CN107607753B

CN107607753B - Novel probe of test fixture

Info

Publication number: CN107607753B
Application number: CN201710855106.3A
Authority: CN
Inventors: 李鹏; 李作鹏; 杨洁; 梅得军; 李晓华
Original assignee: Leader-Tech Electronics (shenzhen) Inc
Current assignee: LEADER-TECH (HUANGSHI) Inc.
Priority date: 2017-09-20
Filing date: 2017-09-20
Publication date: 2021-08-17
Anticipated expiration: 2037-09-20
Also published as: CN107607753A

Abstract

The invention discloses a novel probe of a test fixture, which comprises a test end part, a middle part, a connection bottom and a test needle penetrating through the test end part, the middle part and the connection bottom, wherein the end part of the test needle positioned at the connection bottom is connected with a metal spring; before the probe uses, need drill hole to FPC pad position, arrange the downthehole fixed in with the probe after the drilling, the test needle of test tip protrudes slightly in the surface in hole and contacts FPC's test point, be connected with FPC, play the effect that the contact test switches on, the test needle of connecting the bottom even has metal spring, the elastic toughness of spring all is all to be stronger than traditional probe self spring characteristic, play the buffer protection effect to the test needle, can not cause the indentation to the product, durable wearing and tearing are little, the productivity ratio improves, good elasticity has, metal spring connects on inserting row, insert row is connected with the computer through special data line, thereby reach the effect of test.

Description

Novel probe of test fixture

Technical Field

The invention relates to the technical field of probe preparation, in particular to a novel probe of a test fixture.

Background

The FPC generally refers to a flexible printed circuit board, which is a highly reliable and excellent flexible printed circuit board made of a polyimide or polyester film as a base material, has the characteristics of high wiring density, light weight, thin thickness, and good bending property, and is mainly used in advanced technologies such as aerospace, communication, and the like.

The electric test is the only method for testing the electrical characteristics of the product, and also the most effective means for ensuring the final quality of the product, the detection of the FPC board in the prior art mainly has two modes of organic test and manual test, the mechanical test is to drill holes according to the corresponding positions of FPC pads, a probe is arranged to form a fixed test fixture, and the test mode is connected with an open short circuit tester for testing, the test speed is high, the test quality is high, meanwhile, the insulation impedance can be judged, the test counting is automatic, the test indentation is slight, one end of the probe for detecting the FPC board at present is a needle head, a spring is connected behind the needle head, the needle head and the spring form a probe body (the spring is positioned in the middle of the probe body), a needle sleeve is sleeved outside the probe body, a probe connecting wire is connected on the needle sleeve, and the bending deformation and the breakage of the probe are easily caused by the uneven stress and the insufficient self compressive strength and toughness of the probe in the test process, the replacement frequency is high, the production efficiency is influenced, the measurement precision of the probe is not high, the use is inconvenient, and the disassembly and the replacement are not convenient and flexible; thereby causing high production cost and reducing production efficiency.

Disclosure of Invention

According to one aspect of the invention, the novel probe of the test fixture is provided, and comprises a test end part, a middle part, a connection bottom part and a test needle penetrating through the test end part, the middle part and the connection bottom part, wherein the end part of the test needle positioned at the connection bottom part is connected with a metal spring.

Before the probe is used, drilling needs to be carried out on the position of an FPC (flexible printed circuit) pad, the probe is placed in a hole for fixing after drilling, a test needle at the test end slightly protrudes out of the surface of the hole and contacts with a test point of the FPC, and is connected with the FPC to play a role in conducting a contact test.

The elastic part of the common probe is the middle part of the test needle and is wrapped in the middle of the probe, the elastic force is fixed elastic force, the size of the elastic force cannot be adjusted, the minimum elastic force can be 15 grams (namely bearing 15 grams of FPC empty boards), the elastic force of the probe is the bottom of the test needle, the elastic force can be adjusted according to test requirements, and the elastic force can be adjusted to be 5-60 grams (namely bearing 5-60 grams of FPC empty boards), so that the compression damage to the FPC empty boards can be greatly improved.

In some embodiments, the diameter of the middle part is larger than the diameter of the testing end part and the connecting bottom part, so that the probe can be better fixed in the drill hole, and the part with the larger diameter of the middle part is firmly fixed, so that the up-and-down movement range of the testing probe is further limited; the stability and the pressure resistance of the probe are enhanced.

In some embodiments, the test end, the middle and the connection bottom are all made of high-carbon steel, and the common probe is made of copper, so that the test needle is more wear-resistant and not easy to damage, and the working efficiency is improved.

In some embodiments, the diameter of the test needle is 0.2-0.6 mm, the minimum diameter of the test needle can be 0.2mm, the test requirement of a fine circuit can be effectively met, the application range of the probe is ensured, and meanwhile, the measurement precision is high, so that the production efficiency is improved.

In some embodiments, the end of the test pin at the bottom of the connection is detachably connected with the metal spring; thereby facilitating the disassembly, assembly and replacement of the novel probe.

It should be noted that the length of the probe and the lengths of the test end, middle and connecting bottom parts can be set according to the actual test requirements.

It should be noted that the novel probe of the present invention can be used for testing not only FPC, but also PCB and circuit board.

The test is carried out under the upper and lower mould pressing of the jig, the test frequency service life of the common probe is 50 ten thousand, the test frequency service life of the probe can reach more than 100 ten thousand, the diameter of the common probe can be 0.4MM at least, the diameter of the probe can be 0.2MM at least, the position of the probe contacting with the FPC test point is small, and the tolerance of plus or minus 0.05MM is generated during pressing, so that the probe can more accurately contact with the FPC test point, the test precision is achieved, and the test stability is improved.

Drawings

FIG. 1 is a schematic diagram of a probe structure according to an embodiment of the present invention;

fig. 2 is a schematic view illustrating a probe fixed to a drill hole of an FPC pad according to an embodiment of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings.

Fig. 1 schematically shows a schematic diagram of a probe structure according to an embodiment of the present invention. As shown in the figure, the testing device comprises a testing end part 1, a middle part 2, a connecting bottom part 3 and a testing needle 4 penetrating through the testing end part 1, the middle part 2 and the connecting bottom part 3, wherein the end part of a testing needle 43 positioned at the connecting bottom part 3 is connected with a metal spring 5.

Before the probe is used, the FPC bonding pad needs to be drilled, the probe is placed in the hole to be fixed after the hole is drilled, and the middle part of the test needle is fixed in the insulating material, so that the test needle is only stressed by longitudinal force and is not stressed by transverse force, and the stability and the compression resistance of the probe are enhanced; the test needle 41 of test tip protrudes slightly in the surface of hole and contacts FPC's test point, be connected with FPC, play the effect that the contact test switches on, the test needle 43 of connecting the bottom even has metal spring 5, the elastic toughness of spring all must be stronger than traditional probe self spring characteristic, play the buffer protection effect to the test needle, the metal spring 5 setting of one end can not cause the indentation to the product simultaneously, metal spring connects on the row of inserting, the row of inserting is connected with the computer through special data line, thereby reach the effect of test.

In the embodiment, the diameter of the middle part 2 is larger than that of the testing end part 1 and the connecting bottom part 3, so that the probe can be better fixed in the drill hole, and the part with the larger diameter of the middle part 2 is firmly fixed, so that the up-and-down moving range of the testing needle 4 is further limited; the stability and the pressure resistance of the probe are enhanced.

In this embodiment, the test end part 1, the middle part 2 and the connection bottom part 3 are all made of high-carbon steel materials, and the common probe is made of copper, so that the test needle is more wear-resistant and not easy to damage, and the working efficiency is improved.

In this embodiment, the diameter of test needle 4 is 0.2 ~ 0.6mm, and test needle can accomplish 0.2mm at minimum, can effectively solve the test demand of tiny circuit, ensures the application range of probe, and measurement accuracy is also high simultaneously for production efficiency has been improved.

In this embodiment, the end of the testing pin 43 located at the connecting bottom 3 is detachably connected to the metal spring 5; thereby facilitating the disassembly, assembly and replacement of the novel probe.

Specifically, metal spring 5's one end is the connecting wire, and the other end is the shape of similar cup, and test needle 43 tip card is in metal spring 5's cup shape to realize being connected with dismantling of metal spring 5, probe 43 tip card has also increased area of contact between them in metal spring 5's cup shape, makes its conductivity better.

It should be noted that the length of the probe according to the present invention and the lengths of the test end portion 1, the middle portion 2 and the connecting bottom portion 3 can be set according to actual test requirements.

In this embodiment, the total length of the probe is 10-15 mm, the test end portion 1 is 25% of the total length of the probe, the middle portion 2 is 25% of the total length, the connection bottom portion 3 is 50% of the total length, and the length of the metal spring is 8-10 mm.

Example 2 novel Probe service life test as described in example 1

Utilize probe test tip to push down FPC's metal covering when testing probe life-span, move about from top to bottom and record the number of times, utilize ordinary probe to carry out the same experiment simultaneously, check every 10 ten thousand times, when going on 10 ten thousand times, novel probe and ordinary probe do not have unusually when inspection probe test tip contact surface, the spring that detects ordinary probe when going on 50 ten thousand times has not had elasticity, can't bounce, novel probe still does not have any anomaly, continue to test to novel probe and find that there is slight wearing and tearing vestige at the probe top when reaching 100 ten thousand times, this test is ended.

Therefore, the service life of the probe prepared by the embodiment can reach more than 100 ten thousand times, and the service life of the common probe is 50 ten thousand times.

What has been described above are merely some embodiments of the present invention. It will be apparent to those skilled in the art that various changes and modifications can be made without departing from the inventive concept thereof, and these changes and modifications can be made without departing from the spirit and scope of the invention.

Claims

1. The novel probe of the test fixture is characterized by comprising a test end part (1), a middle part (2), a connecting bottom part (3) and a test needle (4) penetrating through the test end part (1), the middle part (2) and the connecting bottom part (3), wherein the end part of a test needle (43) positioned at the connecting bottom part (3) is connected with a metal spring (5), and the metal spring (5) is arranged outside the connecting bottom part (3);

one end of the metal spring (5) is a connecting wire, the other end of the metal spring is in a cup shape, and the end part of the test needle (4) is clamped in the cup shape of the metal spring (5);

the diameter of the middle part (2) is larger than the diameter of the testing end part (1) and the connecting bottom part (3);

the diameter of the test needle (4) is 0.2-0.6 mm, and the test fixture is a circuit board empty board tester.

2. The novel probe of the test fixture as claimed in claim 1, wherein the test end portion (1), the middle portion (2) and the connecting bottom portion (3) are all made of high carbon steel material.

3. The new probe of the test fixture as claimed in claim 1, wherein the end of the test pin (43) at the connecting bottom (3) is detachably connected to the metal spring (5).