 | Nand闪存的擦写能力测试方法、装置、设备及介质 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1296610A (zh) * | 1999-01-08 | 2001-05-23 | 皇家菲利浦电子有限公司 | 确定最佳擦除和写入功率的方法、以及带有使用所述方法的设备的记录装置 |
CN101324862A (zh) * | 2008-05-05 | 2008-12-17 | 青岛海信电器股份有限公司 | 闪存存储管理方法 |
CN101512665A (zh) * | 2006-09-12 | 2009-08-19 | 桑迪士克股份有限公司 | 非易失性存储器及用于在初始编程电压的修整期间减少擦除/写入循环的方法 |
CN101770813A (zh) * | 2008-12-31 | 2010-07-07 | 联咏科技股份有限公司 | 用于检测非易失式存储器的相邻区块干扰现象的检测方法 |
CN101853692A (zh) * | 2009-04-03 | 2010-10-06 | 群联电子股份有限公司 | 具闪存测试功能的控制器及其储存系统与测试方法 |
CN104252883A (zh) * | 2013-06-26 | 2014-12-31 | 深圳市江波龙电子有限公司 | 闪存管理方法和系统 |
CN105006253A (zh) * | 2015-08-11 | 2015-10-28 | 上海华虹宏力半导体制造有限公司 | 一种闪存芯片数据保留性检查方法及系统 |
CN105469834A (zh) * | 2014-09-12 | 2016-04-06 | 上海华虹宏力半导体制造有限公司 | 嵌入式闪存的测试方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050210179A1 (en) * | 2002-12-02 | 2005-09-22 | Walmsley Simon R | Integrated circuit having random clock or random delay |
JP2006261504A (ja) * | 2005-03-18 | 2006-09-28 | Fujitsu Ltd | 半導体装置及びその試験方法 |
TWI390537B (zh) * | 2008-12-22 | 2013-03-21 | Novatek Microelectronics Corp | 用於偵測非揮發式記憶體之相鄰區塊干擾現象的偵測方法 |
-
2016
- 2016-12-27 CN CN201611224670.7A patent/CN108242252B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1296610A (zh) * | 1999-01-08 | 2001-05-23 | 皇家菲利浦电子有限公司 | 确定最佳擦除和写入功率的方法、以及带有使用所述方法的设备的记录装置 |
CN101512665A (zh) * | 2006-09-12 | 2009-08-19 | 桑迪士克股份有限公司 | 非易失性存储器及用于在初始编程电压的修整期间减少擦除/写入循环的方法 |
CN101324862A (zh) * | 2008-05-05 | 2008-12-17 | 青岛海信电器股份有限公司 | 闪存存储管理方法 |
CN101770813A (zh) * | 2008-12-31 | 2010-07-07 | 联咏科技股份有限公司 | 用于检测非易失式存储器的相邻区块干扰现象的检测方法 |
CN101853692A (zh) * | 2009-04-03 | 2010-10-06 | 群联电子股份有限公司 | 具闪存测试功能的控制器及其储存系统与测试方法 |
CN104252883A (zh) * | 2013-06-26 | 2014-12-31 | 深圳市江波龙电子有限公司 | 闪存管理方法和系统 |
CN105469834A (zh) * | 2014-09-12 | 2016-04-06 | 上海华虹宏力半导体制造有限公司 | 嵌入式闪存的测试方法 |
CN105006253A (zh) * | 2015-08-11 | 2015-10-28 | 上海华虹宏力半导体制造有限公司 | 一种闪存芯片数据保留性检查方法及系统 |
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CN108242252A (zh) | 2018-07-03 |
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