JPH06294815A - Inspection method for mounted parts - Google Patents

Abstract

(57) [Summary] [Purpose] It is an object to provide an inspection method for inspecting the presence or absence of mounting by measuring the connection part of the mounted component. Constitution: A probe 8 having a needle-shaped contact portion 7 is brought into contact with the pattern 2 of the printed wiring board 1, and a probe 10 having a brush-shaped contact portion 9 is brought into contact with a terminal of a component, thereby forming two contact portions. Since the conduction state between them can be measured, it can be inspected whether or not the component is mounted.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of inspecting a component mounted on a printed wiring board.

[0002]

2. Description of the Related Art Conventionally, an impedance checker or a function checker has been used as an inspection device for mounting a component on a printed wiring board by soldering or the like, and inspecting whether the mounted component is mounted in the correct position or not. To be done. As an inspection method by these, a test point is determined, and the probe support base of the above-mentioned checker is moved to the upper part of the test point, and two probes having a needle-shaped contact portion at the tip provided on the lower surface of the probe support base are tested. The impedance between the test points was measured by measuring the presence / absence of mounted components, the resistance value of the mounted components, and so on. However, as shown in FIG. 2A, when a 100 μF capacitor and a 0.1 μF capacitor are connected in parallel between the power supply and ground, the checker does not need to be installed even if the 0.1 μF capacitor is installed. Is judged to be good. Also,
As shown in FIG. 2B, in the case where five 0.1 μF bypass capacitors are connected in parallel, the checker's judgment is good even if one bypass capacitor is not installed, and even if there is a missing item. Regardless, there was a problem of being erroneously judged.

[0003]

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and provides an inspection method for inspecting that a component is surely mounted by measuring the connection site of the mounted component. The purpose is to provide.

[0004]

In order to solve the above problems, according to the present invention, a needle-shaped brush and a brush are attached to the tip of a probe mounted on a probe support base such as an impedance checker for inspecting a printed wiring board on which components and the like are mounted. A contact portion is provided, the needle-shaped contact portion is brought into contact with the pattern of the printed wiring board, the brush-like contact portion is brought into contact with the terminal of the component, and conduction between the two contact portions is measured. Characterize.

[0005]

According to the above construction, the probe having the needle-shaped contact portion is brought into contact with the pattern of the printed wiring board, and the probe having the brush-like contact portion is brought into contact with the terminal of the component, whereby two contact portions are provided. Since the conduction state between them can be measured, it is possible to inspect whether or not the component is mounted.

[0006]

Embodiments of the present invention will be described in detail with reference to the accompanying drawings. As shown in FIG. 1, a printed wiring board 1 has a pattern 2 formed on its upper surface. 3 is a part,
Terminals 4 for connection are provided at both ends, and the terminals 4 are connected to the pattern 2 with solder 5. A probe support 6 is connected to an impedance checker (not shown), and the probe support 6 has a needle-shaped contact portion 7 at its tip.
A probe 10 having a brush-like contact portion 9 having a thin metal wire having elasticity implanted therein is attached to the probe 8. The probe 8 has a spring structure, and when the tip of the probe 8 contacts the sample, the probe 8 contracts in the vertical direction and comes into pressure contact with the contact portion. On the other hand, the brush-shaped contact portion 9 of the probe 10 has elasticity and is structured to surely contact the component surface along the uneven shape of the component. In the above structure, the printed wiring board 1 is fixed to the inspection table, and the probe support table 6 is controlled in the horizontal / vertical directions to move freely. In order to inspect the presence / absence of the mounted component 3, the probe support base 6 moves to the upper part of the component 3 and then descends to the surface of the printed wiring board 1, and the needle-shaped contact portion 7 of the probe 8 contacts the pattern 2. , The brush-shaped contact portion 9 of the probe 10 stops when it comes into contact with the terminal 4. Then, the conduction between the needle-shaped contact portion 7 and the brush-shaped contact portion 9 is measured, and when the mounted component is connected to the pattern 2, there is conduction, and when the mounted component is not connected, there is no conduction. Can be determined.

[0007]

As described above, according to the present invention, a defective product such as a bypass capacitor which cannot be detected by an inspection method such as an impedance checker can be surely detected, so that the conventional visual inspection can be omitted and the inspection cost can be reduced. Reliability can be improved by reduction and mechanization.

[Brief description of drawings]

FIG. 1 is a side external view showing an embodiment of a mounting component inspection method of the present invention.

FIG. 2 is a connection diagram showing an example of mounted components.

[Explanation of symbols]

 1 Printed wiring board 2 Pattern 3 Parts 4 Terminal 5 Solder 6 Probe support 7 Needle-shaped contact part 8 Probe 9 Brush-shaped contact part 10 Probe

Claims (1)

[Claims] 1. A needle-shaped or brush-shaped contact portion is provided at a tip of a probe mounted on a probe support base such as an impedance checker for inspecting a printed wiring board on which components and the like are mounted, and the needle is provided on a pattern of the printed wiring board. -Shaped contact portion is brought into contact, the brush-shaped contact portion is brought into contact with the terminal of the component, and the conduction between the two contact portions is measured.