CN107983665A - A kind of exception LED core particle choosing except method and choosing except system - Google Patents
A kind of exception LED core particle choosing except method and choosing except system Download PDFInfo
- Publication number
- CN107983665A CN107983665A CN201711144177.9A CN201711144177A CN107983665A CN 107983665 A CN107983665 A CN 107983665A CN 201711144177 A CN201711144177 A CN 201711144177A CN 107983665 A CN107983665 A CN 107983665A
- Authority
- CN
- China
- Prior art keywords
- led core
- core particle
- photoelectric properties
- properties test
- inharmonious
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
Choosing except method and choosing except system this application discloses a kind of abnormal LED core particle, wherein, the exception LED core particle is chosen except realization removes choosing for abnormal LED core particle the characteristics of losing viscosity after uv-exposure of the method using the inharmonious films of UV, and without additionally opening up board, original photoelectric properties test equipment is improved, abnormal LED core particle is marked without using red ink, there is no the situation for mis-marked normal LED core particle occur, and compared to carrying out choosing the method removed to abnormal LED core particle using sorting machine, with choosing except efficient, choose except cost is low, and there is the LED core particle for being suitable for needles of various sizes and shape, applicability is preferable.
Description
Technical field
This application involves technical field of semiconductors, choosing except method and choosing more specifically to a kind of abnormal LED core particle
Except system.
Background technology
LED (light emitting diode, Light Emitting Diode) chip, also referred to as LED luminescence chips, are LED light
Core component.Since the 1990s, blue-light LED chip realized volume production, the luminous efficiency of LED chip is higher and higher, with bright
The LED core chip size of degree demand is less and less.
At least there is a LED core particle by encapsulation, each LED core particle completes epitaxial structure in each LED chip
After preparation with the functional structure such as electrode, it is also necessary to the test of photoelectric properties etc. is carried out to it, it is different for test result
Normal LED core particle is determined as abnormal LED core particle.The processing side of abnormal LED core particle in small size LED chip in the prior art
Formula usually has two kinds, is handled one is carrying out a red ink to the abnormal LED core particle of detection, in the encapsulation of follow-up LED chip
These surface points are directly skipped during die bond the LED core particle of red ink；The second is using sorting machine to the abnormal LED of detection
Core particles choose removing.Wherein, often there is red ink and spills in the first mode that red ink mark is carried out to abnormal LED core particle
Phenomenon in normal LED core particle, is caused mis-marked；Abnormal LED core particle is carried out choosing the mode removed using sorting machine for second and chosen
Except less efficient, and cost is higher, for the LED core particle below certain size without suitable suction nozzle, and can not be suitable for LED
The LED core particle of chip perimeter non-fully chip form, applicability are poor.
The content of the invention
In order to solve the above technical problems, choosing except method and choosing except system the present invention provides a kind of abnormal LED core particle, with
Realize avoid the occurrence of it is mis-marked on the basis of, improve the choosing except efficiency of abnormal LED core particle, reduce and choose except abnormal LED core particle
Cost, and improve the purpose for choosing the applicability except method of abnormal LED core particle.
To realize above-mentioned technical purpose, an embodiment of the present invention provides following technical solution：
A kind of exception LED core particle is chosen except method, including：
Multiple LED core particles are arranged at the inharmonious film surfaces of UV, and the inharmonious films of the UV for being provided with multiple LED core particles are positioned over
The support panel surface of photoelectric properties test equipment, the Support tray are the Support tray of transparent material；
Photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment, and described in transmission
Support tray carries out uv-exposure processing to the LED core particle of photoelectric properties test failure；
Blue film is set away from the inharmonious film sides of the UV in multiple LED core particles；
Separate the blue film and multiple LED core particles.
It is optionally, described that photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment,
And include through LED core particle progress uv-exposure processing of the Support tray to photoelectric properties test failure：
Photoelectric properties test is carried out to current LED core particle using the photoelectric properties test equipment, and in the LED core particle
Photoelectric properties test after the completion of, judge that the photoelectric properties of the LED core particle test whether qualification, if it is not, then using with institute
The ultraviolet source for stating the connection of photoelectric properties test equipment carries out uv-exposure processing to the LED core particle；
Judge whether to carry out all LED core particles on the inharmonious films of UV photoelectric properties test, if so, then entering step
S103, if it is not, then using next LED core particle as current LED core particle, and photoelectric properties test equipment described in Returning utilization is to current
LED core particle carries out the step of photoelectric properties test.
It is optionally, described that photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment,
And include through LED core particle progress uv-exposure processing of the Support tray to photoelectric properties test failure：
Photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment, and counts photoelectricity
The positional information of the underproof LED core particle of performance test；
According to the positional information of the LED core particle of the photoelectric properties test failure of statistics, at least one ultraviolet source is utilized
Uv-exposure processing is carried out to the LED core particle of photoelectric properties test failure.
Optionally, the positional information of the LED core particle is the seat for the plane coordinate system established using presetting LED core particle as origin
Mark information.
Optionally, the separation blue film after multiple LED core particles with further including：
Appearance test is carried out to the LED core particle of the inharmonious film surfaces of the UV, and rejects appearance and tests underproof LED core
Grain.
A kind of exception LED core particle is chosen except system, including：
Core particles setup module, for multiple LED core particles to be arranged at the inharmonious film surfaces of UV, and will be provided with multiple LED cores
The inharmonious films of UV of grain are positioned over the support panel surface of photoelectric properties test equipment, and the Support tray is the Support tray of transparent material；
Performance test module, for carrying out photo electric to multiple LED core particles using the photoelectric properties test equipment
It can test, and uv-exposure processing is carried out to the LED core particle of photoelectric properties test failure through the Support tray；
Blue film setup module, for setting blue film away from the inharmonious film sides of the UV in multiple LED core particles；
Core particles separation module, for separating the blue film and multiple LED core particles.
Optionally, the performance test module carries out multiple LED core particles using the photoelectric properties test equipment
Photoelectric properties are tested, and uv-exposure processing tool is carried out to the LED core particle of photoelectric properties test failure through the Support tray
Body is used for,
Photoelectric properties test is carried out to current LED core particle using the photoelectric properties test equipment, and in the LED core particle
Photoelectric properties test after the completion of, judge that the photoelectric properties of the LED core particle test whether qualification, if it is not, then using with institute
The ultraviolet source for stating the connection of photoelectric properties test equipment carries out uv-exposure processing to the LED core particle；
Judge whether to carry out all LED core particles on the inharmonious films of UV photoelectric properties test, if so, then starting the indigo plant
Film setup module, if it is not, then using next LED core particle as current LED core particle, and photoelectric properties test equipment described in Returning utilization
The step of photoelectric properties test is carried out to current LED core particle.
Optionally, the performance test module includes：
Test cell, for carrying out photoelectric properties survey to multiple LED core particles using the photoelectric properties test equipment
Examination, and count the positional information of the LED core particle of photoelectric properties test failure；
Exposing unit, for the positional information of the LED core particle of the photoelectric properties test failure according to statistics, using at least
One ultraviolet source carries out uv-exposure processing to the LED core particle of photoelectric properties test failure.
Optionally, the positional information of the LED core particle is the seat for the plane coordinate system established using presetting LED core particle as origin
Mark information.
It can be seen from the above technical proposal that an embodiment of the present invention provides a kind of abnormal LED core particle choose except method and
The system of removing is chosen, wherein, the characteristics of the choosing except viscosity is lost after uv-exposure of the method using the inharmonious films of UV of LED core particle of exception
Realization removes choosing for abnormal LED core particle, and without additionally opening up board, original photoelectric properties test equipment is improved
, to choosing except cost is relatively low for abnormal LED core particle, specifically, the exception LED core particle is chosen except method first will be multiple
LED core particle is arranged at the inharmonious film surfaces of UV, after photoelectric properties test is carried out to LED core particle using photoelectric properties test equipment,
Uv-exposure processing is carried out to the LED core particle of photoelectric properties test failure through Support tray, so that photoelectric properties test does not conform to
Viscosity is lost between the LED core particle of lattice and the inharmonious films of the UV, is set finally by LED core particle away from the inharmonious film sides of the UV
Blue film and separated mode are put, the LED core particle that the photoelectric properties test failure of viscosity will be lost between the inharmonious films of UV adheres to
In blue film surface, and the LED core particle of photoelectric properties test passes remains adhered to the inharmonious film surfaces of UV, so as to fulfill abnormal LED
Choosing for core particles removes.
Choosing except method without using red ink is marked abnormal LED core particle for the exception LED core particle, is not present out
The situation of existing mis-marked normal LED core particle, and compared to carrying out choosing the method removed to abnormal LED core particle using sorting machine, have
Choose except efficient, choose except cost is low, and there is the LED core particle for being suitable for needles of various sizes and shape, applicability is preferable.
Also, the Support tray for choosing the photoelectric properties test equipment used except method of the exception LED core particle is transparent material
The Support tray of matter, only needs to use ultraviolet when the LED core particle to photoelectric properties test failure carries out uv-exposure processing
It is exposed through the Support tray, without additionally opening up board, so as to reduce using the abnormal LED core
The cost chosen except method of grain.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is attached drawing needed in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
The embodiment of invention, for those of ordinary skill in the art, without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of flow diagram chosen except method for abnormal LED core particle that one embodiment of the application provides；
Fig. 2 is the schematic top plan view for the LED core particle positioned at the inharmonious film surfaces of UV that one embodiment of the application provides；
Fig. 3 is that one kind that one embodiment of the application provides surveys LED core particle using photoelectric properties test equipment
The cross section structure schematic diagram of examination；
Fig. 4 is that a kind of of one embodiment offer of the application sets blue film in LED core particle away from the inharmonious film sides of UV
Cross section structure schematic diagram；
Fig. 5 is a kind of separation indigo plant film that one embodiment of the application provides and the schematic cross-section of LED core particle；
Fig. 6 is a kind of flow diagram chosen except method for abnormal LED core particle that another embodiment of the application provides；
Fig. 7 is a kind of flow diagram chosen except method for abnormal LED core particle that another embodiment of the application provides；
Fig. 8 is that a kind of mode of the positional information for each LED core particle of expression that one embodiment of the application provides is illustrated
Figure；
Fig. 9 is one of the application specific；
Figure 10 is a kind of structure diagram chosen except system for abnormal LED core particle that one embodiment of the application provides；
Figure 11 is a kind of structural representation chosen except system for abnormal LED core particle that another embodiment of the application provides
Figure.
Embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment, belongs to the scope of protection of the invention.
The embodiment of the present application provides the choosing except method of a kind of abnormal LED core particle, as shown in Figure 1, including：
S101：Multiple LED core particles are arranged at the inharmonious film surfaces of UV, and the inharmonious films of UV that will be provided with multiple LED core particles
The support panel surface of photoelectric properties test equipment is positioned over, the Support tray is the Support tray of transparent material；
With reference to figure 2, Fig. 2 is the schematic diagram of the inharmonious films of UV and its surface texture after step S101；Label in Fig. 2
10 represent the inharmonious films of UV, and 20 represent LED core particle.
It should be noted that the inharmonious films of UV, which are also known as UV, loses glue adhesive tape, UV visbreakings adhesive tape or the inharmonious film of ultraviolet irradiation；UV loses
Mucous membrane is that a kind of coated on Special Film shows high bonding force (20n/25mm) in normality, but is glued after ultraviolet irradiates
The film layer that the special glue of relay drastically down type (0.1n/25mm) is made, it is also believed that being irradiated by ultraviolet
The inharmonious films of partial UV lose viscosity.The bonding force of the inharmonious films of UV of non-irradiated with ultraviolet radiation is significantly larger than the bonding of blue film
Power.In this application, choosing for abnormal LED core particle is removed using this characteristic realization of the inharmonious films of UV.
In addition, in the present embodiment, by the support that the Support tray of photoelectric properties test equipment is arranged to transparent material
Disk, can be directly after photoelectric properties test equipment carries out photoelectric properties test, i.e., the LED to photoelectric properties test failure
Core particles carry out uv-exposure, so that it loses the viscosity with the inharmonious films of UV.
S102：Photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment, and is passed through
The Support tray carries out uv-exposure processing to the LED core particle of photoelectric properties test failure；
With reference to figure 3, Fig. 3 is the schematic cross-section that photoelectric properties test equipment tests LED core particle, in figure 3, is shown
The integrating sphere 50 and test probe 40 of photoelectric properties test equipment are gone out.The test probe 40 contacts the two of LED core particle respectively
A electrode；In addition, Support tray 30 is also shown in Fig. 3.
S103：Blue film is set away from the inharmonious film sides of the UV in multiple LED core particles；
With reference to figure 4, Fig. 4 is the schematic diagram of the inharmonious films of UV and its surface texture after step S103.
It should be noted that the blue film used in the preparation process of LED chip, also known as turns over epitaxial or hyaline membrane, table
Face has certain viscosity, is mainly used for playing the protection to LED core particle in follow-up performance detection and appearance detection.
S104：Separate the blue film and multiple LED core particles.
With reference to figure 5, Fig. 5 is the flow diagram of step S104.From figure 5 it can be seen that due to after step S102,
Photoelectric properties detect underproof LED core particle and viscosity are lost with the inharmonious films of UV, therefore are passing through step S103 and S104
Afterwards, the unqualified LED core particle for losing viscosity is adhered on blue film, and the LED core particle and the inharmonious films of UV of photoelectric properties detection qualification
Between due to there are still viscosity, it is and much bigger for viscosity of the viscosity compared to blue film of the inharmonious films of UV, therefore, this portion
The qualified LED core particle of light splitting electrical property detection remains in the inharmonious film surfaces of UV.Chosen so as to fulfill to abnormal LED core particle
Remove.
Choosing except method without using red ink is marked abnormal LED core particle for the exception LED core particle, is not present out
The situation of existing mis-marked normal LED core particle, and compared to carrying out choosing the method removed to abnormal LED core particle using sorting machine, have
Choose except efficient, choose except cost is low, and there is the LED core particle for being suitable for needles of various sizes and shape, applicability is preferable.
Also, the Support tray for choosing the photoelectric properties test equipment used except method of the exception LED core particle is transparent material
The Support tray of matter, only needs to use ultraviolet when the LED core particle to photoelectric properties test failure carries out uv-exposure processing
It is exposed through the Support tray, without additionally opening up board, so as to reduce using the abnormal LED core
The cost chosen except method of grain.
On the basis of above-described embodiment, in one embodiment of the application, as shown in fig. 6, described utilize the light
Electric performance test equipment carries out multiple LED core particles photoelectric properties test, and photoelectric properties are surveyed through the Support tray
Trying underproof LED core particle progress uv-exposure processing includes：
S1021：Photoelectric properties test is carried out to current LED core particle using the photoelectric properties test equipment, and described
After the completion of the photoelectric properties test of LED core particle, judge that the photoelectric properties of the LED core particle test whether qualification, if it is not, then sharp
Uv-exposure processing is carried out to the LED core particle with the ultraviolet source being connected with the photoelectric properties test equipment；
S1022：Judge whether to carry out all LED core particles on the inharmonious films of UV photoelectric properties test, if so, then entering
Step S103, if it is not, then using next LED core particle as current LED core particle, and photoelectric properties test equipment pair described in Returning utilization
The step of current LED core particle carries out photoelectric properties test.
In the present embodiment, photoelectric properties test is being carried out to a LED core particle using photoelectric properties test equipment, and
And after judging the photoelectric properties test failure of the LED core particle, that is, utilize be connected with the photoelectric properties test equipment it is ultraviolet
Light source carries out uv-exposure processing to the LED core particle, so may not need the underproof LED core particle of recording light electric performance test
Test position, reduce the complexity chosen except method of the abnormal LED core particle.
Correspondingly, in the present embodiment, the improvement to the photoelectric properties test equipment can be divided into two parts, when by
Support tray is arranged to the Support tray of transparent material, two be disposed on photoelectric properties test equipment test probe it is synchronization-moving,
Positioned at Support tray deviate from the LED core particle side ultraviolet source, and set photoelectric properties test equipment control logic be
During the photoelectric properties test failure of current LED core particle, connected ultraviolet source is controlled to expose current LED core particle default
Time.Wherein, the value of preset time regards the parameter of the inharmonious films of UV used and performance determines.The application does not limit this
It is fixed, specifically depending on actual conditions.
But in the other embodiment of the application, one kind is additionally provided using the photoelectric properties test equipment to multiple institutes
State LED core particle and carry out photoelectric properties test, and purple is carried out to the LED core particle of photoelectric properties test failure through the Support tray
The method of outer exposure-processed, as shown in fig. 7, comprises：
S1022：Photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment, and is united
The positional information of the underproof LED core particle of photometric electric performance test；
S1023：According to the positional information of the LED core particle of the photoelectric properties test failure of statistics, at least one purple is utilized
Outer light source carries out uv-exposure processing to the LED core particle of photoelectric properties test failure.
In the present embodiment, using the photoelectric properties test equipment to all LED core particles of the inharmonious film surfaces of UV into
While row photoelectric properties are tested, the positional information of the underproof LED core particle of recording light electric performance test；Then according to statistics
The positional information of the LED core particle of photoelectric properties test failure, does not conform to photoelectric properties test using at least one ultraviolet source
The LED core particle of lattice carries out uv-exposure processing.So one or more ultraviolet sources can be utilized to test at the same time photoelectric properties
Underproof LED core particle carries out uv-exposure processing, improves and carries out ultraviolet exposure to the LED core particle of photoelectric properties test failure
The efficiency of light processing, so as to improve the efficiency of the practice chosen except method of the abnormal LED core particle.
But it should be noted that the quantity of ultraviolet source and choosing except the cost of method is for the implementation abnormal LED core particle
It is positively related, that is to say, that the quantity of the ultraviolet source used in step S1024 is more, implements the abnormal LED core particle
Choose except the cost of method is higher, but efficiency of the practice also can be higher at the same time.Therefore, in actual application, can regard actual
Situation carries out uv-exposure processing using appropriate number of ultraviolet source to the LED core particle of photoelectric properties test failure.
Optionally, the positional information of the LED core particle is the seat for the plane coordinate system established using presetting LED core particle as origin
Mark information.
In actual application, each LED core particle positioned at the inharmonious film surfaces of UV can be with a coordinate representation；Ginseng
Examine Fig. 8, the label 10 in Fig. 8 represents the inharmonious films of UV, and 20 represent LED core particles；We can be with positioned at the one of the inharmonious film surfaces of UV
Plane coordinate system, so each LED core particle in the inharmonious film surfaces of UV are established in position where a LED core particle for origin (0,0)
Can be represented with coordinate, it is highly preferred that ensure in the inharmonious film surface arrangement LED core particles of UV each LED core particle it
Between spacing it is identical, the unit of an X-direction can be thus used as using the horizontal and vertical spacing between adjacent LED core particles
The unit length of length or a Y-direction, so that the coordinate of each LED core particle is integer；For example, in fig. 8, with positioned at
The coordinate of the LED core particle of the adjacent X-direction of the LED core particle of origin can be defined as (- 1,0) and (1,0).So, likewise, with
The coordinate of the LED core particle of the Y-direction adjacent positioned at the LED core particle of origin can be respectively defined as (0,1) and (0, -1).
Of course, in the other embodiment of the application, can also record in other manners positioned at the inharmonious film tables of UV
The positional information of the LED core particle in face.The application does not limit this, specifically depending on actual conditions.
On the basis of above-described embodiment, in another embodiment of the application, as shown in figure 9, described in the separation
Blue film after multiple LED core particles with further including：
S105：Appearance test is carried out to the LED core particle of the inharmonious film surfaces of the UV, and it is underproof to reject appearance test
LED core particle.
Under normal circumstances, judge LED core particle whether abnormal condition be LED core particle photoelectric properties test passes,
And appearance test passes, therefore, in the present embodiment, step S105 is added, to the photo electric left in the inharmonious film surfaces of UV
The LED core particle of energy test passes carries out appearance test, and rejects appearance and test underproof LED core particle, completes whole exception
Choosing for LED core particle removes.And the method that appearance test is carried out to LED core particle has been well known to those skilled in the art, the application exists
This is not repeated.
In conclusion the embodiment of the present application provides the choosing except method of a kind of abnormal LED core particle, the exception LED core particle
Choose except the characteristics of losing viscosity after uv-exposure of the method using the inharmonious films of UV realize choosing for abnormal LED core particle is removed, and
Without additionally opening up board, original photoelectric properties test equipment is improved, to choosing except cost for abnormal LED core particle
Relatively low, specifically, the exception LED core particle is chosen except multiple LED core particles are arranged at the inharmonious film surfaces of UV by method first,
After carrying out photoelectric properties test to LED core particle using photoelectric properties test equipment, photoelectric properties test is not conformed to through Support tray
The LED core particle of lattice carries out uv-exposure processing, so that between the LED core particle of photoelectric properties test failure and the inharmonious films of the UV
Viscosity is lost, blue film and separated mode are set away from the inharmonious film sides of the UV finally by LED core particle, will be inharmonious with UV
The LED core particle that the photoelectric properties test failure of viscosity is lost between film is adhered to blue film surface, and photoelectric properties test passes
LED core particle remain adhered to the inharmonious film surfaces of UV, removed so as to fulfill choosing for abnormal LED core particle.
Choosing except method without using red ink is marked abnormal LED core particle for the exception LED core particle, is not present out
The situation of existing mis-marked normal LED core particle, and compared to carrying out choosing the method removed to abnormal LED core particle using sorting machine, have
Choose except efficient, choose except cost is low, and there is the LED core particle for being suitable for needles of various sizes and shape, applicability is preferable.
Also, the Support tray for choosing the photoelectric properties test equipment used except method of the exception LED core particle is transparent material
The Support tray of matter, only needs to use ultraviolet when the LED core particle to photoelectric properties test failure carries out uv-exposure processing
It is exposed through the Support tray, without additionally opening up board, so as to reduce using the abnormal LED core
The cost chosen except method of grain.
Choosing except system is described to abnormal LED core particle provided by the embodiments of the present application below, exception described below
LED core particle chooses choosing except method can correspond reference except system and above-described abnormal LED core particle.
Correspondingly, the embodiment of the present application provides the choosing except system of a kind of abnormal LED core particle, as shown in Figure 10, including：
Core particles setup module 100, for multiple LED core particles to be arranged at the inharmonious film surfaces of UV, and will be provided with multiple LED
The inharmonious films of UV of core particles are positioned over the support panel surface of photoelectric properties test equipment, and the Support tray is the support of transparent material
Disk；
Performance test module 200, for carrying out photoelectricity to multiple LED core particles using the photoelectric properties test equipment
Performance test, and uv-exposure processing is carried out to the LED core particle of photoelectric properties test failure through the Support tray；
Blue film setup module 300, for setting blue film away from the inharmonious film sides of the UV in multiple LED core particles；
Core particles separation module 400, for separating the blue film and multiple LED core particles.
Optionally, the performance test module carries out multiple LED core particles using the photoelectric properties test equipment
Photoelectric properties are tested, and uv-exposure processing tool is carried out to the LED core particle of photoelectric properties test failure through the Support tray
Body is used for,
Photoelectric properties test is carried out to current LED core particle using the photoelectric properties test equipment, and in the LED core particle
Photoelectric properties test after the completion of, judge that the photoelectric properties of the LED core particle test whether qualification, if it is not, then using with institute
The ultraviolet source for stating the connection of photoelectric properties test equipment carries out uv-exposure processing to the LED core particle；
If it is, judge whether to carry out all LED core particles on the inharmonious films of UV photoelectric properties test, if so, then
Start the blue film setup module, if it is not, then carrying out photoelectric properties test to next LED core particle, and return and judge the LED core
The photoelectric properties of grain test whether the step of qualification.
Optionally, as shown in figure 11, the performance test module 200 includes：
Test cell 210, for carrying out photoelectric properties to multiple LED core particles using the photoelectric properties test equipment
Test, and count the positional information of the LED core particle of photoelectric properties test failure；
Exposing unit 220, for the positional information of the LED core particle of the photoelectric properties test failure according to statistics, utilizes
At least one ultraviolet source carries out uv-exposure processing to the LED core particle of photoelectric properties test failure.
Optionally, the positional information of the LED core particle is the seat for the plane coordinate system established using presetting LED core particle as origin
Mark information.
In conclusion the embodiment of the present application provides a kind of choosing except method and choosing except system for abnormal LED core particle, wherein,
It is described exception LED core particle choose except the characteristics of losing viscosity after uv-exposure of the method using the inharmonious films of UV realize to abnormal LED
Choosing for core particles removes, and without additionally opening up board, original photoelectric properties test equipment is improved, to exception
LED core particle is chosen except cost is relatively low, and specifically, the exception LED core particle is chosen except method is first set multiple LED core particles
In the inharmonious film surfaces of UV, after photoelectric properties test is carried out to LED core particle using photoelectric properties test equipment, through Support tray pair
The LED core particle of photoelectric properties test failure carries out uv-exposure processing so that the LED core particle of photoelectric properties test failure with
Viscosity is lost between the inharmonious films of UV, away from the blue film of the inharmonious film side settings of the UV and is separated finally by LED core particle
Mode, the LED core particle of photoelectric properties test failure that viscosity is lost between the inharmonious films of UV is adhered to blue film surface, and
The LED core particle of photoelectric properties test passes remains adhered to the inharmonious film surfaces of UV, is removed so as to fulfill choosing for abnormal LED core particle.
Choosing except method without using red ink is marked abnormal LED core particle for the exception LED core particle, is not present out
The situation of existing mis-marked normal LED core particle, and compared to carrying out choosing the method removed to abnormal LED core particle using sorting machine, have
Choose except efficient, choose except cost is low, and there is the LED core particle for being suitable for needles of various sizes and shape, applicability is preferable.
Also, the Support tray for choosing the photoelectric properties test equipment used except method of the exception LED core particle is transparent material
The Support tray of matter, only needs to use ultraviolet when the LED core particle to photoelectric properties test failure carries out uv-exposure processing
It is exposed through the Support tray, without additionally opening up board, so as to reduce using the abnormal LED core
The cost chosen except method of grain.
Each embodiment is described by the way of progressive in this specification, what each embodiment stressed be and other
The difference of embodiment, between each embodiment identical similar portion mutually referring to.
The foregoing description of the disclosed embodiments, enables professional and technical personnel in the field to realize or use the present invention.
A variety of modifications to these embodiments will be apparent for those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, it is of the invention
The embodiments shown herein is not intended to be limited to, and is to fit to and the principles and novel features disclosed herein phase one
The most wide scope caused.
Claims (9)
1. a kind of exception LED core particle is chosen except method, it is characterised in that including：
Multiple LED core particles are arranged at the inharmonious film surfaces of UV, and the inharmonious films of the UV for being provided with multiple LED core particles are positioned over photoelectricity
The support panel surface of performance test apparatus, the Support tray are the Support tray of transparent material；
Photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment, and passes through the support
Disk carries out uv-exposure processing to the LED core particle of photoelectric properties test failure；
Blue film is set away from the inharmonious film sides of the UV in multiple LED core particles；
Separate the blue film and multiple LED core particles.
2. according to the method described in claim 1, it is characterized in that, described utilize the photoelectric properties test equipment to multiple institutes
State LED core particle and carry out photoelectric properties test, and purple is carried out to the LED core particle of photoelectric properties test failure through the Support tray
Outer exposure-processed includes：
Photoelectric properties test is carried out to current LED core particle using the photoelectric properties test equipment, and in the light of the LED core particle
After the completion of electric performance test, judge that the photoelectric properties of the LED core particle test whether qualification, if it is not, then using with the light
The ultraviolet source of electric performance test equipment connection carries out uv-exposure processing to the LED core particle；
Judge whether to carry out all LED core particles on the inharmonious films of UV photoelectric properties test, if so, S103 is then entered step,
If it is not, then using next LED core particle as current LED core particle, and photoelectric properties test equipment described in Returning utilization is to current LED core
Grain carries out the step of photoelectric properties test.
3. according to the method described in claim 1, it is characterized in that, described utilize the photoelectric properties test equipment to multiple institutes
State LED core particle and carry out photoelectric properties test, and purple is carried out to the LED core particle of photoelectric properties test failure through the Support tray
Outer exposure-processed includes：
Photoelectric properties test is carried out to multiple LED core particles using the photoelectric properties test equipment, and counts photoelectric properties
The positional information of the LED core particle of test failure；
According to the positional information of the LED core particle of the photoelectric properties test failure of statistics, using at least one ultraviolet source to light
The underproof LED core particle of electric performance test carries out uv-exposure processing.
4. according to the method described in claim 3, it is characterized in that, the positional information of the LED core particle is to preset LED core particle
The coordinate information for the plane coordinate system established for origin.
5. according to the method described in claim 1, it is characterized in that, the separation blue film and multiple LED core particles it
After further include：
Appearance test is carried out to the LED core particle of the inharmonious film surfaces of the UV, and rejects appearance and tests underproof LED core particle.
6. a kind of exception LED core particle is chosen except system, it is characterised in that including：
Core particles setup module, for multiple LED core particles to be arranged at the inharmonious film surfaces of UV, and will be provided with multiple LED core particles
The inharmonious films of UV are positioned over the support panel surface of photoelectric properties test equipment, and the Support tray is the Support tray of transparent material；
Performance test module, for carrying out photoelectric properties survey to multiple LED core particles using the photoelectric properties test equipment
Examination, and uv-exposure processing is carried out to the LED core particle of photoelectric properties test failure through the Support tray；
Blue film setup module, for setting blue film away from the inharmonious film sides of the UV in multiple LED core particles；
Core particles separation module, for separating the blue film and multiple LED core particles.
7. system according to claim 6, it is characterised in that the performance test module is tested using the photoelectric properties
Equipment carries out photoelectric properties test to multiple LED core particles, and through the Support tray to photoelectric properties test failure
LED core particle carries out uv-exposure processing and is specifically used for,
Photoelectric properties test is carried out to current LED core particle using the photoelectric properties test equipment, and in the light of the LED core particle
After the completion of electric performance test, judge that the photoelectric properties of the LED core particle test whether qualification, if it is not, then using with the light
The ultraviolet source of electric performance test equipment connection carries out uv-exposure processing to the LED core particle；
Judge whether to carry out all LED core particles on the inharmonious films of UV photoelectric properties test, set if so, then starting the blue film
Module is put, if it is not, then using next LED core particle as current LED core particle, and photoelectric properties test equipment described in Returning utilization is to working as
Preceding LED core particle carries out the step of photoelectric properties test.
8. system according to claim 6, it is characterised in that the performance test module includes：
Test cell, for carrying out photoelectric properties test to multiple LED core particles using the photoelectric properties test equipment, and
Count the positional information of the LED core particle of photoelectric properties test failure；
Exposing unit, it is at least one for the positional information of the LED core particle of the photoelectric properties test failure according to statistics, utilization
Ultraviolet source carries out uv-exposure processing to the LED core particle of photoelectric properties test failure.
9. system according to claim 8, it is characterised in that the positional information of the LED core particle is to preset LED core particle
The coordinate information for the plane coordinate system established for origin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711144177.9A CN107983665A (en) | 2017-11-17 | 2017-11-17 | A kind of exception LED core particle choosing except method and choosing except system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711144177.9A CN107983665A (en) | 2017-11-17 | 2017-11-17 | A kind of exception LED core particle choosing except method and choosing except system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107983665A true CN107983665A (en) | 2018-05-04 |
Family
ID=62030927
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711144177.9A Pending CN107983665A (en) | 2017-11-17 | 2017-11-17 | A kind of exception LED core particle choosing except method and choosing except system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107983665A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110337237A (en) * | 2019-04-23 | 2019-10-15 | 深圳市丰泰工业科技有限公司 | The method for losing viscosity by UV glue with ultraviolet laser |
| CN110660337A (en) * | 2019-10-15 | 2020-01-07 | 京东方科技集团股份有限公司 | Backboard, display panel and method for processing bad points of micro light-emitting diodes |
| CN110773453A (en) * | 2019-10-31 | 2020-02-11 | 博罗承创精密工业有限公司 | Online detection punching method and device for LED support material belt |
| CN111806093A (en) * | 2020-06-28 | 2020-10-23 | 中国科学院苏州纳米技术与纳米仿生研究所 | Thin ink jet printing head and manufacturing method and equipment thereof |
| CN111906053A (en) * | 2019-05-07 | 2020-11-10 | 矽电半导体设备(深圳)股份有限公司 | Core particle sorting method and core particle sorting structure |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103143507A (en) * | 2013-02-27 | 2013-06-12 | 武汉电信器件有限公司 | Screening method of photodiode chips |
| CN103170461A (en) * | 2009-08-07 | 2013-06-26 | 晶元光电股份有限公司 | Chip classification method |
| JP2014044165A (en) * | 2012-08-28 | 2014-03-13 | Shibuya Kogyo Co Ltd | Article inspection device |
| CN104815805A (en) * | 2015-03-19 | 2015-08-05 | 南昌大学 | Automatic screening system and screening method for LED chips |
| CN106493094A (en) * | 2016-09-23 | 2017-03-15 | 华灿光电（浙江）有限公司 | A kind of detection method of LED chip |
| CN106890802A (en) * | 2017-02-08 | 2017-06-27 | 聚灿光电科技股份有限公司 | A kind of LED disks choose bad point method for separating |
| CN107321639A (en) * | 2017-05-27 | 2017-11-07 | 华灿光电（浙江）有限公司 | A kind of screening technique of light-emitting diode chip for backlight unit |
-
2017
- 2017-11-17 CN CN201711144177.9A patent/CN107983665A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103170461A (en) * | 2009-08-07 | 2013-06-26 | 晶元光电股份有限公司 | Chip classification method |
| JP2014044165A (en) * | 2012-08-28 | 2014-03-13 | Shibuya Kogyo Co Ltd | Article inspection device |
| CN103143507A (en) * | 2013-02-27 | 2013-06-12 | 武汉电信器件有限公司 | Screening method of photodiode chips |
| CN104815805A (en) * | 2015-03-19 | 2015-08-05 | 南昌大学 | Automatic screening system and screening method for LED chips |
| CN106493094A (en) * | 2016-09-23 | 2017-03-15 | 华灿光电（浙江）有限公司 | A kind of detection method of LED chip |
| CN106890802A (en) * | 2017-02-08 | 2017-06-27 | 聚灿光电科技股份有限公司 | A kind of LED disks choose bad point method for separating |
| CN107321639A (en) * | 2017-05-27 | 2017-11-07 | 华灿光电（浙江）有限公司 | A kind of screening technique of light-emitting diode chip for backlight unit |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110337237A (en) * | 2019-04-23 | 2019-10-15 | 深圳市丰泰工业科技有限公司 | The method for losing viscosity by UV glue with ultraviolet laser |
| CN111906053A (en) * | 2019-05-07 | 2020-11-10 | 矽电半导体设备(深圳)股份有限公司 | Core particle sorting method and core particle sorting structure |
| CN110660337A (en) * | 2019-10-15 | 2020-01-07 | 京东方科技集团股份有限公司 | Backboard, display panel and method for processing bad points of micro light-emitting diodes |
| CN110660337B (en) * | 2019-10-15 | 2021-11-23 | 京东方科技集团股份有限公司 | Backboard, display panel and method for processing bad points of micro light-emitting diodes |
| CN110773453A (en) * | 2019-10-31 | 2020-02-11 | 博罗承创精密工业有限公司 | Online detection punching method and device for LED support material belt |
| CN111806093A (en) * | 2020-06-28 | 2020-10-23 | 中国科学院苏州纳米技术与纳米仿生研究所 | Thin ink jet printing head and manufacturing method and equipment thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107983665A (en) | A kind of exception LED core particle choosing except method and choosing except system | |
| CN108735872B (en) | Semiconductor chip repairing method and semiconductor chip repairing device | |
| CN106493094A (en) | A kind of detection method of LED chip | |
| CN108122814A (en) | The sorting transfer method of LED core particle in a kind of LED chip | |
| CN106890802A (en) | A kind of LED disks choose bad point method for separating | |
| CN205264271U (en) | Integrated luminous unit module of full -color RGB and LED display screen | |
| DE102014111744A1 (en) | ASSEMBLY FOR HANDLING A SEMICONDUCTOR CHIP AND METHOD FOR HANDLING A SEMICONDUCTOR CHIP | |
| CN102881587B (en) | Laminated diode manufacturing process and chip sieve tray thereof | |
| CN104470248A (en) | Steel mesh optimizing method | |
| CN107910323A (en) | A kind of small spacing full color display method for packing of COB | |
| CN103594402B (en) | A kind of containing chip components plate | |
| CN209963088U (en) | COB light source based on CSP LED chip | |
| US20200135996A1 (en) | Led mounting method and device | |
| CN102522339B (en) | Method for designing general packaging substrate | |
| CN102263039B (en) | Method for manufacturing crystal grain assembly | |
| CN209199979U (en) | Semiconductor chip crystal solidifying apparatus | |
| WO2020248469A1 (en) | Smd led lamp bead emitting polarized light and method for batch manufacturing same | |
| CN205428994U (en) | Linerless end LED chip | |
| CN104167380A (en) | SMT paster packaging method of SMT paster packaging structure | |
| CN103258933B (en) | Method for preventing glue overflowing in packaging process of wafer-type light-emitting diode (LED) circuit board through copper plating | |
| CN112289780A (en) | LED packaging structure, processing method, lamp strip and lamp | |
| CN105679914B (en) | A kind of manufacture method of LED compound glasses substrate | |
| CN103390700B (en) | Light-emittingdiode encapsulation procedure and encapsulating structure thereof | |
| CN105702592B (en) | A kind of COB welding methods and manufacture method | |
| CN105244423B (en) | Packaging method without substrate LED chip and without substrate LED chip |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |