JPH04157370A - Spiral spring probe - Google Patents

Abstract

PURPOSE:To prevent a flaw from occurring, maintain electric contact and correct a shift in position of mounted parts by providing a spiral spring. CONSTITUTION:A spiral spring probe is of a spiral spring structure where a spiral spring 1 is attached to the tip of a contact probe. The spiral spring probe is brought into contact with a bottom of an electrolytic capacitor 5 and connected with a computer to measure electric characteristics. Even if the tip of the probe comes against an elevated insulation part around the bottom of the capacitor 5, or even if the capacitor 5 is tilted, the probe can be in contact with an aluminum part by the spring 1 so that electric characteristics can be measured without damaging a surface of the capacitor 5. When the capacitor 5 is taller than a reference value, the height is absorbed by the spring 1 to be in contact with the aluminum part similarly, so that electric characteristics can be measured without damaging the surface of the capacitor 5. Thus the probe can follow parts even if the parts are tilted or shifted in position.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a check and manufacturing method for determining the quality of components mounted on a board in a television receiver.

[Conventional technology]

The conventional technology does not take into consideration damage to one component, and there is a problem of component destruction.

[Problem to be solved by the invention]

The conventional technology does not take into consideration damage to parts, and has the problem of parts being destroyed.

The purpose of the present invention is to prevent damage to five parts and maintain electrical contact, and further,
Even if a component mounted on a board is misaligned, it can be followed and corrected by a spiral spring to ensure that the component hits the component.

[Effect]

When measuring an electrolytic capacitor using a mesh, crown, three-needle, etc. tip of a contact probe, the bottom surface of the component is not flat, but one periphery is raised and insulated.

If the parts mounted on the board are tilted and the probe hits the surrounding insulated parts, it will not work properly and an error will occur.

However, since the spiral spring probe of the present invention has a spiral spring structure even if it hits the surrounding insulating part, it absorbs the height and evenly hits the aluminum part on the bottom, so it does not malfunction. do not have.

〔Example〕

Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a front view of the present invention. 2 is a front view of the helical spring portion of FIG. 1; FIG. When measuring electrical characteristics by placing a contact probe in contact with the bottom of a capacitor and connecting it to a computer, Figure 3 shows that even if the tip of the probe hits the insulator, it contacts the aluminum part due to the spiral spring and touches the surface of the capacitor. FIG. 7 is a diagram showing that electrical characteristics can be measured without causing damage.

As shown in FIG. 4, even if the capacitor is tilted, the electrical characteristics can be measured without damaging the surface of the capacitor because the helical spring makes contact with the aluminum parts as shown.

As shown in FIG. 6, when the height of the capacitor is higher than the reference value, as shown in FIG. 1, the capacitor contacts the aluminum part and absorbs the height, making it possible to measure the electrical characteristics without damaging the surface of the component. Therefore, even if the color TV receiver is shipped to the market, the surface of the capacitor will not change over time, and no failure will occur.

〔Effect of the invention〕

According to the present invention, since a spring is attached to the tip of the contact probe, there is an effect of preventing scratches when the bottom surface of the electrolytic capacitor is pressed. Furthermore, even if a component is tilted or misaligned, it can be followed.

[Brief explanation of the drawing]

FIG. 1 is a front view of an embodiment of the present invention, FIG. 2 is a front view of the helical spring portion of FIG. 1, FIG. 3 is a front view of the embodiment, and FIG. 4 is a front view of the embodiment. FIG. 5 is a front view of the embodiment. 1...Spiral spring.

Claims (1)

[Claims] 1. A contact probe including a probe, a sleeve, and a spring, characterized in that a helical spring is provided. 2. A spiral spring is attached to the tip of the contact probe. When inspecting electrolytic capacitors mounted on a board, it can follow positional deviations without damaging the components, and , a helical spring probe characterized by having the advantage of electrical contact.